• Single supply with programming operation down
to 2.5V
• Low power CMOS technology
- 1 mA active current typical
-5 µ A standby current (typical) at 3.0V
• ORG pin selectable memory configuration
1024 x 8 or 512 x 16 bit organization (93LC76)
2048 x 8 or 1024 x 16 bit organization (93LC86)
• Self-timed ERASE and WRITE cycles
(including auto-erase)
• Automatic ERAL before WRAL
• Power on/off data protection circuitry
• Industry standard 3-wire serial I/O
• Device status signal during ERASE/WRITE cycles
• Sequential READ function
• 10,000,000 ERASE/WRITE cycles guaranteed
• Data retention > 200 years
• 8-pin PDIP/SOIC package
• Temperature ranges available
- Commercial (C)0 ° C to +70 ° C
- Industrial (I)-40 ° C to +85 ° C
Serial EEPROM
P ACKA GE TYPES
DIP Package
93LC76/86
1
CS
2
CLK
3
DI
4
DO
SOIC Package
93LC76/86
DI
1
2
3
4
CS
CLK
DO
BLOCK DIAGRAM
VCCV
SS
8
V
CC
7
PE
6
ORG
5
V
SS
8
V
CC
7
PE
6
ORG
V
5
SS
DESCRIPTION
The Microchip Technology Inc. 93LC76/86 are 8K and
16K low voltage serial Electrically Erasable PROMs.
The device memory is configured as x8 or x16 bits
depending on the ORG pin setup. Advanced CMOS
technology makes these devices ideal for low power
non-volatile memory applications. These devices also
have a Program Enable (PE) pin to allow the user to
write protect the entire contents of the memory array.
The 93LC76/86 is available in standard 8-pin DIP and
8-pin surface mount SOIC packages.
Microwire is a registered trademark of National Semiconductor Incorporated.
Storage temperature.....................................-65˚C to +150˚C
Ambient temp. with power applied................. -65˚C to +125˚C
Soldering temperature of leads (10 seconds).............+300˚C
ESD protection on all pins................................................4 kV
*Notice: Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any
other conditions above those indicated in the operational listings
of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability
TABLE 1-1:PIN FUNCTION TABLE
NameFunction
CS
CLK
DI
DO
V
SS
ORG
PE
V
CC
um Ratings*
SS
............... -0.6V to Vcc +1.0V
Chip Select
Serial Data Clock
Serial Data Input
Serial Data Output
Ground
Memory Configuration
Program Enable
Power Supply
1.2 A
C Test Conditions
AC Waveform:
= 2.0V
LO
V
HI
V
= Vcc - 0.2V
HI
V
= 4.0V for
(Note 1)
(Note 2)
Timing Measurement Reference Level
Input0.5 V
Output0.5 V
Note 1: For V
2: For V
CC
CC
4.0V
> 4.0V
CC
CC
TABLE 1-2:DC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
V
= +2.5V to +6.0V
CC
Commercial (C): Tamb = 0˚C to +70˚C
Industrial (I): Tamb = -40˚C to +85˚C