The µPD16520 is a vertical driver for CCD image sensors that has a level conversion circuit and a 3-level output
function. Since it incorporates a CCD vertical register driver equivalent to the µPD16510 (10 channels, consisting of
six 3-level channels and four 2-level channels) and a VOD shutter driver (1 channel), it is ideal as a vertical driver for
multiple-electrode high-pixel CCD transfer type area image sensors employed in digital still cameras.
The µPD16520 uses a CMOS process to achieve optimum transmission delay characteristics for vertical driving of
CCD image sensors, as well as output on-state resistance characteristics. The µPD16520 also supports low-voltage
logic (logic supply voltage: 2.0 to 5.5 V).
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any
parameter. That is, the absolute maximum ratings are rated values at which the product is on the
verge of suffering physical damage, and therefore the product must be used under conditions that
ensure that the absolute maximum ratings are not exceeded.
Transmission delay ti m e 1TD1200ns
Transmission delay ti m e 2TD2200ns
Transmission delay ti m e 3TD3
Rise/fall time 1TP1500ns
Rise/fall time 2TP2500ns
Rise/fall time 3TP3
ParameterSymbolConstant
Vertical register serial resistorR1 to R100
Vertical register ground resi storRGND0
Ω
Ω
Capacitance 1 between vertic al regi ster clocks (3 level-3 level)C_330 pF
Capacitance 2 between vertic al regi ster clocks (2 level-2 level)C_220 pF
Capacitance 3 between vertic al regi ster clocks (3 level-2 level)C_321000 pF
Capacitance 4 between vertic al regi ster clocks (2 level-3 level)C_23500 pF
Vertical register ground capacitance 1 (3 level)C1 to C63000 pF
Vertical register ground capacitance 2 (2 level)C7 to C101500 pF
Substrate ground capacitanc eC111600 pF
Figure 2-2. Timing Charts
BI1 to BI4
TI1 to TI6
TD1TD1
µµµµ
PD16520
BO1 to BO4
TO1 to TO6
PG1 to PG6
TO1 to TO6
SUBI
TP1
TD2TD2
TP2
TP1
TP2
Mb
V
Ma
V
L
V
H
V
Ma
V
SUBO
TD3TD3
TP3
Data Sheet S14201EJ1V0DS00
TP3
HH
V
L
V
9
Page 10
3. CAUTIONS
3.1 Power ON/OFF Sequence
µµµµ
PD16520
In the
BI4, SUBI) → VCC, so that in the case of voltage conditions: VDD2 > VDD1, input pin voltage (TI1 to TI6, PG1 to
PG6, BI1 to BI4, SUBI) > VCC, an abnormal current flows. Therefore, when turning the power ON/OFF, make sure
that the following voltage conditions are satisfied: VDD2 ≤ VDD1, input pin voltage (TI1 to TI6, PG1 to PG6, BI1 to
BI4, SUBI) ≤ VCC. Also, to minimize the negative potential applied to the SUB pin of the CCD image sensor, following
the power ON/OFF sequence described below.
(1) Power ON
PD16520, a PN junction (diode) exists between VDD2 → VDD1, input pin (TI1 to TI6, PG1 to PG6, BI1 to
µ
<1> Powering ON V
Make sure that input pin voltage (TI1 to TI6, PG1 to PG6, BI1 to BI4, SUBI) ≤ VCC. Also, when Vsb = 2 V,
make sure that VCC reaches the rated voltage.
<2> Powering ON Vsb, VDD1, VDD2a, VDD2b, V
At this time, make SUBI high level (0.8VCC or higher).
CC
SS
Vsb
VDD1
2V
<1> <2>
Vcc
VDD2a, VDD2b
0V
Vss
Time
10
Data Sheet S14201EJ1V0DS00
Page 11
(2) Power OFF
<1> Powering OFF Vsb, VDD1, VDD2a, VDD2b, V
Until VCC power OFF, keep SUBI high level (0.8VCC or higher).
<2> Powering OFF V
Power OFF VCC when Vsb becomes 2 V or lower. At this time, make sure that the input pin voltage (TI1 to
TI6, PG1 to PG6, BI1 to BI4, SUBI) ≤ VCC.
CC
SS
µµµµ
PD16520
Vsb
VDD1
Vcc
VDD2a, VDD2b
Vss
3.2. Recommended Connection of Unused Pins
Handle input pins and output pins that are not used as follows.
Input pin:High level (connect to V
Output pin: Leave open
CC
)
<1>
<2>
2V
0V
Time
Data Sheet S14201EJ1V0DS00
11
Page 12
4. APPLICATION CIRCUIT EXAMPLE
CCD
VSUB (Substrate voltage)
VDD2b
µµµµ
PD16520
1MΩ
+
µ
1 F
µ
0.1 F
Vsb
VDD1
SS
V
CC
V
34
35
36
38
37
SS
V
TO1
VDD1
VDD2a
PD16520GS-BGG
µ
CC
TI1
TI2
V
4
5
3
1
GND
2
TO2
TI3
33
6
TO3
TI4
31
32
VDD2a
TI5
8
7
TO4
TI6
30
9
29
TO5
PG1
10
28
TO6
VDD2a
PG2
PG3
11
27
12
26
BO1
PG4
13
25
BO2
PG5
14
24
BO3
VDD2b
PG6
BI1
15
23
16
22
BO4
BI2
17
21
Vsb
SUBO
BI4
BI3
18
20
SS
V
SUBI
19
µ
0.1 F
µ
0.1 F
µ
0.1 F
µ
0.1 F
µ
0.1 F
12
TG/SSG
Data Sheet S14201EJ1V0DS00
Page 13
5. PACKAGE DRAWING
38-PIN PLASTIC SSOP (300 mil)
µµµµ
PD16520
3820
detail of lead end
F
G
119
A
P
E
S
C
D
M
M
N
S
B
K
L
H
I
J
NOTE
Each lead centerline is located within 0.10 mm of
its true position (T.P.) at maximum material condition.
ITEM MILLIMETERS
12.7±0.3
A
0.65 MAX.
B
C
0.65 (T.P.)
D
E
F
H
I
J1.05±0.2
K0.2
L0.6±0.2
M
N0.10
P3°
+0.05
0.37
−0.1
0.125±0.075
1.675±0.125
1.55G
7.7±0.2
5.6±0.2
+0.1
−0.05
0.10
+7°
−3°
P38GS-65-BGG
Data Sheet S14201EJ1V0DS00
13
Page 14
µµµµ
PD16520
6. RECOMMENDED SOLDERING CONDITIONS
The µPD16520 should be soldered and mounted under the following recommended conditions.
For the details of the recommended soldering conditions, refer to the document
Mounting Manual (C10535E)
For soldering methods and conditions other than those recommended below, contact your NEC sales
Partial heatingPin t em perature: 300°C Max., Time: 3 sec . M ax. (per pin row)
.
Table 6-1. Surface Mounting Type Soldering Conditions
Semiconductor Device
Condition Symbol
IR35-00-3
VP15-00-3
WS60-00-1
−
Caution Do not use different soldering methods together (except for partial heating).
14
Data Sheet S14201EJ1V0DS00
Page 15
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
DD
pin should be connected to V
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
or GND with a resistor, if it is considered to have a possibility of
µµµµ
PD16520
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Data Sheet S14201EJ1V0DS00
15
Page 16
µµµµ
PD16520
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8
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