Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part,
without the prior written approval of Keithley Instruments is strictly prohibited.
All Keithley Instruments product names are trademarks or registered trademarks of Keithley
Instruments. Other brand names are trademarks or registered trademarks of their respective
Document number: 4200A-SCS-900-01 Rev. A / September 2016
Safety precaut ions
The following safety precautions should be observed before using this product and any associat ed inst rum enta t ion . Although
some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous
conditions may be present.
This product is intended for use by qualified personnel who recognize shock hazards and are familiar with the safety precautions
required to avoid possible injury. Read and follow all installation, operation, and maintenance information carefully before using
the product. Refer to the user documentation for complete product specifications.
If the product is used in a manner not specified, the protection provided by the product warranty may be impaired.
The types of product users are:
Responsible body is the individual or group responsible for the use and maintenance of equipment, for ensuring that the
equipment is operated within its specifications and operating limits, and for ensuring that operators are adequately trained.
Operators use the product for its intended function. They must be trained in electrical safety procedures and proper use of the
instrument. They must be protected from electric shock and contact with hazardous live circuits.
Maintenance personnel perform routine procedures on the product to keep it operating properly, for example, setting the line
voltage or replacing consumable materials. Maintenance procedures are described in the user documentation. The procedures
explicitly state if the operator may perform them. Otherwise, they should be performed only by service personnel.
Service personnel are trained to work on live circuits, perform safe installations, and repair products. Only properly trained
service personnel may perform installation and service procedures.
Keithley Instruments products are designed for use with electrical signals that are measurement, control, and data I/O
connections, with low transient overvoltages, and must not be directly connected to mains voltage or to voltage sources with high
transient overvoltages. Measurement Category II (as referenced in IEC 60664) connections require protection for high transient
overvoltages often associated with local AC mains connections. Certain Keithley measuring instruments may be connected to
mains. These instruments will be marked as category II or higher.
Unless explicitly allowed in the specification s, opera ting man ual, and inst rum ent labe ls, do not connect any instrument to mains.
Exercise extreme caution when a shock hazard is present. Lethal voltage may be present on cable connector jacks or test
fixtures. The American National Standards Institute (ANSI) states that a shock hazard exists when voltage levels greater than
30 V RMS, 42.4 V peak, or 60 VDC are present. A good safety practice is to expect that hazardous voltage is present in any
unknown circuit before measuring.
Operators of this product must be protected from electric shock at all times. The responsible body must ensure that operators
are prevented access and/or insulated from every connection point. In some cases, connections must be exposed to potential
human contact. Product operators in these circumstances must be trained to protect themselves from the risk of electric shock. If
the circuit is capable of operating at or above 1000 V, no conductive part of the circuit may be exposed.
Do not connect switching cards directly to unlimited power circuits. They are intended to be used with impedance-limited
sources. NEVER connect switching cards directly to AC mains. When connecting sources to switching cards, install protective
devices to limit fault current and voltage to the card.
Before operating an instrument, ensure that the line cord is connected to a properly-grounded power receptacle. Inspect the
connecting cables, test leads, and jumpers for possible wear, cracks, or breaks before each use.
When installing equipment where access to the main power cord is restricted, such as rack mounting, a separate main input
power disconnect device must be provided in close proximity to the equipment and within easy reach of the operator.
For maximum safety, do not touch the product, test cables, or any other instruments while power is applied to the circuit under
test. ALWAYS remove power from the entire test system and discharge any capacitors before: connecting or disconnecting
cables or jumpers, installing or removing switching cards, or making internal changes, such as installing or removing jumpers.
Do not touch any object that could provide a current path to the common side of the circuit under test or power line (earth)
ground. Always make measurements with dry hands while standing on a dry, ins ulated surface capable of withstanding the
voltage being measured.
For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or
accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be
impaired.
Do not exceed the maximum signal levels of the instruments and accessories. Maximum signal levels are defined in the
specifications and operating information and shown on the instrument panels, test fixture panels, and switching cards.
When fuses are used in a product, replace with the same type and rating for continued protection against fire hazard.
Chassis connections must only be used as shield connections for measuring circuits, NOT as protective earth (safety ground)
connections.
If you are using a test fixture, keep the lid closed while power is applied to the device under test. Safe operation requires the use
of a lid interlock.
If a screw is present, connect it to protective earth (safety ground) using the wire recommended in the user documentation.
The
symbol on an instrument means caution, risk of danger. The user must refer to the operating instructions located in the
user documentation in all cases where the symbol is mark ed on the instr u ment .
The
symbol on an instrument means caution, risk of electric shock. Use standard safety precautions to avoid personal
contact with these voltages.
The symbol on an instrument shows that the surface may be hot. Avoid personal contact to prevent burns.
The symbol indicates a connection terminal to the equipment frame.
If this symbol is on a product, it indicates that mercury is present in the display lamp. Please note that the lamp must be
properly disposed of according to federal, state, and local law s.
The WARNING heading in the user documentation explains dangers that might result in personal injury or death. Always read
the associated information very carefully before performing the indicated procedure.
The CAUTION heading in the user documentation explains h az ards that coul d dama ge the instrument. Such damage may
invalidate the warranty.
Instrumentation and accessories shall not be connected to humans.
Before performing any maintenance, disconnect the line cord and all test cables.
To maintain protection from electric shock and fire, replacement components in mains circuits — including the power
transformer, test leads, and input jacks — must be purchased from Keithley Instruments. Standard fuses with applicable national
safety approvals may be used if the rating and type are the same. The detachable mains power cord provided with the
instrument may only be replaced with a similarly rated power cord. Other components that are not safety-related may be
purchased from other suppliers as long as they are equivalent to the original component (note that selected parts should be
purchased only through Keithley Instruments to maintain accuracy and functionality of the product). If you are unsure about the
applicability of a replacement component, call a Keithley Instruments office for information.
Unless otherwise noted in product-specific literature, Keithley instruments are designed to operate indoors only, in the following
environment: Altitude at or below 2,000 m (6,562 ft); temperature 0 °C to 50 °C (32 °F to 122 °F) ; and pollution degree 1 or 2.
To clean an instrument, use a damp cloth or mild, water-based cleaner. Clean the exterior of the instrument only. Do not apply
cleaner directly to the instrument or allow liquids to enter or spill on the instrument. Products that consist of a circuit board with
no case or chassis (e.g., a data acquisition board for installation into a computer) should never require cleaning if handled
according to instructions. If the board becomes contaminated and operation is affected, the board should be returned to the
factory for proper cleaning/servicing.
Thank you for choosing a Keithley Instruments product. The Model 4200A-SCS Parameter Analyzer
performs laboratory-grade DC, I-V, C-V, and pulse device characterization, real-time plotting, and
analysis with high precision and subfemtoamp resolution. The 4200A-SCS offers the most advanced
capabilities available in a fully-integrated characterization system, including a complete, embedded
computer with Microsoft Windows
accelerates and simplifies the process of taking data, so users can begin analyzing their results
sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
Introduction to this manual
This manual provides detailed applications to help you achieve success with your Keithley
Instruments 4200A-SCS. In addition, information is provided about the basics of the front panel to
familiarize you with the instrument. Finally, included is an overview of each application, followed by
instructions to complete the application.
More information about the commands that are used in these applications is available. Refer to the
Model 4200A-SCS Refer en ce Man ua l, available from the Learning Center on your 4200A-SCS
desktop.
Extended warranty
Additional years of warranty coverage are available on many products. These valuable contracts
protect you from unbudgeted service expenses and provide additional years of protection at a fraction
of the price of a repair. Extended warranties are available on new and existing products. Contact your
local Keithley Instruments office, sales partner, or distributor for details.
®
operating system and mass storage. Its touchscreen interface
Section
User's Manual
1: Introduction Model 4200A-SCS Parameter Analyz er
Contact information
If you have any questions after you revie w the information in this documentation, please co ntac t your
local Keithley Instruments office, sales partner, or distributor. You can also call the corporate
headquarters of Keithley Instruments (toll-free inside the U.S. and Canada only) at 1-800-935-5595,
or from outside the U.S. at +1-440-248-0400. For worldwide contact numbers, visit the
operation information, and provides a quick test procedure to ensure the instrument is
operational.
•User's Manual: Provides application examples that you can use as a starting point to create your
own applications.
•Reference Manual: Includes advanced operation topics, maintenance information,
troubleshooting procedures, and in-depth descriptions of programming commands.
•Accessories information: Documentation for accessories that are available for the 4200A-SCS.
Keithley
For the latest drivers and additional support information, see the Keithley Instruments website
(http://www.tek.com/keithley).
Organization of manual sections
This manual is organized into the following sections:
• Introduction (on page 1-1): Provides an overview of the 4200A-SCS and this manual.
• Getting started (on page 2-3): Provides high-level guidance on how to install, connect, and power
up the 4200A-SCS.
•Application examples (on page 3-1): Provides detailed examples of how to use the 4200A-S CS in
some typical situations.
•Next steps (on page 10-1): Provides information about additional resources that can help you use
the 4200A-SCS.
This manual is also available from the Learning Center, which you can access from your 4200A-SCS
desktop.
The PDF version of this manual contains bookmarks for each section. The manual sections are also
listed in the Table of Contents at the beginning of this manual.
For more information about bookmarks, see Adobe
®
Acrobat® or Reader® help.
1-2 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Introduction
Supply voltage range
100 V
RMS
to 240 V
RMS
, 50 Hz or 60 Hz
Current rating
1000 VA
Input and output connections
See Front panel overview (on page 2-1) and Rear panel overview (on
page 2-4).
Pollution degree: 1 or 2
-SCS Parameter Analyzer User's Manual Section 1:
Application examples
This manual provides application examples that show you how to perform tests from the front panel
and over a remote interface. The applications include:
• Create a new project and test (on page 3-1)
• Use the RPM to switch the SMU, CVU, and PMU (on page 4-1)
• Configure and use a Series 700 Switching System (on page 5-1)
• Make I-V measurements on a solar cell (on page 6-1)
• Make C-V measurements on a MOSCAP (on page 7-1)
• Use the 4200A-CVIV Multi-Switch (on page 8-1)
• PMU for pulsed I-V measurements on a MOSFET (on page 9-1)
The default settings used for the devices, tests, and projects in Clarius are generally sufficient to
produce usable data when executin g a test. However, you may have additional settings you want to
apply when you configure your measurements.
General ratings
The 4200A-SCS instrument's general ratings and connections are listed in the following table.
Category Specification
Environmental conditions For indoor use only
Temperature range:
Operating: 10 °C to 40 °C (50 °F to 104 °F)
Storage: − 15 °C to 60 °C (5 °F to 140 °F)
Humidity range:
Operating: 5 % to 80 % RH, non-condensing
Storage: 5 % to 90 % RH, non-condensing
Altitude
Operating: 0 to 2000 m (0 to 6252 ft)
Storage: 0 to 4600 m (0 to 150925 ft)
Most of your controls and interfaces are on the front panel of the 4200A-SCS Parameter Analyzer.
The next figure shows the front panel of the 4200A-SCS. The components are summarized following
the figure.
Section 2
Getting started
Section
User's Manual
standard.
Hard drive indicator
Illuminates when the hard drive is being accessed.
Power switch
Turns the main system power on or off.
Headphone connector
Provides a 1/8" stereo output connection.
Interlock indicator
Illuminates when the 12 VDC interlock circuit is closed.
Operate indicator
Illuminates when any internal cards are energized.
2: Getting started Model 4200A-SCS Parameter Analyz er
Figure 1: 4200A-SCS front panel
Display A 1920 p x 1080 p resolution, touch-screen display.
1
Two v3.0 USB ports Allows you to connect to peripherals such as flash drives, pointing devices,
2
Two v2.0 USB ports Allows you to connect to peripherals such as flash drives, pointing devices,
3
scanners, and external hard drives that are compatible with the USB v3.0
standard.
scanners, and external hard drives that are compatible with the USB v2.0
4
5
6
7
8
4200A-SCS-ND has no display and requires an external monitor.
2-2 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Touch screen basics
You can operate the 4200A-SCS using the touch screen. You can use your fingers, clean room
gloves, or a stylus.
To select and move on the screen:
• To scroll, swipe up or down on the screen.
• To select an item, touch it on the screen.
• To double-click an item, touch it twice.
• To right-click an item, touch and hold, then release to see the options.
To enter information, you can use the on-screen keyboard. Swipe from the left side of the display to
open the keyboard.
®
The touch screen uses standard Microsoft
actions, refer to the Microsoft help information, available from the on-screen keyboard window menu
option Tool > Help Topics.
You can also adjust the touch settings using the Pen and Touch options in the Windows Control
Panel.
Windows® touch actions. For additional information on the
Connect a keyboard and mous e
Connect the keyboard to the 4200A-SC S with a USB cable. You can plug it into any of the eight USB
ports. The keyboard is shown in the next figure. To ensure proper operation, be sure that the
keyboard is connected before power-up.
Figure 2: 4200A-SCS keyboard
If you want to use an optional mouse, connect a USB mouse to any of the 4200A-SCS USB ports.
4200A-SCS-900-01 Rev A. / September 2016 2-3
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyz er
Figure 3: Keyboard connections
2-4 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
HDMI port
connection.
Serial port
Connects to an RS-232 periph er al.
External monitor port
15-pin video connector.
IEEE-488 connector
Connects to peripherals with a GPIB interface.
Grounding screw
Connects to protective earth (safety ground)
Power receptacle and
line fuses
Connects to line power through supplied line cord. Two line fuses protect
the instrument.
with the USB v3.0 standard.
Microphone and speaker
connectors
Provides microphone, left speaker, and right speaker connections.
Two LAN connectors
Two gigabit LAN connectors interface the unit to ethernet local networks.
-SCS Parameter Analyzer User's Manual Section 2:
Rear panel overview
The following figure shows the rear panel of the 4200A-SCS. The connectors and components are
summarized following the figure.
Figure 4: 4200A-SCS rear panel
Fan Provides system cooling.
1
DP port Provides a standard DisplayPort connection.
2
3
4
5
Ground unit Provides system-level SENSE, FORCE, and COMMON connections.
6
7
8
9
Four v3.0 USB
10
connectors
11
12
Provides a standard High Definition Multimedia Inter f ac e (H DMI®)
Allows you to connect to peripherals such as keyboards, pointing devices,
printers, flash drives, external hard driv es, and pr int ers that are compatible
4200A-SCS-900-01 Rev A. / September 2016 2-5
Section
User's Manual
connector
Nine instrument slots
Support the factory-installed SMU, CVU, and PMU/PGU cards.
2: Getting started Model 4200A-SCS Parameter Analyz er
12 VDC interlock
13
14
Connect an external monitor
You can connect an external monitor to the 4200A-SCS. For best results, use a 1920x1080p HD
monitor to maintain the correct resolution when using the Clarius application.
Installation
This section contains information about handling and installing the 4200A-SCS:
•Locating the system: Describes how to select the best operating environment location for your
4200A-SCS.
•Basic system connections: Explains how to connect the grounding cable, LAN cable, GPIB-
compatible instruments, and the safety interlock to the 4200A-SCS.
•SMU connections: Describes the easiest method to make SMU connections to the device under
test (DUT).
•Powering the 4200A-SCS: Describes line power requirements for the 4200A-SCS, and shows
how to connect the power line cord.
Connects the instrument to a test fixture or prober interlock circuit.
When you start one of the Clarius+ software tools for the first time, you are required to respond
affirmatively to an on-screen license agreement before proceeding further. If you do not respond,
your system will not function until you reinstall the software.
The condensed installation information in this section is intended to get your 4200A-SCS set up and
ready to turn on as quickly as possible. Detailed information on connections is provided in the Model 4200A-SCS Reference Manual.
2-6 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Locating the system
Locate the 4200A-SCS so that it will operate within the following ambient temperature and humidity
limits:
• Temperature: +10 °C to +40 °C
• Relative humidity: 5 % to 80 %, non-condensing
SMU and preamplifier accuracy specifications are based on operation at 23 °C ±5 °C and between
5 % and 60 % relative humidity. See the 4200A-SCS datasheet at the Keithley Instruments website
(http://www.tek.com/keithley) for derating factors outside these ranges.
To avoid overheating, operate the instrument only in an area with proper ventilation.A llo w at least
eight inches of clearance at the back of the mainframe to assure sufficient airflow and comply with
the following guidelines:
Operate the instrument in a clean, dust-free environment.
Keep the fan vents and cooling vents from becoming blocked (sides and rear of the instrument).
Do not position any devices adjacent to the instrument that force air (heated or unheated) into
cooling vents. This additional airflow could compromise accuracy performance.
When rack-mounting the instrument, ensure adequate airflow around the sides, bottom, and back.
Do not rack-mount high power dissipation equipment adjacent to the 4200A-SCS.
To ensure proper cooling in rack environments with only convection cooling, place the hottest
equipment (for example, power supply) at the top of the rack. Place precision equipment, such as the
4200A-SCS, as low as possible in the rack, where temperatures are the coolest. Adding spacer
panels below the instrument helps to ensure adequate airflow.
4200A-SCS-900-01 Rev A. / September 2016 2-7
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyz er
Basic system connections
This section provides basic system connections to get your 4200A-SCS set up and running. More
detailed connection information is in the "Connections and configuration" section of the Model 4200A-SCS Reference Manual.
Connecting to protective earth
The 4200A-SCS must be connected to protective earth (safety ground) using the supplied
green-yellow ground cable.
Connect one lugged end of the supplied grounding cable to the protective earth (safety ground) screw
on the rear of your 4200A-SCS. See the next figure.
Figure 5: Grounding cable connected to the rear of the 4200A-SCS
2-8 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Connecting a LAN cable
The two LAN connectors on the 4200A-SCS are standard RJ-45 connectors intended for use with
unshielded twisted pair (UTP) cable. For best results, use only CAT 5 UTP cables equipped with
RJ-45 connectors to connect your LANs, as shown in the following figure.
If IP addresses are statically assigned, you need to assign a different IP address to each LAN port.
Figure 6: LAN connections
4200A-SCS-900-01 Rev A. / September 2016 2-9
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyz er
Connecting GPIB instruments
You can use the 4200A-SCS to control one or more external instruments using the IEEE-488 general
purpose instrument bus (GPIB). An example of typical instruments used in a test system with the
4200A-SCS are a switching system and an external C-V meter.
The following figure shows how to connect GPIB instruments to the 4200A-SCS.
Figure 7: 4200A-SCS GPIB instrument connections
Connecting the interlock
The next graphic shows the location of the interlock connector on the rear panel of the 4200A-SCS.
To connect the interlock:
1. Connect one end of the supplied 236-ILC-3 interlock cable to the interlock connector on the rear
2-10 4200A-SCS-900-01 Rev A. / September 2016
panel of the 4200A-SCS rear panel (see the next figure).
Model 4200A
Getting started
2-16
-SCS Parameter Analyzer User's Manual Section 2:
Figure 8: Interlock connector on the rear panel of the 4200A-SCS
2. Connect the other end of the interlock cable to a compatible test fixture, such as the Keithley
Instruments LR:8028.
For more information, see the "Configuring the safety interlock" topic in the 4200A-SCS Reference Manual.
SMU connections
The following topics explain how to connect the source-measure units (SMUs) to the device under
test (DUT).
Do not touch test cables or connectors when powering up the 4200A-SCS. Hazardous
voltage may be output momentarily, posing a safety hazard that could result in personal
injury or death.
Do not turn on the 4200A-SCS until you have reviewed the safe power-up procedure in
Powering the 4200A-SCS (on page
Do not connect the DUT to the 4200A-SCS before powering it up, because the hazardous voltage
that may be output momentarily at power-up could damage the DUT.
If your 4200A-SCS includes preamplifiers, all tests should be performed using the preamplifiers, as
the installed SMUs were optimized at the factory to use them.
).
4200A-SCS-900-01 Rev A. / September 2016 2-11
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyz er
Triaxial cables
Triaxial cables are supplied to make connections to the DUT (device under test). With preamplifiers
installed, use the l ow-noise triaxial cables, which are terminated with 3-slot triaxial connectors on both
ends. One end of the cable connects to the preamplifier and the other end connects to the DUT test
fixture or probe station.
Figure 9: Triaxial cable 4200-TRX-X
If your system does not have preamplifiers installed, use the cables that have a miniature triaxial
connector on one end and a standard 3-slot triaxial connector on the other end. The cable end that is
terminated with the miniature connector connects directly to the SMU, and the other end connects to
the test fixture or probe station.
Figure 10: Triaxial cable 4200-MTRX-X
With preamplifiers installed, NEVER make connections directly to any of the miniature triaxial
connectors on the SMU modules. This may result in damage to the SMU or DUT or may produce
corrupt data.
2-12 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Basic connections
The simplest method to connect SMUs to the device under test (DUT) is to use one SMU for each
terminal of the device. When setting up a test, the FORCE terminal (center conductor) of the SMU is
used to apply voltage or current to the device. The FORCE terminal or ground unit can also be used
to connect the device terminal to the COMMON circuit.
Complete details on connections (including SENSE terminal connections) are provided in the
"Connections and configuration" section of the Model 4200A-SCS Reference Manual.
The next figure shows SMU connections to 2-terminal, 3-terminal, and 4-terminal devices. Notice that
only the FORCE HI terminal of the SMUs is connected to the device terminals. FORCE HI is the
center conductor of the triaxial cable.
Connecting the SMU or ground unit SENSE terminal without the FORCE terminal may damage the
instrument and give erroneous results.
4200A-SCS-900-01 Rev A. / September 2016 2-13
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyz er
Figure 11: SMU (with preamplifiers) connections to DUT
2-14 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Mounting preamplifiers in a probe station
You can mount the preamplifiers remotely on a probe station using an optional mounting kit. Follow
the steps below to mount and connect a remote preamplifier on a probe station. Details are provided
in the documentation provided with the mounting kit.
Three remote preamplifier mounting options are available:
• 4200-MAG-BASE: A magnetic base for mounting a preamplifier onto a probe station platen.
• 4200-VAC-BASE: A vacuum base for mounting a preamplifier onto a probe station platen.
• 4200-TMB: A triaxial mounting bracket option for mounting a preamplifier onto a probe station or
onto the triaxial mounting panel of a test fixture.
Each preamplifier is matched to the SMU it is connected to. When you disconnect the preamplifiers
to mount them to a probe station, make sure to reconnect each one to its matching SMU.
To mount a preamplifier onto a probe station:
1. Turn off the system power for the 4200A-SCS from the front panel.
2. Disconnect the preamplifiers from the rear panel of the 4200A-SCS. They are secured to the rear
panel by a mounting bracket.
3. Mount the preamplifier at the remote location using the appropriate mounting kit.
4. Connect the control cable between the preamplifier control connector on the preamplifier and the
PA CNTRL connector on the SMU.
5. Make sure that the connecting cable is secure at both ends.
For additional preamplifier details, see the Model 4200A-SCS Reference Manual.
Figure 12: Installing a preamplifier on the probe station
4200A-SCS-900-01 Rev A. / September 2016 2-15
Section
User's Manual
2: Getting started Model 4200A-SCS Parameter Analyzer
Powering the 4200A-SCS
Operating the instrument on an incorrect line voltage may cause damage, possibly voiding the
warranty.
The power cord supplied with the 4200A-SCS contains a separate protective earth (safety
ground) wire for use with grounded outlets. When proper connections are made, the
instrument chassis is connected to power-line ground through the ground wire in the power
cord. In the event of a failure, not using a properly grounded protective earth and grounded
outlet may result in personal injury or death due to electric shock.
Do not replace detachable mains supply cords with inadequately rated cords. Failure to use
properly rated cords may result in personal injury or death due to electric shock.
The 4200A-SCS operates from a line voltage in the range of 100 VAC to 240 VAC, at a frequency of
50 Hz or 60 Hz. Line voltage is automatically sensed, but line frequency is not.
To connect and power the unit:
1. Check to be sure that the operating voltage in your area is compatible.
2. Connect the female end of the supplied power cord to the AC receptacle on the rear panel. See
the Rear panel overview (on page 2-4
) for details.
Figure 13: Line power receptacle
3. Connect the other end of the supplied line cord to a grounded AC line power receptacle.
4. Turn the power ON using the front-panel power switch.
Although the instrument does not sense power line frequency at power-up, Keithley ships your
4200A-SCS with line frequency settings that match the line frequency that was specified on the order
— either for 50 Hz or 60 Hz. However, if necessary, you can change the line frequency setting using
the KCon utility. Refer to the Keithley Configuration Utility (KCon) section in the Model 4200A-SCS Reference Manual.
2-16 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Getting started
-SCS Parameter Analyzer User's Manual Section 2:
Operating the 4200A-SCS with the wrong line frequency setting may result in noisy readings
because the line frequency setting affects SMU line frequency noise rejection.
5. Allow the instrument to warm up for at least 30 minutes to achieve rated measurement accuracy.
4200A-SCS-900-01 Rev A. / September 2016 2-17
Set up the measurements in C lariu s ........................................ 3-3
This section provides an example of how to create a new blank project and configure a new blank
test. You will create a test to be performed on a MOSFET, but the procedure is general and can be
applied to different devices and applications.
Section 3
Create a new project and test
The default settings used for the devices, tests, and projects in Clarius are generally sufficient to
produce usable data when executing a test. However, you may have additional settings you want to
apply when you configure your measurements.
Equipment required
• One 4200A-SCS, with the following instruments:
• Two 4200-SMUs or 4210-SMUs
• Two 4200-PAs
• Three 4200-TRX-2 or 4200-MTRX-2 triaxial cables (supplied with SMU)
• One shielded, three-terminal test fixture with triaxial inputs (such as the 8101-PIV)
Section
User's Manual
3: Create a new project and test Model 4200A-SCS Parameter Analyz er
Device connections
Using the supplied cables, connect the output terminals of the instruments directly to the MOSFET
terminals in the shielded test fixture. The triaxial terminals on the shielded test fixture allow you to
connect to the device and maintain a completely shielded and guarded test setup.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
Connection schemati c
The hardware connections from the output of the instruments in the 4200A-SCS chassis to the test
fixture that contains the MOSFET are shown in the following figure. All of the connections are 2-wire,
and only the Force terminal of each SMU is used. The SMUs and GNDU are each connected to a
different terminal of the 3-terminal MOSFET.
Figure 14: Connections from the 4200A-SCS to a MOSFET
3-2 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Create a new project and test
-SCS Parameter Analyzer User's Manual Section 3:
Connect the 4200A-SCS to the DUT
The hardware connections from the output of the instruments in the 4200A-SCS chassis to the test
fixture that contains the MOSFET are shown in the next figure.
Figure 15: Rear panel connections from the 4200A-SCS to a MOSFET
Set up the measurements in Clarius
This section describes how to set up the 4200A-SCS to generate a Vds-Id family of curves for a 3terminal n-type MOSFET. This general procedure can also be used to create tests for other devices
and other applications.
For this example, you will use the Clarius application to:
• Select and rename new project
• Add a device
• Select a custom test
• Configure the test
• Execute the test
• View and analyze the test results
Select and rename a new project
To select and rename a new project:
1. Choose Select.
Figure 16: Select highli g hted
4200A-SCS-900-01 Rev A. / September 2016 3-3
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3: Create a new project and test Model 4200A-SCS Parameter Analy z er
2. In the Library, select Projects.
3. Select and then Create a New Project.
Figure 17: Select a New Project from the Project Library
4. Select Yes when prompted to replace the existing project.
5. Assign a title to the project by selecting Rename above the project tree.
6. Enter a project name into the text box, then select Enter. MOSFET_TEST has been chosen for this
example.
Figure 18: Toolbar with Rename function
3-4 4200A-SCS-900-01 Rev A. / September 2016
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w project and test
-SCS Parameter Analyzer User's Manual Section 3: Create a ne
Add a device
To add a device:
1. Select Devices.
2. From the Filters pane, select the 3 checkbox under the Terminals heading and transistor under
the Device Type option from the Filters pane.
Figure 19: Searching for a device u sing Filters
3. Select the MOSFET, n-type, 3 terminal (3terminal-n-fet) device, then select Add to
copy it to the project tree.
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3: Create a new project and test Model 4200A-SCS Parameter Analy z er
Select a custom test
To select a custom test:
1. Select Tests.
2. Select Custom Test, then select Add to create a new 3-terminal, n-type MOSFET test in the
project tree.
Figure 20: Custom Test option
3. Select Rename from the toolbar. Enter a test name in the text box, then select Enter. vds-id
was chosen for this example.
Figure 21: MOSFET_TEST project tree with one device and one test
Configure the test
To configure the test:
1. Select Configure.
Figure 22: Configure highlighte d
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Create a new project and test
-SCS Parameter Analyzer User's Manual Section 3:
2. In the project tree, select vds-id. Because this test is custom, you must assign functions to all
terminals connected to the MOSFET before you can run the test.
Figure 23: All MOSFET terminals unassigned in a blank test
3. Set the Gate terminal connection to SMU2 and set the Operation Mode to Voltage Step.
4. Change gate the Start, Stop, Step, and Compliance settings to match the next figure or to the
gate settings appropriate for your device.
Figure 24: SMU2 steps from 2 to 5 volts, connected to MOSFET Gate terminal
4200A-SCS-900-01 Rev A. / September 2016 3-7
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3: Create a new project and test Model 4200A-SCS Parameter Analy z er
5. Set the Drain terminal connection to SMU1 and set the Operation Mode to Voltage Linear Sweep.
6. Change the Start, Stop, Step, and Compliance settings to match the next figure.
Figure 25: SMU1 sweeps from 0 to 5 volts, connected to MOSFET Drain terminal
7. Set the Operation Mode of the Source terminal to GNDU.
Execute the test
Select Run to execute the test.
Figure 26: Run
View and analyze the test results
While the test is running, you can view the data in the Analyze pane. Because you created a new
test, the axes of the results graph are not assigned. You must assign axes to the graph to view
graphical results.
To view and analyze the test results:
1. Select Analyze. The Analyze screen appears as a blank spreadsheet and a blank graph with
unassigned axes.
Figure 27: Analyze highlighted
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Create a new project and test
-SCS Parameter Analyzer User's Manual Section 3:
2. Select Graph Settings..., then Define Graph.
3. Select Define Graph.
4. In the Graph Definition screen, assign X to DrainV and Y1 to DrainI.
Figure 28: Define the graph
5. Select OK to apply the settings.
6. When you run the test, the sheet populates with the measured data and the graph displays the
Vds-Id family of curves.
Figure 29: Analyze Pane showing test results
4200A-SCS-900-01 Rev A. / September 2016 3-9
Set up the measurements in Clarius ........................................ 4-4
The 4225-RPM Remote Amplifier/Switch Module is an accessory for the 4225-PMU 2-Channel
UltraFast I-V Module. The 4225-RPM has two purposes:
Section 4
Use the RPM to switch the SMU, CVU, and PMU
• To extend the current measurement ranges of the PMU to the 100 nA range
• To enable the user to switch between the instruments without changing cables
This section provides an example of how to use the 4225-RPM to switch the 4200-SMU or
4210-SMU, 4210-CVU, and 4225-PMU and make DC I-V, C-V, and pulsed I-V measurements to a
single device without having to reconnect the device between measurements.
For this example, make connections from two SMUs, one CVU, and the two-channel PMU to the
inputs of two 4225-RPMs. Then make connections from the outputs of the two 4225-RPMs to a diode.
Finally, generate DC I-V, C-V, and pulsed I-V measurements.
Update the RPM configuration in KCon
The KCon application is used to manage the configuration of the 4200A-SCS, including the
4225-RPM. Before using an RPM for automatic switching, you must update the RPM configuration in
KCon. This associates the instruments connected to each RPM and also enables automatic switching
between tests.
To update the RPM configuration in KCon:
1. Make sure your device is disconnected from the RPM output terminals.
2. Close the Clarius application.
3. Open the KCon application.
4. Select Update Preamp, RPM, and CVIV Configuration.
Figure 30: Update the RPM configurati on in KCon
Section
User's Manual
4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analyz er
5. Select Save.
6. Close KCon.
7. Open the Clarius application.
Equipment required
• One 4200A-SCS with the following instruments:
• Two 4200-SMUs or 4210-SMUs
• Two 4200-PAs
• One 4210-CVU
• One 4225-PMU
• Two 4225-RPM
• Four 4200-TRX-2 or 4200-MTRX-2 triaxial cables (supplied with SMU)
• Four CA-447A SMA cables (supplied with CVU)
• Two CA-547-2A RPM interconnect cables (supplied with RPM)
• Four CA-534-24A triaxial cables
• Two 237-TRX-T triaxial tees
• One shielded test fixture with connection to GNDU (Force LO)
Device connections
Using the supplied cables, make connections from the output terminals of the instruments to the input
terminals of the two RPMs. Connect the output terminals of the RPMs to the diode in a 4-wire
configuration to provide the best measurement accuracy and eliminate the lead resistance effects on
I-V and C-V measurements.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
4-2 4200A-SCS-900-01 Rev A. / September 2016
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
Connection schemati c
The hardware connections from the output terminals of the instruments in the 4200A-SCS are
connected to the input terminals of the two 4225-RPMs and then from the output terminals of the two
RPMs to the diode under test, as shown in the next figure.
The Sense and Force output terminals of 4200-SMU Channel 1 are connected to the SMU Sense and
SMU Force connections of 4225-RPM Channel 1 using 4200-TRX-2 or 4200-MTRX-2 triaxial to
triaxial cables. The same connection is made between 4200-SMU Channel 2 and 4225-RPM
Channel 2, using the same cable model.
The HPOT and HCUR output terminals of the 4210-CVU are connected to the CVU Pot and CVU Cur
inputs of 4225-RPM Channel 1 using CA-447A SMA cables. The LPOT and LCUR output terminals of
the 4210-CVU are connected to the CVU Pot and CVU Cur inputs of 4225-RPM Channel 2 using
CA-447A SMA cables.
The output terminals of the 4225-PMUs are connected to their respective channels' RPM Control
inputs on the 4225-RPMs.
The Force and Sense output terminals from 4225-RPM Channel 1 are connected to the anode of the
diode using two triaxial cables (part number CA-534-24A) and a triaxial tee (Model 237-TRX-T).
These triaxial cables are rated for accurate low current (I-V) and high frequency (C-V and pulsed I-V)
measurements.
The output terminals of 4225-RPM Channel 2 are connected to the cathode of the diode using the
same cables and triaxial tee as those for Channel 1. To prevent noisy measurements, enclose the
diode in a conductive shield connected to the Force LO terminal of the 4200A-SCS.
Figure 31: Connections from the 4200A-SCS and 4225-RPMs to the diode
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4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analy z er
Connect the 4200A-SCS to the DUT
The next figure shows the 4200A-SCS rear-panel connections to the input terminals of two
4225-RPMs and from the outputs of the 4225-RPMs to the diode.
Figure 32: Rear panel connections to the inputs of the 4225-RPM units and from the units to
the device
Set up the measurements in Clarius
This section describes how to set up the 4200A-SCS to perform I-V, C-V, and pulsed I-V
measurements on a diode. You will create a new project and add a test to the project tree for each
measurement type.
For this example, you will use the Clarius application to:
• Create a new project
• Add a device
• Search for and select existing tests in the Test Library
• Configure the tests
• Run the tests
• View and analyze the test results
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
Create a new project
To create a new project:
1. Choose Select.
Figure 33: Select highli g hted
2. In the Library, select Projects.
3. Select and then Create a New Project.
Figure 34: Select a New Project from the Project Library
4. Select Yes when prompted to replace the existing project.
5. Assign a new title to the project by selecting Rename, then enter Diode Test.
6. Select Enter.
4200A-SCS-900-01 Rev A. / September 2016 4-5
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4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analyzer
Add a device
To add a device:
1. Select Devices.
2. To find a diode device in the Device Library, type diode into the search box, then select Search.
3. Select the Diode, 2 terminal device and Add it to the project tree.
Figure 35: Select and add a diode device to the project tree
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
Search for and select existing tests in the Test Library
To search for and select an existing test:
1. Select Tests.
2. To find a diode test in the Test Library, type the word diode in the search box, then select
Search.
3. Scroll to find the Diode Forward I-V Sweep (vfd) test, then Addthe test to the project
tree.
Figure 36: Adding the Diode Forward I-V Sweep (vfd) test to the project tree
4. Scroll to find the Diode C-V Sweep (cv-diode) test, then Add this test to the project tree.
Figure 37: Diode C-V Sweep (cv-diode) test
5. Scroll to find the Diode Pu lse I-V Sweep (pulse-diode) test, then Add this test to the
project tree.
Figure 38: Diode Pulse I-V Sweep (pulse-diode) test
4200A-SCS-900-01 Rev A. / September 2016 4-7
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4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analy z er
Your project tree now has three tests.
Figure 39: Three tests added to project tree
Configure the test
To configure the tests:
1. Choose Configure.
Figure 40: Configure highlighte d
2. In the project tree, select the vfd test. Adjust the Anode settings in the Key Parameters pane as
needed.
Figure 41: Forward I-V sweep, vfd ter m inal settings
4-8 4200A-SCS-900-01 Rev A. / September 2016
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
3. In the Test Settings pane, select Advanced. Adjust the parameters as needed. Be sure to include
the delay between sweep steps.
Figure 42: Test Settings pane and Test Settings Advanced dialog box
4. Select OK to accept the settings.
5. Select Terminal Settings.
6. Select Advanced.
7. Adjust the voltage source and current measurement parameters as needed.
4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analyzer
8. Select OK to accept the changes.
9. Select the cv-diode test from the project tree.
10. Highlight the Anode terminal of the diode in the Key Parameters pane
11. Adjust the voltage source and test frequency settings as needed.
Figure 44: Key Parameters pane for the cv-diode sweep test
4-10 4200A-SCS-900-01 Rev A. / September 2016
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
12. From the Test Settings pane's Advanced dialog box, adjust the timing parameters as needed. Be
sure to include the sweep delay time in your adjustments.
Figure 45: Test Settings pane and the Test Settings Advanced and Formulator dialog boxes for
the cv-diode sweep test
4200A-SCS-900-01 Rev A. / September 2016 4-11
Section
User's Manual
4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analy z er
13. From the Terminal Settings pane and the Terminal Settings Advanced dialog box of the Anode
terminal, adjust the DC voltage source, AC voltage source, and measurement parameters.
Before the corrections can be applied in the test, you can choose to run the CVU Connection
Compensation action from the toolbar.
Figure 46: Terminal Settings pane and the Terminal Settings Advanced dialog box for the c v-
diode sweep test
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
14. In the project tree, select the pulse-diode test.
15. From the Key Parameters pane, adjust the pulse operation as needed.
Figure 47: Key Parameters pane for the pulse-diode test
4200A-SCS-900-01 Rev A. / September 2016 4-13
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4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analy z er
16. Change the Cathode terminal setting to PMU1-2.
17. Select Test Settings.
18. Select Advanced to adjust the test mode or pulse timing settings, as needed.
Figure 48: Test Settings pane and the Test Settings Advanced dial og bo x for the Pulse-Diode
test
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
19. Select OK to accept the changes.
20. Select the Anode terminal.
21. Select Terminal Settings.
22. Select Advanced to configure the measurements as needed, including spot mean, PMU
compensation, and PMU thres hold leve ls.
Figure 49: Terminal Settings pane and the Terminal Settings Advanced dialog box for Pulse-
Diode test
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4: Use the RPM to switch the SMU, CVU, and PMU Model 4200A-SCS Parameter Analy z er
Run the test
Once the three tests have been configured, you can execute every test under the device by selecting
the diode device in the project tree and then Run. Select the check boxes for the three tests and the
device. The three tests run sequentially and the RPM automatically switches the outputs between the
SMU, CVU, and PMU.
Figure 50: Executing the test from the device level
As the instruments switch between tests, the LEDs at the top of the RPMs change color. When the
output is connected to the SMU, the LED is blue. When the output is connected to the CVU, the LED
is red. When the output is connected to the PMU, the LED is green, which is also the default state.
Figure 51: Top of the 4225-RPM indicati ng the LED status
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Use the RPM to switch the SMU, CVU, and PMU
-SCS Parameter Analyzer User's Manual Section 4:
Analyze the results
You can select Analyze when you run the project to view test results in real-time.
Figure 52: Analyze highlighted
Select a test from the project tree to display its results. The data for the vfd test is displayed in the
next graphic. Both the data and the graph are displayed in this view.
Figure 53: Analyze pane
4200A-SCS-900-01 Rev A. / September 2016 4-17
Set up the measurements in Clarius ...................................... 5-10
Update the switch configuration in KCon ................................. 5-6
Introduction
This tutorial demonstrates how to configure a Keithley Instruments Series 700 Switching System
(707/A/B or 708/A/B) in KCon and then how to use the system to connect any instrument terminal to
any test system pin without changing connections. You will also create a new project for an n-channel
MOSFET transistor and use the project to make both I-V and C-V measurements using the switching
system.
Section 5
Switching systems are controlled by the 4200A-SCS using the GPIB bus. Use a 7007-1 or 7007-2
GPIB cable to connect your switching system to the 4200A-SCS. Once the switching system and test
fixture have been defined in KCon, you use Clarius to set up the connections and automatically
connect the instruments to the test system pins using the switching system.
The connectpins action from the Action Library is used in Clarius to control switching systems. This
action controls the opening and closing of crosspoints in a switching system so that you can connect
any row of the matrix card to any (or multiple) columns of the matrix card.
The connectpins action is added to the project and runs twice in this example. Each run
establishes new connection settings.
For more details about switching system connections and the Action Library, refer to the Model 4200A-SCS Reference Manual.
Section
nual
5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er User's Ma
Equipment required
• One 4200A-SCS with the following instruments:
• Three 4200-SMUs or 4210-SMUs
• One 4210-CVU
• Eight 4200-MTRX-X cables or 4200-TRX-X cables if using preamplifiers
• Four CA-447A SMA cables (supplied with the CVU)
• Four CS-1247 SMA female to BNC male adapters (supplied with the CVU)
• Two CS-701A BNC Tee adapters (female, male, female)
• Two 7078-TRX-BNC BNC female to triaxial male adapters
• One Series 700 Switching System with 7072 Matrix Card
• One shielded four-terminal test fixture with triaxial inputs
• One n-channel MOSFET transistor
Device connections
The next topics detail the connections from the 7072 to the n-channel MOSFET and the connections
from the 4200-SMU or 4210-SMUs, 4210-CVU, and GNDU to the 7072 Matrix Card in the Series 700
Switching System.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
5-2 4200A-SCS-900-01 Rev A. / September 2016
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
Connect the 7072 to the DUT
The hardware connections from the 7072 Matrix Card to the 4-terminal MOSFET DUT are shown in
the following figure. Use four 4200-MTRX-X or 4200-TRX-X triaxial cables (if using a preamplifier) to
the input terminals of your test fixture.
Figure 54: Connections from the 7072 Matrix Card to the MOSFET DUT
4200A-SCS-900-01 Rev A. / September 2016 5-3
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5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er
Connect the 4200A-SCS to the 7072
The hardware connections from the output of the instruments in the 4200A-SCS to the 7072 are
shown in the following figure.
To connect the 4200A-SCS and SMUs to the 7072:
Using four 4200-MTRX-X or 4200-TRX-X triaxial cables, make the following connections:
• 4200A-SCS GNDU to 7072 input terminal E
• 42x0 SMU channel 1 Force to 7072 input terminal A
• 42x0 SMU channel 2 Force to 7072 input terminal B
• 42x0 SMU channel 3 Force to 7072 input terminal C
To connect the 4210-CVU to the 7072:
1. Using the labeled parts in the following figure, assemble a tee adapter to connect the 4210-CVU
to the 7072
Figure 55: 4210-CVU to 7072 adapter tee assembly
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
2. Using four CA-447A SMA cables, make the following connections:
• 4210-CVU HCUR to adapter tee assembly 1
• 4210-CVU HPOT to adapter tee assembly 1
• 4210-CVU LPOT to adapter tee assembly 2
• 4210-CVU LCUR to adapter tee assembly 2
3. Connect adapter tee assembly 1 to input terminal G of the 7072.
4. Connect adapter tee assembly 2 to input terminal H of the 7072.
The connections are shown in the following figure.
Figure 56: 4200A-SCS to 7072 Matrix Card connections
4200A-SCS-900-01 Rev A. / September 2016 5-5
Section
ser's Manual
5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er U
Update the switch configuration in KCon
After completing the switch and device connections, use KCon to manage the configuration of all
instrumentation controlled by the 4200A-SCS software. You use KCon to:
• Add a switching system to the 4200A-SCS configuration
• Add a test fixture to the system configuration
• Configure the test fixture
• Add a matrix card to the switching system
• Configure the matrix card connections
To add a switching system to the 4200A-SCS configuration:
1. From the desktop, open the KCon application.
2. In the bottom left of the KCon application window, select Add External Instrument.
3. In the dialog box that appears, select your switching system. The Series 700 Switching Systems
are highlighted in the next figure.
Figure 57: Add External Instrument box, Series 700 Switching Systems highlighted
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
4. Select OK.
5. Select Add External Instrument again, then select Test Fixture.
Figure 58: Add External Instrument d ialog box, Test Fixture highlighted
6. Select OK.
7. From the configuration navigator, select the test fixture you just added (TF1).
8. Set the number of pins equal to the number of output pins in your switching system (12 for this
example, using one 7072 matrix card).
Figure 59: Properties for a Generic Test Fixture
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5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er
9. From the configuration navigator, select the switching system you just added (MTRX1).
10. In the Properties pane, add the 7072 Matrix Card to the correct slot of the switching system.
11. Confirm that the GPIB Channel of your device (0 to 30) matches the channel shown in the
Properties. The next figure shows a Keithley Instruments 707/707A/707B Switching System with
the matrix card installed in slot 1.
Figure 60: Properties pane of Keithley 708/708A/708B Switching System with one 7072 Matrix
Card
5-8 4200A-SCS-900-01 Rev A. / September 2016
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
If you are using a 707B or 708B Switching System, you must use the control panel on the front of
your switching system to enable DDC and change the command set to 70XA by following these
steps:
1. Select Menu.
2. Select DDC.
3. Select Enable.
4. Select 70XA-VERSION.
This allows the switching system to be controlled by the 4200A-SCS.
12. Select the + symbol next to MTRX1 to see the settings for the added 7072 Matrix Card (CARD1).
13. Select the 7072 Matrix Card.
14. Complete the Card Rows Assignments according to how you connected the instruments to the
7072. For this example, the assignments are:
• Row A - SMU1 Force
• Row B - SMU2 Force
• Row C - SMU3 Force
• Row E - GNDU Force
• Row G - CVU1 CVH_CUR
• Row H - CVU1 CVL_CUR
15. Under the Card Columns Assignment heading, designate at least the first four columns with pin
assignments that match their column number. For example, Pin 1 Force to column 1.
Figure 61: Completed Properties pane for the 7072 Matrix Card
16. From the KCon toolbar, select Validate Configuration to ensure that the switching system is
connected properly.
Figure 62: Validate Configuration icon
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5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyzer
17. Select Save to save the system configuration.
18. Select System Configuration Summary, then scroll down to the Connections section. You can
select Save Configuration As or Print Configuration, as you will need these names when
setting the switching system connections in Clarius. The default values for the most common
instruments are shown in the next figure.
Figure 63: System Configuration Summary: Default Terminal ID Connections
19. Close the window when you are finished.
20. Close the KCon application.
Set up the measurements in Clarius
After closing KCon, open the Clarius application from the desktop. In this section, you will use the
Clarius application to configure and run two tests on an n-channel MOSFET transistor: A plot of drain
current versus drain voltage using the SMUs and a C-V sweep. By using the Series 700 Switching
System, you do not need to rearrange cables between the tests.
For this example, you use the Clarius application to:
• Create a new project
• Add a device
• Add an action
• Configure the action
• Search for and add two tests
• Run the project and view the tests
5-10 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
To create a new project:
1. Choose Select.
Figure 64: Select highli g hted
2. In the Library, select Projects.
3. Select and then Create a New Project.
Figure 65: Select a New Project from the Project Library
4. Select Yes when prompted to replace the existing project.
To add a device:
1. Select Devices.
2. Select Search.
3. Scroll to the MOSFET, n-type, 4 terminal device (4terminal-n-fet), then Add it to the
project tree.
4200A-SCS-900-01 Rev A. / September 2016 5-11
Section
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5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er
To add the connectpins action:
1. Select Actions.
2. Select Search.
3. Scroll to the connectpins action, then Add it to the project tree twice.
Figure 66: connectpins added twice
To configure the connectpins action:
1. Select the first connectpins action you added to the project tree.
2. Select Configure.
Figure 67: Configure highlighte d
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
3. Make the following connections using the pairs of TermIdStr# and Pin# text fields in the action:
• SMU1 – Pin 3
• SMU2 – Pin 2
• SMU3 – Pin 1
• GNDU – Pin 4
When you are finished, the Key Parameters view of the action should look like the next graphic. The
listed order of the instruments does not matter so long as each instrument is paired with the correct
pin number.
In this example, assigning TermIdStr1 to SMU1 and Pin 1 to 3 connects SMU1 to Pin 3 on the matrix.
Figure 68: connectpins device connections
4200A-SCS-900-01 Rev A. / September 2016 5-13
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5: Configure and use a Series 700 Switching System Model 4200A-SCS Parameter Analyz er
If you select the OpenAll check box, the connectpins action opens all crosspoints before closing
the specified pairs. This is usually the preferred behavior. However, since connectpins only has
eight field pairs, the action can only close eight crosspoints during each run. To close more
crosspoints, use multiple connectpins actions.
4. Select Save.
5. Select the second connectpins action you added to the project tree.
6. Make the following connections using the pairs of TermIdStr# and Pin# text fields in the action:
• CVH1 – Pin 1
• CVL1 – Pin 2
• CVL1 – Pin 3
• CVL1 – Pin 4
When you are finished, the Key Parameters view of the action will look like the next graphic.
Figure 69: Second connectpins co nn ections
7. Select Save.
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Configure and use a Series 700 Switching System
-SCS Parameter Analyzer User's Manual Section 5:
To search for and add existing tests from the Test Library:
1. Choose Select.
Figure 70: Select highli g hted
2. Select Tests.
3. Type vds into the search box.
4. Scroll to the vds-id test and Add it to the project tree.
5. Drag the vds-id test between the two connectpins actions.
6. Clear the search box, then type cv into the search box.
7. Scroll to the cv-nmosfet test and Add it to the project tree.
8. Drag the cv-nmosfet test after the second connectpins action.
Your project tree will look like the next figure.
Figure 71: Project tree showing tests and actions in the proper order
4200A-SCS-900-01 Rev A. / September 2016 5-15
To run the project and view the tests:
1. In the project tree, select New_Project.
2. Select Run to start the test. The two actions and tests run sequentially with the connectpins
actions setting the crosspoints before the tests are executed.
You can select Analyze when you run the project to view test results in real-time.
Figure 72: Analyze highlighted
To view the results of a test either as it runs or after it has completed, select the test in the project
tree.
Setting up measurements in the Clarius software .................... 6-4
This example shows how to use a 4200-SMU or 4210-SMU instrument to perform a forward-biased
voltage sweep on a solar cell in a 4-wire configuration. Current is measured on each step of the
sweep and an I-V graph is generated from the collected data. The Formulator calculates common
electrical characteristics of the cell.
Section 6
Make I-V measurements on a solar cell
These instructions show you how to make connections from the SMU to the solar cell and how to add
the forward bias I-V test into a new project and automate the measurements.
From the I-V characteristics measured by the 4200A-SCS, you can determine important parameters
about the solar cell, including:
• Maximum current (I
• Maximum power (P
• Open-circuit voltage (V
• Short-circuit current (I
Equipment required
• One 4200A-SCS with one 4200-SMU or one 4210-SMU
• Four triaxial cables (4200-TRX-2 or 4200-MTRX-2)
• One solar cell
• One light source
) and voltage (V
max
)
max
)
oc
)
sc
max
)
Section
User's Manual
6: Make I-V measurements on a solar cell Model 4200A-SCS Parameter Analyz er
Device connections
Connect your preamplifier or SMU output terminals to the solar cell in a 4-wire configuration. This
provides the best measurement accuracy and eliminates the effects of the resistance of the test leads
and unwanted voltage drops.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
Device connection schematic
Connections to the solar cell can be made using two SMUs or one SMU and the Ground Unit
(GNDU). The next figure shows the connection schematic for the application.
Figure 73: Solar cell device c o nn ection schematic
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V measurements on a solar cell
-SCS Parameter Analyzer User's Manual Section 6: Make I-
Connect the 4200A-SCS to the DUT
The following two figures show the 4200A-SCS rear-panel connections for the two methods
mentioned in the Device connection schematic (on pag e 6-2
shown in the following graphics using four 4200-TRX-2 or 4200-MTRX-2 triaxial cables.
Figure 74: Rear-panel connections using two SMUs
) topic. You can make the connections
Figure 75: Rear panel connections using one SMU and GNDU
4200A-SCS-900-01 Rev A. / September 2016 6-3
Section
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6: Make I-V measurements on a solar cell Model 4200A-SCS Parameter Analyz er
Setting up measurements in the Clarius software
This section demonstrates how to set up the 4200A-SCS to perform an I-V sweep on a solar cell. The
fwd-ivsweep test measures current at each step of a user-configured volta ge sw eep. An I-V curve
is generated from the acquired data, and device parameters are calculated in the Formulator.
For this example, use the Clarius application to:
• Create a new project
• Search for and select a test
• Configure the test
• Execute the test
• View and analyze the test results
Create a new project
To create a new project:
1. Choose Select.
Figure 76: Select highli g hted
2. In the Library, select Projects.
3. Select and then Create a New Project.
Figure 77: Select a New Project from the Project Library
4. Select Yes when prompted to replace the existing project.
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V measurements on a solar cell
-SCS Parameter Analyzer User's Manual Section 6: Make I-
Search for and select a test
To search for and select the test:
1. Select Tests.
2. Select the PV Cell check box, then select Search.
Figure 78: Use filters to select the solar cell I-V voltage sweep test
3. Select the Solar Cell Forward I-V Sweep (fwd-ivsweep) test.
4. Select Add.
The test is displayed in the project tree.
Figure 79: Test added to the project tree
Configure the test
To configure the test:
1. Select the fwd-ivsweep solar cell I-V test in the proje ct tree.
2. Select Configure.
Figure 80: Configure highlighte d
4200A-SCS-900-01 Rev A. / September 2016 6-5
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6: Make I-V measurements on a solar cell Model 4200A-SCS Parameter Analy z er
3. Adjust the Anode settings as needed.
Figure 81: Key Parameters pane for the I-V sweep of a solar cell
4. In the Test Settings pane, adjust the Measure Settings and Test Mode as needed.
Figure 82: Test Settings pane
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V measurements on a solar cell
-SCS Parameter Analyzer User's Manual Section 6: Make I-
The Formulator is also located in the Test Settings pane. If you select the Formulator in the Test
Settings pane, the Formulator dialog box will appear as shown in the figure below.
Figure 83: Formulator dialog box
4200A-SCS-900-01 Rev A. / September 2016 6-7
This test calculates Voc, Isc, P
, and other device parameters. See the Electrical Characterization of
max
Photovoltaic Materials and Solar Cells with the 42 00A -SCS Parameter Analyzer application note for
details on Formulator calculations. You can also add new formulas or edit existing formulas. See the
"Formulator" topic in the Model 4200A-SCS Reference Manual for more information.
Execute the test
1. Highlight the fwd-ivsweep test in the project tree.
2. Select Run to execute the test.
Figure 84: Run
Section
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6: Make I-V measurements on a solar cell Model 4200A-SCS Parameter Analyz er
Analyze the test results
You can select Analyze when you run the project to view test results in real-time.
Figure 85: Analyze highlighted
You can also use the View icons in the upper-right of the center pane to choose between Sheet only,
graph only, or Sheet + Graph. The Sheet only view is shown in the next figure.
Figure 86: Sheet only view selected, View icons highlighted
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V measurements on a solar cell
-SCS Parameter Analyzer User's Manual Section 6: Make I-
The sheet displays the results with the voltage and current data labeled Anode V and Anode I,
respectively. The formulas calculated in the Formulator are shown in the right-most columns. They
include the maximum power (PMAX), open circuit voltage (VOC), short circuit current (ISC), and fill
factor (FF). More information about the Sheet and Formulator function can be found in the Model 4200A-SCS Reference Manual.
To see an expanded view of the graphed test results, select the Graph only view. The following
graph shows the sweep of an illuminated silicon photovoltaic (PV) cell generated by the SMU.
Figure 87: Test results showing I-V graph of a n illuminated solar cell
4200A-SCS-900-01 Rev A. / September 2016 6-9
Because the system SMUs can sink current, the curve can pass through the fourth quadrant and
allow power to be extracted from the device (I–, V+). If you want to have the data displayed in the first
quadrant, use the Formulator to multiply the current by -1 and plot this calculated result instead.
You can also show previous test runs in the graph window by selecting them under the Run History
tab. Select the check box next to the tests you want to display, and the test curves are displayed in
the graph window. If you select multiple run histories, the graphs are overlaid.
Additional tests
You can add other solar cell tests to the project. Search for solar cell in the Test library to find
additional tests.
Set up the measurements in Clarius ........................................ 7-3
Capacitance-voltage (C-V) measurements are commonly used in studying gate-oxide quality in detail.
These measurements are made on two-terminal devices called MOS capacitors , w hich ar e MOSFETs
without a source and drain. C-V test results offer device and process information, including bulk and
interface charges. Many MOS device parameters, such as oxide thickness, flat band voltage, and
threshold voltage, can also be extracted from the C-V test data.
Section 7
Make C-V measurements on a MOSC AP
This section provides an example of how to use the 4210-CVU CV Analyzer to make a C-V sweep on
a MOS capacitor and derive common parameter extractions from the C-V data using the Formulator.
Equipment required
• One 4200A-SCS with the following instruments and accessories:
• One 4210-CVU
• Four CA-447A SMA cables
• Four CS-1247 SMA female to BNC male adapters
• Two CS-701 BNC tee adapters
Device connections
Using the supplied cables, make connections from the output terminals of the 4210-CVU to the MOS
capacitor.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
Section
User's Manual
7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er
Connect the 4200A-SCS to the DUT
The hardware connections from the output terminals of the CVU to the MOS capacitor are shown in
the following figure. Connect one cable to each of the CVU terminals, then connect one SMA female
to BNC male adapter to the end of each cable.
The cables from the HCUR and HPOT terminals are coupled with the BNC tee adapter and are then
connected to the gate of the MOS capacitor. The cables from the LCUR and LPOT terminals are also
connected together with the BNC tee adapter and then are connected to the bulk of the MOS
capacitor.
In the Clarius application, you will configure HCUR to be the high terminal of the AC ammeter and
HPOT to be the high of the DC voltage source.
Figure 88: Connections from the 4210-CVU to the MOS capacitor
7-2 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
V measurements on a MOSCAP
-SCS Parameter Analyzer User's Manual Section 7: Make C-
Set up the measurements in Clarius
This section describes how to set up the Clarius application to make a C-V sweep on a MOS
capacitor. You select an existing project from the project library and configure a C-V sweep test.
For this example, you will use Clarius to:
• Search for and select a project in the Project Library
• Configure the test
• Perform offset compensation
• Run the test and review the results
Search for and select a project
1. Choose Select.
Figure 89: Select highli g hted
2. Select Projects.
3. Type MOS cap into the search bar, then select Search.
4. Select MOS Capacitor C-V project(cvu-moscap).
5. Select Create.
6. Select Yes when prompted to replace the existing project.
The project is displayed. This project has three C-V tests for a MOS capacitor, as shown in the next
figure.
Figure 90: MOS capacitor C-V project tree with three tests
4200A-SCS-900-01 Rev A. / September 2016 7-3
Section
User's Manual
7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er
Configure the test
To configure the C-V sweep test, you set the source and measure parameters, define the timing
parameters, and adjust the constants and formulas for extracting parameters from the C-V data.
This test makes a capacitance measurement at each step of a user-configured voltage sweep. A C-V
graph is generated from the acquired data and several device parameters are calculated in the
Formulator.
To configure the test:
1. Select Configure.
Figure 91: Configure highlighte d
2. In the project tree, highlight the moscap-cvsweep test.
3. In the Key Parameters pane, adjust the voltage sweep and test frequency values as needed.
Figure 92: Key parameters for the C-V sweep of a MOS capacitor
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urements on a MOSCAP
-SCS Parameter Analyzer User's Manual Section 7: Make C-V meas
4. In the Test Settings pane, set the Speed to Quiet for sensitive capacitance measurements.
Figure 93: Test Settings pane
4200A-SCS-900-01 Rev A. / September 2016 7-5
Section
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7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er
5. Adjust the Sweep Delay as needed.
The Formulator is located in the Test Settings pane.Select Formulator to display a dialog box,
shown in the next figure.
The Formulator in this test contains equations for deriving common MOS capacitor parameters from
the C-V data. Examples of these parameters include the oxide capacitance, oxide thickness, flatband
voltage, flatband capacitance, threshold voltage, and doping concentration. You can view, edit and
add equations in this dialog box.
Figure 94: Formulator dialog box
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-SCS Parameter Analyzer User's Manual Section 7: Make C-
The next figure shows some of the equations that are included with this test. In the Constants area of
the Formulator, you can change the parameters that are used in the formulas, such as the gate area
and temperature.
Figure 95: Formulas listed in the Formulator
1. Select OK to accept changes made in the Formulator.
2. From the Terminal Settings Advanced dialog box, adjust the DC voltage source, measurement
parameters, AC drive voltage, and enable compensation as needed.
7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er User's
From the Advanced dialog box, adjust the settings for the CVH1 and CVL1 terminals of the CVU as
needed.
In this test, the CVH1 terminals are internally connected to the AC ammeter and the HI of the DC
voltage source by default. The CVH1 terminals are externally connected to the gate of the MOS
capacitor. The CVL1 terminals are internally connected to the AC voltage source and the LO of the
DC voltage source and are externally connected to the bulk of the MOS capacitor or to the prober
chuck.
Perform offset compensation
C-V measurements on a MOS capacitor are generally performed on a wafer using a prober. The
4210-CVU is connected to the MOS capacitor through cables, adapters, and a prober. Cabling adds
stray capacitance to measurements.
To correct for the stray capacitance, Clarius has tools for offset correction. Correction is a two-part
process: You perform the corrections for open, and then you enable the corrections in the Terminal
Settings pane.
Open compensation is generally used for high impedance measurements (< 10 pF or >1 MΩ), while a
short compensation correction is generally performed for low impedance measurements (> 10 nF or <
10 Ω). For a short compensation, you would select Measure Short, and then short the probe to the
chuck.
To perform the corrections:
1. Select Tools.
Figure 97: Tools icon in Clarius
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-SCS Parameter Analyzer User's Manual Section 7: Make C-
2. Select CVU Connection Compensation from the Clarius Tools dialog box.
Figure 98: Clarius Tools dialog box
3. Disconnect the probes from the DUT.
4. Select Measure Open.
Figure 99: CVU Connection Compensation dialog box
4200A-SCS-900-01 Rev A. / September 2016 7-9
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7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er
5. Select OK. You are prompted to verify that the probes have been disconnected from the DUT.
Figure 100: Prompt to remove probes from DUT
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6. Make sure that the probes have been disconnected from the DUT, then select OK. The
compensation runs, and a dialog box confirms that the compensation has run successfully.
7. From the Terminal Settings pane, enable the corrections by selecting the Open or Short
checkbox, as needed.
Figure 101: Enabling CVU Compensation
4200A-SCS-900-01 Rev A. / September 2016 7-11
Run the test
Select Run to execute the test.
Figure 102: Run
Section
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7: Make C-V measurements on a MOSCAP Model 4200A-SCS Parameter Analyz er
View and analyze the test results
You can select Analyze when you run the project to view test results in real-time.
Figure 103: Analyze highlighted
The C-V data is plotted on the graph as the moscap-cvsweep test executes.
Figure 104: Graph in the Analyze pane
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4200A-SCS Parameter Analyzer User's Manual Section 7: Make C-
You can also click the Run sheet of the Analyze pane, as highlighted in the next figure, to display
more data. For example, you can display a holistic view of the parameters for a device.
Figure 105: C-V data in the sheet
4200A-SCS-900-01 Rev A. / September 2016 7-13
Set up the measurements in Clarius ........................................ 8-4
This section provides an example of how to use the 4200A-SCS and Model 4200A-CVIV Multi-Switch
to perform I-V and C-V measurements on the same device without having to manually change
connections to the device between tests.
Section 8
Use the 4200A-CVIV Multi-Switch
The 4200A-CVIV allows you to switch between I-V and C-V measurements as well as make C-V
measurements between output terminals of the 4200A-CVIV.
The 4200A-CVIV can be equipped with up to four 4200-PA Remote Preamplifiers or 4200-CVIV-SPT
SMU Pass-Thru modules.
A MOSFET is used as the device in this example, but the same procedure applies for all devices.
For additional information on the 4200A-CVIV, see the Model 4200A-CV IV Multi-Switch User's Guide.
Equipment required
• One 4200A-SCS with the following instruments:
• Four 4200-SMUs or 4210-SMUs
• Four 4200-PAs or 4200A-CVIV-SPTs (two 4200A-CVIV-SPTs are supplied with the 4200A-CVIV)
• One 4210-CVU
• One 4200A-CVIV
• Four 4200-TRX-2 or 4200-MTRX-2 triaxial cables (supplied with the SMU)
• Four 4200-TRX-0.75 Cables (triaxial cables, approximately 30 in. each)
• Four CA-447A SMA cables (supplied with the CVU)
• One shielded four-terminal test fixture with triaxial inputs
Section
User's Manual
8: Use the 4200A-CVIV Multi-Switch Model 4200A-SCS Parameter Analyz er
Device connections
If you will use 4200-PA Remote Preamplifiers with the 4200A-CVIV, the modules are installed directly
in the instrument. If you will not be using preamplifiers, the 4200A-CVIV-SPT SMU Pass-Thru
modules are installed in the instrument. You can then make connections from the output of the 4200SMU cards to the triaxial inputs of the 4200A-CVIV-SPT modules. To install preamplifiers or the
4200A-CVIV-SPT modules, see the Model 4200A-CVIV Multi-Switch User's Guide for instructions.
You will also make connections from the 4210-CVU to the SMA inputs of the 4200A-CVIV using the
CA-447A SMA cables supplied with the CVU. The Model 4200A-CVIV Mult i-Switch User's Guide
contains additional connection information.
From the output of the 4200A-CVIV, use the 4200-TRX-0.75 triaxial cables to connect the CVIV to the
shielded test fixture. The triaxial terminals on the shielded test fixture allow you to connect directly to
the MOSFET while maintaining a completely shielded and guarded test setup. The triaxial cables can
also be connected to a wafer probing station. A triaxial-to-coaxial adapter can be used to connect to
test fixtures or probe stations that only have coaxial inputs.
The inner shield of the triaxial cable can have voltages up to 200 V present during SMU operation.
Any triaxial-to-coaxial adapter used for conversion should connect the inner conductor and the outer
shield to the coaxial connector only.
Hazardous voltages may be present on all output and guard terminals. To prevent electrical
shock that could cause injury or death, never connect or disconnect from the 4200A-SCS
while the output is on.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads, conductors, or any device under test (DUT) that is in
contact with the conductors. It is good practice to disconnect DUTs from the instrument
before powering up the instrument. Safe installation requires proper shields, barriers, and
grounding to prevent contact with test lead and conductors.
8-2 4200A-SCS-900-01 Rev A. / September 2016
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Switch
-SCS Parameter Analyzer User's Manual Section 8: Use the 4200A-CVIV Multi-
Connection schemati c
Make the hardware connections from the output terminals of the 4200A-CVIV to the MOSFET, as
shown in the following figure. In this example, 2-wire (local sense) measurements are made at the
MOSFET, so four triaxial cables are connected from each Force output terminal of the 4200A-CVIV to
the device.
Each 4200A-CVIV output is connected to a different terminal of the 4-terminal MOSFET. The 4200TRX-0.75 triaxial cables are recommended for use on the output of the 4200A-CVIV. These cables
are used to ensure that both low current I-V measurements and high frequency C-V measurements
can be made with high accuracy.
Figure 106: Connections from the 4200A-CVIV to MOSFET
4200A-SCS-900-01 Rev A. / September 2016 8-3
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8: Use the 4200A-CVIV Multi-Switch Model 4200A-SCS Parameter Analyz er
Set up the measurements in Clarius
This section describes how to set up the 4200A-SCS to control the 4200A-CVIV to automatically
switch between I-V and C-V measurements.
For this example, you use the Clarius application to:
• Create a new project
• Add and configure a C-V compensation action
• Add a MOSFET device
• Add an action for switching the SMUs
• Add a test for making I-V measurements
• Add an action for switching the CVU
• Add a test for making C-V measurements
• Run the project
• View and analyze the test results
The project created in this example is used for two different purposes:
1. The project collects C-V connection compensation constants for all of the 4200A-CVIV channel
configurations that include C-V measurements. This step only needs to be performed once per
configuration.
2. The project runs the tests on the MOSFET. The 4200A-SCS is configured to connect the SMUs
to the MOSFET and produce a Vds-Id family of curves, then the project re-configures the 4200ASCS to connect the 4210-CVU to the MOSFET and perform a C-V measurement between the
gate of the MOSFET (CV HI) and the source, drain, and bulk (CV LO).
You can use this same general procedure to create tests for other devices and for other applications.
YOu can also configure the project to perform multiple I-V measurements and multiple C-V
measurements on the same device with different 4200A-CVIV configurations.
Create and rename a project for I-V and C-V measurements with
compensation
To create and rename a project for I-V and C-V measurements with compensation:
1. To begin a new project, choose Select.
Figure 107: Select highlighted
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-SCS Parameter Analyzer User's Manual Section 8: Use the 4200A-CVIV Multi-
2. In the Library, select Projects.
3. Select and then Create a New Project.
Figure 108: New project option, Projects tab
4. Select Yes when prompted to replace the existing project.
5. Give a new title to the project by selecting Rename from the toolbar. Enter a project name into
the text box, then select Enter. CVIV_COMPENSATION is the test name for this example.
Figure 109: Rename function located above the project tree
Add an action to perform CVU com pensat ion
The cvu-cviv-comp-collect action configures the 4200A-CVIV to the selected channel
configuration and performs compensation.
To add an action:
1. Select Actions.
2. To find the action, enter cviv into the search bar, then select Search.
3. Select the cvu-cviv-comp-collect action, then select Add to copy it to the project tree.
Configure the action
To configure the action:
1. Choose Configure.
Figure 110: Configure highlighted
4200A-SCS-900-01 Rev A. / September 2016 8-5
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8: Use the 4200A-CVIV Multi-Switch Model 4200A-SCS Parameter Analyz er
2. From the project tree, select the cvu-cviv-comp-collect action.
Figure 111: cvu-cviv-comp-collect Action
3. From the CVIV Multi-Switch Configuration terminal settings box, set the output mode of the
4200A-CVIV to Two Wire.
The following step changes the name of each channel to match each channel's corresponding
MOSFET terminal. This step is not necessary for the action to run, but you can see which terminals
correspond to each output terminal by viewing the 4200A-CV I V dis play.
4. In the CVIV Display Config box, change the name of each channel to match the corresponding
MOSFET terminal
5. In the CVIV Display Configuration box, Set channel 3 (Gate) to CV HI and the remaining channels
1, 2, and 3 to CV LO.
6. From the CVU Compensation Selections, enable open correction by selecting Select_Open.
7. Make sure that the DUT is disconnected.
8. Select Run to configure the 4200A-CVIV and collect compensation constants.
Figure 112: Run the action
8-6 4200A-SCS-900-01 Rev A. / September 2016
Model 4200A
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-SCS Parameter Analyzer User's Manual Section 8: Use the 4200A-CVIV Multi-
9. A dialog box is displayed with instructions to remove the device-under-test (DUT) from the test
fixture or lift the probes before performing open compensation. Remove the DUT before selecting
OK.
10. Return the DUT to the test fixture when compensation completes.
11. In the project tree, clear the check box next to the cvu-cviv-comp-collect action.
Clearing this action alerts the software to not perform the compensation collection if the whole
project is executed. It is not necessary to collect compensation constants each time the test is
executed. To recollect the compensation constants, select the action and its check box in the project
tree, then select Run.
The compensation constants are stored in a database that links each 4200A-CVIV configuration to a
set of compensation values. These values are recalled if compensation is enabled in a CVU test while
using this 4200A-CVIV configuration.
For optimal results, the compensation collection action must be executed for every 4200A-CVIV
configuration that is used throughout the test sequence.
Add a device
To add a device:
1. Choose Select.
2. Select Devices.
3. In the Filters pane, select 4 under the Terminals column and Transistor under the Device Type
column.
Figure 113: Searching for a device using Filters
4. Select the MOSFET, n-type, 4 terminal (4terminal-n-fet) device, then select Add to copy it to
the project tree.
4200A-SCS-900-01 Rev A. / September 2016 8-7
Section
User's Manual
8: Use the 4200A-CVIV Multi-Switch Model 4200A-SCS Parameter Analyz er
Add an action for switching the SMUs t o t he device
To add an action:
1. Select Actions.
2. Type cviv into the search bar, then select Search.
3. Select the cviv-configure action, then select Add to copy it to the project tree.
Configure the action
To configure the action:
1. Select Configure.
Figure 114: Configure highlighted
8-8 4200A-SCS-900-01 Rev A. / September 2016
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-SCS Parameter Analyzer User's Manual Section 8: Use the 4200A-CVIV Multi-
2. In the project tree, highlight the cviv-configure action.
3. In the CVU 2/4 Wire Mode settings, set the output mode of the 4200A-CVIV to Two Wire.
4. In the CVIV Display Config settings, change the name of each channel to match the
corresponding MOSFET terminal. These names appear on the display of the 4200A-CVIV.
This step is not necessary for the test to run, but it allows you to see which terminal each output is
connected to by viewing the 4200A-CVIV display.
5. In the CVIV Multi-Switch Channel Config box, set all of the terminals to SMU.
Figure 115: cviv-configure action for I-V testing
4200A-SCS-900-01 Rev A. / September 2016 8-9
Add a test for making I-V measurements
To add a test:
1. Choose Select.
Figure 116: Select highlighted
Section
User's Manual
8: Use the 4200A-CVIV Multi-Switch Model 4200A-SCS Parameter Analyz er
2. Select Tests.
3. To find the test, type vds-id into the search bar, then select Search.
4. Select the vds-id test, then select Add to copy it to the project tree.
5. Select Configure.
Figure 117: Configure highlighted
6. Configure the source and measure parameters of SMU 1 (Source), SMU 2 (Drain), and SMU 3
(Gate) as needed.
7. Assign the instrument of the Bulk terminal to be SMU 4 and set its Operation Mode to Voltage
Bias.
Figure 118: Bulk channel 4 SMU voltage bias configuration
8. Verify that the Bias is set to 0 V and the Compliance is set to 0. 1 A.
Add an action for switching the CVU to t he out put t erminals of the
4200A-CVIV
To add an action:
1. Choose Select to return to the Library.
Figure 119: Select highlighted
2. Select Actions.
3. To find the action, type cviv into the search bar, then select Search.
4. Select the cviv-configureaction, then select Add to copy it to the project tree.
8-10 4200A-SCS-900-01 Rev A. / September 2016
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