600V, SMPS II Series N-Channel IGBT with Anti-Parallel Stealth
TM
FGH50N6S2D
July 2002
Diode
General Description
The FGH50N6S2D is a Low Gate Charge, Low Plateau
Voltage SMPS II IGBT combining the fast switching speed
of the SMPS IGBTs along with lower gate charge, plateau
voltage and av alanche capability (UIS). These LGC devices
shorten delay times, and reduce the power requirement of
the gate drive. These de vices are ideally suited for high volt age switched mode power supply applications where low
conduction loss, fast s wit ching times and UIS capabilit y are
essential. SMPS II LGC devices have been specially designed for:
• Power Factor Correction (PFC) circuits
• Full bridge topologies
• Half bridge topologies
• Push-Pull circuits
• Uninterruptible power supplies
• Zero voltage and zero current switching circuits
IGBT (co-pack) formerly Developmental Type TA49344
Diode formerly Developmental Type TA49392
Package
JEDEC STYLE TO-247
Features
• 100kHz Op eration at 390V, 40A
• 200kHZ Operation at 390V, 25A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . .90ns at TJ = 125
Collector to Emitter Breakdown Voltage600V
Collector Current Continuous, TC = 25°C75A
Collector Current Continuous, TC = 110°C60A
Collector Current Pulsed (Note 1)240A
Gate to Emitter Voltage Continuous±20V
Gate to Emitter Voltage Pulsed±30V
= 150°C, Figure 2150A at 600V
J
Pulsed Avalanche Energy, ICE = 30A, L = 1mH, VDD = 50V480mJ
Power Dissi pation Total TC = 25°C463W
D
Power Dissipation Derating T
Operating Junction Temperature Range-55 to 150°C
J
Storage Junction Temperature Range-55 to 150°C
> 25°C3.7W/°C
C
= 25°C unless otherwise noted
C
E
FGH50N6S2D RevA2
Package Marking and Ordering Information
Device MarkingDevicePackageTape WidthQuantity
50N6S2DFGH50N6S2DTO-247N/A30
FGH50N6S2D
Electrical Characteristics
TJ = 25°C unless otherwise noted
SymbolParameterTes t Cond itionsMinTypMaxUnits
Off State Characteristics
BV
Collector to Emitter Breakdown Voltage IC = 250µA, VGE = 0600--V
CES
I
Collector to Emitter Leakage CurrentVCE = 600VTJ = 25°C--250µA
CES
Gate to Emitter Leakage CurrentVGE = ± 20V--±250nA
I
GES
= 125°C--2.8mA
T
J
On State Characteristics
V
CE(SAT)
V
Collector to Emitter Saturation Voltage IC = 30A,
V
= 15V
GE
Diode Forward VoltageIEC = 30A-2.22.6V
EC
= 25°C-1.92.7V
T
J
= 125°C-1.72.2V
T
J
Dynamic Characteristics
Q
G(ON)
V
GE(TH)
V
Gate ChargeIC = 30A,
= 300V
V
CE
Gate to Emitter Threshold VoltageIC = 250µA, V
Gate to Emitter Plateau VoltageIC = 30A, VCE = 300V-6.58.0V
GEP
V
= 15V-7085nC
GE
= 20V-90110nC
V
GE
CE
= V
GE
3.54.35.0V
Switching Characteristics
SSOASwitching SOAT
t
t
d(OFF)I
E
E
E
t
d(ON)I
t
d(OFF)I
E
E
E
Current T urn-On Delay TimeIGBT and Diode at TJ = 25°C,
d(ON)I
Current Rise Time-15-ns
t
rI
Current T urn-Off Delay Time-55-ns
Current Fall Time-50-ns
t
fI
Turn-On Energy (Note 2)-260-µJ
ON1
Turn-On Energy (Note 2)-330-µJ
ON2
Turn-Off Energy (Note 3)-250350µJ
OFF
Current T urn-On Delay TimeIGBT and Diode at TJ = 125°C
Current Rise Time-15-ns
t
rI
Current T urn-Off Delay Time-92150ns
Current Fall Time-88100ns
of the IGBT only. E
as the IGBT. The diode type is specified in figure 26.
3. Tur n -Off En ergy Loss (E
the input pulse and ending at the point where the collector current equals zero (I
JEDEC Standard No. 24-1 Method for Measurement of P o wer Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.