© 2000 IXYS All rights reserved
1 - 3
I
FRMS
= 2x 60 A
I
FAVM
= 2x 36 A
V
RRM
= 800-1800 V
V
RSM
V
RRM
Type
VV
900 800 MDD 26-08N1 B
1300 1200 MDD 26-12N1 B
1500 1400 MDD 26-14N1 B
1700 1600 MDD 26-16N1 B
1900 1800 MDD 26-18N1 B
Symbol Test Conditions Maximum Ratings
I
FRMS
TVJ = T
VJM
60 A
I
FAVM
TC = 100°C; 180° sine 36 A
I
FSM
TVJ = 45°C; t = 10 ms (50 Hz), sine 650 A
VR = 0 t = 8.3 ms (60 Hz), sine 760 A
T
VJ
= T
VJM
t = 10 ms (50 Hz), sine 580 A
VR = 0 t = 8.3 ms (60 Hz), sine 630 A
òi2dt TVJ = 45°C t = 10 ms (50 Hz), sine 2100 A2s
VR = 0 t = 8.3 ms (60 Hz), sine 2400 A2s
T
VJ
= T
VJM
t = 10 ms (50 Hz), sine 1700 A2s
VR = 0 t = 8.3 ms (60 Hz), sine 1900 A2s
T
VJ
-40...+150 °C
T
VJM
150 °C
T
stg
-40...+125 °C
V
ISOL
50/60 Hz, RMS t = 1 min 3000 V~
I
ISOL
£ 1 mA t = 1 s 3600 V~
M
d
Mounting torque (M5) 2.5-4/22-35 Nm/lb.in.
Terminal connection torque (M5) 2.5-4/22-35 Nm/lb.in.
Weight Typical including screws 90 g
Symbol Test Conditions Characteristic Values
I
R
TVJ= T
VJM
; VR = V
RRM
10 mA
V
F
IF = 80 A; TVJ = 25°C 1.38 V
V
T0
For power-loss calculations only 0.8 V
r
T
TVJ = T
VJM
6.1 mW
Q
S
TVJ = 125°C; IF = 25 A, -di/dt = 0.6 A/ms50mC
I
RM
6A
R
thJC
per diode; DC current 1.0 K/W
per module other values 0.5 K/W
R
thJK
per diode; DC current see Fig. 6/7 1.2 K/W
per module 0.6 K/W
d
S
Creepage distance on surface 12.7 mm
d
A
Strike distance through air 9.6 mm
a Maximum allowable acceleration 50 m/s
2
Features
●
International standard package
JEDEC TO-240 AA
●
Direct copper bonded Al2O3 -ceramic
base plate
●
Planar passivated chips
●
Isolation voltage 3600 V~
●
UL registered, E 72873
Applications
●
Supplies for DC power equipment
●
DC supply for PWM inverter
●
Field supply for DC motors
●
Battery DC power supplies
Advantages
●
Space and weight savings
●
Simple mounting
●
Improved temperature and power
cycling
●
Reduced protection circuits
Dimensions in mm (1 mm = 0.0394")
Diode Modules
312
TO-240 AA
1
2
3
MDD 26
Data according to IEC 60747 and refer to a single diode unless otherwise stated.
IXYS reserves the right to change limits, test conditions and dimensions