Fairchild Semiconductor ISL9N308AD3ST, ISL9N308AD3 Datasheet

ISL9N308AD3 / ISL9N308AD3ST
N-Channel Logic Level UltraFET® Trench Power MOSFETs 30V, 50A, 8m
ISL9N308AD3 / ISL9N308AD3ST
June 2002
PWM Optimized
General Description
This device employs a new advanced trench MOSFET technology and features low gate charge while maintaining low on-resistance.
Optimized for switching applications, this device improves the overall efficiency of DC/DC converters and allows operation to higher switching frequencies.
Applications
• DC/DC converters
Features
• Fast switching
•r
•r
•Q
•Q
•C
= 0.0064Ω (Typ), VGS = 10V
DS(ON)
= 0.010Ω (Typ), VGS = 4.5V
DS(ON)
(Typ) = 24nC, VGS = 5V
g
(Typ) = 8nC
gd
(Typ) = 2600pF
ISS
D
D
G
S
D-PAK
TO-252
(TO-252)
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GS
I
D
P
D
, T
T
J
STG
Drain to Source Voltage 30 V Gate to Source Voltage ±20 V Drain Current Continuous (T Continuous (T Continuous (T Pulsed Figure 4 A Power dissipation
Derate above 25 Operating and Storage Temperature -55 to 175
= 25oC, VGS = 10V) Note 1
C
= 100oC, VGS = 4.5V) Note 1 48 A
C
= 25oC, VGS = 10V, R
C
o
C
C
G DS
= 25°C unless otherwise noted
= 52oC/W) 14 A
θJC
I-PAK
(TO-251AA)
G
S
50 A
100
0.67
W
W/oC
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-252, TO-251 1.5 Thermal Resistance Junction to Ambient TO-252, TO-251 100 Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
N308AD ISL9N308AD3ST TO-252AA 330mm 16mm 2500 units N308AD ISL9N308AD3 TO-251AA Tube N/A 75 units
©2002 Fairchild Semiconductor Corporation
ISL9N308AD3 / ISL9N308AD3ST Rev C
o
C/W
o
C/W
o
C/W
ISL9N308AD3 / ISL9N308AD3ST
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 25V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150
V
GS
o
- - 250
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA1-3V
I
= 50A, VGS = 10V - 0.0064 0.008
Drain to Source On Resistance
D
= 48A, VGS = 4.5V - 0.010 0.012
I
D
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(5) g(TH) gs gd
Input Capacitance Output Capacitance - 520 - pF Reverse Transfer Capacitance - 225 - pF Total Gate Charge at 10V VGS = 0V to 10V Total Gate Charge at 5V VGS = 0V to 5V - 24 37 nC Threshold Gate Charge VGS = 0V to 1V - 2.6 4.0 nC Gate to Source Gate Charge - 7 - nC Gate to Drain “Miller” Charge - 8 - nC
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 15 - ns Rise Time - 67 - ns Turn-Off Delay Time - 35 - ns Fall Time - 32 - ns Turn-Off Time - - 100 ns
(VGS = 4.5V)
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
= 15V, ID = 14A
DD
V
= 4.5V, RGS = 6.2
GS
= 15V
V
DD
I
= 48A
D
= 1.0mA
I
g
-2600- pF
-4568nC
- - 122 ns
µA
Switching Characteristics (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 8 - ns Rise Time - 40 - ns Turn-Off Delay Time - 64 - ns Fall Time - 31 - ns Turn-Off Time - - 142 ns
GS
Unclamped Inductive Switching
t
AV
Avalanche Time ID = 3.2A, L = 3.0mH 215 - - µs
Drain-Source Diode Characteristics
V
SD
t
rr
Q
RR
Notes: 1: TO-251AA continuous current limited by package to 35A.
©2002 Fairchild Semiconductor Corporation
Source to Drain Diode Voltage Reverse Recov ery Time ISD = 48A, dISD/dt = 100A/µs- - 26 ns
Reverse Recovered Charge ISD = 48A, dISD/dt = 100A/µs- - 14 nC
= 10V)
- - 71 ns
= 15V, ID = 14A
V
DD
= 10V, RGS = 6.2
V
GS
I
= 48A - - 1.25 V
SD
= 20A - - 1.0 V
I
SD
ISL9N308AD3 / ISL9N308AD3ST Rev C
ISL9N308AD3 / ISL9N308AD3ST
Typical Characteristic T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
10
60
50
40
30
20
, DRAIN CURRENT (A)
D
I
10
150
0
25 50 75 100 125 150 175
Figure 2. Maximum Contin uous Drain Current vs
-3
t, RECTANGULAR PULSE DURATION (s)
-2
10
VGS = 4.5V
TC, CASE TEMPERATURE (oC)
Case Temperature
P
DM
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
θJC
10
1/t2
0
x R
θJC
t
+ T
VGS = 10V
1
t
2
C
1
10
1000
VGS = 10V
VGS = 5V
, PEAK CURRENT (A)
100
DM
I
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
40
-5
10
©2002 Fairchild Semiconductor Corporation
Figure 3. Normalized Maximum Transient Thermal Impedance
TC = 25oC FOR TEMPERATURES
ABOVE 25 CURRENT AS FOLLOWS:
I = I
-4
10
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
Figure 4. Peak Current Capability
o
C DERATE PEAK
175 - T
25
150
0
10
ISL9N308AD3 / ISL9N308AD3ST Rev C
C
10
1
ISL9N308AD3 / ISL9N308AD3ST
Typical Characteristic (Continued) T
100
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
= 15V
V
DD
75
50
, DRAIN CURRENT (A)
D
25
I
TJ = 25oC
0
12345
TJ = 175oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
= 25°C unless otherwise noted
C
Figure 5. Transfer Ch aracteri stics Figure 6. Saturation Character istics
25
ID = 32A
20
15
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
= 25oC
T
C
100
VGS = 10V
75
50
, DRAIN CURRENT (A)
D
I
25
PULSE DURATION = 80µs
0
0 0.5 1.0 1.5 2.0
2.0
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
1.5
DUTY CYCLE = 0.5% MAX
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 4.5V
VGS = 3.5V
VGS = 3V
T
= 25oC
C
, DRAIN TO SOURCE
DS(ON)
r
ID = 14A
ON RESISTANCE (mΩ)
10
5
246810
ID = 50A
V
, GATE TO SOURCE VOLTAGE (V)
GS
Figure 7. Drain to Source On Resis tanc e vs Ga te
Voltage and Drain Current
1.4
1.2
1.0
0.8
0.6
NORMALIZED GATE
THRESHOLD VOLTAGE
0.4
0.2
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
Figure 9. Normalized Gate Thres hold Volta ge v s
Junction Temperature
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 50A
Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
1.2
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200
, JUNCTION TEMPERATURE (oC)
T
J
ID = 250µA
Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
©2002 Fairchild Semiconductor Corporation
ISL9N308AD3 / ISL9N308AD3ST Rev C
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