Fairchild Semiconductor HGTP12N60A4, HGTG12N60A4 Datasheet

HGTP12N60A4, HGTG12N60A4,
HGT1S12N60A4S9A
Data Sheet August 2003
600V, SMPS Series N-Channel IGBTs
The HGTP12N60A4, HGTG12N60A4 and HGT1S12N60A4S9A are MOS gated high voltage switching devices combining the best features of MOSFETs and bipolar transistors. These devices have the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transis tor. The much lower on-state voltage drop varies only moderately between 25
o
C and 150oC.
This IGBT is ideal for many high voltage switching applications operating at high frequencies where low conduction losses are essential. This device has been optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49335.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTP12N60A4 TO-220AB 12N60A4 HGTG12N60A4 TO-247 12N60A4 HGT1S12N60A4S9A TO-263AB 12N60A4
NOTE: When ordering, use the entire part number.
Symbol
C
Features
• >100kHz Operation at 390V, 12A
• 200kHz Operation at 390V, 9A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 70ns at T
• Low Conduction Loss
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount Components to PC Boards
Packaging
JEDEC TO-220AB ALTERNATE VERSION
COLLECTOR (FLANGE)
JEDEC TO-263AB
= 125oC
J
E C G
G
G
E
FAIRCHILD CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
E
JEDEC STYLE TO-247
COLLECTOR
(BOTTOM SIDE METAL)
COLLECTOR (FLANGE)
E
C
G
©2003 Fairchild Semiconductor Corporation HGTP12N60A4, HGTG12N60A4, HGT1S12N60A4S9A Rev. B2
HGTP12N60A4, HGTG12N 60A4, HGT1S12N60A4S9A
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
HGTG12N60A4, HGTP12N60A4,
HGT1S12N60A4S9A UNITS
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .BV
CES
600 V
Collector Current Continuous
At T
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
C
= 110oC
At T
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .C110
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Switching Safe Operating Area at T Powe r Dissipation Total at T
C
Power Dissipation Derating T
= 150oC, Figure 2 . . . . . . . . . . . . . . . . . . . . . . . . SSOA 60A at 600V
J
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
> 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.33 W/oC
C
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . T
C25
CM
GES
GEM
D
, T
J
STG
Maximum Lead T emperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
54 A 23 A 96 A
±20 V ±30 V
167 W
-55 to 150
300 260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI ON1 ON2 OFF
IC = 250µA, VGE = 0V 600 - - V IC = -10mA, V
= 0V 20 - - V
GE
VCE = 600V TJ = 25oC - - 250 µA
T
= 125oC--2.0mA
J
= 12A,
V
GE
= 15V
T
= 25oC-2.02.7V
J
T
= 125oC-1.62.0V
J
IC = 250µA, VCE = 600V - 5.6 - V VGE = ±20V - - ±250 nA
= 150oC, RG = 10Ω, VGE = 15V
J
L = 100µH, V
CE
= 600V
60 - - A
IC = 12A, VCE = 300V - 8 - V IC = 12A,
= 300V
V
CE
IGBT and Diode at TJ = 25oC I
= 12A
CE
= 390V
V
CE
=15V
V
GE
R
= 10
G
L = 500µH Test Circuit (Figure 20)
V
= 15V - 78 96 nC
GE
V
= 20V - 97 120 nC
GE
-17- ns
-8-ns
-96- ns
-18- ns
-55- µJ
- 160 - µJ
-50- µJ
©2003 Fairchild Semiconductor Corporation HGTP12N60A4, HGTG12N60A4, HGT1S12N60A4S9A Rev. B2
HGTP12N60A4, HGTG12N 60A4, HGT1S12N60A4S9A
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 3) E Turn-On Energy (Note 3) E Turn-Off Energy (Note 2) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 125oC I
= 12A
CE
= 390V
V
CE
= 15V
V
GE
R
= 10
G
L = 500µH Test Circuit (Figure 20)
NOTES:
2. Turn-Off Energy Loss (E at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
3. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T Figure 20.
Typical Performance Curves Unless Otherwise Specified
60
50
V
= 15V
GE
70
TJ = 150oC, RG = 10Ω, V
60
-17- ns
-16- ns
- 110 170 ns
-7095ns
-55- µJ
- 250 350 µJ
- 175 285 µJ
- - 0.75
is the turn-on loss of the IGBT only. E
ON1
as the IGBT. The diode type is specified in
J
= 15V, L = 200µH
GE
o
C/W
ON2
40
30
20
, DC COLLECTOR CURRENT (A)
10
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
500
V
T
300
100
f
= 0.05 / (t
MAX1
f
= (PD - PC) / (E
MAX2
= CONDUCTION DISSIPATION
P
C
(DUTY FACTOR = 50%) = 0.75oC/W, SEE NOTES
R
ØJC
, OPERATING FREQUENCY (kHz)
MAX
TJ = 125oC, RG = 10Ω, L = 500µH, V
f
10
1
I
CE
d(OFF)I
3
, COLLECTOR TO EMITTER CURRENT (A)
+ t
ON2
d(ON)I
+ E
OFF
)
)
CE
= 390V
75
C
o
15V
C
FIGURE 3. OPERATING FREQUENCY vs COLLECT OR TO
EMITTER CURRENT
GE
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
20
VCE = 390V, RG = 10Ω, TJ = 125oC
18 16 14 12 10
8 6 4 2
, SHORT CIRCUIT WITHSTAND TIME (µs)
0
SC
t
3010 20
9101112 15
V
, GATE TO EMITTER V OLTAGE (V)
GE
I
SC
t
SC
13 14
300 275 250 225 200 175 150 125 100 75
50
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
©2003 Fairchild Semiconductor Corporation HGTP12N60A4, HGTG12N60A4, HGT1S12N60A4S9A Rev. B2
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