The HGT1S7N60A4S9A, HGTG7N6 0A4 and HGTP7N 60A4
are MOS gated high voltage switching devices combining
the best fe atures of MOSFETs and bipolar t ransistors . These
devices have the high input impedance of a MOSFET and
the low on-state conduction loss of a bipolar transistor. The
much lower on-state voltage drop varies only moderately
between 25
This IGBT is ideal for many high voltage switching
applications operating at high frequencies where low
conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
CAUTION: Stresses above those listed in “Device M aximum Ratings” m ay cause permanent da mage to the device. This is a stress only rating and operation of th e
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
34A
14A
56A
±20V
±30V
25mJ at 7A
125W
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
J
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
Collector to Emitter Saturation VoltageV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
Current Turn-On Delay Timet
Current Rise Timet
Current Turn-Off Delay Timet
Current Fall Timet
Turn-On Energy (Note 2)E
Turn-On Energy (Note 2)E
Turn-Off Energy (Note 3)E
AS
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI
ON1
ON2
OFF
IC = 250µA, VGE = 0V600--V
IC = -10mA, V
= 0V20--V
GE
VCE = 600VTJ = 25oC--250µA
T
= 125oC--2mA
J
= 7A,
V
GE
= 15V
T
= 25oC-1.92.7V
J
T
= 125oC-1.62.2V
J
IC = 250µA, VCE = 600V4.55.97.0V
VGE = ±20V--±250nA
= 150oC, RG = 25Ω, VGE = 15V
J
L = 100µH, V
CE
= 600V
35--A
ICE = 7A, L = 500µH25--mJ
IC = 7A, VCE = 300V-9. 0-V
IC = 7A,
Current Fall Timet
Turn-On Energy (Note 2)E
Turn-On Energy (Note 2)E
Turn-Off Energy (Note 3)E
Thermal Resistance Junction To CaseR
rI
fI
ON1
ON2
OFF
θJC
IGBT and Diode at TJ = 125oC
= 7A
I
CE
= 390V
V
CE
V
= 15V
GE
= 25Ω
R
G
L = 1mH
Test Circuit (Figure 20)
NOTES:
2. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T
Figure 20.
3. Turn-Off Energy Loss (E
at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.