Fairchild Semiconductor FGH60N6S2 Datasheet

FGH60N6S2
600V, SMPS II Series N-Channel IGBT
FGH60N6S2
August 2003
General Description
The FGH60N6S2 is a Low Gate Charge, Low Plateau Volt­age SMPS II IGBT combining the fast switching speed of the SMPS IGBTs along with lower gate charge and plateau voltage and av alanche capability (UIS). These LGC devices shorten delay times, and reduce the power requirement of the gate drive. These de vices are ideally suited for high volt ­age switched mode power supply applications where low conduction loss, fast s wit ching times and UIS capabilit y are essential. SMPS II LGC devices have been specially de­signed for:
• Power Factor Correction (PFC) circuits
• Full bridge topologies
• Half bridge topologies
• Push-Pull circuits
• Uninterruptible power supplies
• Zero voltage and zero current switching circuits
Formerly Developmental Type TA49346.
Features
• 100kHz Op eration at 390V, 52A
• 200kHZ Operation at 390V, 31A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . .77ns at TJ = 125
• Low Gate Charge . . . . . . . . 140nC at V
• Low Plateau Voltage . . . . . . . . . . . . .6.5V Typical
• UIS Rated . . . . . . . . . . . . . . . . . . . . . . . . .700mJ
• Low Conduction Loss
Package Symbol
TO-247 E
C
G
G
GE
C
o
= 15V
C
COLLECTOR
(Back-Metal)
Device Maximum Ratings T
Symbol Parameter Ratings Units
BV
CES
I
C25
I
C110
I
CM
V
GES
V
GEM
SSOA Switching Safe Operating Area at T
E
AS
P
T
T
STG
CAUTION: Stresses above those listed in “Device Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. Pulse width limited by maximum junction t em perat ure.
©2003 Fairchild Semiconductor Corporation
Collector to Emitter Breakdown Voltage 600 V Collector Current Continuous, TC = 25°C 75 A Collector Current Continuous, TC = 110°C 75 A Collector Current Pulsed (Note 1) 320 A Gate to Emitter Voltage Continuous ±20 V Gate to Emitter Voltage Pulsed ±30 V
Pulsed Avalanche Energy, ICE = 20A, L = 1.3mH, VDD = 50V 700 mJ Power Dissi pation Total TC = 25°C 625 W
D
Power Dissipation Derating T Operating Junction Temperature Range -55 to 150 °C
J
Storage Junction Temperature Range -55 to 150 °C
= 25°C unless otherwise noted
C
= 150°C, Figure 2 200A at 600V
J
> 25°C 5 W/°C
C
E
FGH60N6S2 Rev. A2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
60N6S2 FGH60N6S2 TO-247 Tube N/A 30
FGH60N6S2
Electrical Characteristics
TJ = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off State Characteristics
BV BV
I
CES
I
GES
Collector to Emitter Breakdown Voltage IC = 250µA, VGE = 0 600 - - V
CES
Emitter to Collector Breakdown Voltage IC = -10mA, VGE = 0 20 - - V
ECS
Collector to Emitter Leakage Current VCE = 600V TJ = 25°C - - 250 µA
= 125°C- - 3 mA
T
J
Gate to Emitter Leakage Current VGE = ± 20V - - ±250 nA
On State Characteristics
V
CE(SAT)
Collector to Emitter Saturation Voltage IC = 40A,
V
= 15V
GE
= 25°C-1.92.5V
T
J
= 125°C - 1.65 2.2 V
T
J
Dynamic Characteristics
Q
G(ON)
V
GE(TH)
V
GEP
Gate Charge IC = 40A,
= 300V
V
CE
Gate to Emitter Threshold Voltage IC = 250µA, V Gate to Emitter Plateau Voltage IC = 40A, VCE = 300V - 6.5 8.0 V
V
= 15V - 140 175 nC
GE
= 20V - 180 225 nC
V
GE
CE
= V
GE
3.5 4.3 5.0 V
Switching Characteristics
SSOA Switching SOA T
t
d(ON)I
t
d(OFF)I
E
ON1
E
ON2
E
OFF
t
d(ON)I
t
d(OFF)I
E
ON1
E
ON2
E
OFF
Current Turn-On Delay Time IGBT and Diode at TJ = 25°C, Current Rise Time - 15 - ns
t
rI
Current Turn-Off Delay Time - 70 - ns Current Fall Time - 50 - ns
t
fI
Turn-On Energy (Note 2) - 400 - µJ Turn-On Energy (Note 2) - 490 - µJ Turn-Off Energy (Note 3) - 310 450 µJ Current Turn-On Delay Time IGBT and Diode at TJ = 125°C Current Rise Time - 32 - ns
t
rI
Current T urn-Off Delay Time - 110 150 ns Current Fall Time - 77 90 ns
t
fI
Turn-On Energy (Note 2) - 400 450 µJ Turn-On Energy (Note 2) - 750 850 µJ Turn-Off Energy (Note 3) - 688 950 µJ
= 150°C, RG = 3Ω, VGE =
J
15V, L = 100µH, V
I
= 40A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3
G
= 600V
CE
L = 100µH Test Circuit - Figure 20
I
= 40A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3
G
L = 100µH Test Circuit - Figure 20
200 - - A
-18-ns
-27-ns
Thermal Characteristics
R
NOTE:
Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
2.
of the IGBT only. E as the IGBT. The diode type is specified in figure 20.
3. Turn-Off Energy Loss (E
the input pulse and ending at the point where the collector current equals zero (I JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produc­es the true total Turn-Off Energy Loss.
©2003 Fairchild Semiconductor Corporation FGH60N6S2 Rev. A2
Thermal Resistance Junction-Case TO-247 - - 0.2 °C/W
θJC
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T
ON2
) is defined as the integral of the instantaneous power loss starting at the trailing edge of
OFF
= 0A). All devices were tested per
CE
ON1
is the turn-on loss
J
Typical Performance Curves T
= 25°C unless otherwise noted
J
FGH60N6S2
175
150
125
100
PACKAGE LIMITED
75
50
, DC COLLECTOR CURRENT (A)
CE
I
25
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
TJ = 150oC
Figure 1. DC Collector Current vs Case
Temperature
1000
TJ = 125oC, RG = 3Ω, L = 100µH, VCE = 390V
TC = 75oC
500
50
VGE = 15V
100
100
, OPERATING FREQUENCY (kHz)
MAX
f
f
= 0.05 / (t
MAX1
f
= (PD - PC) / (E
MAX2
= CONDUCTION DISSIPATION
P
C
50
30
(DUTY FACTOR = 50%)
R
= 0.2oC/W, SEE NOTES
ØJC
5
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
10
d(OFF)I
ON2
+ t
d(ON)I
+ E
OFF
)
)
VGE = 10V
30
Figure 3. Operating Frequency vs Collector to
Emitter Current
225
TJ = 150oC, RG = 3Ω, V
200
175
150
125
100
75
50
, COLLECTOR TO EMITTER CURRENT (A)
25
CE
I
0
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
= 15V, L = 100µH
GE
300 400200100 500 600
7000
Figure 2. Minimum Switching Safe Operating Area
16
VCE = 390V, RG = 3Ω, TJ = 125oC
14
12
10
8
6
4
2
, SHORT CIRCUIT WITHSTAND TIME (µs)
SC
t
0
9
11
10
VGE, GATE TO EMITTER VOLTAGE (V)
I
SC
t
SC
12
13
14
1100
1000
900
800
700
600
500
, PEAK SHORT CIRCUIT CURRENT (A)
400
I
300
16
15
Figure 4. Short Circuit Withstand Time
SC
80
DUTY CYCLE < 0.5%, V PULSE DURATION = 250µs
70
60
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
0
0 0.4 0.6 1.20.2 0.8 1.0 1.6 1.81.4 2.0 2.2
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
= 10V
GE
TJ = 125oC
TJ = 150oC
TJ = 25oC
80
DUTY CYCLE < 0.5%, V PULSE DURATION = 250µs
70
60
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
0
00.4
0.2 VCE, COLLECTOR TO EMITTER VOLTAGE (V)
= 15V
GE
TJ = 125oC
TJ = 150oC
0.8 1.0
0.6 1.2
TJ = 25oC
1.6 1.81.4 2.0 2.2
Figure 5. Collector to Emitter On-State Voltage Figure 6. Collector to Emitter On-State Voltage
©2003 Fairchild Semiconductor Corporation FGH60N6S2 Rev. A2
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