MOTOROLA MC54HC573A, MC74HC573A Technical data

MOTOROLA MC54HC573A, MC74HC573A Technical data

MC54/74HC573A

MOTOROLA

SEMICONDUCTOR TECHNICAL DATA

Octal 3-State Noninverting

Transparent Latch

High±Performance Silicon±Gate CMOS

The MC54/74HC573A is identical in pinout to the LS573. The devices are compatible with standard CMOS outputs; with pullup resistors, they are compatible with LSTTL outputs.

These latches appear transparent to data (i.e., the outputs change asynchronously) when Latch Enable is high. When Latch Enable goes low, data meeting the setup and hold time becomes latched.

The HC573A is identical in function to the HCT373A but has the data inputs on the opposite side of the package from the outputs to facilitate PC board layout.

The HC573A is the noninverting version of the HC563A.

Output Drive Capability: 15 LSTTL Loads

Outputs Directly Interface to CMOS, NMOS and TTL

Operating Voltage Range: 2.0 to 6.0 V

Low Input Current: 1.0 μA

In Compliance with the Requirements Defined by JEDEC Standard No. 7A

Chip Complexity: 218 FETs or 54.5 Equivalent Gates

LOGIC DIAGRAM

 

 

 

D0

2

 

 

 

 

19

Q0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3

 

 

 

 

18

 

 

 

 

 

 

D1

 

 

 

 

Q1

 

 

 

 

 

4

 

 

 

 

17

 

 

 

 

 

 

D2

 

 

 

 

Q2

 

 

 

DATA

5

 

 

 

 

16

 

NONINVERTING

 

D3

 

 

 

 

Q3

 

 

 

 

 

 

 

6

 

 

 

 

15

INPUTS

 

D4

 

 

 

 

Q4

 

OUTPUTS

 

 

 

7

 

 

 

 

14

 

 

 

 

 

 

D5

 

 

 

 

Q5

 

 

 

 

 

8

 

 

 

 

13

 

 

 

 

 

 

D6

 

 

 

 

Q6

 

 

 

 

 

9

 

 

 

 

12

 

 

 

 

 

 

D7

 

 

 

 

Q7

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

11

 

 

 

 

 

 

 

 

LATCH ENABLE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1

 

 

 

 

PIN 20 = VCC

 

OUTPUT ENABLE

 

 

 

 

 

 

 

 

 

PIN 10 = GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Design Criteria

 

 

 

Value

Units

 

 

 

 

 

 

 

 

Internal Gate Count*

 

 

 

54.5

ea.

 

 

 

 

 

 

 

 

Internal Gate Propagation Delay

 

 

 

1.5

ns

 

 

 

 

 

 

 

 

Internal Gate Power Dissipation

 

 

 

5.0

μW

 

 

 

 

 

 

 

 

Speed Power Product

 

 

 

0.0075

pJ

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

* Equivalent to a two±input NAND gate.

MC54/74HC573A

 

J SUFFIX

20

CERAMIC PACKAGE

CASE 732±03

 

 

1

 

N SUFFIX

20

PLASTIC PACKAGE

CASE 738±03

 

 

1

 

 

DW SUFFIX

20

1

SOIC PACKAGE

 

CASE 751D±04

 

 

20

 

DT SUFFIX

TSSOP PACKAGE

 

 

1

CASE 948E±02

 

ORDERING INFORMATION

 

MC54HCXXXAJ

Ceramic

 

MC74HCXXXAN

Plastic

 

MC74HCXXXADW

SOIC

 

MC74HCXXXADT

TSSOP

PIN ASSIGNMENT

OUTPUT

 

1

20

VCC

ENABLE

 

 

D0

 

2

19

Q0

D1

 

3

18

Q1

 

D2

 

4

17

Q2

 

D3

 

5

16

Q3

 

D4

 

6

15

Q4

 

D5

 

7

14

Q5

 

D6

 

8

13

Q6

 

D7

 

9

12

Q7

 

GND

 

10

11

LATCH

 

 

ENABLE

 

 

 

 

 

 

 

 

FUNCTION TABLE

 

Inputs

 

Output

 

 

 

 

Output

Latch

 

 

Enable

Enable

D

Q

 

 

 

 

L

H

H

H

L

H

L

L

L

L

X

No Change

H

X

X

Z

 

 

 

 

X = Don't Care

Z = High Impedance

10/96

Motorola, Inc. 1996

1

REV 7

MC54/74HC573A

MAXIMUM RATINGS*

Symbol

Parameter

Value

Unit

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

± 0.5 to + 7.0

V

Vin

DC Input Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Vout

DC Output Voltage (Referenced to GND)

± 0.5 to VCC + 0.5

V

Iin

DC Input Current, per Pin

± 20

mA

Iout

DC Output Current, per Pin

± 35

mA

ICC

DC Supply Current, VCC and GND Pins

± 75

mA

PD

Power Dissipation in Still Air, Plastic or Ceramic DIP²

750

mW

 

SOIC Package²

500

 

 

TSSOP Package²

450

 

 

 

 

 

Tstg

Storage Temperature

± 65 to + 150

_C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

 

_C

 

(Plastic DIP, TSSOP or SOIC Package)

260

 

 

(Ceramic DIP)

300

 

 

 

 

 

This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high±impedance circuit. For proper operation, Vin and Vout should be constrained to the

range GND v (Vin or Vout) v VCC. Unused inputs must always be

tied to an appropriate logic voltage level (e.g., either GND or VCC).

Unused outputs must be left open.

*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recommended Operating Conditions.

²Derating Ð Plastic DIP: ± 10 mW/ _C from 65_ to 125_C

Ceramic DIP: ± 10 mW/_C from 100_ to 125_C

SOIC Package: ± 7 mW/_C from 65_ to 125_C

TSSOP Package: ±6.1 mW/°C from 65_ to 125_C

For high frequency or heavy load considerations, see Chapter 2 of the Motorola High±Speed CMOS Data Book (DL129/D).

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

 

Min

Max

Unit

 

 

 

 

 

 

VCC

DC Supply Voltage (Referenced to GND)

 

2.0

6.0

V

Vin, Vout

DC Input Voltage, Output Voltage (Referenced to GND)

0

VCC

V

TA

Operating Temperature, All Package Types

 

± 55

+ 125

_C

tr, tf

Input Rise and Fall Time

VCC = 2.0 V

0

1000

ns

 

(Figure 1)

VCC = 4.5 V

0

500

 

 

 

VCC = 6.0 V

0

400

 

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

Guaranteed Limit

 

 

 

 

 

 

 

VCC

 

 

 

 

 

 

 

 

 

 

± 55 to

v _

v

 

_

 

 

Symbol

Parameter

Test Conditions

V

_

125

C

Unit

 

25 C

85 C

 

 

VIH

Minimum High±Level Input

Vout = 0.1 V or VCC ± 0.1 V

2.0

1.5

1.5

 

1.5

 

 

V

 

Voltage

|Iout| v 20 μA

3.0

2.1

2.1

 

2.1

 

 

 

 

 

 

4.5

3.15

3.15

 

3.15

 

 

 

 

 

6.0

4.2

4.2

 

4.2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VIL

Maximum Low±Level Input

Vout = 0.1 V or VCC ± 0.1 V

2.0

0.5

0.5

 

0.5

 

 

V

 

Voltage

|Iout| v 20 μA

3.0

0.9

0.9

 

0.9

 

 

 

 

 

 

4.5

1.35

1.35

 

1.35

 

 

 

 

 

6.0

1.8

1 8

 

1.8

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VOH

Minimum High±Level Output

Vin = VIH or VIL

2.0

1.9

1.9

 

1.9

 

 

V

 

Voltage

|Iout| v 20 μA

4.5

4.4

4.4

 

4.4

 

 

 

 

 

 

6.0

5.9

5.9

 

5.9

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Vin = VIH or VIL |Iout| 2.4mA

3.0

2.48

2.34

 

2.2

 

 

 

 

 

|Iout| v 6.0 mA

4.5

3.98

3.84

 

3.7

 

 

 

 

 

|Iout| v 7.8 mA

6.0

5.48

5.34

 

5.2

 

 

 

NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High±Speed CMOS Data Book (DL129/D).

MOTOROLA

2

High±Speed CMOS Logic Data

 

 

DL129 Ð Rev 6

MC54/74HC573A

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

 

 

 

 

Guaranteed Limit

 

 

 

 

VCC

 

 

 

 

 

 

 

± 55 to

 

 

 

Symbol

Parameter

Test Conditions

V

25_C

v 85_C

v 125_C

Unit

 

 

 

 

 

 

 

 

VOL

Maximum Low±Level Output

Vout = 0.1 V or VCC ± 0.1 V

2.0

0.1

0.1

0.1

V

 

Voltage

|Iout| v 20 μA

4.5

0.1

0.1

0.1

 

 

 

 

6.0

0.1

0.1

0.1

 

 

 

 

 

 

 

 

 

 

 

Vin = VIH or VIL |Iout| 2.4mA

3.0

0.26

0.33

0.4

 

 

 

|Iout| v 6.0 mA

4.5

0.26

0.33

0.4

 

 

 

|Iout| v 7.8 mA

6.0

0.26

0.33

0.4

 

Iin

Maximum Input Leakage Current

Vin = VCC or GND

6.0

± 0.1

± 1.0

± 1.0

μA

IOZ

Maximum Three±State Leakage

Output in High±Impedance State

6.0

± 0.5

± 5.0

± 10

μA

 

Current

Vin = VIL or VIH

 

 

 

 

 

 

 

Vout = VCC or GND

 

 

 

 

 

ICC

Maximum Quiescent Supply

Vin = VCC or GND

6.0

4.0

40

160

μA

 

Current (per Package)

IIoutI = 0 μA

 

 

 

 

 

NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High±Speed CMOS Data Book (DL129/D).

AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)

 

 

 

Guaranteed Limit

 

 

 

 

 

 

VCC

 

 

 

 

 

 

 

 

 

 

± 55 to

v _

 

v

 

_

 

 

Symbol

Parameter

V

_

C

125

C

Unit

 

25 C

85

 

 

tPLH,

Maximum Propagation Delay, Input D to Q

2.0

150

190

 

 

225

 

 

ns

tPHL

(Figures 1 and 5)

3.0

100

140

 

 

180

 

 

 

 

 

4.5

30

38

 

 

45

 

 

 

 

 

6.0

26

33

 

 

38

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPLH,

Maximum Propagation Delay, Latch Enable to Q

2.0

160

200

 

 

240

 

 

ns

tPHL

(Figures 2 and 5)

3.0

105

145

 

 

190

 

 

 

 

 

4.5

32

40

 

 

48

 

 

 

 

 

6.0

27

34

 

 

41

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPLZ,

Maximum Propagation Delay, Output Enable to Q

2.0

150

190

 

 

225

 

 

ns

tPHZ

(Figures 3 and 6)

3.0

100

125

 

 

150

 

 

 

 

 

4.5

30

38

 

 

45

 

 

 

 

 

6.0

26

33

 

 

38

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPZL,

Maximum Propagation Delay, Output Enable to Q

2.0

150

190

 

 

225

 

 

ns

tPZH

(Figures 3 and 6)

3.0

100

125

 

 

150

 

 

 

 

 

4.5

30

38

 

 

45

 

 

 

 

 

6.0

26

33

 

 

38

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tTLH,

Maximum Output Transition Time, Any Output

2.0

60

75

 

 

90

 

 

ns

tTHL

(Figures 1 and 5)

3.0

27

32

 

 

36

 

 

 

 

 

4.5

12

15

 

 

18

 

 

 

 

 

6.0

10

13

 

 

15

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Cin

Maximum Input Capacitance

 

10

10

 

 

10

 

 

pF

Cout

Maximum Three±State Output Capacitance (Output in High±Impedance State)

15

15

 

 

15

 

 

pF

NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the Motorola High± Speed CMOS Data Book (DL129/D).

 

 

Typical @ 25°C, VCC = 5.0 V

 

CPD

Power Dissipation Capacitance (Per Enabled Output)*

23

pF

*Used to determine the no±load dynamic power consumption: PD = CPD VCC2f + ICC VCC. For load considerations, see Chapter 2 of the

Motorola High±Speed CMOS Data Book (DL129/D).

High±Speed CMOS Logic Data

3

MOTOROLA

DL129 Ð Rev 6

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