ETS-Lindgren 95252-1 User Manual

Archived 6/1/10

Bulk Current

Injection Probes

MANUAL

© ETS-Lindgren, L.P. – February 2005 Rev C – PN 399263

95236-1 95242-1 95252-1

BULK CURRENT INJECTION PROBES

Archived 6/1/10

ETS-Lindgren L.P. reserves the right to make changes to any products herein to improve functioning,
design, or for any other reason. Nothing contained herein shall constitute ETS-Lindgren L.P. assuming any
liability whatsoever arising out of the application or use of any product or circuit described herein.
ETS-Lindgren L.P. does not convey any license under its patent rights or the rights of others.

© Copyright 2005 by ETS-Lindgren L.P. All Rights Reserved.

No part of this document may be copied by any means

without written permission from ETS-Lindgren L.P.

E-MAIL & INTERNET

[e-mail]

http://www.ets-lindgren.com

USA

1301 Arrow Point Dr., Cedar Park, TX 78613
P.O. Box 80589, Austin, TX 78708-0589
Phone [phone]
Fax [phone]

FINLAND

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Mekaanikontie 1
27510, Eura, Finland
Phone + 358.2.838.3300
Fax + 358.2.865.1233

JAPAN

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Bunkyo-ku
Tokyo 112-0006
JAPAN
Phone + 81 3 3813 7100
Fax + 81 3 3813 8068

CHINA

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Beijing Postcode: 100083
CHINA
Phone + 86 010 82755304
Fax + 86 010 82755307

© ETS-Lindgren, L.P. – February 2005
Rev C – PN 399263

BULK CURRENT INJECTION PROBES

Archived 6/1/10

Table of Contents

INTRODUCTION............................................................................................................. 1

APPLICATION................................................................................................................. 2

CONDUCTED SUSCEPTIBILITY ..........................................................................................2

TEST SETUP APPARATUS.................................................................................................. 4

CONDUCTED EMISSION.............................................................................................. 7

TRANSFER IMPEDANCE (ZT)............................................................................................. 7

INSERTION LOSS......................................................................................................... 10

EQUIPMENT.................................................................................................................... 10

PROCEDURE ...................................................................................................................11

PRECAUTIONARY MEASURES................................................................................ 12

SPECIFICATIONS......................................................................................................... 13

SUPPORTING EQUIPMENT....................................................................................... 16

MAINTENANCE............................................................................................................ 17

WARRANTY STATEMENT ........................................................................................ 18

© ETS-Lindgren, L.P. – February 2005
Rev C – PN 399263

BULK CURRENT INJECTION PROBES

Archived 6/1/10

© ETS-Lindgren, L.P. – February 2005
Rev C – PN 399263

BULK CURRENT INJECTION PROBES Introduction

Archived 6/1/10

INTRODUCTION

The ETS-Lindgren Bulk Current Injection Probe series is used to
inject RF current into conductors and cables of electrical and
electronic equipment undergoing susceptibility testing.

The Bulk Current Injection Probe provides a means of applying a
controlled RF stress level to an instrument under test (IUT)
through interconnecting cables or power cables without requiring a
direct connection to the conductor(s) of interest. The models in
this series are simply clamped around the test conductor which
then becomes a one turn secondary winding, with the current probe
forming the core and primary winding of an RF transformer. RF
energy can be injected onto single and multi-conductor cables,
grounding and bonding straps, outer conductors of shielding
conduits and coaxial cables, etc.

The bulk current injection probe series is especially designed to
provide minimum insertion loss over the following frequency
ranges:

Model Number Frequency Range Useful Range

95236-1 0.1 to 10 MHz 0.01 to 100 MHz
95242-1 2 to 400 MHz 2 to 400 MHz
95252-1 450 to 900 MHz 20 to 1000 MHz

Table 1

Because of the high efficiency design, the injection probes can also

© ETS-Lindgren, L.P. – February 2005 1
Rev C – PN 399263

be used as very sensitive sensors.

Application BULK CURRENT INJECTION PROBES

Archived 6/1/10

APPLICATION

The principal use of the bulk current injection probe is for inducing
relatively large RF currents into the signal and power circuits of
equipment under test for conducted susceptibility. A secondary
application would be to use the same probe in a more familiar role
as a sensor for measuring weak conducted RF currents.

CONDUCTED SUSCEPTIBILITY

Conducted susceptibility testing is intended to insure that RF
signals, when coupled on to interconnecting cables and power
supply lines of an IUT, will not cause malfunction or degradation
of performance. In addition, this testing can provide an amplitude
vs. frequency malfunction signature for the system which, when
compared with the levels of current on the cables in a typical
operating environment, can assist in the determination of adequate
safety margins.

TYPICAL TEST SETUP

Typical conducted susceptibility tests require that all power and
interconnecting cables be tested by subjecting them to the required
current or voltage levels, while monitoring the applied current
using a current probe. Usually, a reference level calibration is
performed using a calibration jig with a specified impedance. This
reference curve is then replayed to expose the IUT to a controlled
stress level, while a current probe is used to insure that a low

2 © ETS-Lindgren, L.P. – February 2005
Rev C – PN 399263

impedance IUT is not overstressed.
Note: Some tests may allow the reference calibration to be
performed at a lower level and then scaled up to the required
power level when applied to the IUT.

BULK CURRENT INJECTION PROBES Application

Archived 6/1/10

Entire cables or cable bundles may be tested, or each line may be
broken out and tested individually. Some standards may also
require simultaneous injection onto multiple cable bundles using
several injection probes. Absorbing clamps may be required to
isolate peripheral equipment from the IUT, and insure that only the
IUT is exposed to the required stress level. Refer to the pertinent
test standard for more specific details.

© ETS-Lindgren, L.P. – February 2005 3
Rev C – PN 399263