Fairchild MOSFET service manual

Application Note AN-9056
Using Fairchild Semiconductor Dual CoolTM MOSFETs
Dennis Lang
INTRODUCTION
Pursuing a strategy of power density leadership, Fairchild Semiconductor has released a new power specific packaging technology, Dual CoolTM, to meet the rigors of escalating demand for more improved thermal management in electronics designs. This technology creates a direct heat path from both the drain and source sides of the vertical MOSFET die structure through the addition of a heat slug to the top of the package. This structure allows for supplemental cooling on the top of the package with a heat sink system in addition to the direct conduction path in to the printed circuit board.
This application note will describe the package construction, address thermal characterization challenges and offer some systemic examples utilizing heat sinks.
PACKAGE CONSTRUCTION
Dual Cool package construction is an evolutionary concept based on contemporary customer packaging form factor preferences, and incorporating new features to meet future performance expectations. The package design team chose to keep the very popular Power33 and Power56 lead geometries and pin outs allowing customers to add heat sinkable performance to existing PCB pad designs. Customers currently using a heat sink on the surface of a PowerQFN package will find this a very useful feature. Dual Cool uses 4 mils thin silicon as the core package design constraint. This represents half the thickness of the typical MOSFET which traditionally used 8 mils thick silicon dice. By reducing the die thickness to 4 mils, thermal and electrical performance are improved by reducing the parasitic resistance
created by the bulk resistance from the doped silicon area electrons flow through to get from the trench structure at the top of the wafer to the drain lead frame connection at the bottom. The top and bottom surfaces of the die are plated with solderable metal to permit solder attachment of the drain lead frame on the bottom, and the source and gate clips on the top. To improve the heat transfer path from the die to the top of the package for use with a heat sink, a heat slug is soldered to the source clip and exposed on the top of the package to interface with a heat sink.
Figure 1: Solid model illustrating Dual Cool package construction.
Solder attachment of the silicon to the lead frames, with optimized copper clips additionally reduces electrical and thermal parasitics. The
, that is, the thermal resistance from the
JC
junction to the case has two important values with this package type, the junction to case thermal resistance to the drain tab as well as the top heat slug. The datasheet offers these values for each specific product type. These numbers are a measure of the two efficient heat paths out of the component, giving the designer options for
managing the heat loads created by high power density for designs.
CHALLENGE FOR BOARD DESIGNERS
The majority of consumer electronics designers use FR-4 board material for their designs. FR-4 employs a resin system that has a glass transition temperature (Tg) typically in the range of 115-125ºC. This is the lowest Tg material in most consumer electronics products, thus setting the limit for temperatures in operation. Reaching the glass transition temperature can see a radical transition of FR-4 material properties, including a four-fold increase in the out of plane (or Z-axis) coefficient of thermal expansion (CTE). The exponential increase in CTE results in multiplied stresses on board to component solder joints, and plated through holes in the PCB. High aspect ratio plated through holes, relatively small holes to large board thicknesses, lead to boards that are particularly sensitive to temperature excursions above Tg. To avoid this scenario many designers strive to limit their board temperatures at 100ºC, creating safety factor in the design. With the long term reliability of their products directly related to thermal management, designers need effective tools to characterize their designs.
TEST METHODOLOGY
This device presents a challenge for thermal characterization on an end user‟s board. An increasingly popular way for power designers to characterize their designs is using infrared thermographs. This technique works well with normal PowerQFN devices as the plastic mold compound is semi-transparent to infrared, presents a relatively consistent case emissivity of approximately 0.92, and with thin ( 1.0mm) plastic molded components, the camera often yields temperatures within 5-10% of junction temperature. By allowing for the particulars of using an infrared camera, the designer can quickly and precisely determine the important
temperatures in a system without a heat sink during design optimization and verification. When power packages of any kind are used with a heat sink, a challenge is presented to the
engineer or technician who would opt to use this method. The heat sink is not transparent to infrared, preventing the camera from capturing accurate temperatures of the device junction.
Figure 2: Cross section of Dual Cool and heat sink assembly.
Figure 3: Thermograph of Dual Cool with heat sink in operation.
To measure the temperature of various devices under test, a method for attaching a thermocouple to the drain pad was devised. This method should be as close to the die as possible to assure that surrounding components, airflow, and other factors do not affect thermocouple readings. Attempts to correlate temperature to a
location on the surface copper layer near the component proved untenable. Heat transfer is a non-linear function over distance and varying load and environmental conditions may render a correlation incorrect over the range of use conditions the board is characterized across. To address these concerns, it is desirable to locate the thermocouple as near the silicon die as possible.
An unplated via can be drilled in the drain pad of verification boards for insertion of a thermocouple to touch the drain lead of the device. This via should not be plated, otherwise, during SMT processing, solder will wick down the copper and foul the opening for the thermocouple. The via should be kept as small as possible, but be large enough to use the thermocouple size desired. The boards used in this experiment had a 28 mils diameter hole drilled. The boards designed for this study were all single layer. If the board to be tested is multilayer, it is a good idea to create a keep out in the copper planes of all layers for the drilled hole to assure there is no shorting of layers through the thermocouple wire. As the Dual Cool package was designed to duplicate the industry standard PCB pad for
3.3x3.3mm and 5x6mm PowerQFNs, the same footprint and PCB design was used to directly compare wire bonded, clip bonded and Dual Cool products at thermal steady state. The board was constructed of lead free rated, 62 mils thick FR-4 material.
Figure 4: Power56 PCB pad with unplated hole for thermocouple.
It may occur to the designer that this hole could reduce thermal or electrical performance. As up to 25% voiding is acceptable in the device this was not considered a problematic concern for a
verification board. Of more concern is the ability of the thermocouple wires to act as a heat sink
and remove enough heat from the board to under-predict temperatures during operation in the end application. This leads to the first reported experiment, attempting to address the question, can larger thermocouples change the results of the experiment?
DEVICES CHOSEN FOR ALL EXPERIMENTS
The devices used in this experiment were meant to be as similar as possible, to make the differences in thermal performance attributable to the package technologies exclusively. Compared in this paper will be components with traditional bond wires used to make the gate and source connections, a clip-bonded product, using soldered copper clips to make the gate and source connections, and the Dual Cool package described in detail previously. All three components used employ 4 mil thick die. The die used in the chosen Dual Cool and clip
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