Fairchild Semiconductor HGTP7N60A4, HGTG7N60A4, HGT1S7N60A4S Datasheet

HGT1S7N60A4S9A, HGTG7N60A4
Data Sheet August 2003
HGTP7N60A4
600V, SMPS Series N-Channel IGBT
The HGT1S7N60A4S9A, HGTG7N6 0A4 and HGTP7N 60A4 are MOS gated high voltage switching devices combining the best fe atures of MOSFETs and bipolar t ransistors . These devices have the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25
This IGBT is ideal for many high voltage switching applications operating at high frequencies where low conduction losses are essential. This device has been optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49331.
PART NUMBER PACKAGE BRAND
HGT1S7N60A4S9A TO-263AB 7N60A4 HGTG7N60A4 TO-247 7N60A4 HGTP7N60A4 TO-220AB 7N60A4
NOTE: When ordering, use the entire part number.
o
C and 150oC.
Features
• >100kHz Operation at 390V, 7A
• 200kHz Operation at 390V, 5A
• 600V Switching SOA Capability
• Typical Fall Time
. . . . . . . . . . . . . . . . . . . 75ns at T
• Low Conduction Loss
SymbolOrdering Information
G
= 125oC
J
C
E
Packaging
JEDEC STYLE TO-247 JEDEC TO-220AB
E
C
G
E C G
COLLECTOR
COLLECTOR
(BOTTOM SIDE METAL)
FAIRCHILD CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
JEDEC TO-263AB
G
E
(FLANGE)
COLLECTOR (FLANGE)
©2003 Fairchild Semiconductor Corporation HGT1S7N60A4S9A, HGTG7N60A4, HGTP7N60A4 Rev. B1
HGT1S7N60A4S9A, HGTG7N60A4, HGTP7N60A4
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
ALL TYPES UNITS
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
CES
600 V
Collector Current Continuous
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
= 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
Collector Current Pulsed (N o t e 1 ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Switching Safe Operating Area at T Single Pulse Avalanche Energy at T Powe r Dissipation Total at T
C
Power Dissipation Derating T
= 150oC, Figure 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . .SSOA 35A at 600V
J
= 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
C
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
> 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0 W/oC
C
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . T
C25
C110
CM
GES
GEM
AS
D
, T
J
STG
Maximum Lead T emperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Device M aximum Ratings” m ay cause permanent da mage to the device. This is a stress only rating and operation of th e device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
34 A 14 A 56 A
±20 V ±30 V
25mJ at 7A
125 W
-55 to 150
300 260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
Pulsed Avalanche Energy E Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t Current Rise Time t Current Turn-Off Delay Time t Current Fall Time t Turn-On Energy (Note 2) E Turn-On Energy (Note 2) E Turn-Off Energy (Note 3) E
AS
GEP
g(ON)
d(ON)I
rI
d(OFF)I
fI ON1 ON2 OFF
IC = 250µA, VGE = 0V 600 - - V IC = -10mA, V
= 0V 20 - - V
GE
VCE = 600V TJ = 25oC - - 250 µA
T
= 125oC--2mA
J
= 7A,
V
GE
= 15V
T
= 25oC-1.92.7V
J
T
= 125oC-1.62.2V
J
IC = 250µA, VCE = 600V 4.5 5.9 7.0 V VGE = ±20V - - ±250 nA
= 150oC, RG = 25Ω, VGE = 15V
J
L = 100µH, V
CE
= 600V
35 - - A
ICE = 7A, L = 500µH25--mJ IC = 7A, VCE = 300V - 9. 0 - V IC = 7A,
= 300V
V
CE
IGBT and Diode at TJ = 25oC I
= 7A
CE
= 390V
V
CE
= 15V
V
GE
R
= 25
G
L = 1mH Test Circuit (Figure 20)
V
= 15V - 37 45 nC
GE
V
= 20V - 48 60 nC
GE
-11- ns
-11- ns
- 100 - ns
-45- ns
-55- µJ
- 120 150 µJ
-6075µJ
©2003 Fairchild Semiconductor Corporation HGT1S7N60A4S9A, HGTG7N60A4, HGTP7N60A4 Rev. B1
HGT1S7N60A4S9A, HGTG7N60A4, HGTP7N60A4
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 2) E Turn-On Energy (Note 2) E Turn-Off Energy (Note 3) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 125oC
= 7A
I
CE
= 390V
V
CE
V
= 15V
GE
= 25
R
G
L = 1mH Test Circuit (Figure 20)
NOTES:
2. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T Figure 20.
3. Turn-Off Energy Loss (E at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
Typical Performance Curves Unless Otherwise Specified
35
30
25
V
= 15V
GE
40
TJ = 150oC, RG = 25Ω, V
30
-10- ns
-7-ns
- 130 150 ns
-7585ns
-50- µJ
- 200 215 µJ
- 125 170 µJ
--1.0oC/W
is the turn-on loss of the IGBT only. E
ON1
as the IGBT. The diode type is specified in
J
= 15V, L = 100µH
GE
ON2
20
15
10
, DC COLLECTOR CURRENT (A)
5
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
500
200
100
f
= 0.05 / (t
MAX1
= (PD - PC) / (E
f
MAX2
P
= CONDUCTION DISSIPATION
C
, OPERATING FREQUENCY (kHz)
MAX
f
30
(DUTY FACTOR = 50%)
R
= 1.0oC/W, SEE NOTES
ØJC
TJ = 125oC, RG = 25Ω, L = 2mH, V
1
d(OFF)I
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
ON2
+ t
d(ON)I
+ E
OFF
)
)
= 390V
CE
TCV
o
75
C
15V
FIGURE 3. OPERATING FREQUENCY vs COLLECT OR TO
EMITTER CURRENT
GE
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
s)
µ
14
12
10
8
6
20510
, SHORT CIRCUIT WITHSTAND TIME (
4
SC
t
10
VCE = 390V, RG = 25Ω, TJ = 125oC
I
SC
t
SC
11 12 15
VGE, GATE TO EMITTER VOLTAGE (V)
13 14
14016
120
100
80
60
40
20
, PEAK SHORT CIRCUIT CURRENT (A )
SC
I
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
©2003 Fairchild Semiconductor Corporation HGT1S7N60A4S9A, HGTG7N60A4, HGTP7N60A4 Rev. B1
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