Fairchild Semiconductor FGH50N6S2 Datasheet

FGH50N6S2
600V, SMPS II Series N-Channel IGBT
FGH50N6S2
August 2003
General Description
The FGH50N6S2 is a Low Gate Charge, Low Plateau Volt­age SMPS II IGBT combining the fast switching speed of the SMPS IGBTs along with lower gate charge, plateau voltage and av alanche capability (UIS). These LGC devices shorten delay times, and reduce the power requirement of the gate drive. These de vices are ideally suited for high volt ­age switched mode power supply applications where low conduction loss, fast s wit ching times and UIS capabilit y are essential. SMPS II LGC devices have been specially de­signed for:
• Power Factor Correction (PFC) circuits
• Full bridge topologies
• Half bridge topologies
• Push-Pull circuits
• Uninterruptible power supplies
• Zero voltage and zero current switching circuits
IGBT formerly Developmental Type TA49342
Features
• 100kHz Op eration at 390V, 40A
• 200kHZ Operation at 390V, 25A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . .90ns at TJ = 125
• Low Gate Charge . . . . . . . . . 70nC at V
• Low Plateau Voltage . . . . . . . . . . . . .6.5V Typical
• UIS Rated . . . . . . . . . . . . . . . . . . . . . . . . .480mJ
• Low Conduction Loss
Package Symbol
TO-247 E
C
G
G
GE
C
o
= 15V
C
COLLECTOR
(Back-Metal)
Device Maximum Ratings T
Symbol Parameter Ratings Units
BV
CES
I
C25
I
C110
I
CM
V
GES
V
GEM
SSOA Switching Safe Operating Area at T
E
AS
P
T
T
STG
CAUTION: Stresses above those listed in “Device Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. Pulse width limited by maximum junction t em perat ure.
©2003 Fairchild Semiconductor Corporation
Collector to Emitter Breakdown Voltage 600 V Collector Current Continuous, TC = 25°C 75 A Collector Current Continuous, TC = 110°C 60 A Collector Current Pulsed (Note 1) 240 A Gate to Emitter Voltage Continuous ±20 V Gate to Emitter Voltage Pulsed ±30 V
Pulsed Avalanche Energy, ICE = 30A, L = 1mH, VDD = 50V 480 mJ Power Dissi pation Total TC = 25°C 463 W
D
Power Dissipation Derating T Operating Junction Temperature Range -55 to 150 °C
J
Storage Junction Temperature Range -55 to 150 °C
= 25°C unless otherwise noted
C
= 150°C, Figure 2 150A at 600V
J
> 25°C 3.7 W/°C
C
E
FGH50N6S2 RevA3
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
50N6S2 FGH50N6S2 TO-247 Tube N/A 30
FGH50N6S2
Electrical Characteristics
TJ = 25°C unless otherwise noted
Symbol Parameter Tes t Cond itions Min Typ Max Units
Off State Characteristics
BV BV
Collector to Emitter Breakdown Voltage IC = 250µA, VGE = 0 600 - - V
CES
Emitter to Collector Breakdown Voltage IC = -10mA, VGE = 0 20 - - V
ECS
Collector to Emitter Leakage Current VCE = 600V TJ = 25°C--250µA
I
CES
I
Gate to Emitter Leakage Current VGE = ± 20V - - ±250 nA
GES
= 125°C--2.8mA
T
J
On State Characteristics
V
CE(SAT)
Collector to Emitter Saturation Voltage IC = 30A,
V
= 15V
GE
V
Diode Forward Voltage IEC = 30A - 2 .2 2.6 V
EC
= 25°C-1.92.7V
T
J
= 125°C-1.72.2V
T
J
Dynamic Characteristics
Q
G(ON)
V
GE(TH)
V
Gate Charge IC = 30A,
= 300V
V
CE
Gate to Emitter Threshold Voltage IC = 250µA, V Gate to Emitter Plateau Voltage IC = 30A, VCE = 300V - 6.5 8.0 V
GEP
V
= 15V - 70 85 nC
GE
= 20V - 90 110 nC
V
GE
CE
= V
GE
3.5 4.3 5.0 V
Switching Characteristics
SSOA Switching SOA T
t
t
d(OFF)I
E E
E
t
d(ON)I
t
d(OFF)I
E E
E
Current T urn-On Delay Time IGBT and Diode at TJ = 25°C,
d(ON)I
t
Current Rise Time - 15 - ns
rI
Current T urn-Off Delay Time - 55 - ns
t
Current Fall Time - 50 - ns
fI
Turn-On Energy (Note 2) - 260 - µJ
ON1
Turn-On Energy (Note 2) - 330 - µJ
ON2
Turn-Off Energy (Note 3) - 250 350 µJ
OFF
Current T urn-On Delay Time IGBT and Diode at TJ = 125°C Current Rise Time - 15 - ns
t
rI
Current T urn-Off Delay Time - 92 150 ns
t
Current Fall Time - 88 100 ns
fI
Turn-On Energy (Note 2) - 260 - µJ
ON1
Turn-On Energy (Note 2) - 490 600 µJ
ON2
Turn-Off Energy (Note 3) - 575 850 µJ
OFF
= 150°C, VGE = 15V, RG = 3
J
L = 100µH, V
I
= 30A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3
G
= 600V
CE
L = 200µH Test Circuit - Figure 26
I
= 30A,
CE
= 390V,
V
CE
= 15V,
V
GE
R
= 3
G
L = 200µH Test Circuit - Figure 26
150 - - A
-13-ns
-13-ns
Thermal Characteristics
R
NOTE:
2.
of the IGBT only. E as the IGBT. The diode type is specified in figure 26.
3. Turn-Off Energy Loss (E
the input pulse and ending at the point where the collector current equals zero (I JEDEC Standard No. 24-1 Method for Measurement of P o wer Device Turn-Off Switching Loss. This test method produc­es the true total Turn-Off Energy Loss.
©2003 Fairchild Semiconductor Corporation FGH50N6S2 RevA3
Thermal Resistance Junction-Case IGBT - - 0.27 °C/W
θJC
Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same T
ON2
) is defined as the integral of the instantaneous power loss starting at the trailing edge of
OFF
= 0A). All devices were tested per
CE
is the turn-on loss
ON1
J
Typical Performance Curves T
= 25°C unless otherwise noted
J
FGH50N6S2
140
120
100
80
PACKAGE LIMITED
60
40
, DC COLLECTOR CURRENT (A)
CE
20
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
Figure 1. DC Collector Current vs Case
Temperature
700
300
100
f
= 0.05 / (t
MAX1
= (PD - PC) / (E
f
MAX2
= CONDUCTION DISSIPATION
P
C
(DUTY FACTOR = 50%)
R
= 0.27oC/W, SEE NOTES
, OPERATING FREQUENCY (kHz)
MAX
f
ØJC
TJ = 125oC, RG = 3Ω, L = 200µH, V
10
1
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
d(OFF)I
ON2
+ t
d(ON)I
+ E
OFF
)
)
CE
= 390V
T
75oC
C =
VGE = 15V
VGE = 10V
6010 30
Figure 3. Operating Frequency vs Collector to
Emitter Current
200
TJ = 150oC, RG = 3Ω, V
150
100
50
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
= 15V, L = 100µH
GE
300 400200100 500 600
7000
Figure 2. Minimum Switching Safe Operating Area
14
VCE = 390V, RG = 3Ω, TJ = 125oC
12
10
8
6
4
2
, SHORT CIRCUIT WITHSTAND TIME (µs)
SC
t
0
91112 15
10 16
, GATE TO EMITTER VOLTAGE (V)
V
GE
I
SC
t
SC
13 14
900
800
700
600
500
400
300
200
, PEAK SHORT CIRCUIT CURRENT (A) I
Figure 4. Short Circuit Withstand Time
SC
60
DUTY CYCLE < 0.5%, V PULSE DURATION = 250µs
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
0
0.75
0.50 1.00
= 15V
GE
TJ = 150oC
1.25 2.00 2.25
, COLLECTOR TO EMITTER VOLTAGE (V)
V
CE
1.50 1.75
TJ = 25oC
TJ = 125oC
60
DUTY CYCLE < 0.5%, VGE =10V PULSE DURATION = 250µs
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
0
0.50 1.00 1.50 2.0 2.250.75 VCE, COLLECTOR TO EMITTER VOLTAGE (V)
TJ = 25oC
TJ = 150oC
TJ = 125oC
1.751.25
Figure 5. Collector to Emitter On-State Voltage Figure 6. Collector to Emitter On-State Voltage
©2003 Fairchild Semiconductor Corporation FGH50N6S2 RevA3
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