Fairchild Semiconductor HGTP3N60A4, HGTD3N60A4S Datasheet

HGTD3N60A4S, HGTP3N60A4
Data Sheet August 2003
600V, SMPS Series N-Channel IGBT
The HGTD3N60A4S and the H GTP3N60A4 are MOS gated high voltage switching devices combining the best features of MOSFETs and bipol ar transis tors. Thes e devic es hav e the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on­state volta ge drop v aries o nly moder ately bet ween 2 5
o
150
C.
o
C and
This IGBT is ideal for many high voltage switching applications operating at high frequencies where low conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49327.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTD3N60A4S TO-252AA 3N60A4 HGTP3N60A4 TO-220AB 3N60A4
NOTE: When ordering, use the entire part number.
Symbol
C
Features
• >100kHz Operation at 390V, 3A
• 200kHz Operation at 390V, 2.5A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 70ns at T
•12mJ E
Capability
AS
• Low Conduction Loss
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount Components to PC Boards”
Packaging
JEDEC TO-252AA
G
E
COLLECTOR
(FLANGE)
JEDEC TO-220AB
= 125oC
J
G
COLLECTOR
(FLANGE)
E
FAIRCHILD CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
©2003 Fairchild Semiconductor Corporation HGTD3N60A4S, HGTP3N60A4 Rev. B1
E
C
G
HGTD3N60A4S, HGTP3N60A4
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
ALL TYPES UNITS
Collector to Emitter Voltag e. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
CES
600 V
Collector Current Continuous
At T
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
C
= 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Gate to Emitter Voltage Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Switching Safe Operating Area at T Single Pulse Avalanche Energy at T Power Dissipation Total at T Power Dissipation Derating T
= 150oC, Figure 2 . . . . . . . . . . . . . . . . . . . . . . . .SSOA 15A at 600V
J
= 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
C
= 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
C
> 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.56 W/oC
C
Operating and Storage Junction Temperature Range. . . . . . . . . . . . . . . . . . . . . . . T
C25
C110
CM
GES
GEM
AS
D
, T
J
STG
Maximum Lead Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
17 A
8A
40 A
±20 V ±30 V
12mJ at 3A
70 W
-55 to 150
300 260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
Pulsed Avalanche Energy E Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E
AS
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI ON1 ON2 OFF
IC = 250µA, VGE = 0V 600 - - V IC = -10mA, V
= 0V 20 - - V
GE
VCE = 600V TJ = 25oC - - 250 µA
T
= 125oC--2.0mA
J
= 3A,
V
GE
= 15V
T
= 25oC-2.02.7V
J
T
= 125oC-1.62.2V
J
IC = 250µA, VCE = 600V 4.5 6.1 7.0 V VGE = ±20V - - ±250 nA
= 150oC, RG = 50Ω, VGE = 15V
J
L = 200µH, V
CE
= 600V
15 - - A
ICE = 3A, L = 2.7mH 12 - - mJ IC = 3A, VCE = 300V - 8.8 - V IC = 3A,
V
= 300V
CE
IGBT and Diode at TJ = 25oC
= 3A
I
CE
= 390V
V
CE
V
= 15V
GE
= 50
R
G
L = 1mH Test Circuit - Figure 20
= 15V - 21 25 nC
V
GE
V
= 20V - 26 32 nC
GE
-6-ns
-11- ns
-73- ns
-47- ns
-37- µJ
-5570µJ
-2535µJ
©2003 Fairchild Semiconductor Corporation HGTD3N60A4S, HGTP3N60A4 Rev. B1
HGTD3N60A4S, HGTP3N60A4
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 125oC I
= 3A
CE
= 390V
V
CE
= 15V
V
GE
R
= 50
G
L = 1mH Test Circuit - Figure 20
NOTES:
2. Turn-Off Energy Loss (E at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
3. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T Figure 20.
Typical Performance Curves Unless Otherwise Specified
20
16
V
= 15V
GE
20
TJ = 150oC, RG = 50Ω, V
16
-5.58 ns
-1215ns
- 110 165 ns
- 70 100 ns
-37- µJ
- 90 100 µJ
-5080µJ
--1.8oC/W
is the turn-on loss of the IGBT only. E
ON1
as the IGBT. The diode type is specified in
J
= 15V, L = 200µH
GE
ON2
12
8
4
, DC COLLECTOR CURRENT (A)
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
600
300
200
f
= 0.05 / (t
MAX1
= (PD - PC) / (E
f
MAX2
100
P
= CONDUCTION DISSIPATION
C
, OPERATING FREQUENCY (kHz)
MAX
f
50
(DUTY FACTOR = 50%) = 1.8oC/W, SEE NOTES
R
ØJC
TJ = 125oC, RG = 50Ω, L = 1mH, V
1
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
d(OFF)I
ON2
+ t
d(ON)I
+ E
OFF
)
)
= 390V
CE
TCV
o
C
75
GE
15V
54
FIGURE 3. OPERATING FREQUENCY vs COLLECT OR TO
EMITTER CURRENT
12
8
4
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
20 64
VCE = 390V, RG = 50Ω, TJ = 125oC
t
SC
16
14
12
10
8
6
, SHORT CIRCUIT WITHSTAND TIME (µs)
4
SC
623
t
10 11 12 15
, GATE TO EMITTER V OLTAGE (V)
V
GE
I
SC
13 14
5618
48
40
32
24
16
8
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
0
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
©2003 Fairchild Semiconductor Corporation HGTD3N60A4S, HGTP3N60A4 Rev. B1
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