HP 1652B, 1653B User manual

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HEWLETT

PACKARD

SERVICE MANUAL

HP 1652B/1653B

Logic Analyzers

This manual applies directly to instruments

For Additional Information about serial numbers see

INSTRUMENTS COVERED BY THIS MANUAL

0 COPYRIGHT HEWLETT-PACKARD COMPANY/COLORADO DIVISION 1989

1900 GARDEN OF THE GODS ROAD, COLORADO SPRINGS, COLORADO U.S.A.

prefixed with serial number:

in Section

Manual Part No. 01652-90905 Microfiche Part No.

01652-90805

Printed in U.S.A. February 1990

CERTIFICATION

Hewlett-Packard Company certifies that this product met its published specifications at the time of ship-

ment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.

WARRANTY

This Hewlett-Packard product is warranted against defects in material and workmanship for a period of one year from date of shipment. During the warranty period, Hewlett-Packard Company will, at its option, either repair or replace products which prove to be defective.

For warranty service or repair, this product must be returned to a service facility designated by HP. Buyer shall prepay shipping charges to HP and HP shall pay shipping charges to return the product to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes for products returned to HP from another country.

HP warrants that its software and firmware designated by HP for use with an instrument will execute its programming instructions when properly installed on that instrument. HP does not warrant that the

operation of the instrument or software, or firmware will be uninterrupted or error free.

.--

LIMITATION OF WARRANTY

The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by

Buyer, buyer-supplied software or interfacing, unauthorized modification or misuse, operation outside the environmental specifications for the product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HP SPECIFICALLY DISCLAIMS THE IMPLIED

WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.

EXCLUSIVE REMEDIES

THE REMEDIES PROVIDED HEREIN ARE BUYER’S SOLE AND EXCLUSIVE REMEDIES. HP SHALL NOT

BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES,

WHETHER BASED ON CONTRACT, TORT, OR ANY OTHER LEGAL THEORY.

ASSISTANCE

Product maintenance agreements and other customer assistance agreements are available for Hewlett-Packard products.

For any assistance, contact your nearest Hewlett-Packard Sales and Service Office. Addresses are

provided at the back of this manual.

CW3A789

Safety Considerations

General

Operation

General

Warnings and

Cautions

This is a Safety Class I instrument (provided with terminal for protective earthing). BEFORE APPLYING POWERverify that the power transformer primary is matched to the available line voltage, the correct fuse is installed, and Safety Precautions are taken (see the following warnings). In addition, note the instrument’s external markings which are described under “Safety Symbols.”

BEFORE SWITCHING ON THE INSTRUMENT, the protective earth terminal of the instrument must be connected to the protective conductor of the (mains) powercord. The mains plug shall only be inserted in a socket outlet provided with a protective earth contact. The protective action must not be negated by the use of an extension cord (power cable) without a protective conductor (grounding). Grounding one conductor of a two-conductor outlet is not sufficient protection.

Servicing instructions are for use by service-trained personnel. To avoid dangerous electric shock, do not perform any servicing unless qualified to do so.

If this instrument is to be energized via an auto-transformer (for voltage reduction) make sure the common terminal is connected to the earth terminal of the power source.

Any interruption of the protective (grounding) conductor (inside or outside the instrument) or

disconnecting the protective earth terminal will cause a potential shock hazard that could result in

personal injury. Whenever it is likely that the protection has been impaired, the instrument must be made

inoperative and be secured against any unintended operation.

Only fuses with the required rated current, voltage, and specified type (normal blow, time delay, etc.) should be used. Do not use repaired fuses or short circuited fuseholders. To do so could cause a shock or fire hazard.

Do not operate the instrument in the presence of flammable gasses or fumes. Operation of any electrical instrument in such an environment constitutes a definite safety hazard.

Do not install substitute parts or perform any unauthorized modification to the instrument. Adjustments described in the manual are performed with power supplied to the instrument while

protective covers are removed. Energy available at many points may, if contacted, result in personal injury.

Any adjustment, maintenance, and repair of the opened instrument under voltage should be avoided as much as possible, and when inevitable, should be carried out only by a skilled person

who is aware of the hazard involved.

Capacitors inside the instrument may still be charged even if the instrument has been disconnected from its source of supply.

Warning

Caution

Safety Symbols

Instruction manual symbol. The product will be marked with this symbol when it is necessary for the user to refer to the instruction manual in order to protect against damage to the product.

Indicates Hazardous Voltages

Earth terminal (sometimes used in manual to indicate circuit common connected to grounded chassis).

The WARNING sign denotes a hazard. It calls attention to a procedure, practice, or the like, which, if

not correctly performed or adhered to, could result in personal injury. Do not proceed beyond a

WARNING sign until the indicated conditions are fully understood and met. The CAUTION sign denotes a hazard. It calls attention to an operating procedure, practice, or the

like, which, if not correctly performed or adhered to, could result in damage to or destruction of part or all of the product. Do not proceed beyond a CAUTION sign until the indicated conditions are fully understood or met.

. . . III

New editions are complete revisions of the manual. Update packages, which are

issued between editions, contain additional and replacement pages to be merged into the manual by the customer. The dates on the title page change only when a new edition is published.

A software and/or firmware code may be printed before the date; this indicates the

version level of the software and/or firmware of this product at the time of the manual or update was issued. Many product updates and fixes do not require manual changes and, conversely, manual corrections may be done without accompanying product changes. Therefore, do not expect a one to one correspondence between product updates and manual updates.

Edition 1

February

1990

01652-90905

List of Effective Pages

The List of Effective Pages gives the date of the current edition and of any pages

changed in updates to that edition. Within the manual, any page changed since the

last edition is indicated by printing the date the changes were made on the bottom

of the page. If an update is incorporated when a new edition of the manual is

printed, the change dates are removed from the bottom of the pages and the new

edition date is listed in Printing History and on the title page.

Pages Effective Date

all . . . . . ...* . . . . . . . . February 1990

Contents

Section 1:

General Information

Introduction..........................................................l- 1

Instruments Covered by this Manual

Safety Considerations

Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . l-3

Accessories Supplied

Accessories Available .................................................

Logic Analyzer Specifications

Probes ..........................................................

State Mode

TimingMode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...1-7

Logic Analyzer Operating Characteristics

Probes Measurement Configurations

State Analysis Timing Analysis

Measurement and Display Functions

Oscilloscope Specifications

Vertical Horizontal

Trigger ...........................................................

Oscilloscope Operating Characteristics

Vertical (at BNC)

Horizontal ........................................................

Trigger...........................................................l-l 7

Waveform Display

MeasurementAids ..............................................

Interactive Measurements

Acquisition Mixed Displays Time Correlation Time Interval Accuracy between Modules

General Characteristics

Operating Environment Power Requirements

Weight...........................................................1-2 0

Dimensions.......................................................1-2 0

Recommended Test Equipment

.....................................

..................................................

.................................................. l-4

........................................... l-7

........................................................ 1-7

................................

..................

...................................................... 1-8

.............................

........................................................

................................................. l-15

.................................................

.......................................................

.................................................... 1-19

.................................................. 1-19

..~.......................................l- 7

......................................... 1-8

...................... l-11

................................. 1-12

............................................ 1-15

................................. l-15

.............................................

............................. 1-19

...............................................

............................................ l-19

............................................... l-20

........................................ 1-21

l-2

l-5

..l-7

l-7

..l-15

1-15 1-15

1-16 1-17

..1-18

1-19 1-19

1-19

Section 2:

16526/1653B

Service Manual

Installation

Introduction..........................................................2- 1

Safety Considerations

InitialInspection......................................................2- 1

Operating Disk Installation Power Requirements Line Voltage Selection

PowerCable .......................................................

Applying Power User Interface

HP-IBInterfacing.....................................................2- 5

HP-IB Address Selection

..................................................

.............................................

.................................................. 2-l

................................................. 2-2

......................................................

........................................................ 2-5

..............................................

Contents-1

2-l 2-l

..2- 3

2-3

2-6

RS-232-C Interface

....................................................

RS-232-C Configuration ...............................................

Degaussing the Display

................................................

Operating Environment ................................................

Storage and Shipment

.................................................

Tagging for Service ....................................................

OriginalPackaging ....................................................

OtherPackaging.. .................................................

Cleaning Requirements ...............................................

2-7 2-7 2-9 2-9 2-9 2-9 2-9

..2-10

2-10

Section 3:

Performance Tests Introduction

Recommended Test Equipment Test Record Self Tests

Power-up Self Test

Selectable Self Tests Performance Test Interval Performance Test Procedures Logic Analyzer Performance Tests

Test Connector

Clock, Qualifier, and Data Inputs Test 1

Clock, Qualifier, and Data Inputs Test 2

..........................................................

.........................................

..........................................................

............................................................

.................................................

................................................

.............................................. 3-3

.......................................... 3-3

......................................

....................................................

...............................

..............................

Clock, Qualifier, and Data Inputs Test 3 (HP 1652B Only) Clock, Qualifier, and Data Inputs Test 4 Clock, Qualifier, and Data Inputs Test 5

Clock, Qualifier, and Data Inputs Test 6 Glitch Test Threshold Accuracy Test

Oscilloscope Performance Tests

Input Resistance Test

.......................................................

...........................................

............. ..........................

..............................................

Voltage Measurement Accuracy Test

DC Offset Accuracy Test Bandwidth Test

...................................................

...........................................

Time Measurement Accuracy Test Trigger Sensitivity Test

.............................................

..............................

................................. 3-37

...................................

...............

31 3-l 3-l

3-l

3-2 3-2

3-5

3-6 3-11 3-l-5 3-18 3-21

3-24

3-27

3-31

3-35

3-35 3-42

3-45

3-48

3-51

Section 4:

Contents-2

Adjustments and Calibration

Introduction..........................................................4-1

Equipment Required Adjustments and Calibration Interval Safety Requirements Instrument Warm-up

..................................................

.................................... 4-l

.................................................. 4-2

Adjustments .........................................................

4-l

4-2

Calibrafion...........................................................4- 2

Power Supply Assembly Adjustment CRT Monitor Assembly Adjustments

Intensity, Sub-Bright, and Contrast Adjustment

.....................................

....................................

.........................

Focus Adjustment ..................................................

Horizontal Phase, Vertical Linearity, and Height Adjustments

System Board Assembly Threshold Adjustment

...........................

Oscilloscope Assembly High-Frequency Pulse Adjustment

............ 4-5

..................

4-3 4-4 4-4 4-5

4-6 4-9

SoftwareCalibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...4-11

HP 1652B/1653B

Service Manual

Offset Calibration ...............................

Attenuator Calibration .............................................

Gain Calibration ..................................................

Trigger Calibration ................................................

Delay Calibration

..................................................

.................. 4-12

4-12 443 4-13 4-13

Section 5:

Section 6A:

Replaceable Parts

Introduction 51 -

Abbreviations - . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

ReplaceableParts.....................................................5-1

Exchange Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-l

Ordering Information 52 - . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Direct Mail Order System - . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52

Theory of Operation

Introduction ........................................................ .6A-1

Safety ........................................................... ...6A- 1

Block Level Theory .................. ................................ 6A-1

Power Supply Assembly ........................................... .6A-4

CRT Monitor Assembly ....... .F ................................... 6A-4

Main Assembly. ................................................... 6A-4

Central Processing Unit (CPU) ..................................... .6A-4

Oscilloscope Assembly ............................................ .6A-4

Keypad and Knob Assembly ................................... ..... 6A-5

Disk Controher .................................................. .6A-5

RS-232-C Interface ............................................... .6A-5

HP-IB Interface .................................................. 6A-5

Logic AnaIyzer Theory of Operation ................................... .6A-7

Data Acquisition .................................................. 6A-7

Arming Control .................................................. .6A-7

Memory..........................................................6A- 8

Oscilloscope Theory of Operation ..................................... .6A-9

Attenuator/ Preamps .............................................. .6A-9

PostAmpIifier ................................................. ...6A- 9

ADCandFISOMemory ........................................ ...6A- 9

Triggering ........................................................ 6A-9

TimeBase.......................................................6A-l 0

Fine Interpolator ................................................ .6A-10

Probe Compensation ............................................. .6A-10

DigitalInterface..................................................6A-l 0

AnalogInterface ............................................... ..6A-10

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Section 6B:

HP 1652B/l653B Service Manual

Self Tests

Introduction.........................................................6B- 1

Power-Up Self Tests ................................................. .6B-1

Selectable Self Tests ................................................. .6B-2

Selecting the Self Tests Menu ...................................... .6B-2

AnaIyzer Data Acquisition Self Test ................................. .6B-3

Scope Data Acquisition Self Test ................................... .6B-4

RS-232-C Self Test ............................................... .6B-4

BNCSelfTest.....................................................6B- 5

Keyboard Self Test ............................................... .6B-5

Contents-3

RAM Self Test .................................................... 6B-5

ROM Self Test ....................................................

Disk Drive Self Test ............................................... 6B-6

Cycle Through Tests ............................................... 6B-7

6B-6

Section 6C:

Section 6D:

Troubleshooting

Introduction.........................................................6C- 1

Safety

Trouble Isolation Flowcharts ......................................... .6C-1

Power Supply Voltages Check

Troubleshooting Auxiliary Power ..................................... .6C-16

Assembly Removal and Replacement

Introduction ........................................................ .6D-1

Removal and Replacement of the Rear Panel Assembly .................. .6D-3

Removal and Replacement of the Disk Drive

Removal and Replacement of the Power Supply Assembly ................ .6D-5

Removal and Replacement of the Oscilloscope Assembly ................. .6D-5

Removal and Replacement of the Attenuators ...........................

Removal and Replacement of the Keyboard Assembly ................... .6D-8

Removal and Replacement of the Fan Removal and Replacement of the Main Assembly Removal and Replacement of the CRT Monitor Assembly

Removal and Replacement of the Feet/Tilt Stand

.............................................................. 6C-1

........................................ 6C-12

CRT Monitor Signals Check ...................................... .6C-13

KeyboardSignalsCheck...........................................6C-l 4

Disk Drive Voltages Check ........................................ 6C-15

Disassembling the Keyboard Assembly

.................................

...........................

............................... 6D-9

......................

............... .6D-11

.......................

.6D-4

6D-7

.6D-10

.6D-10 .6D-12

Contents-4

HP 1652B/1653B

Service Manual

Contents

Section 1:

General Information

Introduction..........................................................l -1

Instruments Covered by this Manual Safety Considerations Product Description Accessories Supplied Accessories Available

Logic AnaIyzer Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . l-7

Probes ............................................................

StateMode.. ......................................................

Timing Mode

Logic Analyzer Operating Characteristics

Probes .............................................................

Measurement Configurations

StateAnalysis......................................................l- 8

Timing Analysis Measurement and Display Functions

Oscilloscope Specifications

Vertical ........................................................

Horizontal

Trigger...........................................................l -15

Oscilloscope Operating Characteristics

Vertical (at BNC)

Horizontal........................................................l.l 6

Trigger. Waveform Display

MeasurementAids ................................................

Interactive Measurements

Acquisition Mixed Displays Time Correlation Time Interval Accuracy between Modules

General Characteristics

Operating Environment Power Requirements

Weight............................................................l.2 0

Dimensions.......................................................1-2 0

Recommended Test Equipment

........................................................

..........................................................

.................................................. l-2

................................................... 1-3

..................................................

.................................................

......................................................

.............................................. ; .... l-11

............................................ 1-15

.................................................

................................................. 1-17

............................................. 1-19

....................................................... 1-19

.................................................... 1-19

.................................................. 1-19

............................................... 1-19

............................................ 1-19

............................................... l-20

..................................... l-2

l-4 l-5

l-7 l-7 l-7

................................

.........................................

................................. 1-12

................................. l-15

l-7 l-7 l-8

..1.15

l-15

1-17

1.18

............................. 1-19

........................................ 1-21

General Information

Introduction

This Service Manual explains how to test, adjust, and service the Hewlett-Packard 1652B/1653B Logic Analyzer. This manual is divided into six sections:

1 - General Information.

0 2 - Installation.

3 - Performance Tests.

- Adjustments and Calibration.

5 - Replaceable Parts.

6 - Service.

For easier access, the Service section is presented in four sub-sections:

6A - Theory of Operation.

6B - Self Tests.

6C - Troubleshooting.

6D - Assembly Removal and Replacement.

HP 1652B/1653B

Service Manual

Information for operating, progr

amming, and interfacing the HP 1652BJ1653B is contained in the HP 1652B/1653B Operating and Programming manual set supplied with each instrument.

Section 1, “General Information,” includes a description of the HP 1652B/1653B logic analyzer, including its specifications, options, available accessories, and recommended test equipment for maintaining the instrument.

Listed on the title page of this manual is a microfiche part number. This number

can be used to order 4 by 6- inch microfilm transparencies of the manual. Each

microfiche contains up to 96 photo-duplicates of the manual pages. The microfiche package also includes the latest Manual Changes supplement and pertinent Service Notes.

General

Information

1-I

Instruments Covered by this Manual

The instrument serial number is located on the rear panel. Hewlett-Packard uses a two part serial number consisting of a four-digit prefix and a five-digit suffix

separated by a letter (for example, OOOOAOOOOO). The prefix is the same for all identical instruments and changes only when a modification is made that affects parts compatibility. The suffix is assigned and is different for each instrument. This manual applies directly to instruments with the serial prefix shown on the title

page*

An instrument manufactured after the printing of this manual may have a serial number prefix that is not listed on the title page. This unlisted serial prefix indicates the instrument is different from those described in this manual. The manual for this newer instrument is accompanied by a Manual Changes supplement. This supplement contains “change information” that explains how to adapt the manual to the newer instrument.

In addition to change information, the supplement may contain information for correcting errors in the manual. To keep this manual as current and accurate as possible, Hewlett-Packard recommends that you periodically request the latest Manual Changes supplement. The supplement for this manual is identified with

the manual print date and part number, both of which appear on the page. Complimentary copies of the supplement are available from Hewlett-Packard.

manual title

Safety Considerations

This product is a Safety Class 1 instrument (provided with a protective earth terminal). Review the instrument and manual for safety markings and instructions before you begin operating this instrument. Specific warnings, cautions, and instructions are placed wherever applicable throughout the manual. These precautions must be observed during all phases of operation, service, and repair of the instrument. Failure to comply with these precautions, or with specific warnings elsewhere in this manual, violates safety standards of design, manufacture, and

intended use of this instrument.

Hewlett-Packard assumes no liability for the customer’s failure to comply with these safety requirements.

General Information

1-2

HP 16528/1653B

Service Manual

Product Description

The HP 1652B/1653B logic analyzers are general purpose instruments featuring measurement capabilities in all three domains of interest to the digital system designer: Analog, Timing, and State. Each of these domains is available to the

user separately

or in an interactive combination.

The HP 1652B includes an 80.channel, 35 MHz state, 100 MHz timing logic analyzer, selectable in 16 channel groupings with a 2-channel, 100 MHz, 400 Msample/s digitizing oscilloscope. The HP 1653B includes an 32.channel, 25 MHz state, 100 MHz timing logic analyzer, also selectable in 16 channel groupings with a

2-channel, 100 MHz, 400 Msample/s digitizing oscilloscope. Both analyzers can be configured as two independent state analyzers or one state and one timing analyzer. Two channels of oscilloscope measurement can be added to any configuration. Some of the main features of the analyzer include the following:

Simultaneous state/state, or simultaneous state/timing analysis. Time interval; number of states; pattern search; minimum, maximum, and

average time interval statistics. Transitional timing to store data only when there is a transition. Clock qualifiers, storage qualification, time and number of state tagging, and

prestore. Small lightweight probing.

Some of the main features of the digitizing oscilloscope include the following:

2 channels of 400 Msamples/s digitizing for 100 MHz bandwidth single-shot analysis.

2k memory depth

Automatic pulse parameters which display time between markers, acquires until capturing specified time between markers, and performs statistical analysis on time between markers.

Arming by either analyzer or BNC input.

60 mV through 40 V full screen resolution.

Lightweight miniprobes.

HP 16528/l 6538

Service Manual

Genera II nformation

1-3

Other main features of the HP 1652B/1653B include the following:

A user interface consisting of a panel keyboard with a Rotary Pulse Generator

(RPG) knob.

Nine-inch white phosphor, high resolution monitor.

3.5inch floppy disk drive.

HP-IB and RS-232C interfaces for hardcopy output to a printer or controller interface.

Accessories

Supplied

The following accessories are supplied with the HP 1652B/1653B Logic Analyzer:

Woven probe cable (HP part number 01650-61607) with a 40.pin connector on

each side, 17 signal lines, 18 return lines, 2 chassis ground lines, and 2 power lines. Each power line supplies + 5 volts for preprocessor power. Each cable supplies 600 milliamperes with a maximum power available from the HP 1652B/1653B of 2 amperes. Five probe cables are supplied with the HP 1652B and two are supplied with the HP 1653B.

Probe Tip Assemblies (HP part number 01650-61608) that provide 16 data channels, 1 clock channel, and 1 ground lead per pod assembly. The probe

input specifications are listed in the Logic Analyzer Specifications of this

section. Five Probe Tip Assemblies are supplied with the HP 1652B and two

are supplied with the HP 1653B.

Grabbers for the probe tip assemblies are supplied in packages of 20 (HP part number 5959-0288). One-hundred grabbers (5 packages) are supplied with the HP 1652B and 40 grabbers (2 packages) are supplied with the HP 1653B.

Two HP 10430A lO:l, 1 MS& 6.5 pF, 1 m mini-probes.

Two right angle BNC adapters (HP part number 1250-0076).

One BNC-to-mini probe adapter (HP part number 125001454).

General

I-4

One Operating System Disk.

One Performance Verification Disk.

One 2.3 meter (7.5 feet) Power Cord (see section 2, “Installation,” for the

available power cords). One Operating and Reference Manual Set .

One Programming Reference Manual.

One Service Manual.

One RS-232C Loopback Connector.

Information HP 1652B/1653B

Service Manual

Accessories Available

The following accessories are available for the HP 1652B/l653B Logic Analyzer:

Termination Adapter (HP part number 01650-63201).

HP Model 10269C General Purpose Probe Interface to connect the logic analyzer directly to microprocessor preprocessors.

Preprocessors for specific microprocessors and bus systems (for more information see your Hewlett-Packard Sales/Service Offices).

lO:l, lOO:l, 10 MS& 10 pf resistive divider probe set, 1.5 m (HP 1002OA).

BNC to BNC cable, 1.2 m (HP 10503A).

24-pin IC test clip (HP 102llA).

BNC-to-BNC ac coupling capacitor (HP 10240B).

1O:l Probes:

1 MQ 7.5 pF miniprobe, 1 m (HP 10435A).

1 MQ 10 pF miniprobe, 2 m (HP 10433A).

1:l Probes:

36 pF miniprobe, 1 m (HP 10438A).

62 pF miniprobe, 2 m (HP 10439A).

50 S2 miniprobe, 2 m (HP 10437A).

1OO:l Probes:

10 MQ, 2.5 pF miniprobe, 2 m (HP lOWA).

Soft Carrying Case (HP part number 1540-1066).

HP Model 1008A Option 006 Testmobile.

HP Model 92192A 3.5~inch Microfloppy Disks (box of ten).

Rackmount Kit (HP part number 5061-6175).

HP 16528/1653B General Information

Service Manual

l-5

Logic Analyzer

Specifications

The following specifications are the performance standards or limits against which the HP 1652B/1653B logic analyzer is tested.

Probes

State Mode

Minimum Swing: 600 mV peak-to-peak.

Threshold Accuracy olt;age Range Accuraq

-2.ov to + 2.ov t 150 mV

-9.9v to -2.N & 300 mV

-I- 2.w to -I- 9.9v t 300 mV

Clock Repetition Rate: Single phase is 35 MHz maximum (25 MHz on the HP 1653B). With time or state counting, minimum time between states is 60 ns (16.67 MHz). Both mixed and demultiplexed clocking use master-slave clock timing. The master clock must follow the slave clock by at least 10 ns and precede the next slave clock by ~50 ns.

Clock Pulse ‘Width: ~10 ns at threshold.

Setup Time: Data must be present prior to the clock transition, > 10 ns.

Hold Time: Data must be present after the rising clock transition, 0 ns.

Data must be present after the falling clock transition, 0 ns (HP 1653B). Data must be present after the falling L clock transition, 0 ns (HP 1652B). Data must be present after the falling J, K, M, and N clock transition, 1 ns (HP 1652B).

Timing Mode

Logic Analyzer Operating Characteristics

HP 1652B/1653B

Service Manual

Probes

Minimum Detectable Glitch: 5 a~ wide at the tlxe&&L

The following operating characteristics are not specifications, but are typical

operating characteristics for the HP 1652B/1653B logic analyzer. These

characteristics are included as additional information for the user..

Input RC: 100 KQ t 2% shunted by approximately 8 pF at the probe tip.

Dynamic Range: & 10 volts about the threshold.

‘ITL Threshold Preset: + 1.6 volts.

ECL Threshold Preset: -1.3 volts.

Threshold Range: -9.9 to + 9.9 volts in 0.1 volt increments.

Threshold Setting: Threshold levels may be defined for pods 1 and 2 individually (HP 1653B). Threshold levels may be defined for pods 1,2, and 3 on an individual

basis and one threshold may be defined for pods 4 and 5 (HP 1652B).

General Information

1-7

Measurement

Configurations

Minimum Input Overdrive: 250 mV or 30% of the input amplitude, whichever is

greater.

Maximum Voltage: 2 40 volts peak.

Maximum Power Available Through Cables: 600 mA at SV per cable; 2 amp @

5V per HP 1652Bl1653B.

Analyzer Configurations:

State Analysis

Analvzer 1 Timing Off State Off Timing State State Off

Channel Assignment: Each group of 16 channels (a pod) can be assigned to

Analvzer 2 Off

Timing Off State State

Timing State

Off

Analyzer 1, Analyzer 2, or remain unassigned. The HP 1652B contains 5 pods; the HP 1653B contains 2 pods.

Memory

Data Acquisition: 1024 samples/channel.

Trace Specification

Clocks: Five clocks (HP 1652B) or two clocks (HP 1653B) are available and can

be used by either one or two state analyzers at any time. Clock edges can be ORed together and operate in single phase, two phase demultiplexing, or two phase mixed mode. The clock edge is selectable as positive, negative, or both edges for each clock.

General Information

1-8

Clock Qualifier: The high or low level of four ORed clocks (HP 1652B) or one

clock (HP1653B) can be ANDed with the clock specification. Setup time: 20 ns; hold time: 5 ns.

Pattern Recognizers: Each recognizer is the AND combination of bit (0, 1, or X)

patterns in each label. Eight pattern recognizers are available when one state analyzer is on. Four are available to each analyzer when two state analyzers are on.

Range Recognizers: Recognizes data which is numerically between or on two

specified patterns (ANDed combination of zeros and/or ones). One range term is available .and is assigned to the first state analyzer turned on. The maximum size is

32 bits and on a maximum of 2 pods.

HP 16528/1653B

Service Manual

Qualifier: A user-specified term that can be anystate, nostate, a single pattern recognizer, range recognizer, or logical combination of pattern and range recogmzers.

Sequence Levels: There are eight levels available to determine the sequence of events required for trigger. The trigger term can occur anywhere in the first seven sequence levels.

Branching: Each sequence level has a branching qualifier. When satisfied, the

analyzer will restart the sequence or branch to another sequence level.

Occurrence Counter= Sequence qualifier may be specified to occur up to 65535 times before advancing to the next level.

Storage Qualification: Each sequence level has a storage qualifier that specifies the states that are to be stored.

Enable/Disable: Defines

a window of post-trigger storage. States stored in this

window can be qualified.

Prestore: Stores two qualified states that precede states that are stored.

Tagging

State Tagging: Counts the number of qualified states between each stored state. A measurement can be shown relative to the previous state or relative to trigger. Maximum count is 4.4 X (10 to the 12th power).

Time Tagging: Measures the time between stored states, relative to either the previous state or to the trigger. Maximum time between states is 48 hours.

With tagging on, the acquisition memory is halved; minimum time between states is

60 ns.

Symbols

Pattern Symbols: A mnemonic can be defined for the specific bit pattern of a

label. When the data display is SYMBOL, a mnemonic is displayed where the bit pattern occurs. Bit patterns can include zeros, ones, and don’t cares.

HP 1652B/1653B

Service Manual

Range Symbols: A mnemonic can be defmed covering a range of values. Bit pattern for lower and upper limits must be defined as a pattern of zeros and ones. When the data display is SYMBOL, values within the specified range are displayed as mnemonic + offset from the base of the range.

Number of Pattern and Range Symbols: 200 per HP 1652B/1653B.

Symbols can be down-loaded over RS-232C and HP-IB.

General Information

1-9

State Compare Mode

This mode performs a post-processing

bit-by-bit comparison of the acquired

data and the compare data image.

Compare Image: This is created by copying a state acquisition into the compare

image buffer. It allows editing of any bit in the compare image to a zero, one, or

don’t ear-e.

Compare Image Boundaries: Each channel (column) in the compare image can

be enabled or disabled via bit masks in the compare image. Upper and lower

ranges of states (rows) in the compare image can be specified. Any data bits that

do not fall within the enabled channels and the specified range are not compared.

Stop Measurement: Repetitive acquisitions may be halted when the comparison

between the current state acquisition and the current compare image is equal or not equal.

Displays: Compare Listing display shows the compare image and bit masks. The

Difference Listing display highlights differences between the current state acquisition and the current compare image.

State X-Y Chart Display

This function plots the value of the specified label on the y-axis versus states or another label on the x-axis. Both axes can be scaled by the user.

Markers: The markers are correlated to state listing, state compare, and state

waveform displays. They are available as pattern, time, or statistics (with time

counting on), and states (with state counting on).

Accumulate: Chart display is not erased between successive acquisitions.

State Waveform Display

This function displays a state acquisition in a waveform format.

States/div: 1 to 104 states.

Delay: -1023 to 1024 states.

Accumulate: The waveform display is not erased between successive acquisitions.

Overlay Mode: Multiple channels can be displayed on one waveform display line.

The primary use is to view a summary of bus activity.

Maximum Number of Displayed Waveforms: 24.

General information

I-10

HP 16528/1653B

Service Manual

Markers: The markers are correlated to state listing, state compare, and X-Y chart displays. The markers can be used for pattern, time, or statistics (with time counting on), and states (with state counting on).

Timing

Analysis

Transitional Timing Mode

A sample is stored in acquisition memory only

stored with each sample allows reconstruction covered by a full memory acquisition varies with the number of pattern changes in

the data.

Sample Period: 10 ns.

Maximum Time Covered By Data: 5,000 seconds.

Minimum Time Covered by Data: 10.24 ,US.

Glitch Capture Mode

Data sample and glitch information is stored every sample period.

Sample Period: 20 ns to 50 ms in a l-2-5 sequence dependent on seconds/division and delay settings.

Memory Depth: 512 samples/channel.

when the data changes. A time of a waveform display. Time

tag

Time Covered by Data: Sample period X 512.

Waveform Display

Sec/div: 10 ns to 100 s; 0.01% resolution.

Screen Delay: -2500 s to 2500 s. The presence of data is dependent on the number of transitions in data between the trigger and trigger plus delay (transitional timing).

Accumulate: The waveform display is not erased between successive acquisitions.

Hardware Delay: &(20 ns to 10 ms).

Overlay Mode: Multiple channels can be displayed on one waveform display line. The primary use is to view a summary of bus activity.

Maximum Number Of Displayed Waveforms: 24.

Time Interval Accuracy

Channel to Channel Skew: 4 ns typical.

HP 1652B/1653B

Service Manual

General Information

l-11

Sample Period Accuracy: 0.01% of sample period.

Measurement

and Display

Functions

Time Interval Accuracy:

2 (sample period + channel-to-channel skew +

0.01%

of time interval reading).

Trigger Specification

Asynchronous Pattern: Trigger on an asynchronous pattern less than or greater

than a specified duration. The pattern is the logical AND of a specified low, high,

or don’t care for each assigned channel. If the pattern is valid but the duration is

invalid, there is a 20 ns reset time before the instrument will look for patterns again.

Greater Than Duration: Minimum duration is 30 ns to

ms with

ns or

0.01%

resolution, whichever is greater. Accuracy is + 0 ns to -20 ns. Trigger occurs at pattern + duration.

Less Than Duration: Maximum duration is 40 ns to

ms with

ns or

0.01%

resolution, whichever is greater. Pattern must be valid for at least 20 ns. Accuracy is + 20 ns to -0 ns. Trigger occurs at the end of the pattern.

Glitch/Edge Triggering: Trigger on a glitch or edge following a valid duration of an asynchronous pattern while the pattern is still present. Edge can be specified as rising, falling, or either. Less than duration forces glitch and edge triggering off.

Autoscale (Timing Analyzer Only)

Autoscale searches for and displays channels with activity on the pods assigned to

the timing analyzer.

General Information

I-12

Acquisition Specifications

Arming: Each analyzer can be armed by the run key, the other analyzer, the oscilloscope, or the external trigger in port.

Trace Mode: Single mode acquires data once per trace specification. Repetitive mode repeats single mode acquisitions until stop is pressed or until the time interval between two specified patterns is less than or greater than a specified

value, or within or not within a specified range. There is only one trace mode when two analyzers are on.

Labels

Channels may be grouped together and given up to a six character name. Up to 20 labels in each analyzer may be assigned with up to

channels per label. The

primary use is for naming groups of channels such as address, data, and control

busses.

HP 16528/1653B

Service Manual

Indicators

Activity Indicators: Provided in the Configuration, State Format, and Timing

Format menus for identifying high, low, or changing states on the inputs.

Markers: Two markers (X and 0) are shown as dashed lines on the display.

Trigger: The trigger is displayed as a vertical dashed line in the timing waveform

display and as line 0 in the state listing display.

Marker Functions

Time Interval: The X and 0 markers measure the time interval between one point

on a timing waveform and trigger, two points on the same timing waveform, two

points on different waveforms, or two states (time tagging on).

Delta States (State Analyzer Only): The X and 0 markers measure the number of

tagged states between one state and trigger, or between two states.

Patterns: The X and 0 markers can be used to locate the nth occurrence of a

specified pattern before or after trigger, or after the beginning of data. The 0

marker can also find the nth occurrence of a pattern before or after the X marker.

Statistics: The X to 0 marker statistics are calculated for repetitive acquisitions.

Patterns must be specified for both markers and statistics are kept only when both patterns can be found in an acquisition. Statistics are minimum X to 0 time, maximum X to 0 time, average X to 0 time, and ratio of valid runs to total runs.

Run/Stop Functions

Run: Starts the acquisition of data in a

Stop: In single trace mode or the first run of a repetitive acquisition, STOP halts

specified trace mode.

the acquisition and displays the current acquisition data. For subsequent runs in repetitive mode, STOP halts the acquisition of data and does not change current display.

Data Display/Entry

Display Modes: State listing; timing waveforms; interleaved, time-correlated

listing of two state analyzers (time tagging on); time-correlated state listing and timing waveform display (state listing in upper half, timing waveform in lower half, and time tagging on).

Timing Waveform: Pattern readout of timing waveforms at X or 0 marker.

HP 16528/1653B

Service Manual

Bases: Binary, Octal, Decimal, Hexadecimal, ASCII (display only), and

User-defined symbols.

General Information

l-13

Oscilloscope

Specifications

The following specifications are the performance standards or limits against which

the oscilloscope in the HP 1652B/1653B is tested.

Vertical

Horizontal

Trigger

Oscilloscope

Operating

Bandwidth (-3 dB): dc to 100 MHz (single shot).

DC Gain Accuracy: t 3% of full scale.

DC Offset Accuracy: t (2 mV + 2% of the channel offset + 2.5% of full scale).

Voltage Measurement Accuracy (DC): (Gain accuracy + ADC resolution +

Offset accuracy).

Time Interval Measurement Accuracy: - ‘(2% X s/div + 0.01% X delta-t +

500 ps).

Sensitivity: 10% of full screen.

The following operating characteristics are not specifications, but are typical

operating characteristics for the oscilloscope in the HP 1652B/1653B. These are

included as additional information for the user.

Characteristics

VefiiCai Transition Time (10% to 90%): 5 3.5 ns.

(at BNC)

Number of Channels: 2.

HP 1652B/1653B Service Manual

Vertical Sensitivity Range: 15 mV/div to 10 V/div (1:l probe).

Vertical Sensitivity Resolution: Adjustable 2 digit resolution.

Maximum Sample Rate: 400 MSamples/second.

Analog-to-Digital Conversion: 6 bit real-time.

Analog-to-Digital Resolution: t 1.6% of full scale.

Waveform Record Length: 2048 points.

Input R: 1 MQ 2 1% or 50 Q t 1%.

Input C: Approximately 7 pF.

Input Coupling: dc.

General Information

l-15

Maximum Safe Input Voltage:

--.

1 MQ input

50 s2 input

DC Offset Range (19 Probe):

Vertical Sensitivitv

550 mV/div Ir2.ov 100 mV/div - 200 mV/div *lOV 500 mV/div - 1 Vfdiv k5OV

22 V/&v kl25V

t5 V max if input impedance is at 50 Q.

DC Offset Resolution (1:l Probe):

Vertical Sensitivitv

5 50 mV/div 200 pv

100 mVJdiv - 200 mV/div 1mV 500 mVfdiv - 1 V/div 5mV

~2 Vfdiv 25 mV or 4 digits of

& 250 V [dc + peak ac (< 10 kHz)] t5VRMS

Available Offset

Resolution

resolution, whichever

is greater

Horizontal

Probe Factors: Any integer ratio from 1:l to 1OOO:l.

Channel Isolation: 40 dB: dc to 50 MHz.

30 dB: 50 MHz to 100 MHz (with channels at equal sensitivity).

Timebase Range: 5 ns/div to 5 s/div.

Timebase Resolution:

Time/Division Setting Resolution

t < 10 ns/div t > 10 nsldiv

Delay Pre-trigger Range:

Time/Division Setting Delay

5 ns s s/div 5 500 ns 5 X (sec/div) 500 ns 5 s/div 5 5 s 2.5~s

100 ps adjustable with 3digit resolution

General Information

1-16

HP 16528/1653B

Service Manual

Delay Post-trigger Range:

Trigger

Time/Division Setting

25 ms - 5 s/div 100,~s - 25 msjdiv

5 ns - lOO&div

Triggering on either input channel, rising

Trigger Level Range: dc Offset -~5 divisions.

Trigger Level Resolution (1:l Probe):

Trieeer Level Resolution

550 mV/div

100 mV/ div - 200 mV/div

500 mV/div - 1 Vldiv

~2 Vldiv

Arming: Armed by the Run key, external BNC low input, or by Analyzer 1 or 2.

Trigger Modes

falling edge.

Available Delav

40 X (sldiv)

1s 10,000 X (s/div)

400 pv 2mV 10 mV

50 mV

Waveform

Display

Immediate:

Edge: Triggers on the rising or falling edge from channel 1 or 2.

Auto-Trigger: Self-triggers if no trigger condition is found within approximately 1 second after

Trigger Out: Arms Analyzer 1 or 2, or triggers the rear panel BNC.

Display Formats: 1 to 8 oscilloscope waveforms can be displayed.

Display Resolution: 500 points horizontally, 240 points vertically.

Display Modes

Normal: New acquisitions replace old acquisitions on screen.

Accumulate: New acquisitions are added to the screen and displayed with the previous acquisitions until a parameter is changed and a new acquisition is made.

Average: New acquisitions are averaged with older acquisitions and displayed. The maximum number of averages is 256.

Triggers immediately after the condition is met.

arming.

HP 1652B/1653B

Service Manual

General Information

1-17

Overlay: Channels 1 and 2 can be overlayed in the same display area.

Measurement

Aids

Connect-the-dots: straight lines.

Waveform Reconstruction: A reconstruction filter fills in the missing data points when the timebase is set to 5 100 ns/d.ivision or when the timebase setting is reduced to a point where there are fewer than 500 data samples on the screen.

Waveform Math: Display capability of A-B, B-A, and A + B functions is provided.

Mixed Mode: Oscilloscope plus logic analyzer displays on the same screen.

Time Markers: Two vertical markers labeled X and 0. Voltage levels are displayed for each marker. Time interval measurements can be made between any two events.

Automatic Search: Searches for a specified absolute or a positive or negative edge with count adjustable from 1

Auto Search Statistics: Displays mean, maximum, and minimum values for elapsed time from X to 0 markers for multiple runs. The number of valid runs and total number of runs are also displayed.

Trigger Level Marker: A horizontal trigger level marker is displayed in the Trace/Trigger menu only.

Provides a display of the sample

points which

percentage to 1024.

are connected

voltage level at

Automatic Measurements: The following pulse parameter measurements can be

performed automatically:

Frequency Period

v P-P Rise time

Fall time Preshoot Overshoot

+ pulse width

- pulse width

Grid: Selectable (On/Off).

Setup Aids

Autoscale: Automatically sets the vertical and horizontal ranges, offset, and trigger levels to display the input signals. This requires an amplitude above peak, and a frequency between 50 Hz and 100 MHz.

General Information

1-18

16528/1653B

Service Manual

Preset= Scales the vertical range, offset, and trigger level to predetermined values

for displaying ECL or TTL waveforms.

Interactive

Measurements

Acquisition

Mixed

Displays

beset Vertical Range TT.L* 1.5 v

ECL” 500 mV

* Values when Probe = 1O:l.

Calibration: Offset, attenuation, gain, trigger level, delay, and set to defaults.

Probe Compensation Source: The external BNC supplies a square wave signal of approximately-400 mV to -900 mV at approximately 1.25 kHz.

Oscilloscope, timing, and state can occur simultaneously or in series.

Timing channels and oscilloscope channels can be displayed on the same screen. Multiple state machine listings can be displayed with time tags on the same screen. Timing channels can be displayed with a state listing with Time Tags turned on. State listings with time tags, timing channels, and oscilloscope channels can be displayed on the same screen.

Trigger Level

1.60 V

-1.3 v

Time

Correlation

Time Interval

Accuracy

between

Modules

General

Characteristics

Operating

Environment

All modules are time correlated with the exception of when the oscilloscope is being armed by the logic analyzer, and when the oscilloscope is not in trigger immediate mode.

Equals the sum of channel to channel time interval accuracies of each machine used for a measurement.

The following general characteristics for the HP 1652B/1653B include the environment operating conditions, shipping weights, and instrument dimensions.

Temperature

Instrument: Operating: O°C to +55”C (32°F to + 131°F).

Non-operating: -4OOC to + 70°C (-40°F to + 158°F).

Probes and Cables: O°C to 65OC ( + 32°F to + 149°F).

Disk Media: 10°C to 50°C (+ 50°F to + 149°F).

HP 16528/1653B Service Manual

General Information

1-19

Power

Requirements

Weight

Humidity

Instrument: Operating: Up to 95% relative humidity (non-condensing) at

+40°C(+1040F).

Non-operating: Up to 90% relative humidity at + 65OC

(+149"F).

Disk Media: 8% to 80% relative humidity at + 40°C ( + 104°F).

Altitude

Operating: Up to 4600 meters (15,000 ft).

Non-operating: Up to 15,300 meters (50,000 ft).

Vibration

Operating: Random vibration 5 to 500 Hz, 10 minutes per axis, 0.3 g (rms) Non-operating: Random vibration 5 to 500 Hz, 10 minutes per axis, 2.41 g (rms);

Resonant search 5 to 500 Hz swept sine, 1 Octave/minute sweep rate, 0.75 g (O-peak), 5 minute resonant dwell at 4 resonances per axis.

115/230 Vat, -25% to + 15%, 48 to 66 Hz, 200 W max.

10.0 kg (22 lbs) net weight; 18.6 kg (41 Ibs) shipping weight.

mensions

J45OlC13

Refer to the outline drawing below.

1 .

Dimensions are for general information only. If dimensions are required For building special enclosures, contact your HP field engineer.

2. Dimensions are in millimetres and (inches).

194.3

(7.65”)

Figure 1-l. HP 16528/1653B Dimensions

NOTES

425.4 (16.75”)

General Information

l-20

HP 1652B/1653B

Service Manual

Recommended

Test Equipment

Instrument

Table l-1 lists the test equipment required to test performance, make adjustments,

and troubleshoot the HP 1652B/l653B Logic Analyzer. The table includes the

critical specifications of the test equipment and lists each procedure in which the equipment is required. Other equipment may be substituted if it meets or exceeds the critical specifications listed in the table.

Table l-1. Recommended Test Equipment

Recommended

Critical Specifications

Model

Use*

Oscilloscope

Pulse Generator

Signal Generator

Power SUPPlY

DC Power SUPPlY

Digital Voltmeter

dual channel dc to 300 MHz

5 ns pulse width 20 ns period

1.3 ns risetime double pulse 100 kHz Repetition Rate Overshoot: 5% of Amp.

Risetime 5300 ps Picosecond Pulse A

Frequency: 100 kHz to 300 MHz HP 8656B P

Output Accuracy: -+l dB

210.2 v output HP 6216C P

current: 0 to 0.4 amperes

Range: t 100 mV to t5 V HP 6114A

Accuracy: 20.1%

5.5 digit resolution HP 3478A Accuracy: 20.025%

HP 545024:

HP 816WO20 P

Labs 2700C

PAT

p, A

Power Meter/ Power Sensor

Power Splitter

Adapter

* P = Performance Tests A = Adjustments

HP 1652B/1653B

Service Manual

1 to 500 MHg -70 dBm to 0 dBm, -~1.2% HP 436A/

50 ohms type N, outputs differ by < 0.15 dB HP 11667A P

Type N male to BNC female (qty. 2)

HP 8482A

HP Part Number P

1250-0780

T = Troubleshooting

General Information

1-21

Instrument

Table l-l. Recommended Test Equipment (Continued)

Recommended

Critical Specifications

Model

Use*

Adapter

Power Supply Cable

BNC Cable (male-to-male) 4%inch (Qty 2)

Cable

BNC Tee lM,2F (Qty 2)

Coupler

Type N male to BNC male

BNC(female)-to-Dual Banana

50 ohm feedthrough (Qty 2)

No Substitute

Banana (male)-to-Banana (male) (Qty 2)

Type N (male) 240inch

BNC male-to-male (Qty 2)

HP Part Number

1250-0082

HP Part Number

1251-2277

HP 101OOC

54503-61604

HP 10503A

11000-60001

HP 11500B ’ P

HP Part Number P

1250-0781

HP 1250-0216 P

P, A

p, A P,A

Resistor

2 Ohms, 25 Watts

HP Part Number

0811-1390

* P = Performance Tests A = Adjustments T = Troubleshooting

General Information

I-22

16528/1653B

Service Manual

Contents

Section 2:

Installation Introduction

Safety Considerations

InitialInspection......................................................2- 1

Operating Disk Installation Power Requirements Line Voltage Selection

Power Cable .........................................................

Applying Power

User Interface

HP-IBInterfacing .....................................................

HP-IB AddressSelection

RS=232=CInterface....................................................2- 7

RS-232-C Configuration Degaussing the Display Operating Environment Storage and Shipment

TaggingforService....................................................2- 9

OriginalPackaging.. ................................................

OtherPackaging.. .................................................

Cleaning Requirements

..........................................................

.................................................. 2-1

............................................. 2-l

..................................................

.................................................

......................................................

........................................................

..............................................

............................................... 2-7

................................................ 2-9

........ ‘. .. ;

................................................. 2-9

............................................... 2-10

.................................... 2-9

2-l

2-1 2-2

2-3

2-5 2-5 2-6

..2- 9

..2-10

Installation

Introduction

Safety Considerations

Initial Inspection

This section of the manual contains information and instructions necessary for setting up the HP 1652B/l653B Logic Analyzer. This includes inspection procedures, power requirements, hardware connections and configurations, and packaging information.

The safety symbols used with Hewlett-Packard instruments are illustrated in the front of this manual. WARNING and CAUTION symbols and instructions should be reviewed before operating the instrument. These warnings and cautions must be followed for your own protection and to avoid damaging the instrument.

Inspect the shipping container for damage. If the shipping container or cushioning material is damaged, keep it until the contents of the shipment have been checked for completeness and the instrument has been checked mechanically and electrically. The contents of the shipment are listed under “Accessories Supplied” inSection 1. If the contents are incomplete, if there is mechanical damage or defect, or if the instrument does not operate properly, notify the nearest Hewlett-Packard office. If the shipping container is damaged, or the cushioning materials show signs of stress, notify the carrier as well as the Hewlett-Packard

office. Keep the shipping materials for the carrier’s inspection. The Hewlett-Packard office will arrange for repair or replacement at HP option without waiting for claim settlement.

Operating Disk Installation

Power Requirements

Caution

HP 1652B/1653B Service Manual

The instrument is shipped with a yellow protective disk in the disk drive. Before applying power to the instrument, remove the protective disk from the disk drive and install the operating system disk. Reinstall the protective disk whenever the instrument is to be transported.

The HP 1652B/1653B Logic Analyzer requires a power source of either 115 Vat or 230 Vat, -22% to + lo%, single phase, 48 to 66 Hz, 200 Watts maximum power.

BEFORE CONNECTING POWER TO THIS INSTRUMENT, be sure the Line Voltage Select switch on the rear panel of the instrument is set properly and the correct fuse is installed.

Installation

2-1

Line Voltage

Selection

When shipped from the factory, the line voltage selector is set and an appropriate fuse is installed for operating the instrument in the country of destination.

To operate the instrument from a power source other than the one set at the factory:

1. Turn the rear power switch to the OFF position and remove the power cord from the instrument.

2. Remove the fuse module by carefully prying at the top center of the module until you can grasp it and pull it out by hand (see figure 2-l).

LINE FILTER SWITCH ASSEMBLY

0 1650E82

Figure 2-1. Removing the Fuse Module

Installation HP 16528/1653B

2-2

Service Manual

3. Reinsert the fuse module with the arrow for the appropriate line voltage

aligned with the bar on the line filter assembly switch (see figure 2-2).

Power Cable

Applying Power

115v

3.0 A FUSE

Figure

Reconnect the power cord, turn the rear power switch to the ON position,

2-2.

Fuse Module Settings

230V

3.0 A FUSE

and continue normal operation.

This instrument is equipped with a three-wire power cable. When connected to an appropriate AC power outlet, this cable grounds the instrument cabinet. The type of power cable plug shipped with the instrument depends on the country of destination. See Table 2-1 for the option numbers of available power cables and plug configurations.

When power is applied to the HP 1652B/1653B, a power-up self test is automatically performed. For information on the power-up self test, refer to section 3.

1652B/1653B

Service Manual

Installation

2-3

Table 2-l. Power Plug Cord Configurations

Singapore

Straight (Shielded>

India (Unpolarized

in many nations)

Taiwan

United States and

Canada only

*Part number shown for plug is industry identifier for plug only. Number shown for cable is HP part number for

complete cable including plug.

c+These cords are included in the CSA certification approval of the equipment.

E=:“;Lh Ground N3d”M

Installation

2-4

1652B/1653B

Service Manual

User Interface

The front-panel user interface of the HP 1652B/l653B consists of the front-panel

keys, the KNOB, and the display. The interface allows you to configure the logic analyzer, each analyzer (machine) within the logic analyzer, and the oscilloscope in the logic analyzer.

It also displays acquired data and measurement results.

Using the front-panel interface is a process of:

selecting the desired menu with menu keys.

placing the cursor on the desired field within the menu by rotating the KNOB.

displaying the field options or current data by pressing the SELECT key.

selecting the desired option by rotating the KNOB or entering new data by

using the KNOB or the keypad.

Starting and stopping data acquisition by using the RUN and STOP keys.

For additional information on the user interface refer to the HP 1652B/1653B

Front-Panel Operation Reference manual.

HP-IB Interfacing

The Hewlett-Packard Interface Bus (HP-IB) is Hewlett-Packard’s implementation of IEEE Standard 4884978, “Standard Digital Interface for Programming Instrumentation.” HP-IB is a carefully defined interface that simplifies the integration of various instruments and computers into systems. The interface makes it possible to transfer messages between two or more HP-IB compatible devices. HP-IB is a parallel bus of 16 active signal lines divided into three functional groups according to function.

Eight signal lines, called data lines, are in the first functional group. The data lines

are used to transmit data in coded messages. These messages are used to program the instrument function, transfer measurement data, and coordinate instrument operation. Input and output of all messages, in bit parallel-byte serial form, are also transferred on the data lines. A 7-bit ASCII code normally represents each piece of data.

Data is transferred by means of an interlocking “Handshake” technique which permits data transfer (asynchronously) at the rate of the slowest active device used in that transfer. The data byte control lines coordinate the handshaking and form the second functional group.

The remaining five general interface management lines (third functional group)

are used to manage the devices connected to the HP-IB. This includes activating all connected devices at once, clearing the interface, and other operations.

The connections to the HP-IB connector on the rear panel are shown in figure 2-3.

HP 1652B/1653B Service Manual

Installation

2-5

0101 0102 D103 D104

EOI

DAV NRFD NDAC

IFC (BCL)

SRQ

ATN (MRE >

SHIELD

D105 0106 D107 D108 REN P/O TWISTED PAIR WITH 6 P/O TWISTED PAIR WITH 7 P/O TWISTED PAIR WITH 8 P/O TWISTED PAIR WITH 9 P/O TWISTED PAIR WITH 10 P/O TWISTED PAIR WITH

SIGNAL GROUND

SHOULD BE GROUNDED NEAR TERMINATION OF

OTHER WIRE OF TWISTED PAIR

HP=IB Address

Selection

01652~65

TYPE 57 MICRORIBBON CONNECTOR

Figure 2-3. HP-IB Interface Connector

Each instrument connected to the HP-IB interface bus requires a unique address. The address provides a method for the system controller to select individual instruments on the bus. The address of the HP 1652B/1653B defaults at power up to decimal “07.” ‘To change the address of the HP 1652B/1653B proceed as follows:

1. Press the I/O key on the front-panel keypad and the I/O menu will appear on

screen.

2. Rotate the KNOB until “I/O Port Configuration” is highlighted.

3. Touch the SELECT key and the External I/O Port Configuration menu will appear on screen.

External II0 Port Conliguration

1 Printer

connected to [RS-232-C]

RS-232-C

Configuration

Protocol : [piEm6Fq Stop Bits : I] Parity ’ jNone]

Baud rate * 11

Data Bits : 8

Control I et- connected to [HpIel

HP16 Configuration

HP18 Address : rj

(Done)

Installation

2-6

Psinter Information

Pr lnter :lLaserJet]

Paper ufdth : w]

Figure 2-4. External l/O Port Configuration Menu

4. Select the HP-IB Address field with the KNOB and press the SELECT key.

5. When the pop-up field appears on screen, rotate the KNOB to select the desired HP-IB address.

HP 16528/1653B

Service Manual

6. Touch the SELECT key to enter the new address.

7. Select the DONE field in the upper-right corner of the menu using the KNOB and SELECT key to exit the External I/O Port Configuration menu.

RS=232-C Interface

RS-232-C

Configuration

The HP 1652B/1653B interfaces with RS-232-C communication lines through a standard 25 pin D connector. The HP 1652B/1653B is compatible with RS-232-C protocol. When a hardwire handshake method is used, the Data Terminal Ready (DTR) line (pin 20 on the Computer/Modem connector) is used to signal whether space is available for more data in the logical I/O buffer. Pin outs of the RS-232-C connectors are listed in table 2-2.

At power up, the RS-232-C interface is configured as shown in figure 2-5. To

change the RS-232-C configuration:

1. Press the I/O key on the front-panel keypad and the I/O menu will appear on

screen.

2. Rotate the KNOB until “I/O Port Configuration” is highlighted.

3. Touch the SELECT key and the External I/O Port Configuration menu will appear on screen.

External

I/O

Port Configuration

Printer connected to [Rs-232-C] Controller connected to IHPIBj

RS-232-C Configuration

Protocol : IXON/XOFF] Stop Bits : VI Parity 1 [ None 1 Baud rate 1 1 9600 1

Data Bits : B

HP18 Configuration

HPIB Address : 171

(TKZ-)

HP 1652B/1653B Service Manual

Psinter Inlomation

Printer : lLsserJet] Paper uldth : 18.5”

Figure 2-5. External I/O Port Configuration Menu

4. Using the KNOB and SELECT key, configure the RS-232-C interface as

desired.

5. Select the DONE field in the upper-right corner of the menu using the KNOB and SELECT key to exit the External I/O Port Configuration menu.

Installation

2-7

Pin No. Function

Table 2-2. RS-232-C Signal Definitions

RS-232-C Standard Signal Direction and Level

1 Protective Ground

Transmitted Data (TD)

Received Data (RD) BB Data to Mainframe

Request to Send (RTS) CA Signal from Mainframe

5 Clear to Send (CTS)

6 Data Set Ready (DSR)

7 Signal Ground 8 Data Carrier Detect (DCD)

AI3

Not applicable Data from Mainframe

High = Space = “0” = + 12 V

Low = Mark = “1” = -12 V

High = Space = “0” = + 3 V to + 25 V Low = Mark = “1” = -3 V to -25 V

High=ON= +12V Low = OFF = -12v

Signal to Mainframe

High = ON = +3Vto +12v

=oF+F=

Low

-3 v to -25 v

Signal to Mainframe

High = ON =

+3Vto +25v

Low = OFF = -3 V to -25 V Not applicable Signal to Mainframe

= ON =

High

+3Vto +25V

Low = OFF = -3 V to -25 V

23 Data Signal Rate Selector

Installation 2-8

Data Terminal Ready (DTR) CD Signal from Mainframe

High=ON= +12V Low = OFF = -12 v

CHIC1 Signal from Mainframe

Always High = ON = + 12 V

HP 16528/1653B

Service Manual

Degaussing the Display -

If the instrument has been subjected to strong magnetic fields, the CRT may

become magnetized and display data may become distorted. To correct this

condition, it may be necessary to degauss the CRT with a conventional external

television type degaussing coil.

Operating

Environment

Storage and Shipment

Tagging for Service

The operating environment for the HP 1652B/1653B is described in section 1 of this manual. Note the non-condensing humidity limitation. Condensation within the instrument cabinet can cause poor operation or malfunction. Protection should be provided against temperature extremes which cause condensation within the instrument.

The HP 1652B/1653B will operate at all specifications within the temperature and humidity range given in section 1 of this manual.

The instrument may be stored or shipped in environments within the following

limits:

Temperature: -40° c to + 75O c. Humidity: Up to 90% at 65O C.

Altitude: Up to 15,300 meters (50,000 feet).

If the instrument is to be shipped to a Hewlett-Packard office for service or repair, attach a tag to the instrument identifying the owner, address of the owner, complete instrument model and serial numbers, and a description of the service

reauired.

Original Packaging

HP 1652B/1653B Service Manual

If the original packaging material is unavailable or unserviceable, materials identical to those used in factory packaging are available through Hewlett-Packard

offkes. If the instrument is to be shipped to a Hewlett-Packard office for service, attach a tag identifying the owner, address of the owner, complete instrument model and serial numbers, and a description of the service required. Mark the container FRAGILE to ensure careful handling. In any correspondence, refer to the instrument by model number and full serial number.

Installation

2-9

Other

Packaging

The following general instructions should be followed for repacking the instrument with commercially available materials.

Remove the disk from disk drive and install a yellow shipping disk. Wrap the instrument in heavy paper or plastic. Use a strong shipping container. A double-wall carton made of 350 lb. test

material is adequate. Use a layer of shock-absorbing material 70 to 100 mm (3 to 4 inches) thick

around all sides of the instrument to provide firm cushioning and prevent

movement inside the container. Protect the control panel with cardboard. Seal the shipping container securely. Mark the shipping container FRAGILE to ensure careful handling. In any correspondence, refer to the instrument by model number and serial

number.

Cleaning

Requirements

Use MILD SOAP AND WATER to clean the HP 1652B/1653B cabinet and front panel. Care must be taken to not use a harsh soap which may damage the water-base paint finish of the instrument.

--1

Installation

2-10

HP 16528/1653B

Service Manual

Contents

Section 3:

Performance Tests

Introduction . . ........................................................ 31 -

Recommended Test Equipment ......................................... 3-1

Test Record . . - ........................................................ 31

SelfTests .......................................................... ..3- 1

Power-up Self Test 32 - .... .............................................

Selectable Self Tests - ...... .......................................... 32

Performance Test Interval .............................................. 3-3

Performance Test Procedures - .......................................... 33

Logic Analyzer Performance Tests ............ .......................... 3-5

Test Connector 35 - ...... ..............................................

Clock, Qualifier, and Data Inputs Test 1 ............................... 3-6

Clock, Qualifier, and Data Inputs Test 2 .............................. 3-11

Clock, Qualifier, and Data Inputs Test 3 (HP 1652B Only) ............... 3-15

Clock, Qualifier, and Data Inputs Test 4 .............................. 3-18

Clock, Qualifier, and Data Inputs Test 5 .............................. 3-21

Clock, Qualifier, and Data Inputs Test 6 .............................. 3-24

Glitch Test ....................................................... 3-27

Threshold Accuracy Test ........................................... 3-31

Oscilloscope Performance Tests ....................................... 3-35

Input Resistance Test .............................................. 3-35

Voltage Measurement Accuracy Test ................................. 3-37

DC Offset Accuracy Test ........................................... 3-42

Bandwidth Test ................................................... 3-45

Time Measurement Accuracy Test ................................... 3-48

Trigger Sensitivity Test ............................................. 3-51

Performance Tests

Introduction

Recommended

Test Equipment

Test Record

Self Tests

The procedures in this section test the instrument’s electrical performance by using the specifications listed in section 1 as the performance standards. All tests may be performed without access to the interior of the instrument.

Equipment required for the performance tests in this section are listed in the Recommended Test Equipment table in section 1. Any equipment that satisfies the critical specification listed in the table may be substituted for the recommended model.

The results of the performance tests may be tabulated on the Performance Test Record provided at the end of this section. The Performance Test Record lists the performance tests and provides an area to mark whether the test passed or failed. The results recorded in the table at incoming inspection may be used for later comparisons of the tests during periodic maintenance, troubleshooting, and after repairs or adjustments.

The power-up self test is automatically performed upon applying power to the logic analyzer. Self tests do not require test equipment and may be performed

individually to provide a higher level of confidence that the instrument is operating properly. A message that the instrument has failed the test will appear if any problem is encountered during the test. The individual self tests may be performed for functions listed in the self test menu which is invoked via the I/O menu. Since the HP 1652B/1653B self test is located on the Performance Verification disk, you must have the Performance Verification disk installed to run the tests.

HP 16528/1653B Service Manual

Performance Tests

3-1

Power-up

Self Test

The power-up self test is automatically invoked at power-up of the HP 1652B/1653B Logic Analyzer. The revision number of the operating system firmware is given in the upper right of the screen during the power-up self test.

each test is completed, either “passed” or “failed” will be printed in front of the

name of the test in this manner:

PERFORMING POWER-UP SELF TESTS

passed ROM test passed RAM test passed Interrupt test passed Display test passed Keyboard test

passed Acquisition test passed Threshold test passed Disk test

LOADING SYSTEM FILE

As indicated by the last message, the HP 1652B/1653B will automatically load from

the operating system disk in the disk drive. If the operating system disk is not in

the disk drive, the message “SYSTEM DISK NOT FOUND” will be displayed at the bottom of the screen and “NO DISK” will be displayed in front of disk test in place of “passed”.

Selectable Self

Tests selectable self tests are:

If the message “SYSTEM DISK NOT FOUND” appears on screen, insert the operating system disk into the disk drive, and press any front-panel key.

Eight self tests may be invoked individually via the Self Test menu. The eight

Analyzer Data Acquisition

Scope Data Acquisition

a RS-232-C

BNC

Keyboard

ORAM

ROM

Disk Drive

a Cycle through tests

After entering the I/O Self Tests menu, the required test is selected by moving the cursor to the test and pressing the front panel SELECT key. A pop-up menu appears with a description of the test to be performed. The self test does not begin until the cursor is placed on Execute, Single test, or Repetitive test and the front panel SELECT key is pressed.

After the test has been completed, either “Passed”, “Failed”, or “Tested” will be displayed on the Self Test menu in front of the test. These self tests are used as

troubleshooting aids. For more information, refer to section 6.

Performance Tests

3-2

HP 16528/1653B

Service Manual

,--

Performance

Test Interval

Periodic performance verification of the HP 1652B/1653B is required at two year intervals. The instrument’s performance should be verified after it has been serviced, or if improper operation is suspected. Calibration should be performed before any performance verification tests. Further checks requiring access to the interior of the instrument are included in the adjustment section, but are not required for the performance verification.

Performance

Test

Procedures

Au performance tests should be performed at the instrument’s environmental operating temperature and after a 15 minute warm up. The performance tests for the HP 1652B/1653B are separated into two sections. The first section contains the performance verification tests for the logic analyzer portion of the HP 1652B/1653B and the second section contains the performance verification tests for the oscilloscope portion. Procedures are based on the model or part number for the recommended equipment.

HP 16528/1653B Performance Tests Service Manual 3-3

Logic Analyzer Performance

Tests

These procedures test the electrical performance of the logic analyzer by using the specifications in section 1 as the performance standards. All tests may be performed without access to the interior of the instrument. Results of performance tests may be tabulated in the Performance Test Record at the end of this section.

Test

COnneCtOt’ The logic analyzer performance tests and adjustments require connecting the pulse

generator outputs to probe pod inputs. Figure 3-l is a test connector that may be built to allow testing of multiple channels (up to eight at one time). The test

connector consists of a BNC connector and a length of wire. Connecting more than eight channels to the test connector at a time will induce loading of the circuit and true signal representation will degrade. Test results may not be accurate if

more than eight channels are connected to the test connector. The Hewlet .&Packard part number for the BNC connector

12504032. An equivalent part may be used in place of the H Iewlett

01650E38

figure 3-1 is

-Packard part.

Figure 3-l. Test Connector

For quicker connection without the use of grabbers, a test connector may be built as shown in figure 3-2 to allow testing of multiple channels (up to eight at one time). The test connector consists of a BNC connector and a 2-by-8 Berg connector. The Hewlett-Packard part number for the BNC connector in figure 3-2 is 1250-1032 and the Hewlett-Packard part number for the 2-by-8 Berg connector is 1252-1816. Equivalent parts may be used in place of the Hewlett-Packard parts.

JUMPER WIRE

HP 16528/1653B

Service Manual

GRAY

SIGNAL LEAD

> /H Q

BNC BULKHEAD CONNECTOR

‘BERG CONNECTOR

BLkCK

GROUND PROBE

0165X 10

Figure 3-2. Test Connector Using Berg Connector

Performance Tests

3-5

Clock, Qualifier,

_-...

and Data Inputs

Test 1

Description:

This test verifies the setup and hold times for the falling edge of the HP 1652B L clock specification, and the falling edge of the HP 1653B J and K clock specification. This test also verifies the maximum clock rate with counting mode on.

Specification:

Clock repetition rate: With time or state counting mode on, minimum time

between states is 60 ns. Setup time: Data must be present prior to the clock transition, > 10 ns.

*HP 1652B hold time: Data must be present after the falling edge of the L clock

transition, 0 ns. HP 1653B hold time: Data must be present after the falling edge of the J and K

clock transition, 0 ns.

Equipment Required:

Pulse Generator .......................... HP 8161 A/O20

Oscilloscope ............................ HP 54502A

50 Ohm Feedthrough (2) ................... HP IOlOOC

Test Connector (2) ........................ see figure 3-l and 3-2

BNC m-m Coupler (2) ..................... HP 1250-0216

BNC Cable (2) ........................... HP 10503A

BNCTeem-f-f (2) ......................... HP1250-0781

Note

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3-3.

OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER

CLK BIT

DATA BITS 2 D

GND

FIGURE

3-l ,

Figure 3-3. Setup for Data Test 1

In this setup, only eight channels are tested at one time to minimize loading. The

ground lead must be connected to ensure accurate test results.

01650849

Performance Tests HP 1652B/1653B 3-6 Service Manual

2. Adjust the pulse generator for the output in figure

I+-- 60NS ---WI

DATA,OUTPUT A + 10NS

CLOCK OUTPUT B

L ----

0165CM’lO

3-4.

----

3.2v

Figure

Setting for HP

3-4.

Waveform for Data Test

8161A:

Parameter Output A Output B

Input Mode Period (PER) Width (WID)

Norm

ns ---

IO ns

Leading Edge (LEE) 1 ns

Trailing Edge (TRE)

High Level (HIL)

3.2 V 3.2

Low Level (LOL) ov ov Delay (DEL) 0 ns 0 ns Output Mode

Assign the pod under test to

ENABLE ENABLE

Analyzer 1 in

m-m

the

System Configuration

as in figure 3-5. Refer to steps a through c if you are unfamiliar with menus.

Unassl

;tkz tinal yrer

HP 1652B/1653B

Service Manual

Figure

3-5.

*System Configuration for Data Test

a. Move the cursor to the Type field of

b. Set the analyzer Type to

c. Move the cursor to the

State

using the cursor and the SELECT key.

Pod

to be tested and assign it to

Analyzer 1

and press SELECT.

Machine 1.

Performance Tests

3-7

4. In the State Format Specification assign the Clock Period to > 60 ns. Also assign the lower 8 channels of the pod under test to a label as shown in

figure

3-6. If you are testing the HP 1652B, assign the falling edge of the L clock for all pods. If you are testing the HP 1653B, assign the falling edge of the J clock for all pods. Refer to steps a through c if you are unfamiliar with the menus.

L-1. State Format Speclf ica tlon (Specify Symbols 1

Clock

[ LJ

Cl ock Period

1-1

Clctlvity )

Label Pal

POD I

-off-

-offQff-

-off-

-Dff-

-Dffdff-

-Dff-

Pod 1

-1

Figure 3-6. Format Specification for Data Test 1

a. Press the front-panel FORMAT/CHAN key.

b. Move the cursor to Clock field. Then use the cursor and SELECT

key to assign the falling edge of the appropriate clock as in figure 3-7.

te Fonra t Speclf lea tlon Specify Symbols

Clock Per

/ [>J

10d

Activity )

Label Pal

Pod 1

Figure 3-7. Clock Assignment for Data Test 1

Performance Tests 3-8

HP 1652B/1653B

Service Manual

c. Move the cursor to the bit assignment field and turn on the appropriate

eight bits to be tested (* = on; . = off) as in figure 3-8.

Clock Period

1601

Activity ) ,,,,,,,,SS$SS5$$

Label Pol 15 . . . . 87 . . . . 0

Pod 1

,.+*+++++*

ation

Specify Symbols

Figure 3-8. Bit Assignment for Data Test 1

5. Set up the State Trace Specification without sequencing levels and set Count States as in fimre 3-9. Refer to stem a through c if vou are

unfamiliar with men&.

SJJ- S ts te Trace Speclf lcation

Trace mode ISingte

While storing y any state”

Trigger on “a” I times

Store Y any state”

Base )

-1 pcGT/

Label )

Sequence Levels

firmed by

1 Run 1

l3ranches

1 Off ]

Count

[ States 1

Pres tore

1 Off 1

HP 16528/1653B

Service Manual

Figure 3-9. Trace Specification for Data Test 1

a. Press the front-panel TRACE/TRIG key. b. Move the cursor to Count and press SELECT. c. Move the cursor to States, press SELECT, and set it to any state by

pressing SELECT again.

Performance Tests

3-9

Note !b

6. Press RUN. The State Listing is displayed and shows Fs for the channels

under test as in figure 3-10.

w] - IState Listing 1

tlarkers 1 Off ]

Label >

Base )

+oooo +ooo 1 +0002 +0003 +0004 +ooos WOO6

t+ooo7J

+oooe +0009 +oOlO

MO11 HI012 +0013 MO14 +oOlS

Figure 3-10. State Listing for Data Test 1

To ensure a consistent pattern of Fs in the listing, use the front-panel ROLL field and knob to scroll through the State Listing.

FF FF FF FF FF

FF FF FF FF FF FF FF FF FF FF FF

0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

7. If you are testing the HP 1653B, connect the K clock of Pod 2 to the test connector and repeat steps 4 and 6 for the falling edge of the K clock.

8. Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested. Take care not to

dislodge grabbers from the test connector. If you are testing the HP 1653B, reassign the falling edge of the J clock.

9. Repeat steps 3,4,6 and 7 until all of the pods have been tested.

10. Disconnect the lower eight bits (bits 0 through 7) from the test connector and attach the upper eight bits (bits 8 through 15) to the test connector.

11. Repeat steps 3,4,6,7 and 8 until the upper bits of all pods have been tested.

Performance Tests HP

16528/1653B

3-10 Service Manual

Clock, Qualifier,

and Data Inputs

Test 2

Description: This test verifies the setup and hold time specification for the rising edge transition

of all of the clocks on the HP 1652B/l653B.

Specification: Setup time: Data must be present prior to the clock transition, > 10 ns. Hold time: Data must be present after the rising clock transition, 0 ns.

Equipment Required:

Pulse Generator

Oscilloscope ............................ HP

Ohm Feedthrough (2)

..........................

...................

HP 8161A/O20

54502A

HP IOlOOC

Test Connector (2) ........................ see figure 3-1 and 3-2

BNC m-m Coupler (2) BNCCable (2)

........................... HP 10503A

.....................

HP 1250-0216

BNCTee m-f-f (2) ......................... HP 1250-0781

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3.11.

FIGURE

3-l

CLK BIT

FIGURE ’

3-l

8 EB

01650849

1652B/1653B

Service Manual

Figure 3-l 1. Test Setup for Data Test 2

lnthiss t

e up, only eight channels are tested at one time to minimize loading. The

ground lead must be connected to ensure accurate test results.

Performance Tests

3-11

2. Adjust the pulse generator for the output in figure 3-12.

DATA,OUTPUT A

CLOCK OUTPUT B

10NS+ 4

+--28.5~s

----

0165OWll

3.2v

Figure

3-12.

Waveform for Data Test

Setting for HP 816lA: Parameter

Input Mode Period (PER)

16528

1653B

Width (WID)

Leading Edge (LEE)

Trailing Edge (TRE) 1 ns

High Level (HIL) Low Level (LOL) ov Delay (DEL) 0 ns

Output Mode

Assign the pod under test to

Output A Output B

Norm

28.5

40.0

3.2

ENABLE ENABLE

Analyzer 1 in

m-w w-w

m-m

1 ns

3.2

V ov 0 ns

the

System Configuration

the previous test figure 3-5.

In the

State Format Specification

assign the rising edge of the J clock to the

assign the

Clock

Clock Period

field. Also,

8 channels of the pod under test to a label as in figure 3-13.

S late Form t Speclf lea tlon

Clock

Jt 1

Specify Symbols

as in

to < 60 ns, and

assign the lower

Performance Tests

3-12

Activity ) ,,,,,,,,s2stszt3

Label Pal 15 . . . . 87 . . . . 0

a [ . . . . . .

Figure

3-13.

*,+++*+*+a

Format Specification for Data Test 2

HP 1652B/1653B

Service Manual

5. Set the State Trace Specification without sequencing levels and set Count to Off as in figure 3-14.

-II- S ts te Trace Speclf ica tlon

Trace mode~l

Whrie storing *) any state”

Trigger on ueN I times

Store y any s to te”

Label >

Base >

a b

poDI1 piiq

I I lzirl I

Sequence Levels

* Armed by

1 Run ]

Branches

1 Of1 1

Count

1 Olf J

Prestore

1 Off ]

Figure 3-14. Trace Specification for Data Test 2

6. Press RUN. The State Listing is displayed and lists all OS for the channels under test as in figure 3-15.

WI- [State Listing ] tlarkers 1 Off 1

+OOOO 00 +ooo 1 00

0---

+0002 00 woo3 00 MO04 00 +ooos 00 +0006 00

pzz5.j 00

+oooe 00 +0009 00 +oOlO 00 +OOll 00 +0012 00 +0013 00 MO14 00 +oOlS 00

Figure 3-15. State Listing for Data Test 2

To ensure a consistent pattern of OS in the listing, use the front-panel ROLL field

Note !b

and knob to scroll through the State Listing.

HP 16528/1653B

Service Manual

Performance Tests

3-13

7. Connect the next clock to the test connector and repeat steps 4 and 6 for the appropriate clock. Repeat these steps until all clocks have been tested (clocks J, K, L, M and N).

8. Remove the probe tip assembly from the logic analyzer probe cable and

attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector.

9. Repeat steps 3,4,6, and 7 until the lower bits of all pods (pods 1 through 5)

have been tested with all clocks.

10. Disconnect the lower eight bits (bits 0 through 7) from the test connector. Attach the upper eight bits (bits 8 through 15) to the test connector and

repeat steps 3,4,6,7, and 8 until the upper bits of all pods (pods 1 through 5)

have been tested with all clocks.

Performance Tests

3-14

HP 16528/1653B

Service Manual

Clock, Qualifier,

and Data Inputs

Test 3

(HP 1652B Only)

Description: This performance test verifies the hold time specification for the falling clock

transitions of the J, K, M, and N clock on the HP 1652B.

Specification:

HP 1652B Hold time: Data must be present after the falling J, K, M, and N clock

transition, 1 ns.

Equipment Required:

Pulse Generator

..........................

HP 8161AJO20

Oscilloscope ............................ HP 54502A

50 Ohm Feedthrough (2)

Test Connector (2)

BNC m-m Coupler (2) BNC Cable (2) BNC Tee m-f-f (2)

...........................

.........................

................... HP IOlOOC

........................

see figure 3-1 and 3-2

..................... HP 1250-0216

HP 10503A HP 1250-0781

Procedure:

1. Connect the HP 1652B and test equipment as in figure 3-16.

4l4l

LOGIC ANALYZER

Note m

HP 1652B/l6538

Service Manual

Figure 3-16. Setup for Data Test 3

In this setup, only eight channels are tested at one time to minimize loading. The ground lead must be connected to ensure accurate test results.

Performance Tests

3-15

2. Adjust the pulse generator for the outputs in figure 3-17.

Z8.5NS4

----

01650w12

CLOCK OUTPUT B

DATA,OUTPUT A

10NS+ 4

+ 57NS --+

llNS+ +

. ----

Figure 3-17. Waveform for Data Test 3

Setting for HP 8161A:

3.2V

Parameter Input Mode

Period (PER)

Width (WID)

Leading Edge (LEE)

Trailing Edge (TRE)

High Level (Hit) Low Level (LOL) Delay (DEL) Double Pulse (DBL) Output Mode

3. Assign the pod under test to

Output A Output B Norm

57 ns

w-m

B-B

1 ns 1 ns

ns 1 ns

3.2

3.2 V

ov ov 0 ns

---

28.5

ENABLE ENABLE

Analyzer 1 in

the

System Configuration

the previous figure 3-5.

In the

State Format Specification

and the falling edge of J clock to the

menu assign the

Clock

field. Also, assign the lower 8

Clock Period

to < 60 ns,

channels of the pod under test to a label as in the previous test figure 3-13.

Set the

State Trace Specification

without sequencing levels and set

Off as in the previous test figure 3-14.

Press RUN. The

State Listing

is displayed and lists alternating Fs and OS as

in figure 3-18.

as in

Count

Performance Tests

3-16

[iI - IState Listinq ]

tlarkers 1 Off ]

Label >

ease )

+oooo +ooo 1 +Qooz +0003 +0004 +oOOS +0006

I+ooolj

+0008 +0009 +QOlO +oOll +0012 Ml013 MO14 +0015

Figure

FF 00 FF 00 FF 00 FF 00 FF 00 FF

00 FF 00 FF

3-18.

State Listing for Data Test

16528/l 6538

Service Manual

Note

To ensure a consistent pattern of alternating Fs and OS, use the front-panel ROLL

field and knob to scroll through the State Listing.

Connect the next clock to the test connector and repeat steps 4 and 6 for the appropriate clock. Repeat these steps until the J, K, M, and N clocks have

been tested. Remove the probe tip assembly from the logic analyzer probe cable and

8 .

attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector. Repeat steps 3,4,6, and 7 until all pods have been tested (pods 1 through 5).

Disconnect the lower eight bits (bits 0 through 7) from the test connector.

Attach the upper eight bits (bits 8 through 15) to the test connector. Then repeat steps 3,4,6,7, and 8 until the upper bits of all pods have been tested

(pods 1 through 5).

HP 16528116538 Service Manual

Performance Tests

3-17

Clock, Qualifier,

Description:

and Data ‘nputs

Test 4

This test verifies the

minimum swing voltages of the input probes and the

maximum clock rate of the HP 1652B/1653B when it is in the single phase mode.

Specification: Minimum swing: 600 mV peak-to-peak. Clock repetition rate: Single phase is 35 MHz maximum (25 MHz maximum for

the HP 1653B).

Clock pulse width: > 10 ns at threshold.

Equipment Required:

Pulse Generator ......... .’

Oscilloscope ............................

................ HP 8161 A/O20

HP 54502A

50 Ohm Feedthrough (2) ................... HP IOlOOC

Test Connector (2) ......................... see figure 3-1 and 3-2

BNC m-m Coupler (2) ..................... HP 1250-0216

BNC Cable (2) ........................... HP 10503A

BNC Tee m-f-f (2)

......................... HP 1250-0781

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3-19. In order to most accurately measure the amplitude of the test signals from the pulse generator, high impedance scope probes should be used to look at the signal levels at the output of the pulse generator.

LOGIC ANALYZER

Note @

Performance Tests 3-18

Figure 3-19. Setup for Data Test 4

In this setup, only eight channels are tested at one time to minimize loading. The ground lead must be connected to ensure accurate test results. It is recommended that all eight channel grounds be connected.

HP 1652B/1653B

Service Manual

2. Adjust the pulse generator for the output in figure 3-20.

28.5NS --+

10NS--)c 4 ----

CLOCK OUTPUT B

----

1.9v

1 .6V

1.3v

20NS + ----

DATA, OUTPUT A

Figure 3-20. Waveform for Data Test 4

Setting for HP 816lA: Parameter

Input Mode Period (PER)

HP 1652B HP 1653B

Width (WID)

Leading Edge (LEE)

Trailing Edge (TRE)

High Level (HIL) Low Level (LOL)

Delay (DEL)

HP 1652B HP 1653B

Double Pulse (DBL)

HP 1652B HP 1653B

Output Mode

Output A

Norm

57 ns

80 ns

20 ns

1 ns 1 ns

1.9v

1.3v

18.5 ns

30 ns

m--

ENABLE

----

m--e

0165OW13

1.9v

1 .6V

1.3v

Output B

m-w

Ions 1 ns 1 ns

1.9V (see Note)

1.3V (see Note)

0 ns 0 ns

28.5 ns 40 ns ENABLE

Note #

HP 16528/1653B

Service Manual

The voltage levels of the waveforms must have the correct amplitude at the logic analyzer probe tips. The pulse generator output may have to be increased slightly to compensate for loading by the logic analyzer.

3. Assign the pod under test to Analyzer-1 in the System Configuration as in the previous figure 3-5.

4. In the State Format Specification assign the Clock Period to < 60 ns, and the rising edge of the J clock to the Clock field. Also, assign the lower 8 channels of the pod under test to a label as in the previous figure 3-13.

5. Set the State Trace Specification without sequencing levels and set the Count to Off as in the previous figure 3-14.

Performance Tests

3-19

Note d

6. Press RUN. The State Listing is displayed and shows alternating Fs and OS

for the channels under test as in figure 3-21.

[F?EiiKTj- [State Llstlng 1

tlarkers 1 Off ]

Label

Base : w/

+oooo 00 +ooo 1 FF +0002 00 +0003 FF +0004 00 +ooos FF +0006 00

pz5imj FF

44008 00

+0009 FF +ooto 00 +oOll FF +0012 00 +0013 FF MO14 00 +0015 FF

Figure 3-21. State Listing for Data Test 4

To ensure a consistent pattern of alternating Fs and OS, use the front-panel ROLL

field and knob to scroll through the State Listing.

7. Connect the next clock to the test connector and repeat steps 4 and 6 until all clocks have been tested (clocks J, K, L, M, and N).

8. Remove the probe tip assembly from the logic analyzer probe cable and

attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector.

9. Repeat steps 3,4,6 and 7 until the lower bits of all pods have been tested (pods 1 through 5).

10. Disconnect the lower eight bits (bits 0 through 7) from the test connector and attach the upper eight bits (bits 8 through 15) to the test connector.

11. Repeat steps 3,4,6,7, and 8 until the upper bits of all pods (pods 1 through 5) have been tested with all clocks.

Performance Tests 3-20

HP 16528/16538

Service Manual

Clock, Qualifier,

and Data Inputs

Test 5

Description: This performance test verifies the maximum clock rate for mixed mode clocking

during a state operation.

Specification:

Clock repetition rate: Single phase is 35 MHz maximum (25 MHz maximum for

the HP 1653B). With time or state counting,

minimum time between states is 60 ns (16.7 MHz maximum). Both mixed and demultiplexed clocking use master-slave clock timing. The master clock must follow the slave clock by at least

ns and

precede the next slave clock by 50 ns.

Equipment Required:

Pulse Generator .......................... HP

Oscilloscope ............................ HP

Ohm Feedthrough

Test Connector

BNC m-m Coupler BNC Cable

BNCTee m-f-f

(2)

................... HP

(2)

........................ see figure 3-1 and

(2)

..................... HP

........................... HP 10503A

......................... HP

816lA/O20 54502A

IOIOOC

1250-0216

1250-0781

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3-22 by connecting channels O-3 and 8-11 of the pod under test to the test connector. On the slave clock transition, the four bits of the lower byte are transferred to the logic analyzer. On the master clock transition, the four bits of the upper byte are transferred to the logic analyzer.

LOGIC ANALYZER

FIGURE

3-l

CLK BIT

500

DATA

FIGURE ’

3-1

DATA BITS ;

/ a

GND

01650849

3-2

Note m

HP 1652B/16538

Service Manual

Figure

this setup, only eight channels are tested at one time to minimize loading. The

3-22.

Setup for Data Test 5

ground lead must be connected to ensure accurate test results.

Performance Tests

3-21

2. Adjust the pulse generator for the output in figure 3-23.

+ 10NS

CLOCK OUTPUT B

DATA,OUTPUT A

40NS -+

Figure

Setting for

HP 8161A:

I I I

‘-120NS------d I I

I I

14- 60NS -+I I+- 20NS

3-23.

Waveform for Data Test 5

Parameter Output A Output B Input Mode

Period (PER)

Width (WID)

Leading Edge (LEE)

Trailing Edge (TRE)

High Level HIL) Low Level (LOL) Delay (DEL) Double Pulse (DBL)

Output Mode

Norm

120

ns 1 ns 1 ns

3.2

B-B

ENABLE

WV---

. ----

m-m

IO ns

1 ns

3.2

V ov 0 ns

ENABLE

----

3.2V

3.2v

0165ow14

Assign the pod under test to

Analyzer 1 in

the

System Configuration as in

the previous figure 3-5.

Set

up the

clock to the

State Format Specification

Master Clock

and the rising J clock to the

as in figure 3-24. Assign the falling J

Slave Clock.

steps a through d after figure 3-24 if you are unfamiliar with menus.

State Format Speclflcatlon

l-laster Clock Slave Clock

[ JJ. ] 1 Jt 1

Clock Period

Figure

l(J

Activity ) Label Pal

3-34.

Pod 1

-1 ,,,,$$ss,,,,ss:3

15 . . . . 87 . , , . 0

.*a*,,.,**+*

. . . .

Format Specification for Data Test 5

Refer to

Performance Tests

3-22

HP 1652B/1653B

Service Manual

a. Move the cursor to the Pod Clock field and press SELECT. Then

assign Mixed Clocks.

b. Move tlie cursor to the clock fields and assign the falling transition of

the J clock to the Master Clock and the rising transition of the J clock

to the Slave Clock.

c. Move the cursor to the appropriate bit assignment field and turn on

channels O-3 and 8-11 of the pod under test.

d. Move the cursor to the Clock Period and set it to < 60 ns.

5. Set the State Trace Specification without sequencing levels and Count Off as in the previous figure 3-14.

6. Press RUN. The State Listing displays alternating Fs and OS for the channels under test as in figure 3-25.

Label

Base t pj

+aooo 00 +oOOl +uoo2 00 +0003 +0004 00 +ooos +0006 00

p?EJ

+0008 00 +0009 FF 44010 WOll ;:

MO12 00 +0013

+0014 00

MO15

FF FF FF FF

FF FF

Note d

IIC

Figure 3-25. State Listing for Data Test 5

To ensure a consistent pattern of alternating Fs and OS, use the front-panel ROLL

field and knob to scroll through the State Listing.

7. Connect the next clock to the test connector and repeat steps 4 and 6. Repeat these steps until all clocks have been tested (clocks J, K, L, M, and

8. Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector.

9. Repeat steps 3,4,6, and 7 until channels 0 - 3 and 8 - 11 of all pods have been tested (pods 1 through 5). Start with the falling edge of the J clock as the Master clock and rising edge of the J clock as the Slave clock.

10. Disconnect bits O-3 and bits 8-11 from the test connector and attach bits 4-7

and bits 12-15 to the test connector. Repeat steps 3,4,6,7, and 8 until all pods have been tested (pods 1 through 5) with all clocks.

HP 1652B/1653B Service Manual

Performance Tests

3-23

Clock, Qualifier,

and Data Inputs

Test 6

Description: This performance test verifies the maximum clock rate for demultiplexed clocking

during a state operation.

Specification:

Clock repetition rate: Single phase 35 MHz maximum (25 MHz maximum for the

HP 1653B). With time or state counting, minimum time between states is 60 ns

(16.7 MHz maximum). Both mixed and demultiplexed clocking use master-slave clock timing; the master clock must follow the slave clock by at least 10 ns and precede the next slave clock by 50 ns.

Equipment Required:

Pulse Generator . . . . . . . . . . . . . . . . . . . . . . . . . .

Oscilloscope . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP

50 Ohm Feedthrough (2) . . . . . . . . . . . . . . . . . . . HP

8161A/O20 54502A IOIOOC

Test Connector (2) . . . . . . . . . . . . . . . . . . . . . . . . see figure 3-1 and 3-2

BNC m-m Coupler (2) . . . . . . . . . . . . . . . . . . . . . HP

BNC Cable (2) . . . . . . . . . . . . . . . . . . . . . . . . . . . HP

BNC Tee m-f-f (2) . . . . . . . . . . . . . . . . . . . . . . . . . HP

1250-0216 10503A 1250-0781

Procedure:

Connect the HP 1652B/1653B and test equipment as in figure 3-26 by connecting channels O-7 of the pod under test to the test connector. During demultiplexed clocking only the lower eight bits of each pod are used.

FIGURE

3-l

CLK BIT

Figure 3-26. Setup for Data Test 6

Performance Tests

3-24

16528/1653B

Service Manual

2. Adjust the pulse generator for the output in figure 3-27.

CLOCK OUTPUT B

DATA,OUTPUT A

40NS -+ I+- 60NS -+I I+- 20NS

I+-- 60NS -+

+ 10NS

L 1 ----

I I

‘1120NS ------WI I I

I I I

----

3.2v

0165OW14

Figure 3-27. Waveform for Data Test 6

Setting for HP 8161A:

Parameter Output A

Input Mode

Period (PER) Width (WID)

Norm 120 ns

60 ns Ions

Leading Edge (LEE) 1 ns Trailing Edge (TRE)

High Level (HIL)

Low Level (LOL)

Delay (DEL)

Double Pulse (DBL) Output Mode

1 ns 1 ns

3.2V . 3.2 V ov ov

40 ns ns

--- 60 ns ENABLE ENABLE

Output B w-m

e-e

1 ns

3. Assign the pod under test to Analyzer 1 in the System Configuration as in

the previous figure 3-5.

4. Set up the State Format Specification as in figure 3-28. Assign the falling J

clock as the Master Clock and the rising J clock as the Slave Clock. Refer to steps a through d if you are unfamiliar with the menus.

[-I-

Clock Period

1’601

hctivity >

Lobe1 P-01

State Fomet Speclllcation

Hester Cl ctck

[ JA

Pod 1

Specify Symbols

Slave Clock

[ Jt 1

Figure 3-28. Format Specification for Data Test 6

HP 1652B/1653B Service Manual

Performance Tests

3-25

a. Move the cursor to the Pod Clock field, press SELECT, and assign

Demultiplex.

b. Move the cursor to the clock fields and assign the falling clock

transition of the J clock to the Master Clock and the rising J clock transition to the Slave Clock.

c. Move the cursor to the appropriate bit field and assign ALL channels

to the pod under test (only bits 0 through 7 are available for assignment).

d. Move the cursor to the Clock Period and set it to < 60 ns.

5. Set the State Trace Specification without sequencing levels and set Count Off as in the previous figure 3-14.

6. Press RUN. The State Listing shows alternating Fs and OS for the pod under test as in figure 3-29.

[ml- [State Llstlng ]

tlarkers

Of1 j

r I

Note d

IIC

Figure 3-29. State Listing for Data Test 6

To ensure a consistent pattern of alternating Fs and OS, use the front-panel ROLL field and knob to scroll through the State Listing.

7. Connect the next clock to the test connector and repeat steps 4 and 6.

8. Repeat steps 4,6, and 7 until all clocks have been tested (clocks J, K, L, M and N).

9. Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector.

10. Repeat steps 3,4,6,7,8, and 9 until all pods have been tested (pods 1 through 5). Start with the falling edge of the J clock as the Master Clock and

rising edge of the J clock as the Slave Clock.

Performance Tests

3-26

HP 16528/1653B

Service Manual

Glitch Test

Description: This performance test verifies the glitch detection specification of the

HP 1652Bl1653B.

Specification: Minimum detectable glitch: 5 ns wide at the threshold.

Equipment Required:

Pulse Generator .......................... HP 8161 A/O20

Oscilloscope ............................ HP 54502A

50 Ohm Feedthrough ..................... HP 101OOC

Test Connector .......................... see figure 3-1 and 3-2

BNC m-m Coupler ........................ HP 1250-0216

BNC Cable ............................. .’ HP 10503A

BNC Tee m-f-f ........................... HP 12504781

Procedure:

1. Connect the test equipment as in figure 3-30. The clock inputs are not used for the glitch test since glitch detection is part of timing analysis. Use the oscilloscope to make sure pulses are 5 ns wide at the threshold (1.6 V).

DATA BITS 7

E E

FIGURE

3-1

GND

0 cl F

Ol6!50103

Figure 3-30. Setup for Glitch Test

In this setup, only eight channels are tested at one time to minimize loading. The

Note m

ground lead must be connected to ensure accurate test results.

HP 16528/1653B

Service Manual

Performance Tests

3-27

2. Adjust the pulse generator for the output in figure 3-31.

20NS -4 +-

5NS+ 4

- ?

DATA,OUTPUT A

----

0165OW15

Figure 3-31. Waveform for Glitch Test

Setting for HP 8161A:

Parameter Output A Output B

3.2v

Input Mode Norm Period (PER) Width (WID)

20 5

Leading Edge (LEE) 1 ns

Trailing Edge (TRE)

High Level (HIL)

3.2 V

Low Level (LOL) ov Delay (DEL) 0 ns

---

--0-0

---

Output Mode ENABLE ---

Assign the pod under test to

Analyzer 1 in

the

System Configuration

figure 3-32. Refer to steps a through c if you are unfamiliar with menus.

System Configuration

r ~~~~

Analyzer 1

Name1 [nCICHINE[

Type:

1-J

( Autoscale )

Unassl ;izg analyzer

+iiT-,

as in

Performance Tests

3-28

Figure

a. Move the cursor to the Type field of

b. Set the analyzer Type to

3-32.

System Configuration for Glitch Test

Analyzer 1

Timing

using the cursor and SELECT key.

and press SELECT.

c. Move the cursor to the pod to be tested and assign it to

(Analyzer 1).

Machine 1

1652B/16538

Service Manual

4. In State Format Specification assign the lower eight bits of the pod under test to a label as shown in figure 3-33. Make sure the appropriate eight bits in the

bit assignment field are turned on.

VI/- Tlmlng Foram t Speclf lea lion

Pod 1

l-l-L

, I . , . , . I

Activity > ,,,,,,,,ts*tsttt

Label Pol 15 .,., 87 .,., 0

LI***IL*

(Specify Symbols 1

Figure 3-33. Glitch Test Timing Format Specification

5. Set Timing Trace Specification as in figure 3-34. Follow steps a through d if you are unfamiliar with menus.

lnACHINE]I-

Trace model-1

Armed by 1-1 Acquisition mode 1 G1 itch ]

Lob

Fln

The n find

Gil tch -1

flmlng Trace Speclflcatlon

present for

Edge I..

] 30ns 1

HP 1652B/1653B Service Manual

Figure 3-34. Glitch Test Timing Trace Specification

a. Move the cursor to the Acquisition mode field and select the Glitch

mode.

b. Move the cursor to the Find Pattern field and press SELECT. Assign

all Don’t Cares (all Xs) and press SELECT. c. Set the Present for field to >30 ns. d. Set Then find Glitch “on” for all channels (* = on; . = off).

Performance Tests

3-29

6. Press RUN. The timing analyzer acquires data and shows glitches for channels under test as in figure 3-35. Select the Delay field and rotate the

knob to assure consistent glitch detection.

Note m

[nCltHINEjJ-

Figure

If the sample clock and data synchronize, glitches may be displayed on the timing

Tlmlng Waveloms

3-35.

Glitch Test Timing Waveforms

screen as valid data transitions.

7. Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested. Take care not to dislodge grabbers from the test connector.

8. Repeat steps 3,4, and 6 until all pods have been tested (pods 1 through 5).

Make sure to assign the correct pod to be tested in the System Configuration menu.

9. Disconnect the lower eight bits (bits 0 through

from the test connector and

attach the upper eight bits (bits 8 through 15) to the test connector.

10. Repeat steps 3,4,6, and 7 until the upper bits of all pods have been tested (pods 1 through 5).

Performance Tests

3-30

HP 1652B11653B

Service Manual

Threshold

Accuracy Test

Description:

This performance test verifies the threshold accuracy within the ranges stated in

the specification.

Specification: Threshold accuracy 150 mV accuracy over the range -2.0 to + 2.0 volts; 300 mV

accuracy over the ranges -9.9 to -2.1 volts and + 2.1 to + 9.9 volts.

Equipment Required:

Power Supply

Test Connector

BNC (f)-to-Dual Banana (m) Adapter BNC Cable

............................ HP 6216C

.......................... see figure 3-l and 3-2

......... HP 1251-2277

.............................. HP 10503A

Procedure:

1. Connect the test equipment as in figure 3-36.

LOGIC ANALYZER

DATA BITS q

P P

01650850

Note e

1652B/1653B

Service Manual

Figure

this setup, only eight channels are tested at one time to minimize loading. The

3-36.

Threshold Accuracy Test Setup

ground lead must be grounded to ensure accurate test results.

Assign the pod under test to

Analyzer 1

in the

System Configuration as in

the previous figure 3-32.

Performance Tests

3-31

3. Configure the Timing Format Specification for a User Defined pod threshold of 0.0 V for the pod under test and assign the lower eight bits in the bit assignment field as in figure 3-37. Refer to steps a through c if you are unfamiliar with menus.

v/j-

FLctivity > ----------------

Label

Tlmlng Format Speclf lcallon

Pod 1

+ 0.0 v

PO1

Specify Symbols

Figure 3-37. Threshold Accuracy Format Specification

a. Move the cursor to the Pod Threshold field and press SELECT.

b. Move the cursor to User-defined and press SELECT. Then enter the

appropriate voltage threshold.

c. Move the cursor to the bit assignment field and turn on the appropriate

eight bits to be tested (* = on; . = off).

4. Set the Timing Trace Specification as in figure 3-38. Follow steps a through d if you are unfamiliar with menus.

[ 30ns ]

Speclflcatlon

Acquisition mode

1 Glitch 1

WI)- Tlmlng Trace

Trace mode-1

Armed by 1-1

Label >

Base 1

Find

Then f lnd

Pat tern

pr ese

Edge

Glitch

[POD-J

1 Hex 1 I

tnt for

I I

Figure 3-38. Threshold Accuracy Trace Specification

a. Move the cursor to the Acquisition mode and select the Glitch mode.

b. Move the cursor to Find Pattern and press SELECT. Then assign

Don’t Cares (all X s) and press SELECT. c. Set present for to > 30 ns. d. Set Then find Glitch to all Don’t Cares (all periods ‘Y).

Performance Tests

3-32

HP 1652B/1653B

Service Manual

5. Adjust the power supply output for + 150 mV.

6. Press RUN. Data displayed on the Thing Waveforms display is all high for the pod and channels under t&t as in figure 3-39.

-iItlarkers I-1

Accumulate torrj flme/Dlv 7100

PoDij

Timing biavef ems

Delay 11 Sample period - 20 ns

I :

Figure 3-39. Threshold Accuracy Timing Waveforms 1

7. Adjust the power supply output for -150 mV.

8. Press RUN. Data displayed on the Timing Waveforms display is all low for the channels under test as in figure 3-40.

l-l-

tlar ker9 1-1 CIccumula te Time/D iv 11 Delay IO] Sample period -

lpoDd

Tlmlng Wsvef arms

Iorrj

20 ns

I 1

Figure 3-40. Threshold Accuracy Timing Waveforms 2

9. Return to the Timing Format Specification and change the User Defined

pod threshold to + 9.9 V.

10. Adjust the power supply output for + 10.2 V.

11. Press RUN. Data displayed on Timing Waveforms display is all high for the pod and channels under test as in the previous figure 3-39.

HP 16528/1653B

Service Manual

Performance Tests

3-33

12,

Adjust the power supply output for + 9.6 V. Press RUN. Data displayed on Timing Waveforms display is all low for the

13,

pod and channels under test as in the previous figure 3-40.

14. Return to the Timing Format Specification and change the User Defined pod threshold to -9.9 V.

15 .

Adjust the power supply output for -9.6 V.

16.

Press RUN. Data displayed on Timing Waveforms display is all high for the

pod and channels under test as in the previous figure 3-39.

I 1. Adjust the power su~plv output for -10.2 V.

J I AI d *

Press RUN. Data displayed on Timing Waveforms display is all low for the

18. pod and channels test as in the previous figure 340.

Remove the probe tip assembly from the logic analyzer prob

19. attach it to the next logic analyzer probe cable to be tested.

le cab1 .e and

Take care n lot to

dislodge grabbers from the test connector.

Repeat steps 2 through 18 until all pods have been tested (pods 1 through 5).

20 .

21.

Disconnect the lower eight bits (bits 0 through 7) from test connector and

attach the upper eight bits (bits 8 through 15) to the test connector.

Repeat steps 2 through 19 until the upper bits of all pods have been tested

22. 1 through 5).

(pods

Performance Tests HP

16528/1653B

3-34 Service Manual

Oscilloscope Performance

Tests

These procedures test the HP 1652B/1653B oscilloscope module’s electrical performance using the specifications listed in section 1 as the performance standards. All tests can be performed without access to the interior of the instrument. Results of performance tests may be tabulated in the Performance Test Record at the end of this section.

Input Resistance

Test

Note @

Description: This test checks the input resistance of the vertical inputs. A four-wire

measurement is used for accuracy at 50 S2. Input resistance is not a specification,

but this test is provided for the convenience of the user.

The Input Resistance Test is optional. The input resistance is not specified in the instrument performance specifications. The values given are typical. Results are not recorded in the test record.

Characteristic:

1 MS2 21% and50 Q ~1%

Equipment Required:

Digital Multimeter . . . . . . . . . . . . . . . . . . . . . . . . . HP 3478A

BNC Cable (2) . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 10503A

BNC Tee m-f-f . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 1250-0781

BNC &to-Banana (m) Adapter (2) . . . . . . . . . . . HP 1251-2277

Procedure:

1. Set up the multimeter to make a four-wire resistance measurement.

HP 1652B/1653B

Service Manual

2. Use the BNC-to-banana adapters to connect one end of each BNC cable to

the four-wire resistance connections on the multimeter. Then connect the free ends of the cables to the BNC tee as in figure 3-41.

QSENSE-7 r--INPUT

LOGIC ANALYZER/’ -

OSCILLOSCOPE

1 2

01652E13 I

Figure 34. Setup for input Resistance Test

Performance Tests

3-35

3. Connect the male end of the BNC tee to the channel 1 input of the HP 1652B/1653B oscilloscope.

4. In the System Cdnfiguration menu, turn both State/Timing Analyzers off and

turn the oscilloscope on as in figure 3-42. Refer to steps a through d if you are unfamiliar with menus.

System Configuration

Figure 3-42. System Configuration for Input Resistance

a. Move the cursor to the Type field of Analyzer 1 and press the SELECT

key

Note

b. Set the analyzer Type to Off using the cursor and SELECT key.

c. Repeat steps a and b for Analyzer 2. d. Move the cursor to the On/Off field of the Oscilloscope and press the

SELECT key to turn the oscilloscope On.

5. Press the TRACE/TRIG key and use the cursor and SELECT key to set the

Run Mode to Single.

6. Press the FORMAT/CHAN key and use the cursor and SELECT key to set

Input to CH 1.

7. Set the Impedance to 1 MOhm and press RUN. The multimeter should read lMS2 rtlOkSZ.

8. Set the Impedance to 50 Ohms and press RUN. The multimeter should read

50 Q 20.5 s2.

9. Repeat steps 3,6,7, and 8 for channel 2.

Failure of this test indicates a faulty attenuator if resistance is out of specifications.

The oscilloscope assembly also may be at fault if input resistance cannot be changed. See troubleshooting in section 6C for more information.

Performance Tests

3-36

HP 16528/1653B

Service Manual

VOltage Description:

Measurement

Accuracy Test

This test verifies the voltage measurement accuracy of the instrument.

Specification:

t (Gain Accuracy + Offset Accuracy + ADC Resolution)

Equipment Required:

Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 6114A

Digital Multimeter . . . . . . . . . . . . . . . . . . . . . . . . . HP 3478A

BNC Cable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 10503A

BNC (f)-to-Banana (m) Adapter . . . . . . . . . . . . . HP 1251-2277

Banana (m)-to-Banana (m) Cable (2) . . . . . . . . . HP 11000-60001

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3-43.

INPUT

MULTIMETER

O *-l-l

POWER SUPPLY

- &

LOGIC ANALYZER

01652E14

Figure 3-43. Setup for Voltage Measurement Accuracy

2. Connect the power supply to Channel 1 of the HP 1652B/1653B oscilloscope.

3. In the System Configuration menu, turn both State/Timing Analyzers off and

turn the oscilloscope on as shown in the previous test figure 3-42.

HP 16528/16538

Service Manual

Performance Tests

3-37

4. Unassign all of the pods frgm the analyzers as shown in figure 3-44. Refer to steps a through c if you are unfamiliar with menus.

System Configuration

Clnalyter 2

Type: [o”]

Figure 3-44. System Configuration

a. Move the cursor to an assigned pod and press SELECT. b. Move the cursor to Unassigned and press SELECT. c. Repeat steps a and b for all assigned pods.

5. Press the FORMAT/CHAN key and turn off channel 2 by deleting the channel 2 waveform as in figure 3-45. Refer to steps a and b if you are unfamiliar with menus.

II)- Channel

Input

Probe

s/Dlv

rCH1 1

1 1 1 1

t I I

Figure

a. Move the cursor to

V/Div [ 1.500 V )

Impedance []

Delay

3-45.

Deleting Channel

2 at the left side of the display and press

Offset

I : : : : : :

: : :

: .

: :

: . : :

. :

I , t 1 I I

Preset

1 I I I

pZEFTJ I

SELECT.

b. Move the cursor to

Delete waveform

and press SELECT.

Performance Tests

3-38

HP 1652B/1653B

Service Manual

6. Using the knob and SELECT key, set Input to CH 1, Probe to l:l, and

Impedance to 1 MOhm as in figure 3-46.

[Scope)- Channel (Autoscale >

Input [CH] VfDiv [lso.oJ Probe 1-1 Impedance [InOhm-J Preset pmq s/Dlv 11o.001 Delay

1 CH m’

, 1 1 I 1 I L I I

: :

OffSEt

p5zzcir~

Figure 3-46. Channel Menu Configurktion

7. Press the TRACE/TRIG key and set the Mode to Immediate and Run mode to Repetitive as in figure 3-47.

IScope - Trigger

tlode [ Immediate ] Run mode (Repetitive]

s/Dlv [j Delay Armed by IRUn]

Figure 3-47. Trigger Menu Configuration

HP 16528/1653B Performance Tests

Service Manual 3-39

8. Press DISPLAY

and

set Markers to Time, Display to AVG# 32, Connect dots

to On, and Grid to On as in figure 3-48.

tlarkersl Time 1 Display 1-1 Connect dots I] x to 0 r-1 Trig to X 1 0 s ] Trig to or01

s/Dlv 11o.ooj Delay

CH 1-j

,,.,.-..................

, . . . . ..: .,..: . . . .

.--- . .

. . i ; 1 f ;

,.,...... . . . . . . . . . . . . . . _ . . . _ . . . . . . . . .

1 I I 1 I I t *

f : : . : :

: i

* .+...i....+/....i....

1 :

~ : :

: . . . . : . . . . . . . . . . . * .: . . . . : . . .

1 :

i ; ; : ! i

Grid

Figure 3-48. Waveforms Menu Configuration

9. Press the FORMAT/WAN key and set V/Div and Offset according to the

first line of the following table.

Test

V/Div

Offset

Power Supply

Tolerance X and 0

Result

10.0 v

5.0 v

2.0 v

1.0 v

500 mV 200 mV

100 mV

50 mV 20 mV

15 mV

20.00 v

10.00 v

4.00 v

2.00 v

1.00 v 400 mV 200 mV

100 mV

40mV 30 mV

35.0 v

17.5 v

7.0 v

3.5 v

1.75 v 700 mV 350 mV 175 mV

70 mV 50 mV

t3.242 V k 1.622 V

20.650 V

20.326 v

-0.164 v

266.8 mV t34.4 mV t 18.2 mV

t8.48 mV k6.86 mV

31.758 - 38.242 V

15.878 - 19.122 V

6.935 - 7.065 V

3.174 - 3.826 v

1.586 - 1.914 V

633.2 - 766.8 mV

315.6 - 384.4 mV

156.8 - 193.2 mV

61.52 - 78.48 mV

43.14 - 56.86 mV

10. Set the power supply to the voltage listed on the first line of the previous table.

Performance Tests

3-40

HP 16528/1653B

Service Manual

11. Press the TRACE/TRIG key, then press RUN. The Trigger level cursor will appear as in figure 3-49.

-Scope- Trigger node 1 Immediate ]

s/Dlv 11

W’ * * . . 1 * * : : ;g:;; . . . :

. . . . . . . . . . . . . . . . . . , : : . . . : . . . . : . . . .

. . . . . . . . . . . . . . . . . . . . . . . . .

. . #..........I. . . . . . . . . . . . p.:....:....:....:....

1 1 I I h 1 1 1 I

Delay

. .

i : : : :

I 1 : : : :

. ..a............. a....,.

, ; f ; f

] : : I

(Calibration )

Run mode 1-1

Armed by 1-1

Figure 3-49. Trigger Menu

12. After the display has time to settle, observe the X and 0 cursor voltage display. Verify that these voltages are within the limits in the previous table and press STOP.

13. Repeat steps 9 through 12 for each line of the table.

14. Press the FORMATKHAN key and turn on channel 2 by inserting a

waveform on the display. Refer to steps a through c if you are unfamiliar with menus.

Note m

a. Move the cursor to CH 1 at the left side of the display and press

SELECT. b. Move the cursor to Insert waveform and press SELECT. c. Move the cursor to CH 2 and press SELECT.

15. Turn off channel 1 by deleting the channel 1 waveform.

16. Set Input to CH 2 and connect the power supply to Channel 2.

17. Repeat steps 6 through 13 for channel 2.

Voltage measurement errors can be caused by the need for self-calibration. Perform the Offset Calibration and Gain Calibration (see Adjustments, section 4) before troubleshooting the instrument. If self-calibration fails to correct the problem, the cause may be the attenuator or the oscilloscope assembly.

HP 1652B/1653B Performance Tests Service Manual 3-41

Off

set

Accuracy Test

Description:

This test verifies the DC offset accuracy of the instrument.

Specification:

+(2 mV + 2% of channel offset + 2.5% of full scale)

Equipment Required:

Digital Voltmeter ..........................

Power Supply BNC Cable BNC (f)-to-Banana (m) Adapter

Banana (m)-to-Banana (m) Cable ............ HP 1100040001

............................ HP 6114A

.............................. HP 10503A

.............

HP 3478A

HP 1251-2277

Procedure:

1. Connect the HP 1652B/1653B and test equipment as in figure 3-50.

zLYzziT+-T (

01652E 14

POWER SUPPLY

Figure 3-W Setup for DC Offset Accuracy

LOGIC ANALYZER

1 2

0 0

Performance Tests

3-42

2. In the System Configuration menu, turn both State/Timing Analyzers off, unassign all of the pods from the analyzers, and turn the oscilloscope on as in the previous test figure 3-44.

3. Press the FORMATKHAN key and turn on channel 1 by inserting the

channel 1 waveform. Then turn off channel 2 by deleting the channel 2

waveform.

4. Using the knob and SELECT key, set Input to CH 1, Probe to l:l, and

Impedance to 1 MOhm as in the previous test figure 3-46.

1652B/l653B

Service Manual

5. Press the TRACE/TRIG key and set the Mode to Immediate and the Run mode to Repetitive as in figure

IscopSl- Trigger

ilode 1 Immediate 1

s/Dlv ~1o.oo]

CHl J

Delay

3-51.

Run mode I-

Armed by IT

Figure 3-51. Trigger Men&

6. Press DISPLAY and set the Markers to Time, Display to AVG# 32, Connect dots On, and Grid On as in figure 3-52.

I[Scope}- ldnvef ornks

llarkers [ Time ] Display 1-1 x to 0 [O] Tr lg to X j-01 s/Dlv ~1o.00~ Delay

Connect dots [‘Z-j

Trig

to O[o]

GritI

HP 16528/1653B

Service Manual

Figure

3-52.

Waveforms Display Menu

7. Press FORMAT/CM and set V/Div and Offset according to the frost line of the following table.

Test

V/Div

Offset

1.0 v 20.0 v

500

200

100 mV

10.0 v 10.0 v

5.0 v 5.0 v

2.0 v 2.0 v 20.052

Power Supply

20.0 v

Tolerance Off set Result

~0.502V 19.50 - 20.50 v

to.242 to.122 v

V 9.758 - 10.242 V

4.878-5.122

1.948 - 2.052 V

8. Set the power supply to the voltage listed on the fixst line of the previous table.

Performance Tests

3-43

9. Press RUN and readjust Offset so the trace is as close to the center horizontal line of the eraticule as

possible after it has settled (averaging

complete) as in figure”3-53.

-II- Channet

Input [CH] V/Div Probe 1-j Impedance [1j Preset s/Div pc5Eiq Delay

Figure

10.

Verify that the Offset voltage is within the limits specified in the prevrous

3-53.

[-l

Channel Menu

Offset 119.931

(UsERI

table. Then press STOP.

11. Repeat steps 7 through 10 for each line of the table.

12.

Turn on channel 2 by inserting a waveform on the display. Refer to steps a

through c if you are unfamiliar with menus.

a. Move the cursor to CH 1 at the left side of the display and press

SELECT.

Note d

IIC

b. Move the cursor to Insert waveform and press SELECT. c. Move the cursor to CH 2 and press SELECT.

13.

Turn off channel 1 by deleting the channel 1 waveform.

14. Set Input to CH 2 and connect the power supply to Channel 2.

17.

Repeat steps 7 through

Offset errors can be caused by the need for self-calibration. Perform the Offset

for channel 2.

Calibration (see Adjustments) before troubleshooting the instrument. If self-calibration fails to correct the problem, the cause may be the attenuator or oscilloscope assembly.

Performance Tests

3-44

1652B/f653B

Service Manual

Bandwidth Test

Note d

Description:

This test checks the bandwidth of the oscilloscope in the HP 1652B/1653B.

Before doing the Bandwidth test, verify that the Attenuator Calibration is valid

cp f

er armed within the last six months or 1000 hours).

Specification:

Bandwidth: dc to 100 MHz

Equipment Required:

Signal Generator . . . . . . . . . . . . . . . . . . . . . . . . . HP 8656B

Power Meter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 436A

Power Sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 8482A

Power Splitter . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Type N (m) 24 inch cable

. . . . . . . . . . . . . . . . . . HP 11500B

Type N (m) to BNC (m) Adapter . . . . . . . . . . . . .

HP 11667B HP 1250-0082

Procedure:

1. With the N cable, connect the signal generator to the power splitter input. Connect the power sensor to one output of the power splitter as in figure 3-54.

SIGNAL GENERATOR

POWER METER

POWER

01652E15

SENSOR

Figure 3-54. Setup for Bandwidth Test

2. Using an N-to-BNC adapter, connect the other power splitter output to the channel 1 input of the HP 1652B/1653B oscilloscope.

3. In the System Configuration menu, turn both State/Timing Analyzers off, unassign all of the pods from the analyzers, and turn the oscilloscope on as in the previous figure 3-44.

4. Press FORMATKHAN and turn on channel 1 by inserting the channel 1 waveform. Then turn off channel 2 by deleting the channel 2 waveform.

HP 1652B/1653B

Service Manual

Performance Tests

3-45

5. Set the Input to CH 1, V/Div to 100 mV, Offset to 0 V, Probe to l:l, Impedance to 50 Ohms, and s/Div to 5.0 us as in figure 3-55.

[Scape- Channe I

Input /TiEI V/Div [-I Offset

Probe

1-1 Impedance 1-1

S/DiV

t c:H

Delay

Preset piErJ

Figure 3-55. Channel Menu Configuration

6. Press TRACEITRIG and set ‘the Run mode to Repetitive and trigger Level to 0 V as in the previous figure 3-51.

7. Press DISPLAY and set Markers to Time, Display to Normal, Connect dots On, and Grid On as in figure 3-56.

-Scope- liavef arms Auto-Measure tlarkersl Time 1 Display

x to 0 [OJ s/Dlv pmEiq Delay

Trlg

[NDrmal)

to X 1-1 Trig to 0-0

Connect dots Ion]

Grid

: . . . . : . . . .

Figure 3-56. Waveforms Display Menu Configuration

8. Set the signal generator for 100 kHz at -4.5 dBm and press RUN on the HP 1652B/1653B. The signal on screen should be five cycles at two divisions amplitude.

9. Press TRACEITRIG and adjust the trigger Level for a stable display. The signal on screen should be five cycles at approximately 2 divisions amplitude.

10. Press DISPLAY and set Display to AVG# 16.

Performance Tests 3-46

HP 16528/1653B

Service Manual

11. After the measurement settles (averaging complete, about 10 seconds) use Auto-Measure to obtain a peak-to-peak voltage measurement as in figure

3-57.

-Scope- kuef arms ( Autoscsle) rlarkersl

x to 0 [-5.oooJ Trlg to X L-1 Trig to 0-J

s/Dlv [I

CHl ]

Time ] Display -1 Connec t

Delay

i : : :i ;;: :“‘: : . I .I .

0 -x

r I

. I

* :i

: ; .

dots [on]

Grid

. 9

. . . . . . . . . . . . . - . : + . . . . . . . - . . . . e....

I I I I* I’ I I I 1

I . :, .

’ :

.I :I .

I -, I * : i . .

- ; : t -

Figure 3-57. Waveforms Display Menu

12. Set the power meter Cal Factor % to the 100 kHz value from the cal chart on

the power sensor probe, then press dB[REF] to set a 0 dB reference.

13. In the Waveforms Display menu, set Display to Normal and s/Div to 5 ns.

14.

Change the signal generator to 100 MHz and set the power meter Cal Factor

to the 100 MHz % value from chart.

15. Adjust the signal generator amplitude for a power reading as close as possible to 0.0 dB(REL).

16. Set the oscilloscope Display to AVG# 16.

17. After the measurement settles (averaging complete), use Auto-Measure to obtain a peak-to-peak voltage as in step 11. Note this value.

18. Calculate the response using the formula:

Response (dB) = 20 loglo v,OOkHz

hOOMHz

HP 16528/1653B

Service Manual

19. Correct the result from step 18 with any difference in the power meter from step 15. Observe signs. For example:

Result from step Power meter reading =

true response

18 = -2.3

-0.2

= (-2.3)-(-0.2) = -2.1

dB dB(REL)

Performance Tests

3-47

20. Turn on channel 2 by inserting a waveform on the display.

Note m

Time

Measurement

Accuracy Test

21. Turn off

22. Connect the splitter to channel 2 and power

channel 1 by deleting the channel 1 waveform.

repeat steps 5 through 19 for

channel 2.

Failure of the bandwidth test can be caused by faulty attenuator or oscilloscope assembly, or the need for high-frequency pulse response adjustment.

Description: This test uses a precise frequency

source to check the accuracy of the time

measurement functions.

Specification:

t (500 ps + 2% X s/Div + 0.01% X delta-t)

Equipment Required:

Signal Generator ......................... HP 8656B

BNC Cable .............................. HP

Type N (m) to BNC

Adapter .............. HP

10503A 1250-0780

Procedure:

Use a Type N to BNC adapter to connect the signal generator to the channel

input of the HP 1652B/1653B oscilloscope as in figure 3-58.

Figure 3-58. Setup for Time Measurement Accuracy

In the

System Configuration

menu, turn both State/Timing Analyzers off, unassign all of the pods from the analyzers, and turn the oscilloscope on as in the previous figure 3-44.

3. Press FORMAT/CHAN and turn on channel 1 by inserting the channel 1 waveform. Then turn off channel 2 by deleting the channel 2 waveform.

Performance Tests

3-48

HP 16528/1653B

Service Manual

4. Set Input to CH 1, V/Div to 100 mV, Offset to 0 V, Probe to l:l, Impedance to 50 Ohms, and s/Div to 5.0 ns as in figure 3-59.

-II- Channel Input

Probe

s/Dlv

VfDiv

Impedance

Delay

Offset

Preset

,...._..............-.. . * :..........,. . . . . . . . . . . .

. . . . . . . . . . .

,....-... . . _ . . . . . . , . . . _ . . . . . . . . . - . . .

. : .

. . . . .

J” : * ’ . ’ : - * * * : . .

: .

: : : :

.., . . . . . . . . . . . . . . I

: : : :

: :

Figure 3-59. Channel Menu Configuration

5. Press DISPLAY and set Display to Normal, Connect dots On, and Grid On.

6. Press TRACE/TRIG and set the Run mode to Repetitive and trigger Level to 0 V as in the previous figure 3-51.

7. Set the signal generator to 100 MHz at approximately 150 mV.

8. Press RUN and use the Level and Delay to center the rising edge of the waveform as close as possible to center screen as in figure 3-60. It may be necessary to use Offset to center the signal symmetrically about the horizontal axis.

[Scapel- Trigger

tlode [ Edge 1 Source ICH] Run mode [ml

Level ptmEiiq Sl ope [PositiveI auto-Trig I]

s/Dtv 1-1 Delay 12.61 armed by 71

: ! ! 1 : !

: .

(Calibration )

HP 1652B/1653B

Service Manual

Figure 3-60. Centering the Waveform

9. Press STOP, then press DISPLAY. Set Display to AVG# 16.

10. Press RUN and when the waveform has stabilized at center screen, press STOP.

Performance Tests

3-49

11.

Use the following table for the next steps.

Delay Tolerance Limits 10 ns 20.601 ns 9.399 to 10.601 ns

100

ns 20.610 ns 99.39 to 100.61 ns

500 ns kO.650 ns 499.35 to 500.65 ns

12. Select Delay and enter the delay value listed on the first line of the previous table using the keypad.

13. Select Delay again and use the knob to move the rising edge of the waveform directly.over the center reference as in figure 3-61. Verify that the delay is

within t.he limits specified in the table.

IScope]- Waver arms

tlarkers [ Off ] ‘Di Sample period -

s/Dlv

15.01 De

2.5 ns laylpJ

~ Connect dots [onI

Figure 3-61. Waveforms Display

14. Repeat steps 12 and 13 for the other delays in the table.

15.

Set the signal generator to 1 MHz.

16. Press DISPLAY and set Display to Normal.

17. Press FORMAT/CHAN and set s/Div to 500 ns and Offset to 0 V.

18. Repeat steps 8 through 14 using the values in the following table.

Delay Tolerance 1 us

2 us

2 10.600 ns 989.4 to 1.010 us

t 10.700 Ix 1.989 to 2.010 us

Limits

Performance Tests

3-50

HP 1652B/1653B

Service Manual

19. Turn on channel 2 by inserting a waveform on the display.

Note m assembly.

20. Turn off channel 1 by deleting the channel 1 waveform.

21. Connect the signal generator to channel 2 and repeat steps 4 through 18 for channel 2.

Time Measurement Accuracy failure is caused by a defective oscilloscope

Trigger Sensitivity

Test

Note d

Description: This test checks the channel trigger for sensitivity at the rated bandwidth.

Before doing the Trigger Sensitivity test, verify that the Trigger Calibration is valid

cp f

er ormed in the last 6 months or 1000 hours).

Specification:

10.0% of full scale.

Equipment Required:

Signal Generator ......................... HP 86568

BNC Cable .............................. HP 10503A

Type N (m)-to-BNC (f) ..................... HP 1250-0780

Procedure:

1. Use the Type N-to-BNC adapter to connect the signal generator to channel 1 of the HP 1652B/1653B as in figure 3-62.

HP 16528/1653B

Service Manual

SIGNAL GENERATOR

01652E16

Figure 3-62. Setup for Trigger Sensitivity

2. In the System Configuration menu, turn both State/Timing Analyzers off, unassign all of the pods from the analyzers, and turn the oscilloscope on as in the previous figure 3-44.

3. Press FORMATKHAN and turn on channel 1 by inserting the channel 1

waveform. Then turn off channel 2 by deleting the channel 2 waveform.

LOGIC ANALYZER -

1 2

Performance Tests

0 0

3-51

4. Set Input to CH 1, V/Div to 2 V, Offset to 0 V, Probe to l:l, Impedance to 50 Ohms, and s/Div to 2.0 us as in figure 3-63.

[ScopeI- Channe 1

Input [I] V/Div [2.oool Offset Probe [T] Impedance fTF%iEj Preset piiF] s/Dlv ]2.ooo] Delay

Figure 3-63. Channel Menu Configuration

5. Press TRACE//TRIG and set the Run mode to Repetitive and trigger Level to ov .

6. Press DISPLAY and set Display to Normal, Connect dots On, and Grid On . as in figure 3-64.

[Scope]- Navef ems

tlarkers [ Off 1 Display pG?zq Connec t dots [on] Sample period - 10.0 ns s/Div [2.ooo] Del ay

Grid

Performance Tests

3-52

Figure 3-64. Waveforms Display Menu

7. Set the signal generator to 1 MHz and press RUN on the HP 1652B/1653B.

8. Adjust the signal generator output level for 0.4 divisions of vertical deflection (approximately + 3 dBm).

HP 1652B/1653B

Service Manual

9. Press TRACEITRIG and adjust the trigger Level for a stable display (Auto-triggered message does not appear on screen). The test passes if triggering is stable, as shown in figure 3-65.

-Scope- Hevef arms [ Off

tlarker s Sample perlod - 10.0 ns

s/Dlv pXKF] Delay

ICH1& : ; . I ; ; : :

,..................._....,.........I... . . . . ..s....

. . . . . . . . . . . . . . . . : . . . . _ . . . . . . . . _ . . .

] Display 1 Normal ] Connect dotsll

: :

: . : . . .

. . : .

1 , f 1 1 1 1 I 1

: :

Gfld

. . . . .

. .

Figure 3-65. Waveforms Display Menu

10.

Press STOP and set the s/Div to 5 ns.

11.

Set the signal generator to 100 MHz and.press RUN on the HP 1652B/1653B. Adjust the signal generator output level for 0.4 divisions of vertical deflection

12. (approximately + 3 dBm).

Note

Press TRACE/TRIG and adjust the trigger level for a stable display

13. (Auto-triggered message does not appear on screen). The test passes if triggering is stable.

14.

Press FORMATKHAN and set V/Div to 200 mV and repeat steps 4 through

13. The signal generator output should be reduced to approximately -17 dBm.

Press FORMATKHAN and set V/Div to 20 mV and repeat steps 4 through

15.

13. The signal generator output should be set to approximately -37 dBm.

16.

Turn on channel 2 by inserting a waveform on the display.

17.

Turn off channel 1 by deleting the channel 1 waveform.

18.

Connect the signal generator to channel 2 and repeat steps 4 through 15 for

channel 2.

Trigger sensitivity test failure is caused by a defective attenuator or oscilloscope

assembly.

HP 1652B/16538

Service Manual

Performance Tests

3-53

Table 3-1. Performance Test Record

Hewlett-Packard Model 1652B/1653B Logic Analyzer

Serial Number

Test

Clock, Qualifier, and Data

Inputs Test 1

Clock, Qualifier, and Data

Inputs Test 2

Recommended Calibration

Interval 24 Months

Pod1 Pod2 Pod3

Pod4 Pod5

Pod1 Pod2 Pod3 Pod4 Pod5

Tested by Work Order No. Date Tested

Results

Passed Failed

Clock, Qualifier, and Data

Inputs Test 3 (HP 1652B Ohly)

Clock, Qualifier, and Data

Inputs Test 4

Clock, Qualifier, and Data

Inputs Test 5

Passed Failed

Pod1 Pod2 Pod3 Pod4 Pod5

Passed Failed Pod1 Pod2 Pod3 Pod4 Pod5

Performance Tests

3-54

1652B/1653B

Service Manual

Table

3-l.

Performance Test Record (continued)

Test

Clock, Qualifier, and Data

Reqults

Passed Failed

Inputs Test 6 Pod1

Pod2 Pod3 Pod4 Pod5

Glitch Test

Passed Failed Pod1 Pod2 Pod3 Pod4

Pod5

Threshold Accuracy Test Passed Failed

Pod1 Pod2

pod3 - Pod4

Pod5

HP 16528116538 Service Manual

Performance Tests

3-55

Table 3-l. Performance Test Record (continued)

Test

Voltage Measurement Accuracy Test

DC Offset Accuracy Test

Bandwidth

Test Down <3dB at 100 MHz

Range Chan 1

10.0 v 31.758 - 38.242 V

5.0 v

2.0 v 6.935 - 7.065 V

1.0 v 3.174 - 3.826 V

500 mV 200 mV 633.2 - 766.8 mV

100 mV

50 mV 20 mV 61.52 - 78.48 mV

15 mV 43.14 - 56.86 mV

Range

1.0 v 500 mV 200 mV 100 mV

Limits

15.878 - 19.122 v

1.586 - 1.914 V

315.6 - 384.4 mV

156.8 - 193.2 mV

19.50 - 20.50 v

9.758 - 10.242 V

4.878 - 5.122 V

1.948 - 2.052 v

desults

Chan2

Chan 1 Ghan 2

Chan 1 Chan 2

Time

Measurement Accuracy Test

Trigger Sensitivity Test

10 ns 9.4 to 10.6 ns 100 ns 99.4 to 100.6 ns

500 ns 499.4 to 500.6 ns

1 us 989.5 to 1.010 us

2 us 1.990 to 2.010 us

2 V/div

200 mV/div 0.4 div at 1 MHz

20 mVldiv

0.4 div at 1 MHz

0.4 div at 100 MHz

0.4 div at 1 MHz

0.4 div at 100 MHz

Chan

1 Chan 2

Chan 1 Chan 2

_--

Performance Tests 3-56

HP 16528/1653B

Service Manual

Contents

Section 4:

Adjustments and Calibration

Introduction. ......................................................... 4-l

Equipment Required .................................................. 4-1

Adjustments and Calibration Interval .................................... 4-l

Safety Requirements .................................................. 4-2

Instrument Warm-up .................................................. 4-2

Adjustments ......................................................... 4-2

Calibration ........................................................... 4-2

Power Supply Assembly Adjustment ..................................... 4-3

CRT Monitor Assembly Adjustments .................................... 4-4

Intensity, Sub-Bright, and Contrast Adjustment ......................... 4-4

Focus Adjustment .................................................. 4-5

Horizontal Phase, Vertical Linearity, and Height Adjustments ............ 4-5

System Board Assembly Threshold Adjustment ........................... 4-6

Oscilloscope Assembly High-Frequency Pulse Adjustment .................. 4-9

Software Calibration ..................... ............................ 4-11

Offset Calibration ................................................. 4-12

Attenuator Calibration ............................................. 4-12

Gain Calibration ................ ................................... 4-13

Trigger Calibration ................................................ 4-13

DelayCalibration..................................................4-1 3

Adjustments and Calibration

Introduction

Caution lb

Equipment

Required

This section provides the adjustment procedures for the HP 1652B/1653B. The primary adjustments groups are:

Power Supply Assembly Adjustment.

CRT Monitor Assembly Adjustment.

System Board Assembly Threshold Adjustment.

a Oscilloscope Assembly High-Frequency Pulse Adjustment.

This section also contains the software calibration procedures for the oscilloscope assembly.

The effects of ELECTROSTATIC DISCHARGE can damage electronic components. Use grounded wriststraps and mats when performing any kind of service to this instrument.

The equipment required for the adjustments and calibration procedures in this section are listed in the Recommended Equipment table in section 1 of this manual. Any equipment that satisfies the critical specifications listed in this table may be substituted for the recommended model. Equipment for individual procedures is listed with the procedure.

Adjustments

and Calibration

Interval

Warning

The recommended adjustment interval for the HP 1652B/1653B is two years. The

adjustments are set at the factory on assemblies when they are tested. However, adjustments may be necessary after repairs have been made to the instrument.

Usually the only assembly that may require adjustments is the assembly that has been replaced.

Read the Safety Summary at the beginning of this manual before performing any adjustment procedures.

Software calibration should be done on the HP 1652B/1653B oscilloscope under any of the following conditions:

At six month intervals or every 1,000 hours.

If the ambient temperature changes more than loo C from the temperature at the last software calibration.

To optimize measurement accuracy.

HP 16528/1653B

Service Manual

Adjustments and Calibration

4-l

HP 1652B, 1653B User manual

Specifications and Main Features

Frequently Asked Questions

User Manual