Fairchild Semiconductor HGTG30N60B3 Datasheet

Data Sheet August 2003
HGTG30N60B3
60A, 600V, UFS Series N-Channel IGBT
The HGTG30N60B3 is a MOS gated high voltage switching device com binin g the b est f e atures of MO SFETs a nd bip olar transistors. This device has the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25
o
C and 150oC.
The IGBT is ideal for many high voltage switching applications operating at moderate frequencies where low conduction losses are essential, such as: AC and DC motor controls, pow er su ppl ies and drivers for solenoids, relays and contactors.
Formerly Developmental Type TA49170.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTG30N60B3 TO-247 G30N60B3
NOTE: When ordering, use the entire part number.
Symbol
C
Features
• 60A, 600V, TC = 25oC
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 90ns at T
• Short Circuit Rating
• Low Conduction Loss
Packaging
JEDEC STYLE TO-247
E
C
G
COLLECTOR
(BACK METAL)
= 150oC
J
G
E
FAIRCHILD CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
©2003 Fairchild Semiconductor Corporation HGTG30N60B3 Rev. B2
HGTG30N60B3
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
HGTG30N60B3 UNITS
Collector to Emitter Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .BV
CES
600 V
Collector Current Continuous
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
= 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At T
C
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Switching Safe Operating Area at T Powe r Dissipation Total at T
C
Power Dissipation Derating T
= 150oC (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . SSOA 60A at 600V
J
= 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
> 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.67 W/oC
C
Reverse Voltage Avalanche Energy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .E
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . T
Maximum Lead T emperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Short Circuit Withstand Time (Note 2) at V Short Circuit Withstand Time (Note 2) at V
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
= 12V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
GE
= 10V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
GE
C25
C110
CM
GES
GEM
D
ARV
, T
J
STG
L SC SC
60 A 30 A
220 A
±20 V ±30 V
208 W
100 mJ
-55 to 150 260
4 µs
10 µs
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. V
Electrical Specifications T
= 360V, TJ = 125oC, RG = 3Ω.
CE(PK)
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CES ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA T
IC = 250µA, VGE = 0V 600 - - V IC = -10mA, V VCE = BV
= I
C110
= 15V
V
GE
IC = 250µA, VCE = V
= 0V 20 - - V
GE
CES
,
TC = 25oC - - 250 µA T
= 150oC--3.0mA
C
T
= 25oC - 1.45 1.9 V
C
T
= 150oC-1.72.1V
C
GE
4.2 5.0 6.0 V
VGE = ±20V - - ±250 nA
= 150oC,
J
= 3Ω,
R
G
= 15V,
V
GE
V
CE (PK)
V
CE (PK)
= 480V 200 - - A = 600V 60 - - A
L = 100µH Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E
GEP
G(ON)
rI
fI ON1 ON2 OFF
IC = I IC = I
V
CE
IGBT and Diode at TJ = 25oC I
CE
VCE = 0.8 BV VGE = 15V R
G
L = 1mH Test Circuit (Figure 17)
C110 C110
= 0.5 BV
= I
C110
= 3
, VCE = 0.5 BV ,
VGE = 15V - 170 190 nC
CES
V
CES
CES
= 20V - 230 250 nC
GE
-7.2- V
-36- ns
-25- ns
- 137 - ns
-58- ns
- 500 - µJ
- 550 800 µJ
- 680 900 µJ
©2003 Fairchild Semiconductor Corporation HGTG30N60B3 Rev. B2
HGTG30N60B3
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E Thermal Resistance Junction To Case R
rI
fI ON1 ON2 OFF
θJC
IGBT and Diode at TJ = 150oC I
= I
CE
C110
VCE = 0.8 BV VGE = 15V R
= 3
G
CES
L = 1mH Test Circuit (Figure 17)
NOTES:
3. Turn-Off Energy Loss (E at the point where the collector current equals zero (I
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
CE
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T Figure 17.
Typical Performance Curves Unless Otherwise Specified
60
50
40
30
20
, DC COLLECTOR CURRENT (A)
10
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
V
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
GE
= 15V
225
TJ = 150oC, RG = 3Ω, V
200 175 150 125 100
75 50 25
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
100 500 600 VCE, COLLECTOR TO EMITTER VOLTAGE (V)
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
-32- ns
-24- ns
- 275 320 ns
- 90 150 ns
- 500 - µJ
- 1300 1550 µJ
- 1600 1900 µJ
--0.6oC/W
is the turn-on loss of the IGBT only. E
ON1
as the IGBT. The diode type is specified in
J
= 15V, L =100µH
GE
200
300 400
ON2
700
100
10
f
= 0.05 / (t
MAX1
, OPERATING FREQUENCY (kHz)
MAX
f
1
0.1
= (PD - PC) / (E
f
MAX2
PC = CONDUCTION DISSIPATION
(DUTY FACTOR = 50%)
R
= 0.6oC/W, SEE NOTES
ØJC
5
I
d(OFF)I
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
TJ = 150oC, RG = 3Ω, L = 1mH,
T
)
75
)
OFF
110 110oC10V
C
o
C
o
75
C10V
o
C
+ t
ON2
d(ON)I
+ E
V 15V
15V
GE
V
= 480V
CE
FIGURE 3. OPERATING FREQUENCY vs COLLECT OR TO
20
VCE = 360V, RG = 3Ω, TJ = 125oC
18 450
16
14
12
10
8
, SHORT CIRCUIT WITHSTAND TIME (µs)
6
6020 40
SC
t
10 11 12 13 14 15
V
, GATE TO EMITTER VOLTAGE (V)
GE
I
SC
t
SC
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
500
400
350
300
250
200
150
EMITTER CURRENT
©2003 Fairchild Semiconductor Corporation HGTG30N60B3 Rev. B2
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
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