The FGH60N6S2 is a Low Gate Charge, Low Plateau Voltage SMPS II IGBT combining the fast switching speed of
the SMPS IGBTs along with lower gate charge and plateau
voltage and av alanche capability (UIS). These LGC devices
shorten delay times, and reduce the power requirement of
the gate drive. These de vices are ideally suited for high volt age switched mode power supply applications where low
conduction loss, fast s wit ching times and UIS capabilit y are
essential. SMPS II LGC devices have been specially designed for:
• Power Factor Correction (PFC) circuits
• Full bridge topologies
• Half bridge topologies
• Push-Pull circuits
• Uninterruptible power supplies
• Zero voltage and zero current switching circuits
Formerly Developmental Type TA49346.
Features
• 100kHz Op eration at 390V, 52A
• 200kHZ Operation at 390V, 31A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . .77ns at TJ = 125
Collector to Emitter Breakdown Voltage600V
Collector Current Continuous, TC = 25°C75A
Collector Current Continuous, TC = 110°C75A
Collector Current Pulsed (Note 1)320A
Gate to Emitter Voltage Continuous±20V
Gate to Emitter Voltage Pulsed±30V
Pulsed Avalanche Energy, ICE = 20A, L = 1.3mH, VDD = 50V700mJ
Power Dissi pation Total TC = 25°C625W
D
Power Dissipation Derating T
Operating Junction Temperature Range-55 to 150°C
Collector to Emitter Breakdown Voltage IC = 250µA, VGE = 0600--V
CES
Emitter to Collector Breakdown Voltage IC = -10mA, VGE = 020--V
ECS
Collector to Emitter Leakage CurrentVCE = 600VTJ = 25°C--250µA
= 125°C--3 mA
T
J
Gate to Emitter Leakage CurrentVGE = ± 20V--±250nA
On State Characteristics
V
CE(SAT)
Collector to Emitter Saturation VoltageIC = 40A,
V
= 15V
GE
= 25°C-1.92.5V
T
J
= 125°C-1.652.2V
T
J
Dynamic Characteristics
Q
G(ON)
V
GE(TH)
V
GEP
Gate ChargeIC = 40A,
= 300V
V
CE
Gate to Emitter Threshold VoltageIC = 250µA, V
Gate to Emitter Plateau VoltageIC = 40A, VCE = 300V-6.58.0V
V
= 15V-140175nC
GE
= 20V-180225nC
V
GE
CE
= V
GE
3.54.35.0V
Switching Characteristics
SSOASwitching SOAT
t
d(ON)I
t
d(OFF)I
E
ON1
E
ON2
E
OFF
t
d(ON)I
t
d(OFF)I
E
ON1
E
ON2
E
OFF
Current Turn-On Delay TimeIGBT and Diode at TJ = 25°C,
Current Rise Time-15-ns
t
rI
Current Turn-Off Delay Time-70-ns
Current Fall Time-50-ns
t
fI
Turn-On Energy (Note 2)-400-µJ
Turn-On Energy (Note 2)-490-µJ
Turn-Off Energy (Note 3)-310450µJ
Current Turn-On Delay TimeIGBT and Diode at TJ = 125°C
Current Rise Time-32-ns
t
rI
Current T urn-Off Delay Time-110150ns
Current Fall Time-7790ns
t
fI
Turn-On Energy (Note 2)-400450µJ
Turn-On Energy (Note 2)-750850µJ
Turn-Off Energy (Note 3)-688950µJ
= 150°C, RG = 3Ω, VGE =
J
15V, L = 100µH, V
I
= 40A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3Ω
G
= 600V
CE
L = 100µH
Test Circuit - Figure 20
I
= 40A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3Ω
G
L = 100µH
Test Circuit - Figure 20
200--A
-18-ns
-27-ns
Thermal Characteristics
R
NOTE:
Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
2.
of the IGBT only. E
as the IGBT. The diode type is specified in figure 20.
3. Turn-Off Energy Loss (E
the input pulse and ending at the point where the collector current equals zero (I
JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.