This N-Channel MOSFET has been designed
specifically to improve the overall efficiency of DC/DC
converters using either synchronous or conventional
switching PWM controllers. It has been optimized for
low gate charge, low R
extremely low R
DS( ON) , fast switching speed and
in a small package.
DS(ON)
Features
• 30 A, 30 V R
R
• Low gate charge (9 nC typical)
• Fast Switching
= 20 mΩ @ VGS = 10 V
DS(ON)
= 28 mΩ @ VGS = 4.5 V
DS(ON)
Applications
• DC/DC converter
• Motor Drives
• High performance trench technology for extremely
low R
DS(ON)
D
D
G
S
D-PAK
TO-252
(TO-252)
G DS
Absolute Maximum RatingsT
I-PAK
(TO-251AA)
o
=25
C unless otherwise noted
A
G
S
Symbol Parameter Ratings Units
V
Drain-Source Voltage 30 V
DSS
V
Gate-Source Voltage
GSS
ID Continuous Drain Current @TC=25°C (Note 3) 30 A
@TA=25°C (Note 1a) 9.5
Pulsed (Note 1a) 60
PD
TJ, T
STG
Power Dissipation @TC=25°C (Note 3) 36
@TA=25°C (Note 1a) 2.8
@T
Operating and Storage Junction Temperature Range -55 to +175
FDD6612A FDD6612A D-PAK (TO-252) 13’’ 12mm 2500 units
FDU6612A FDU6612A I-PAK (TO-251) Tube N/A 75
2002 Fairchild Sem iconductor Corporation
FDD6612A/FDU6612A Rev D1 (W )
°C/W
°C/W
°C/W
Page 2
FDD6612A/FDU6612A
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions MinTyp Max Units
Drain-Source Avalanche Ratings (Note 2)
W
Drain-Source Avalanche Energy Single Pulse, VDD = 15 V, ID=10 A 90 mJ
DSS
IAR Drain-Source Avalanche Current 10 A
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆T
I
DSS
I
GSSF
I
GSSR
Breakdown Voltage Temperature
Coefficient
J
Zero Gate Voltage Drain Current V
Gate–Body Leakage, Forward VGS = 20 V, VDS = 0 V 100 nA
Gate–Body Leakage, Reverse VGS = –20 V VDS = 0 V –100 nA
= 0 V, ID = 250 µA
V
GS
= 250 µA,Referenced to 25°C
I
D
= 24 V, VGS = 0 V 1
DS
30 V
22
mV/°C
µA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
= VGS, ID = 250 µA
V
DS
= 250 µA,Referenced to 25°C
I
D
VGS = 10 V, ID = 9.5 A
= 4.5 V, ID = 8 A
V
GS
= 10 V, ID = 9.5 A, TJ=125°C
V
GS
gFS Forward Transconductance VDS = 5 V, ID = 9.5 A 22 S
1 1.6 3 V
-4.2
17
24
26
20
28
36
mV/°C
mΩ
Dynamic Characteristics
C
Input Capacitance 830 pF
iss
C
Output Capacitance 185 pF
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance VGS = 15 mV, f = 1.0 MHz 1.8
V
= 15 V, V
DS
f = 1.0 MHz
= 0 V,
GS
80 pF
Ω
Switching Characteristics (Note 2)
t
Turn–On Delay Time 6 12 ns
d(on)
tr Turn–On Rise Time 10 18 ns
t
Turn–Off Delay Time 18 29 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 9 13 nC
Qgs Gate–Source Charge 2.8 nC
Qgd Gate–Drain Charge
V
= 15 V, ID = 1 A,
DD
V
= 10 V, R
GS
= 40V, ID = 9.5 A,
V
DS
= 5 V
V
GS
GEN
= 6 Ω
5 12 ns
3.1 nC
FDD6612A/FDU6612A Rev. D1 (W)
Page 3
FDD6612A/FDU6612A
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions MinTyp Max Units
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 2.3 A
VSD Drain–Source Diode Forward
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area Figure 10. Single Pulse Maximum
Power Dissipation
1
D = 0.5
0.2
0.1
0.01
0.1
0.05
0.01
0.02
Single Pulse
0.001
r(t), NORMALIZED EFFECTIVE
TRANSI ENT THER MAL RE SISTANCE
0.0001
0.00010.0010.010.1110100300
t , TIME (sec)
1
R (t) = r(t) * R
JA
θ
R =
JA
θ
P(pk)
t
1
t
2
T - T = P * R (t)
J
A
Duty Cycle, D = t / t
Figure 11. Transient Thermal Response Curve
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
FDD6612A/FDU6612A Rev. D1 (W)
96°C/W
JA
θ
1
JA
θ
2
Page 6
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4
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