SERIAL DATA ANALYZERS
(3 GHZ–6 GHZ)
A 360° Solution for
Serial Data Analysis
and Jitter
A Total Solution for Serial Data Analysis
With serial data—both electrical and optical—quickly
becoming a dominant form of data transmission, fast and
accurate analysis becomes a priority. The LeCroy SDA
integrates all the key tests into one device while providing
powerful standard and jitter packages. Here are a few key
measurements that are part of this powerful analyzer’s
capabilities:
• Eye patterns with violation locator
• Accurate and repeatable jitter analysis
• Precision numerical clock recovery with
adjustable PLL response
• Bit error analysis
• 1 ps jitter noise floor
• Compliance testing for a broad range of standards
A Four-Quadrant 360° Analysis
of Your Serial Data Signal
Eye Patterns Show Mask Violations to the Bit
•
Eye pattern measurement on up to 8 million consecutive
bits ensures that even transient jitter and noise events
are captured
• Consecutive bit eye pattern analysis allows for the
measurement of the wave shapes of individual bits
that violate the compliance mask (violation location)
• Fast update rate
• Very low measurement jitter (typically 1 ps rms)
Jitter Bathtub
•
Bathtub curve extrapolated directly from the time
interval error (TIE) histogram gives an accurate total
jitter measurement.
•
Presents jitter as a function of bit error rate.
•
Predicts maximum BER performance of system.
2
Serial Data Analysis
One-button access that covers the
following serial data measurements:
• Eye patterns
Jitter analysis (including total,
•
random and deterministic)
• Signal rise/fall and overshoot
• Extinction ratio and Q factor
• Standards compliance
New Advanced Serial
Data and Jitter Analysis
(Standard)
ith this analysis software, the
W
SDA resolves the most challenging
measurements like:
• Edge-to-edge jitter
• Clock jitter
• Filtered jitter
• Effective and MJSQ jitter
• ISI plot of data dependent jitter
• N-cycle jitter plot
• Bit error rate analysis
• Mask violation
Serial Data Standards
The SDA supports a wide range
of standards, including:
• Serial Attached SCSI (SAS 1.5 Gb/s,
.0 Gb/s, and 6 Gb/s)
3
®
• PCI Express
(2.5 Gb/s and 5 Gb/s)
• UWB – Wimedia Alliance
• Serial ATA (1.5 Gb/s and 3.0 Gb/s)
• Fully Buffered DIMM (FB-DIMM)
AMB Point-to-Point (3.2 Gb/s to
4.8 Gb/s)
• Fibre Channel (133 Mb/s to 8.5 Gb/s)
• USB 2.0 (HS signal quality)
• IEEE 802.3 (10Base-T, 100Base-T,
1000Base-T)
• High Definition Multimedia
Interface (HDMI)
• 1000Base-LX4 (XAUI)
Gen1 and Gen2
Jitter Trend
•
Time domain view of jitter displays transient jitter events
that can be missed by viewing the histogram alone.
•
Clearly shows any non-stationary jitter behavior.
Histogram
•
Display of measured jitter histogram clearly shows
any unusual jitter distributions such as bi-modal or
non-Gaussian tails. By simply viewing the jitter breakdown
(Rj, Dj), the raw data view shows jitter behavior that can
be lost.
•
This unprocessed display gives a high degree of
confidence in the accuracy of the jitter breakdown
and bathtub curve.
3
Thorough Jitter Analysis
Jitter is the most critical measurement in serial data signal
analysis, and LeCroy has the ultimate solution for you. The
SDA can measure a full set of clock and timing jitter param-
eters as well as time interval error (TIE) measurements for
data signals. With the included ASDA-J measurement
package (see below), you get the most effective jitter
analysis tool available today.
• TIE measurements are performed using a precise software
clock recovery.
• Data bit deviation is measured from their ideal locations
in time.
• Processed data is displayed in several different views,
including bathtub, histogram, time trend, and data
dependent jitter vs. bit.
• Measurements include total, random, and deterministic, with
the latter broken down into periodic and data dependent parts.
Turbocharge Your Jitter Measurements
Many different instruments
such as sampling oscilloscopes, time interval ana-
lyzers (TIA’s),
ASDA-J
Software
and bit error
rate test sets
are used to
evaluate the jitter in serial
data streams. The LeCroy
ASDA-J package (included),
is the first software to implement all of these standard
methods.
With a single
instrument, the slight differences among methods can
be viewed and understood.
ASDA-J provides specific
jitter measurements to meet
all serial data standards.
Jitter Wizard
This feature automatically selects
all of the critical instrument settings,
ensuring the highest accuracy and
repeatability.
• Prompts the user about the signal
under test.
• Sampling rate, level, bit rate, and
pattern length are automatically
detected.
Edge-to-Edge Jitter
In this mode, timing is measured
on data transitions relative to one
another in the same way as a timing
interval analyzer (TIA).
• Measurements can be displayed
directly or compensated to correlate
with phase jitter measurements.
• Tj, Rj, and Dj measurements can
be made at specific UI spacings or
for all spacings in the data stream.
Filtered Jitter
ASDA-J offers a filtered jitter
mode to support ITU-T and SONET
measurements.
• Band-pass filter with selectable
upper and lower cutoff frequencies
supplied.
• Peak-to-peak and rms value, plus
the jitter waveform, are displayed
in this mode.
4
Bathtub Curve
The bathtub curve shows the overall jitter distribution
over a unit interval and serves as the basis for bit error
rate estimation.
Synchronous N-cycle Plot
This display shows the data dependent jitter for each
data transition in a repeating data pattern. The pattern
is automatically detected from the data stream.
N-cycle vs. N Jitter Plot
This display shows the rms jitter as
a function of the UI spacing. This
display provides a very sensitive way
of viewing periodic jitter effects.
The minimum value of this plot gives
the rms value of the random jitter.
The horizontal axis is the number
of UI, N, over which the jitter is
measured and the vertical dimension
shows the rms jitter for that spacing.
The plot above shows a signal with
low frequency periodic jitter.
Jitter Analysis: Rj, Dj, Tj
The SDA measures total jitter by
extrapolating the histogram of jitter
measurements. The ASDA-J option
includes the following three methods
for determining the random and
deterministic components to support
all existing standards:
• Conventional. Deterministic jitter
is measured directly and Rj is the
difference between the total and
deterministic parts.
• Effective. BERT-scan method
using the bathtub curve to fit a
“dual dirac” jitter model.
• MJSQ. Fibre Channel method
using two Gaussian curves to fit
the extremes of the measured
distribution.
ISI Plot
The ISI plot displays data dependent
jitter contributions to the eye pattern
for the second-to-last bit of a bit length,
set from 3 to 10. This plot measures
data dependent jitter without the
need for a repeating bit pattern.
5
The Cleanest Eye Patterns Possible
Eye pattern analysis is
a widely used tool for
assessing the signal
integrity of serial data
streams. The SDA measures eye patterns on a
continuous
to 8M consecutive
record of up
unit
intervals (UI). A software-
defined clock recovery
algorithm is used to
separate the record into
segments that are one UI
in length, and the segments
are then overlaid to form
the eye pattern. Subsequent
acquisitions are accumulated
with the previous ones.
• Consecutive UI ensures the
capture of transient events
on any single bit.
• Eye pattern measurement
compliant for PCI Express,
Serial ATA, USB 2.0, and
Serial Attached SCSI.
• Trigger jitter is eliminated,
giving a measurement of
jitter that is 7x lower than
traditional methods of
measuring eye patterns.
A Sharp Focus for
Eye Patterns
Eye violation location displays indi-
vidual
bits that violate the eye mask
boundaries. The SDA measures
eye patterns
ASDA-J
Software
test. The original
indexed by the software so
parts of the overall waveform that
violate the mask boundaries, when
formed into an eye pattern, can be
identified by the particular bit that
caused them. The signal waveform
around the failed bit is displayed,
and relationships between the fail-
ure and adjacent bits can be easily
seen. A second channel from the
instrument
and time-aligned
under test, to locate relationships
between failures and other signals
in the system under test.
6
consecutive unit
intervals of the
data stream under
waveform is
can also be displayed,
with the signal
on
that the
The original bit sequence is stored along with the eye pattern, allowing the user
to locate the exact bit or bits that caused a mask failure. This type of analysis
pinpoints the source of mask failures, speeding up the debugging process. The
display can be set to show any number of bits around a specific violation up
to the total acquisition so specific bit patterns can be recognized. A table of
violations and bit locations is also available.
• Fully programmable clock
recovery algorithm, includ-
ing first- and second-order
PLL models, provides
compliance to all existing
standards and allows the
modeling of specific
receiver types.
• Clock recovery modes for
PCI Express, DVI/HDMI, and
“GOLDEN” PLL.
• Fast update rate for both
electrical and optical
signals with reference
receiver.
Eye patterns are measured on a continuous record of up to 8M consecutive UI,
giving low jitter, high update rates, and the ability to capture single-bit anomalies.
Bit Error Rate Analysis
While bit error rate performance can be predicted through
signal quality tests on the transmitter, jitter tolerance
testing
error rate analysis. The SDA converts the captured record
of consecutive bits to generate a bit stream, using its
software clock recovery and a threshold detector. The bit
stream is compared to the expected pattern to determine
the number of bit errors and the error ratio. Bit error
locations can be displayed in a 3-dimensional map that
shows the error locations relative to their position within
a frame or pattern. This type of display shows the root
causes of bit errors by clearly indicating pattern or frame
related issues.
• Measures total errors, 1’s errors, 0’s errors, and
• Up to 1e-7 BER on a single capture.
• Error map shows locations of bit errors accumulated
• Reference patterns can be PRBS5 to PRBS23, and
of receivers can only be evaluated through bit
error rate.
over multiple signal acquisitions to measure lower bit
error rates.
arbitrary patterns can be entered into the instrument
or stored in a file.
The bit error map displays the location of bit errors
(shown as bright squares) relative to their location in a
frame or pattern. Each frame is displayed as a row in the
plot. Frames can be of fixed length, delimited by a specific
bit pattern, or both. The bit error rate, along with the
number of bit errors, is displayed below the map.
8B/10B Protocol Decoding
Simultaneously translates up to 4 lanes of 8B/10B encoded
Serial Data waveforms into symbol views to allow easier
troubleshooting. This allows the user to quickly correlate
protocol events with the physical serial data waveform.
The decoder operates with 8B/10B encoded data at rates
up to 6.25 Gb/s.
7
Serial Pattern Trigger
The SDA 6000A XXL and SDA 4000A XXL include a serial
pattern trigger that enables signal acquisition to be
synchronized with a specific bit sequence in the serial
data stream under test. This trigger can be combined with
the powerful jitter and eye pattern analysis features of the
SDA to measure specific parts of a data stream, such as
unscrambled header bytes or specific channels, in a
multiplexed data stream. The SDA can also:
• Trigger on pattern lengths up to 32 bits
• Support data rates from 50 Mb/s to 2.7 Gb/s
• Provide recovered clock and data signals to external
measurement equipment
Standards Compliance
The SDA Series offers a growing list of compliance pack-
ages to support everything from USB 2.0 to PCI Express.
These optional packages enhance the basic analysis and
debug capabilities of the SDA by adding specific compli-
ance measurements and displays. Simple single-button
operation can be invoked to perform an entire set of
measurements and to display all results, including a
pass/fail indicator. LeCroy continues to add new measure-
ments to the SDA to support current and emerging serial
data standards.
Future-proof Customization
As new standards are being developed, specialized
measurements are often needed. Using the powerful
customization features of the SDA, specialized parame-
ters and functions can be implemented using MATLAB,
Mathcad,®Excel, Visual Basic, or any other programming
language. These functions can then be embedded into
the instrument, creating custom measurements that can
be accessed in the same manner as any of the standard
features of the instrument.
8
The SDA-PCIE-G2 software option for the SDA implements
PCI-SIG
The software measures both systems and add-in cards.
®
Customization and Automation can be used to create
special measurements for new standards. The plot above
shows an implementation of the Serial ATA Generation I
jitter test in an Excel spreadsheet.
®
compliant eye pattern and jitter measurements.
New Q-Scale–See Jitter Components Accurately
First introduced in real-time serial data analyzers by LeCroy, the new Q-Scale view shows
a graphical representation of key jitter components. It is a powerful tool for the engineer
troubleshooting the source of jitter in circuits.
In brief, Q-Scale analysis depicts a
Gaussian distribution as a straight line.
There are two fundamental benefits
of using Q-Scale:
4
1. When placed on top of the reference
line, you can instantly judge how
Gaussian the distribution is. This
is much easier than trying to look
at the sides of a bathtub curve.
2. Greatly improved stability of the
Random Jitter (Rj) component.
Because the Rj component is heavily
weighted to form the Tj, the Total Jitter
number is also much more repeatable.
Interpreting the
Q-Scale
As with any jitter histogram, the
width indicates the amount of jitter.
The slope of the grey lines decreases
with increasing random jitter.
The alignment of the red lines with
the grey reference lines indicates how
close to pure Gaussian the distribution
on the corresponding face is. Note
that it is possible and common for
the two faces of the histogram to be
nonsymmetrical, and even represent
different amounts of jitter relative to
the ideal edge placement.
The bottom tails of the red lines curve
inward toward the center when there
is a bounded component present.
Likely sources of this jitter would be
cross talk and power supply noise.
The distance between the dotted
lines in the center is the deterministic
(effective Dj) component, in the
1
2
1. Linearity Reveals the Source
of Random Jitter
When red line lies on grey reference,
the face has a Gaussian distribution.
• Bottom curves outward = more Rj
• Bottom curves inward = more
bounded
2. Total Jitter Population at Your
Finger Tips
Base of the histogram is total jitter
interval at selected BER (shown as
dotted lines).
correct time scale. There is no separa-
tion in these lines when the Dj is zero,
indicating pure random jitter.
Three parameters are used to fit the
tail of the histogram—Sigma, Mean,
and Population. The Rho factor indi-
cates the closeness of the data fit
to the extrapolated model necessary
to extend the histogram to the selected
BER. A value of 1.0 would indicate a
3
3. Precise Intuitive Calculation of Rj
Slope of grey line decreases with
increasing Rj.
4. Directly View Dj Magnitude
Intersection of the grey reference
lines with the top of the grid represents
the deterministic component in time
(Effective Dj). Displayed as dotted
vertical lines: Sigma value = Random
Jitter Rho-fitting coefficient (quality
of model fit)
perfect fit to a single Gaussian
distribution. Rho is the amount of
the distribution of the histogram fit
into the extrapolated tail. Essentially,
this number represents a figure of
merit for the measurement quality.
9
The SDA serial pattern trigger can be used to acquire specific bit patterns
for processing.
Optical-to-Electrical
Converters
The OE525 and OE555 O/E converters
feature 4.5 GHz optical bandwidth
nd multi-mode optical fiber inputs,
a
and operate over the 500–870 nm
and 950–1630 nm wavelength
ranges,
converters
feature DSP-based
reference receivers
that give precise
response for any
data rate and
on any channel.
respectively. The O/E
LabNotebookTM– A Comprehensive
Report Documentation and Setup
Archival Tool
Now you can efficiently create complete and detailed
waveform reports directly in the serial data analyzer. An
all-in-one solution for annotating and sharing information,
LabNotebook simplifies results recording and report
generation by eliminating the multi-step processes that
often involve several pieces of equipment.
Freehand notes
can be written on
the screen with a
stylus right on the
waveform and then
saved in the report
file. Simple and
very efficient.
Makes Reports the Way You Want
WaveLink®D600ST
Mechanical Performance Without Rival
Best-in-class mechanical design for optimum utility:
• Small-tip, high-bandwidth differential probe
• Three interconnect configurations for flexibility
• Very small form factor for accessing tight spaces
Each of the interchangeable leads is a thin, highly flexible
145 mm (5.7") long lead connecting the tip and the
D600ST probe tip module.
LabNotebook enables you to focus on results rather
than the process, so you can now:
• Save all displayed waveforms
• Save the relevant setups with the saved waveform
• Add freehand notes with a stylus or as text
• Convert the complete report to pdf, rtf, or html
• Print or e-mail reports
10
Specifications
Vertical System SDA 6020 SDA 6000A XXL SDA 4020 SDA 4000A XXL SDA 3010
nalog Bandwidth @ 50 Ω (-3 dB) 6 GHz 6 GHz 4 GHz 4 GHz 3 GHz
A
ise Time (Typical) 75 ps 75 ps 105 ps 105 ps 150 ps
R
nput Channels 4
I
Bandwidth Limiters 20 MHz, 200 MHz, 1 GHz, 3 GHz, 4 GHz (1 and 3 GHz for SDA 4xxx model only. 4 GHz for SDA 6xxx model only)
Input Impedance 50 Ω ±2.0% 50 Ω ±1.5%, 1 MΩ || 15 pF
nput Coupling DC, GND 1 MΩ: AC, DC, GND; 50 Ω: DC
I
aximum Input Voltage ±4 V
M
Channel-Channel Isolation ≥ 100:1 at 2 GHz; ≥ 40:1 at 3 GHz; ≥ 20:1 at 4 GHz 250:1 at same V/div setting,
ertical Resolution 8 bits; up to 11 bits with enhanced resolution (ERES)
V
Sensitivity 2 mV–1 V/div (fully variable, < 10 mV/div through zoom) 50 Ω: 2 mV–1 V/div (fully variable);
C Gain Accuracy ±1.5% of full scale ±1.5% of full scale
D
Offset Range ±750 mV @ 2 mV–194 mV/div 50 Ω: ±700 mV @ 2–4.95 mV/div
ffset Accuracy ±(1.5% of full scale +1.5% of offset value +2 mV) ±(1.5% of full scale + 0.5% of
O
4 V @ 196 mV–1 V/div ±1.5 V @ 5–100 mV/div
±
peak
Horizontal System
Timebases Internal timebase common to 4 input channels; an external clock may be applied at the auxiliary input
Time/Division Range Real Time: 20 ps/div–10 s/div Real Time: 200 ps/div–10 s/div;
Math and Zoom Traces 8 independent zoom and 8 math or zoom traces
Sample Rate and Delay Time Accuracy ±1 ppm ≤ 10 s interval ±5 ppm ≤ 10 s interval
Time Interval Accuracy ≤ 0.06 / SR + (1 ppm * Reading) (rms)
Jitter Noise Floor 1 ps rms (typical)
Trigger and Interpolator Jitter < 2 ps rms (typical) 3 ps rms (typical)
Channel-Channel Deskew Range ±9 x time/div. setting, or 25 ns, whichever is larger ±9 x time/div. setting,
External Timebase Reference 100 MHz; 50 Ω impedance, applied at the rear input
External Clock 30 MHz–2 GHz 50 Ω 30 MHz–2 GHz 50 Ω 30 MHz–1 GHz 50 Ω
impedance applied N/A impedance applied N/A impedance applied
at the auxiliary input at the auxiliary input at the auxiliary input
Random Interleave Sampling: to 20 ps/div RIS mode: to 20 ps/div;
Acquisition System
Single-Shot Sample Rate/Ch 20 GS/s on 4 Ch 20 GS/s on 2 Ch; 20 GS/s on 4 Ch 20 GS/s on 2 Ch; 20 GS/s on 2 Ch;
Random Interleaved Sampling (RIS) 200 GS/s for repetitive signals, to 20 ps /div. Upper time/div limit function of sample rate and memory length settings
Maximum Trigger Rate 150,000 waveforms/second (in Sequence Mode, up to 4 channels)
Intersegment Time ≤ 6 µs
Maximum Acquisition Memory Points/Ch 4 Ch (2 Ch) / (4 Ch) 4 Ch (2 Ch) / (4 Ch) (4 Ch / 2 Ch) (Sequence Mode)
Standard Memory 20M 100M / 50M 20M 100M / 50M 10M / 20M 5000
VL – Memory Option 32M N/A 32M N/A N/A 10,000
XL – Memory Option 50M N/A 50M N/A 25M / 50M 20,000
10 GS/s on 4 Ch 10 GS/s on 4 Ch 10 GS/s on 4 Ch
Acquisition Processing
Averaging Summed averaging to 1 million sweeps; continuous averaging to 1 million sweeps
Enhanced Resolution (ERES) From 8.5 to 11 bits vertical resolution
Envelope (Extrema) Envelope, floor, or roof for up to 1 million sweeps
Interpolation Linear or Sin x/x
Triggering System
Modes Normal, Auto, Single, and Stop
Sources* Any input channel, External, Ext X 10, Ext ÷10, or line; slope and level unique to each source (except line trigger)
Coupling Mode DC
Pre-trigger Delay 0–100% of memory size (adjustable in 1% increments)
Post-trigger Delay The smaller of 0–10,000 divisions or 86,400 seconds
Hold-off by Time or Events From 2 ns up to 20 s or from 1 to 99,999,999 events
Internal Trigger Range ±5 div from center
*External trigger not available on the SDA 6000A XXL or SDA 4000A XXL.
0 Ω: 5 V
5
(peak AC: ≤ 5 kHz + DC)
MΩ: 2 mV–2 V/div (fully variable)
1
MΩ: ±700 mV @ 2–4.95 mV/div
1
Roll mode: up to 1000 s/div
or 100 ms, whichever is larger
1 MΩ: 100 V max.
,
rms
40:1 at 3 GHz
±10 V @ 0.102-1 V/div
±1.5 V @ 5–100 mV/div
±20 V @ 0.102–2 V/div
offset value + 2 mV)
Max. Segments
11
Specifications
Triggering System SDA 6020 SDA 6000A XXL SDA 4020 SDA 4000A XXL SDA 3010
rigger Sensitivity with Edge Trigger (Ch 1-4) 3 div @ ≤ 5 GHz 2 div @ ≤ 4 GHz
T
xternal Trigger Sensitivity (Edge Trigger) 1.2 V @ ≤ 5 GHz 800 mV @ ≤ 4 GHz,
E
ax. Trigger Frequency, SMART Trigger
M
External Trigger Input Range Aux (±0.4 V); Aux (±0.4 V); Aux (±0.4 V);
™
50 MHz @ ≤ 10 mV
7
Aux X10 (±0.04 V); N/A Aux X10 (±0.04 V); N/A Aux X10 (±0.04 V);
ux/10 (±4 V) Aux/10 (±4 V) Aux/10 (±4 V)
A
2 div @ < 4 GHz 1.2 div @ < 3 GHz (typical)
.2 div @ < 3 GHz (typical)
1
800 mV @ < 4 GHz 480 mV < 3 GHz (typical)
80 mV < 3 GHz (typical)
4
Basic Triggers
Edge/Slope/Line Triggers when signal meets slope (positive or negative) and level condition.
SMART Triggers
tate or Edge Qualified Triggers on any input source only if a defined state or edge occurred on another
S
ropout Triggers if signal drops out for longer than selected time between 2 ns and 20 s.
D
Pattern* Logic combination (AND, NAND, OR, NOR) of 5 inputs – 4 channels and external trigger input.
Serial Trigger
Data Rates N/A 50 Mb/s to 2.7 Gb/s N/A 50 Mb/s to 2.7 Gb/s N/A
Pattern Length N/A Up to 32 bits N/A Up to 32 bits N/A
Clock and Data Outputs 1/2 amplitude AC 1/2 amplitude AC
†
input source. Delay between sources is selectable by time or events.
Each source can be high, low, or don’t care. The High and Low level can be selected independently.
riggers at start or end of the pattern.
T
N/A coupled LVPCL, N/A coupled LVPCL, N/A
400 mV
into 50 Ω 400 mV
p-p
into 50 Ω
p-p
SMART Triggers with
Exclusion Technology
Glitch and Pulse Width Triggers on positive or negative glitches with widths selectable from 600 ps to 20 s, or on intermittent faults
Signal or Pattern Width Triggers on positive or negative pulse widths selectable from 600 ps to 20 s,
Signal or Pattern Interval Triggers on intervals selectable between 2 ns and 20 s.
or on intermittent faults
div < 3 GHz
2
1 div < 2 GHz
div < 3 GHz
2
1 div < 2 GHz
Setup Storage
Front Panel and Instrument Status Store to the internal hard drive or to a USB-connected peripheral device.
Power Requirements
Voltage 100–240 VAC ±10% at 50/60/400 Hz; 200–240 VAC ±10% at 50/60 Hz; Automatic AC Voltage Selection
Max. Power Consumption 800 VA (800 W) 650 W/650 VA 800 VA (800 W) 650 W/650 VA 650 W/650 VA
Environmental
Temperature (Operating) +5 °C to +40 °C including CD-ROM drives
Temperature (Non-Operating) -20 °C to +60 °C
Humidity (Operating) 5% to 80% relative humidity (non-condensing) up to +30 °C.
Humidity (Non-Operating) 5% to 95% relative humidity (non-condensing) as tested per MIL-PRF-28800F
Altitude (Operating) Up to 10,000 ft. (3048 m) at or below +25 °C
Altitude (Non-Operating) Up to 40,000 ft. (12,192 m)
Upper limit derates to 25% relative humidity (non-condensing) at +40 °C.
Physical Dimensions
Dimensions (HWD) 264 mm x 397 mm x 491 mm; 10.4" x 15.6" x 19.3" (height excludes feet)
Weight 23 kg; 50 lbs. 18 kg; 39 lbs. 23 kg; 50 lbs. 18 kg; 39 lbs. 18 kg; 39 lbs.
Shipping Weight 29 kg; 63 lbs. 24 kg; 53 lbs. 29 kg; 63 lbs. 24 kg; 53 lbs. 24 kg; 53 lbs.
Certifications
CE Compliant, UL and cUL listed; conforms to EN 61326-1, EN 61010-1, UL 3111-1,
and CSA C22.2 No. 1010.1
Warranty and Service
3-year warranty; calibration recommended annually.
Optional service programs include extended warranty, upgrades, and calibration services.
*Maximum of 4 channels (no External) on the SDA 6000A XXL and SDA 4000A XXL.
†
Serial Trigger is available in SDA 6000A XXL and SDA 4000A XXL.
12
Specifications
Standard Fixtures Measurements Software Options Web Site
InfiniBand Rj, Dj, Tj, Eye pattern www.infinibandta.org
PCI Express CLB, CBB (available through jitter, eye patterns SDA-PCIE-G2 www.pci-sig.org
Fibre Channel OE525 jitter, Rj, Dj, Tj, eye pattern www.fibrechannel.org
(133 to 4.25 Gb/s) (optical standards)
USB 2.0 TF-USB HS signal quality USB2 www.usb.org
(HS signal quality) (eye pattern)
IEEE 1394b QP-SIB, QP-SIG eye pattern, Rj, Tj, Dj www.1394TA.com
(jitter and eye pattern) (available from
ONET/SDH OE555 eye pattern, filtered jitter telecom-info.telcordia.com
S
(optical, up to
OC48/STM16)
Ethernet 10/100 TF-ET eye pattern, Rj, Tj, Dj ENET www.IEEE.org
1000Base-ST, TF-ENET
1000Base-LX TF-10BT
apidIO (Parallel/Serial) eye pattern, Tj, Rj, Dj www.rapidio.org
R
Serial Attached SCSI eye pattern, jitter: Tj, Dj SDA-SAS www.T10.org
00Base-LX4 (XAUI) eye pattern, jitter: Tj, Dj www.10gea.org
1
DVI TPA-R, TPA-P (available eye pattern with software www.DDWG.org
DMI TPA-R, TPA-P (available eye pattern with software SDA-HDMI www.HDMI.org
H
FB-DIMM contact LeCroy all PHY compliance SDA-FB-DIMM www.jedec.org
Serial ATA TF-SATA eye pattern, jitter Gen1 SDA-SATA www.sata-io.org
WiMedia UWB PSD, EVM, Magnitude, Phase SDA-UWB* www.wimedia.org
Standard
Advanced Serial Data Analysis Tools
Eye Diagram
bit rate eye timing
pattern detect eye crossing
Tx density extinction ratio
mask test with violation locator average power
eye amplitude
Clock Recovery
standard PLL settings number of poles
(FC GOLDEN, PCI Express, natural frequency
DVI, Custom) damping factor
custom filter settings
Jitter Analysis
jitter wizard synchronous N-cycle with bit
edge to reference (data to clock) pattern display
edge to edge (data to data) bathtub curve
conventional jitter histogram
effective filtered jitter
MJSQ periodic jitter (Pj) with
basic (Tj, Rj, Dj) peak frequency listing
Dj breakdown (DDj, Pj, DCD) TIE clock jitter
advanced (peak-peak and rms) period jitter
TIE jitter half-period jitter
ISI plot with bit sequence tracking cycle-cycle jitter
Pass/Fail Testing
Simultaneously test multiple parameters against selectable parameter limits or
pre-defined masks. Pass or fail conditions can initiate actions, including document
to local or networked files, e-mail the image of the failure, save waveforms, send a
pulse out at the front panel auxiliary BNC output, or (with the GPIB option) send
a GPIB SRQ.
8B/10B Protocol Decoding
Simultaneously translates up to 4 lanes of 8B/10B encoded Serial Data waveforms
into symbol views to allow easier troubleshooting. This allows the user to quickly
correlate protocol events with the physical serial data waveform. The decoder
operates with 8B/10B encoded data at rates up to 6.25 Gb/s.
PCI-SIG)
Quantum Parametrics)
through DDWG) clock recovery PLL, rise/fall
through DDWG) clock recovery PLL, rise/fall
easurements
m
(edge to edge), Gen2
(2nd order PLL)
PSK, DCM, Constellation
Q
*Compatible with SDA 6000A XXL and SDA 6020 only
Math Tools
Display up to four math function traces (F1 – F4). The easy-to-use graphical interface
simplifies setup of up to two operations on each function trace, and function traces can
be chained together to perform math-on-math.
absolute value
Auto-correlation function
average (summed)
average (continuous)
cubic interpolation
function
derivative
deskew (resample)
difference (–)
enhanced resolution
(to 11 bits vertical)
envelope
exp (base e)
exp (base 10)
fft (power spectrum,
magnitude, phase,
up to 25 Mpts)
floor
histogram of
2 billion events
integral
invert (negate)
log (base e)
log (base 10)
parameter math
(+,-,*,/ of two
different parameters)
product (x)
ratio (/)
reciprocal
rescale (with units)
roof
(sinx)/x
sparse function
square
square root
sum (+)
track graphs
trend (datalog) of
zoom (identity)
Measure Tools
Displays any 8 parameters together with statistics, including their average, high, low,
and standard deviations. Histicons provide a fast, dynamic view of parameters and
wave shape characteristics.
amplitude
area
base
cycles
delay
∅delay
duty cycle
duration
falltime (90–10%,
80–20% @level)
frequency
first
histogram
parameters
last
level@ x
maximum
mean
median
minimum
narrowband power
measurements
number of points
+overshoot
–overshoot
peak-to-peak
period
phase
risetime (10–90%,
20–80% @level)
rms
std. deviation
top
1 million events
width
time@minimum
(min.)
time@maximum
(max.)
∅time@level
∅time@level from
trigger
x@max
x@min
13
Optional
Advanced Customization Package (XDEV)
This package provides a set of tools to modify the oscilloscope and customize it
to meet your unique needs. Additional capability provided by XDEV includes:
• Creation of your own measurement parameter or math function, using third
party software packages, and display of the result in the oscilloscope.
Supported third party software packages include:
– VBScript
– MATLAB
– Excel
– Mathcad
• CustomDSO – create your own user interface in a oscilloscope dialog box.
• Adding macro of keys to run VBScript files
• Support of plug-ins
Compliance Packages
• ENET – Ethernet Test Software Package
• SDA-FBDIMM – FB-DIMM Solution Analysis Software Package
• SDA-HDMI – HDMI Compliance Test Software Package
• SDA-PCIE-G2 – PCI Express Development and Compliance Software for
Gen1 and Gen2
• SDA-SAS – SAS I/II Solution Analysis Compliance Software Package
• SDA-UWB – UWB Test Solution Software Package
• SATA – SATA Gen1/Gen2 Solution Analysis Software Package
• USB – USB 2.0 Compliance Test Software Package
LeCroy M1 Timing Tools
The SDA acquires data, calculates, displays, and analyzes jitter in clock and serial
data. A wide variety of measurement tools is available including differential crossing point measurements. Jitter viewing tools include line graph, histogram, jitter
spectrum, text, and eye diagram. Available in an advanced or basic version.
LeCroy M1 Timing Tool (Advanced, 1 oscilloscope) LeCROY M1/ADV-1
LeCroy M1 Timing Tool (Advanced, 4 oscilloscopes) LeCROY M1/ADV-4
LeCroy M1 Timing Tool (Basic) LeCROY M1/BASIC
14
Ordering Information
Description Product Code
4 Ch; 6 GHz Serial Data Analyzer; 20 GS/s; 20 Mpts/Ch SDA 6020
4 Ch; 6 GHz Serial Data Analyzer; 10 GS/s; 50 Mpts/Ch; SDA 6000A XXL
20 GS/s, 100 Mpts in 2 or 1 Ch
4 Ch; 4 GHz Serial Data Analyzer; 20 GS/s; 20 Mpts/Ch SDA 4020
4 Ch; 4 GHz Serial Data Analyzer; 10 GS/s; 50 Mpts/Ch; SDA 4000A XXL
20 GS/s, 100 Mpts in 2 or 1 Ch
4 Ch; 3 GHz Serial Data Analyzer; 10 GS/s, 10 Mpts/Ch; SDA 3010
20 GS/s, 20 Mpts/Ch in 2 or 1 Ch
Memory Options SDA 6020/SDA 4020/SDA 3010
16 Mpts/Ch (32 Mpts/Ch interleaved) SDA-VL*
25 Mpts/Ch (50 Mpts/Ch interleaved) SDA-XL
*SDA-VL memory option is not available for the SDA 3010.
Included with Standard Configurations
ProLink Adapter SMA; 4 each (not included with SDA 3010) LPA-SMA
ProLink Adapter BNC; 2 each (not included with SDA 3010) LPA-BNC
Getting Started Manual
CD-ROM containing Operator’s Manual,
Remote Control Manual, and Automation Manual
CD-ROMs containing Utility Software, and
Norton Antivirus Software (1 year subscription)
CD-ROM Drive
Optical 3-button Wheel Mouse-USB
Standard Ports; 10/100Base-T Ethernet, Parallel,
SVGA Video Output, USB 2.0
Protective Front Cover
Standard Commercial Calibration and Performance Certificate
3-Year Warranty
Software Options
Application Specific Test and Analysis Software Options
Advanced Optical Recording Measurement AORM
Disk Drive Measurement Software Package DDM2
Advanced Math and WaveShape Analysis Software Options
Digital Filter Software Package DFP2
Advanced M1 Software Package for LECROYM1/ADV-1
Jitter and Timing Measurements (1 seat)
Advanced M1 Software Package for LECROYM1/ADV-4
Jitter and Timing Measurements (4 seats)
Basic M1 Software Package for LECROYM1/BASIC
Jitter and Timing Measurements
Advanced Customization Software Package XDEV
Processing Web Editor Software Package XWEB
for Functions and Parameters
Standards Compliance Software Options
Ethernet Test Software Package ENET
HDMI Compliance Test Software Package SDA-HDMI
PCI Express Development and Compliance Software SDA-PCIE-G2
for Gen1 and Gen2
SAS I/II Solution Analysis Compliance Software Package SDA-SAS
SATA Gen1/Gen2 Solution Analysis Software Package SDA-SATA
UWB Test Solution Software Package SDA-UWB*
USB 2.0 Compliance Test Software Package USB2
*Compatible with SDA 6000A XXL and SDA 6020 only.
1-800-5-LeCroy www.lecroy.com
Local sales offices are located throughout the world.
To find the most convenient one visit www.lecroy.com
© 2006 by LeCroy Corporation. All rights reserved. Specifications, prices, availability,
and delivery subject to change without notice. Product or brand names are trademarks
or requested trademarks of their respective holders.
Description Product Code
Hardware and Software Option
32 Digital Oscilloscope Mixed Signal Option MS-32-DSA
Hardware Options and Accessories
1 MΩ Adapter includes PP005A Passive Probe AP-1M
Dual Monitor Display DMD-1
IEEE-488 GPIB Control Interface GPIB-1
Keyboard, USB KYBD-1
ProLink-to-BNC Adapter; 1 each LPA-BNC*
Kit of 4 ProLink BNC Adapters with Case LPA-BNC-KIT*
ProLink-to-SMA Adapter LPA-SMA*
Kit of 4 SMA ProLink Adapters with Case LPA-SMA-KIT*
Oscilloscope Cart with Additional Shelf and Drawer OC1024
Oscilloscope Cart OC1021
Rackmount Adapter with 25" (64 cm) Slides RMA-25
Rackmount Adapter with 30" (76 cm) Slides RMA-30
Internal Graphics Printer WM-GP02
Removable Hard Drive Package (includes USB, CD-ROM, WM-RHD
removable hard drive, and spare hard drive)
Additional Removable Hard Drive WM-RHD-02
Soft Carrying Case WM-SCC
Hard Transit Case WM-TC1
*Not available with the SDA 3010.
Compliance Test Fixtures
Ethernet Compliance Test Fixture for 10Base-T TF-10BT
Ethernet Compliance Test Fixture for 100Base-T/1000Base-T TF-ENET
[Includes a Set of 2 Test Fixtures Signals on
Twisted Pair Cables (UTP)]
Telecom Adapter Kit 100 Ω Bal., 120 Ω Bal., 75 Ω Unbal. TF-ET
HDMI Test Fixture Set (TPA-P-SE, TPA-P-DI) TF-HDMI
Serial ATA Test Fixture (includes pair of SMA cables) TF-SATA
USB 2.0 Testing Compliance Test Fixture TF-USB
Probes Options and Probe Accessories
1 GHz, Active Differential Probe (÷1, ÷10, ÷20) AP034
WaveLink 7.5 GHz, Differential Probe Adjustable Tip Module D600A-AT*
WaveLink 7 GHz, Differential Probe Small Tip Module D600ST*
WaveLink 4 GHz, 5 V Differential Probe Small Tip Module D350ST*
WaveLink 6 GHz, Differential Positioner Mounted D500PT*
Tip Probe Module
WaveLink ProLink Probe Body WL600
2.5 GHz, 0.7 pF Active Probe (÷10), Small Form Factor HFP2500
(Qty. 4) 1.5 GHz, 0.9 pF, 1 MΩ ZS1500-QUADPAK
High Impedance Active Probe
(Qty. 4) 1 GHz, 0.9 pF, 1 MΩ ZS1000-QUADPAK
High Impedance Active Probe
Optical-to-Electrical Converter, 500–870 nm OE525
ProLink BMA Connector
Optical-to-Electrical Converter, 950–1630 nm OE555
ProLink BMA Connector
7.5 GHz, Low Capacitance Passive Probe 500/1000 Ω PP066
Probe Deskew and Calibration Test Fixture TF-DSQ
*For a complete probe, order a WL600 Probe Body with the Probe Tip Module.
Customer Service
LeCroy oscilloscopes and probes are designed, built, and tested to
ensure high reliability. In the unlikely event you experience difficulties,
our digital oscilloscopes are fully warranted for three years and our
probes are warranted for one year.
This warranty includes:
• No charge for return shipping • Long-term 7-year support
• Upgrade to latest software at no charge
SDAJDSrev4_revA_W1_29Nov06
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