HP 2040D User Manual
Series 2040D Test Systems
2040D
Maintenance
Manual
Part Number #4200-0181
Version 1.0
Table Of Contents
System Overview......................................................................................... 3
SYSTEM MAINTENANCE OVERVIEW ................................................ 5
Selftest & Calibration .................................................................................. 7
SELFTEST AND CALIBRATION OVERVIEW........................................ 8
Purpose Of Calibration ........................................................... 8
When To Calibrate.................................................................. 8
SELFTEST........................................................................................... 9
Selftest Failure Analysis ......................................................... 14
CALIBRATION................................................................................. 16
Diagnostics................................................................................................ 19
DIAGNOSTIC TOOLS ..................................................................... 20
SelfTest EXaminer (STEX) for Microsoft Windows 95 ......................... 20
Overview.............................................................................. 20
Creating the Diagnostic File for STEX ..................................... 20
Analyzing Selftest Data .......................................................... 21
TRMAN (Tester Resource Manager) .................................................. 25
Menu Bar ............................................................................. 25
TESTHEAD - PATCHBOARD - UUT P/S BUILT-IN DIAGNOSTICS .... 31
Breakers and Test Points ........................................................ 32
LED Indicators ...................................................................... 32
GPIB/HPIB POWER SUPPLIES ......................................................... 37
Troubleshooting Hewlett-Packard Power Supplies.................. 37
Certification .............................................................................................. 43
CERTIFICATION .............................................................................. 45
Setup .................................................................................... 45
Module Repair & Replacement ................................................................. 49
REPAIR AND REPLACEMENT PROCEDURES ................................... 50
COMPUTER ASSEMBLY ........................................................ 51
INTERNAL AND PATCHBOARD P/S OVERVIEW ............................. 52
TESTHEAD & PATCHBOARD P/S REPLACEMENT ................. 53
+5VDC Testhead Power Supply............................................ 54
UUT POWER SUPPLIES - Description.............................................. 56
UUT POWER SUPPLY CONTROLLER REPLACEMENT .......... 57
UUT POWER SUPPLIES........................................................ 58
GPIB/HPIB POWER SUPPLIES .............................................. 59
UUT - GPIB/HPIB P/S DISCONNECT AT TEST BAY ............... 60
CIRCUIT BOARD REPLACEMENT ................................................... 61
CONTACT SPRING REPAIR ............................................................. 63
USE OF PATCHBOARD SPRING REMOVAL TOOL (0000-2746)...... 64
CONTACT SPRING REPLACEMENT (Conventional Method) . 65
Series 2040 Maintenance Manual V2.00 Maintenance Overview
System Overview
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Series 2040 Maintenance Manual V2.00Maintenance Overview
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Series 2040 Test System
Series 2040 Maintenance Manual V2.00 Maintenance Overview
SYSTEM MAINTENANCE OVERVIEW
The Series 2040 Test System has been designed with extensive diagnostics and
self testing capabilities. Each module and circuit board includes additional
circuitry for calibration and self testing programs. In addition, a Selftest
Assembly is provided to calibrate and functionally test every component in the
test system. This assembly attaches to the fixture interface to provide the best
accuracy and reliability for calibration and self-diagnostics.
The Certification program uses a Calibration station containing a Digital
Voltmeter (DVM) and Universal Counter/Timer, which are certified by the
National Institute of Standards and Technology as a “Transfer Standard,” to
calibrate the internal precision references of the tester. The Selftest Assembly
uses a 18-bit D/A converter (TDAC) as an internal precision voltage standard.
The internal precision time standard is a Temperature Compensated Crystal
Oscillator located on the Time Measurement System board.
The Calibration and Selftest routines calibrate the remainder of the system to
the tester’s internal precision references. Calibration constants are derived
during Calibration. These constants are used during runtime to maintain
system accuracy. The Calibration constants are stored on the hard drive and
reloaded at powerup. Complete system auto-calibration is achieved without
any pots to adjust.
The Selftest programs use the Selftest Assembly to test all circuits to their
published specifications, and assure that all paths and modules are functional.
The System Maintenance guide is written for troubleshooting to the module
and circuit board level.
The tester shall be disconnected from all power sources
before it is opened for any adjustment, replacement,
maintenance or repair. If service repairs performed under
power become necessary, the repairs shall be performed
by a skilled technician who is aware of the hazard
involved.
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Series 2040 Maintenance Manual V2.00Maintenance Overview
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Series 2040 Test System
Series 2040 Maintenance Manual V2.00 Selftest & Calibration
Selftest & Calibration
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Series 2040 Maintenance Manual V2.00Selftest & Calibration
SELFTEST AND CALIBRATION OVERVIEW
Calibration on the Series 2040 Functional Test System is completely
automated. All calibration is based on high precision references built into the
system Testhead and the Selftest Assembly. A high precision Temperature
Compensated Crystal Oscillator (TCXO) on the Time Measurement System
Board (TMS) is used as a frequency/time reference. A precision digital to
analog converter (TDAC) contained within the Selftest Assembly is used as a
voltage reference for system calibration.
Purpose Of Calibration
Calibration of the functional tester is necessary to obtain gain and offset terms
for all signal paths that exist within the system, and to determine timing for the
MDE’s (Measurement Display Electronics) sweeps, delays, triggers, and
measurement mark. Since potentiometers are used in only a few instances
where factory calibration is required, the majority of the calibration is done by
taking measurements and calculating calibration terms which can be
referenced at a later time. These terms are used by the hardware functional
calls to account for gains, offsets, and timing discrepancies, and their use is
transparent to the user.
In all calibration programs, limits are set on what values any given calibration
term may take on. If a calculated value is outside of the allowable range, a
failure will result and be displayed/printed to the designated output device .
When To Calibrate
Selftest is the best guide to determine if calibration is required. The battery of
Selftest programs is designed to test all functions of the 2040 to their
specifications. If any failures occur during Selftest (especially borderline
failures), calibration should be carried out before proceeding to troubleshoot
the system.
Running through Selftest periodically can tell you if calibration is or is not
required. If you find that all Selftest programs run without failures, there is no
need to recalibrate any portion of the tester. The recommended guideline is to
calibrate every 3 months.
Whenever a temperature change of more than five (5) degrees Celsius occurs
or a Testhead board swap is made, the 2040 should be recalibrated.
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Series 2040 Maintenance Manual V2.00 Selftest & Calibration
SELFTEST
Selftest on the Series 2040 Test System is an automated procedure. The
programs that comprise Selftest are organized under the Selftest Executive in a
test menu called “Functional”. These programs exercise the hardware
functions available to the user through the hardware functional calls. To
perform Selftest, proceed as follows:
1) Install the Selftest unit on the Patchboard assembly as shown
below:
A) Pull the locking handle towards the front of the unit until it
B) Slide the pins on the rear of the Selftest unit into the
C) The ribbon assembly should be installed in the receptacle
D) Rotate the locking handle back to it’s original position to
2) Enter the Selftest Executive by selecting (double-clicking on) the
“SelfExec” program from the Windows Explorer. The Selftest
Executive menu will be displayed as shown on the next page.
3) From the File menu, select Configure, and the small “Report
Series 2040 Test System
is vertical.
Patchboard and rotate the Selftest unit forward until it is
vertical, and sets into the Patchboard.
behind the Selftest, with the colored edge of the ribbon on
the left side, while viewing the front of the unit.
lock the Selftest into place.
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Utilities” dialog box in shown on the
next page will appear. This box contains
three separate ways of reporting the
data collected during the tests. Data
may be stored to a file, displayed on the
screen and/or printed.
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In addition, each of these three
reporting functions can report “All
Data”, “Fail Data” or “No Data”. “All
Data” includes all of the pass or fail
sequences from the test. “Fail Data”
includes only information on the tests
that failed. “No Data” disables that reporting function. To select, merely
use the mouse to check or uncheck each reporting function. If a
reporting device is unchecked, the options under that device appear
“ghosted”, indicating that they are disabled. For diagnostic purposes,
enable the “Printer” and “File” options, and select the “Fail Data”
option. Under the “File” section, click the “Diagnostic File” check box.
Disable the Window reporting functions.
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Series 2040 Maintenance Manual V2.00 Selftest & Calibration
4) Once the type(s) of reporting is completed, click on “OK” to return
to the Selftest Executive menu. Select “Functional” from the
Selftest Executive screen, and the Functional menu will appear as
shown below.
The Functional test menu has been organized so that tests closely
related are blocked together in groups. If only one test is to be run,
use the mouse to select that particular test. If a related group of
tests is to be run, they may be selected using only the mouse. For
example, if the Measurement Display Electronics group is to be
selected, place the mouse pointer on test #30 and hold the left
button down, and drag the mouse down to test #38. The entire
MDE group is now selected. If a random series of tests is desired,
place the mouse pointer on the box under “Run sequence”. When
the Windows text tool appears, click the left mouse button. At the
blinking cursor, any sequence of tests can be entered. The test
numbers, however, must follow this syntax:
‘E’ (Execute) signifies the beginning of a sequence or acts as a
separator between sequences.
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Series 2040 Maintenance Manual V2.00Selftest & Calibration
“:” (Colon) signifies that the following number indicates the amount
of iterations to perform of the previous sequence.
‘,’ (Comma) shares the definition of ‘E’ as a separator between
sequences.
‘-’ (Dash) signifies inclusive or ‘through’.
EXAMPLE: E1-3:5,6-100:2,1-5
This sequence executes tests 1 through 3 five times, tests 6 through
100 two times, and tests 1 through 5 once.
If a single test or a group of selected tests is to be run once, 10
times, or 100 times, use the mouse to select the appropriate button
on the upper left. If the test or group is to be run at some other
number, place the mouse pointer in the box to the direct left of the
stop button, and the Windows text tool will appear in place of the
mouse pointer. Click the left mouse button while texttool is
displayed in the box, and a blinking cursor appears in the box. The
user can now enter any number from 1 to 999 for the number of
times a test should run.
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For diagnostic purposes, click
the mouse button on the small
box in the upper left corner of
the menu next to “All Tests”.
Select the “1" button, and the
program will run all of the
functional tests once, while reporting the data to wherever it was
directed from the ”Report Utilities" box. For diagnostics this path
should include the “File” and “Printer” categories, and the “Fail
Data” and “Diagnostic File” options.
5) If any of the Functional programs fail, check these common
problems:
SELFTEST ASSEMBLY IMPROPERLY INSTALLED - Check to make
sure the assembly is properly installed on the Patchboard. Also,
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Series 2040 Maintenance Manual V2.00 Selftest & Calibration
check the Selftest assembly’s cable for damage.
UUT POWER SUPPLIES OFF - Make sure the UUT Power Supplies
are on.
TESTHEAD POWER SUPPLY FAULT - Check the Testhead Power
Supply Controller’s indicator LEDs. If any of the LEDs are not lit,
reset the system and recheck.
MISALIGNED PINS ON PATCHBOARD RECEIVER - Remove the
Selftest Assembly and carefully inspect the alignment of the
Patchboard receiver pins. Adjust any pins that are misaligned,
remount the Selftest Assembly, and re-test.
After the common problems have been eliminated, a failure in
Functional Selftest can indicate a hardware problem. Since a failure
in Functional Selftest could also be caused by calibration,
recalibrate the unit and run Functional Selftest again. If calibration
or Functional Selftest fails now, a hardware problem most likely
exists. Refer to the Selftest Failure Analysis on the next two pages.
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Series 2040 Maintenance Manual V2.00Selftest & Calibration
Selftest Failure Analysis
Test Name #1 #2 #3
1) SELF_dig-f Selftest TH Cont/CPU TH P/S Cont
2) th_config_tst Testhead configuration does not match the stored configuration.
3) ams_dig_f AMS TH Cont/CPU TH P/S Cont
4) ams_mode_f AMS MSP/ISO ASB
5) ams_sig3_f AMS MSP/ISO TH P/S Cont
6)
7) arly_dig_f Arly/AFET TH Cont/CPU TH P/S Cont
8) arly_f Arly/AFET RMUX AMS
9) afet_rft_f AFET RMUX AMS
10)
11) mrly_dig_f MRLY Selftest TH Cont/CPU
12) mrly_f MRLY RMUX AMS
13)
14) rmux_dig_f RMUX TH Cont/CPU TH P/S Cont
15) rmux_f RMUX AMS Selftest
16) rmux_prt_f RMUX AMS MDE
17)
18)
19)
20)
21) arb_mem_f ASB TH Cont/CPU TH P/S Cont
22) arb_brst_f ASB AMS MDE
23) arb_ext_f ASB AMS MDE
24) arb_freq_f ASB AMS MDE
25) arb_mon_f ASB AMS MSP/ISO
26) arb_ref_f ASB AMS MDE
27) da_ref_f ASB AMS MSP/ISO
28)
29)
30) mde_dlmd_f MDE TMS AMS
31) mde_dltm_f MDE TMS AMS
32) mde_expm_f MDE TMS AMS
33) mde_freq_f MDE TMS AMS
34) mde_mrkp_f MDE TMS AMS
35) mde_msmk_f MDE TMS AMS
36) mde_pmes_f MDE TMS AMS
37) mde_tgfl_f AMS MDE TMS
38) mde_tglv_f AMS MDE TMS
39)
40)
41) tms_dig_f TMS TH Cont/CPU TH P/S Cont
42) tms_evnt_f TMS MDE AMS
43) tms_test_f TMS MDE TH P/S Cont
44)
45) dio_f DIO Selftest TH P/S Cont
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Series 2040 Maintenance Manual V2.00 Selftest & Calibration
46) dio_ext_f DIO Selftest TH P/S Cont
47)
48) iamp_dig_f INST TH Cont/CPU TH P/S Cont
49) inst_f INST ASB AMS
50) amp_cmrr_f INST RMUX AMS
51) isoamp_f MSP/ISO ASB AMS
52)
53) pwr_mon_f Power Supply TH P/S Cont MSP/ISO
54) ptest_f UUT Controller AMS/RMUX Selftest
55) th_iso_f Scope Connected? Internal coax short?
56)
57) msp_ser_f MSP TH Cont/CPU TH P/S Cont
58)
59)
60)
61) ocio_dig_f OCIO TH Cont/CPU TH P/S Cont
62) ocio_f OCIO Selftest TH Cont/CPU
63) ocio_rail_f OCIO Selftest TH Cont/CPU
64)
65) adio_f ADIO Selftest TH Cont/CPU
66) adio_ext_f ADIO Selftest TH Cont/CPU
67) ams_int_f AMS MDE TH Cont/CPU
68)
69) dms_dig_f DMS Selftest TH Cont/CPU
70 dms_mem_f DMS TH Cont/CPU TH P/S Cont
71)
72) psc_dig_f PSC Any other Trigger Matrix board.
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Series 2040 Maintenance Manual V2.00Selftest & Calibration
CALIBRATION
Whenever a Testhead board is
replaced, or any time that Selftest
determines a failure, a calibration
must be performed. If a unit
passes the complete Functional
Selftest routine, a calibration is
not necessary. When Calibrate is
selected from the Selftest
Executive, the screen shown to
the right is displayed.
The Calibrate menu operates
under the same basic rules as the
Functional menu. For installation
purposes, use the mouse to select the “All Tests” box, and select the “1"
button for the number of times to be run. (See page #6). Ensure that the
Printer and Fail Data are selected, so that any failures will be printed
automatically.
The following is a list of the calibration programs located in the Calibrate
menu in the Selftest Executive, with the three most likely boards or assemblies
that could cause failures:
Test Name #1 #2 #3
#1 AMS_RMUX_c AMS RMUX MSP/ISO
#2 AMS_SIG3_c AMS MSP/ISO RMUX
#3 AMS_DIFF_c AMS RMUX ICAM
#4 DMS_c DMS
#5 ARB_v_c ASB MSP/ISO AMS
#6 DA_v_c ASB MSP/ISO AMS
#8 DIO_c DIO TH CONT/CPU Selftest
#9 ADIO_c ADIO TH CONT/CPU Selftest
#10 ADIO_dac_c ADIO AMS RMUX
#12 MDE_c MDE TMS AMS
#13 MDE_TGDC_c MDE TMS AMS
#15 POWER_c UUT Cont AMS/RMUX Selftest
#17 ISOAmp_c MSP/ISO AMS RMUX
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Series 2040 Maintenance Manual V2.00 Selftest & Calibration
Any type of failure during calibration could indicate a hardware problem. If a
failure during Functional was the reason that a calibration is being run, refer to
the Selftest Failure Analysis sheet on page 8 of this section.
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Series 2040 Test System
Series 2040 Maintenance Manual V2.00 Diagnostics
Diagnostics
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Series 2040 Maintenance Manual V2.00Diagnostics
DIAGNOSTIC TOOLS
SelfTest EXaminer (STEX) for Microsoft Windows 95
Overview
The STEX program may be used to help graphically interpret the
results of any diagnostic output file generated by Digalog System’s
SelfExec program run on the Series 2040 testers. STEX uses the results of the
diagnostic output file to show the configuration of the tester and evaluate
possible problems with the tester resources based on failed test data and/or
system errors during testing. STEX will use these results to ‘decide’ what the
top three most likely resource problems are in the tester, based on Selftest
output information. These results will be shown graphically on the STEX
interface, highlighting and identifying the potentially problematic resources in
the tester.
STEX can be very useful in aiding an operator who is troubleshooting possible
problems in the Digalog testers by providing a graphical depiction of the
location of potentially faulty tester resources. These resources include all
Testhead boards, the Testhead power supplies, the variable power supplies
and their controller modules, the computer with its Testhead controller card,
and the Selftest unit itself.
Creating the Diagnostic File for STEX
To use STEX to analyze Selftest data, the proper information must be recorded
in the Selftest output file first. A new user selection under SelfExec’s output
configuration has been added to provide this information. To obtain a
diagnostic file for use in STEX, follow these steps
when running SelfExec:
1) Under the ‘File’ menu, select
‘Configuration’.
2) On the configuration form under ‘File
Options’, select either ‘Fail Data Only’ or ‘All
Data’ and select ‘Diagnostic’.
3) Run the desired calibration and function
tests.
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Series 2040 Test System
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