Fairchild Semiconductor 74ABT574CSCX, 74ABT574CSC, 74ABT574CPC, 74ABT574CMTCX, 74ABT574CMTC Datasheet

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© 1999 Fairchild Semiconductor Corporation DS011511 www.fairchildsemi.com
November 1992 Revised November 1999
74ABT574 Octal D-Type Flip-Flop with 3-STATE Outputs
74ABT574 Octal D-Type Flip-Flop with 3-ST ATE Outputs
General Description
The ABT574 is an oc tal flip-flop with a buffered co mmon Clock (CP) and a buffered comm on Output Enable (OE
). The information p resented to the D inputs is stored in the flip-flops on the LOW-to-HIGH Clock (CP) transition.
The device is functiona lly identical to the A BT374 but has broadside pinouts.
Features
Inputs and outputs on opposite sides of package allowing easy interface with microprocessors
Useful as input or output port for microprocessors
Functionally identical to ABT374
3-STATE outputs for bus-oriented applications
Output sink capability of 64 mA, source capability
of 32 mA
Guaranteed output skew
Guaranteed multiple output switching specifications
Output switching specified for both 50 pF and
250 pF loads
Guaranteed simultaneous switching, noise level and dynamic threshold performan ce
Guarante ed latchup pr otection
High impedance glitch free bus loading during entire
power up and power down cycle
Non-destructive hot insertion capability
Ordering Code:
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Connection Diagram Pin Descriptions
Order Number Package Number Package Description
74ABT574CSC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Body 74ABT574CSJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ABT574CMSA MSA20 20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide 74ABT574CMTC MTC20 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Pin Names Description
D
0–D7
Data Inputs CP Clock Pulse Input (Active Rising Edge) OE
3-STATE Output Enable Input (Active LOW) O
0–O7
3-STATE Outputs
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74ABT574
Functional Description
The ABT574 consi sts of ei gh t e dge -tr igge re d flip-flops with individual D-type inputs and 3-STATE true outputs. The buffered clock and buffered Outp ut Enable are com mon to all flip-flops. The eight flip-flops will store the state of their individual D inputs that meet the setup and hold times requirements on the LOW-to-HIGH Clock (CP) transition.
With the Output Enable (OE
) LOW, the contents of the
eight flip-flops are available at the outputs. When OE
is HIGH, the outputs are in a high i mpedance state. O pera­tion of the OE
input does not affect the state of the flip-
flops.
Function Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance
= LOW-to-HIGH Transition
NC = No Change
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
Inputs Internal Outputs Function
OE
CP D Q O
H H or L L NC Z Hold H H or L H NC Z Hold H
L L Z Load
H
H H Z Load
L
L L L Data Available
L
H H H Data Available L H or L L NC NC No Change in Data L H or L H NC NC No Change in Data
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74ABT574
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired . Functional operation under these conditions is not implied.
Note 2: Either voltage lim it or c urrent limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3: Guaranteed, but not tested. Note 4: For 8-bit toggling, I
CCD
< 0.8 mA/MHz.
Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
CC
Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 mA to +5.0 mA Voltage Applied to Any Output in the Disabled or Power-Off State −0.5V to 5.5V in the HIGH State 0.5V to V
CC
Current Applied to Output in LOW State (Max) twice the rated I
OL
(mA) DC Latchup Source Current 500 mA Over Voltage Latchup (I/O) 10V
Free Air Ambient Temperature −40°C to +85°C Supply Voltage +4.5V to +5.5V Minimum Input Edge Rate (∆V/∆t) Data Input 50 mV/ns Enable Input 20 mV/ns Clock Input 100 mV/ns
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized LOW Signal
V
CD
Input Clamp Diode Voltage 1.2 V Min IIN = 18 mA
V
OH
Output HIGH Voltage 2.5 V Min IOH = 3 mA
2.0 V Min IOH = 32 mA
V
OL
Output LOW Voltage 0.55 IOL = 64 mA
I
IH
Input HIGH Current 1
µA Max
VIN = 2.7V (Note 3)
1 V
IN
= V
CC
I
BVI
Input HIGH Current Breakdown Test 7 µA Max VIN = 7.0V
I
IL
Input LOW Current −1
µA Max
VIN = 0.5V (Note 3)
1 V
IN
= 0.0V
V
ID
Input Leakage Test 4.75 V 0.0 IID = 1.9 µA
All Other Pins Grounded
I
OZH
Output Leakage Current 10 µA 0 5.5V
V
OUT
= 2.7V; OE = 2.0V
I
OZL
Output Leakage Current −10 µA 0 5.5V
V
OUT
= 0.5V; OE = 2.0V
I
OS
Output Short-Circuit Current −100 275 mA Max V
OUT
= 0.0V
I
CEX
Output High Leakage Current 50 µA Max V
OUT
= V
CC
I
ZZ
Bus Drainage Test 100 µA 0.0 V
OUT
= 5.5V; All Other GND
I
CCH
Power Supply Current 50 µA Max All Outputs HIGH
I
CCL
Power Supply Current 30 mA Max All Outputs LOW
I
CCZ
Power Supply Current 50 µA Max
OE = V
CC
All Others at VCC or GND
I
CCT
Additional ICC/Input Outputs Enabled 2.5 mA VI = VCC 2.1V
Outputs 3-STATE 2.5 mA Max Enable Input VI = VCC 2.1V Outputs 3-STATE 2.5 mA Data Input VI = VCC 2.1V
All Others at VCC or GND
I
CCD
Dynamic I
CC
No Load mA/
Max
Outputs Open, OE = GND,
(Note 3) 0.30 MHz One Bit Toggling (Note 4),
50% Duty Cycle
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