Fairchild Semiconductor HGTP20N60A4, HGTG20N60A4 Datasheet

HGTG20N60A4, HGTP20N60A4
Data Sheet December 2001
600V, SMPS Series N-Channel IGBTs
The HGTG20N60A4 and HGTP20N 60A4 are M OS gated high voltage switching devices combining the best features of MOSFETs and bipol ar transis tors. Thes e devic es hav e the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25 and 150
o
C.
o
C
This IGBT is ideal for many high voltage switchin g applications operating at high frequencies where low conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49339.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTP20N60A4 TO-220AB 20N60A4 HGTG20N60A4 TO-247 20N60A4
NOTE: When ordering, use the entire part number.
Symbol
C
Features
• >100kHz Operation at 390V, 20A
• 200kHz Operation at 390V, 12A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 55ns at T
• Low Conduction Loss
Temperature Compe nsating SABER™ Model www.intersil.com
• Related Literature
- TB334 “Guidelines f or Solde ring Surface Mount
Components to PC Boards
Packaging
JEDEC TO-220AB ALTERNATE VERSION
COLLECTOR
(FLANGE)
E
C
G
= 125oC
J
JEDEC STYLE TO-247
E
G
E
FAIRCHILD SEMICONDUCTOR IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
C
G
COLLECTOR
(FLANGE)
©2001 Fairchild Semiconductor Corpo ration HGTG20N60A4, HGTP20N60A4 Rev. B
HGTG20N60A4, HGTP20N60A4
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specified
HGTG20N60A4, HGTP20N60A4 UNITS
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
CES
600 V
Collector Current Continuous
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
= 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Switching Safe Operating Area at T Pow er Dissi pation Total at T
C
Power Dissipation Derating T
= 150oC (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . SSOA 100A at 600V
J
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
> 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.32 W/oC
C
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . T
C25
C110
CM
GES
GEM
D
, T
J
STG
Maximum Lead T emperature f or Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
70 A 40 A
280 A
±20 V ±30 V
290 W
-55 to 150
300 260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications
TJ = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI ON1 ON2 OFF
IC = 250µA, VGE = 0V 600 - - V IC = 10mA, V
= 0V 15 - - V
GE
VCE = 600V TJ = 25oC - - 250 µA
T
= 125oC--2.0mA
J
= 20A,
V
GE
= 15V
T
= 25oC-1.82.7V
J
T
= 125oC-1.62.0V
J
IC = 250µA, VCE = 600V 4.5 5.5 7.0 V VGE = ±20V - - ±250 nA
= 150oC, RG = 3Ω, VGE = 15V
J
L = 100µH, V
CE
= 600V
100 - - A
IC = 20A, VCE = 300V - 8.6 - V IC = 20A,
= 300V
V
CE
IGBT and Diode at TJ = 25oC
= 20A
I
CE
V
= 390V
CE
=15V
V
GE
= 3
R
G
L = 500µH Test Circuit (Figure 20)
V
= 15V - 142 162 nC
GE
V
= 20V - 182 210 nC
GE
-15- ns
-12- ns
-73- ns
-32- ns
- 105 - µJ
- 280 350 µJ
- 150 200 µJ
©2001 Fairchild Semiconductor Corpo ration HGTG20N60A4, HGTP20N60A4 Rev. B
HGTG20N60A4, HGTP20N60A4
Electrical Specifications
TJ = 25oC, Unless Otherwise Specified (Continued)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 125oC I
= 20A
CE
= 390V
V
CE
= 15V
V
GE
R
= 3
G
L = 500µH Test Circuit (Figure 20)
NOTES:
2. Turn-Off Energy Loss (E at the point where the collector current equals zero (I of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
3. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T Figure 20.
Typical Performance Curves
100
DIE CAPABILITY
80
Unless Otherwise Specified
V
= 15V
GE
120
TJ = 150oC, RG = 3Ω, V
100
-1521ns
-1318ns
- 105 135 ns
-5573ns
- 115 - µJ
- 510 600 µJ
- 330 500 µJ
- - 0.43
is the turn-on loss of the IGBT only. E
ON1
as the IGBT. The diode type is specified in
J
= 15V, L = 100µH
GE
o
C/W
ON2
PACKAGE LIMIT
60
40
20
, DC COLLECTOR CURRENT (A)
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERA TURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
500
300
f
= 0.05 / (t
MAX1
f
= (PD - PC) / (E
MAX2
= CONDUCTION DISSIPATION
P
C
(DUTY FACTOR = 50%) = 0.43oC/W, SEE NOTES
R
ØJC
TJ = 125oC, RG = 3, L = 500µH, V
5
I
, OPERATING FREQUENCY (kHz)
MAX
f
100
40
d(OFF)I
, COLLECTOR TO EMITTER CURRENT (A)
CE
ON2
+ t
d(ON)I
+ E
OFF
)
)
= 390V
CE
TCV
o
75
C
GE
15V
4030
FIGURE 3. OPERATING FREQUENCY vs COLLECTOR T O
EMITTER CURRENT
80
60
40
20
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
VCE = 390V, RG = 3Ω, TJ = 125oC
12
10
8
6
4
2
, SHORT CIRCUIT WITHSTAND TIME (µs)
0
SC
t
5010 20
10 11 12 15
VGE, GATE TO EMITTE R VOLTAGE (V)
I
SC
t
SC
13 14
45014
400
350
300
250
200
150
100
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
©2001 Fairchild Semiconductor Corpo ration HGTG20N60A4, HGTP20N60A4 Rev. B
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