GW Instek GUT-6000B User Manual

GUT-6000B
Digital IC Tester

USER MANUAL

INTRODUCTION.......................................................3

FEATURES...............................................................4

SPECIFICATIONS.....................................................5

CONTROLS & INDICATORS....................................6

KEYS’ INSTRUCTION...............................................7

OPERATIONAL INSTRUCTIONS.............................8

1. OPERATIONAL PROCEDURES.............................8

2. TESTING PROCEDURES......................................9

3. AUTO LOOP TEST.....................................................10

4. AUTO Search..............................................................11

TROUBLE SHOOTING.............................................12

MESSAGE DESCRIPTION.......................................13

KEY CODE DESCRIPTION......................................15

KEY CODE TABLES.................................................16

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INTRODUCTION

GOOD WILL INSTRUMENT CO., LTD., accumulated over 30 years experiences in
electronic products’ research and development, is a pioneering manufacturer in IC
testers industry. The GUT-6000B, desktop design, is a newly launched and best
quality possible and multi-functions equipped product.

User’s friendly sets up by replacing another IC; the GUT-6000B continues to
undertake the task. The hard ware design of ''black-light'' function extends user’s
convenience for testing ICs in an inadequate light environment. The Buzzer key built
in variou s tones can easily identify the testing result. The unique capability
in identifying over 1800 CMOS/TTL digital ICs (up to 24 pins) surpasses the other
major digital IC testers.

The GUT-6000B feature such as built in ''auto search & test'' speeds to ide nti fy and
test IC. In addition, the ''loop'' design for continuously testing function is intelligently
applied to detect defective ICs and their stability. All these strengths provide
significantly conveniences for digital IC testers.

All the GUT-6000B accumulated incalculable benefits are to be discovered as users
utilize the value-added, multi-functions equipped tester. This is a best choice for the
factories, R&D sections, maintenance departments, laboratories as well as academics
because it really cre ates future with your business.

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FEATURES

1. Reliable desktop design.

2. User’s friendly set up and operates.

3. 16 X 1 character LCD display.

4. Built in 6 functions and 10 numerical keys.

5. Identifier over 1800 CMOS/TTL digital ICs (up to 24 pins).

6. High test speed at an average 0.6 second for one IC test.

7. The following IC series can be tested under 5V, 3.3V, 3.0V, 2.5V.
(1) 54/74 TTL series.

(2)40/45 CMOS series.

(3) Driver series.
(4)Other compatible ICs with the above mentioned devices.

8. “AUTO” function key supports “auto search and test” function. User only to put the

IC into the socket, no need to press any key, no need to process any other

movement, the “auto search and test’ will continue processing.

9. “LOOP” function key supports “continue examining”, able to make sure reliability of

the IC.

10. Various “BUZZER” sounds to presents the test results “FAIL”, or “PASS”.

Display

16*1 character dot matrix LCD display

TEST SOCKET

One position for 28 Pin IC socket

OPERATIONAL KEY
( 1 ) TYPE, BUZZER, VOLTAGE, LOOP,

AUTO, GO, BACK SPACE

( 2 ) 10 numerical keys ( 0 – 9 )

TEST VOLTAGE

5V, 3.3V, 3.0V, 2.5V VDC

ALARM

Various tones for the test result

POWER SUPPLY

110/220VAC, 50/60 Hz (Auto range)

OPERATING
TEMPERATURE

10℃ to 40 ℃

STORAGE TEMPERATURE

0℃ to 50 ℃

MEASURENENT

13”(W) x 11.8”(D) x 4.3”(H)

WEIGHT

3.3 LB ( 1.5kg )

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SPECIFICATIONS

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CONTROLS & INDICATORS

(1) Liquid Crystal Display ........16x1 character 9x7 dot matrix LCD display.

(2) 28Pin Test IC Socket
(3) Keyboard

(4) Fuse ....................................1A, protects tester from damage.

(5) Power Switch ......................Power On or Off.

(6) AC Receptacle ....................Plug power cord.

(7) GND ....................................Ground

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KEYS' INSTRUCTION

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Operational Instructions

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Testing Procedures