PC8101GR is a silicon monolithic integrated circuit designed as up-to-150 MHz quadrature modulator for digital mobile
communications, mainly CT2. This modulator consists of digital 90° phase shifter, dual mixers and various buffer amplifiers
which are packaged in 20 pin SSOP. Up/down converter IC (µPC8100GR) is also available as for kit-use with this IC. So,
these pair devices contribute to make RF block small, high-performance and low power-consumption.
This product is manufactured using NEC’s 20 GHz f
passivation film and gold electrodes. These materials can protect chip surface from external pollution and prevent corrosion
and migration. Thus, this product has excellent performance, uniformity and reliability.
T NESAT
III silicon bipolar process. This process uses silicon nitride
FEATURES
• Operating frequency: fIF = 50 MHz to 150 MHz, Local input frequency: fLo = 100 MHz to 300 MHz, fI/Q = DC to 500 kHz
• Digital 90° phase shifter is incorporated. (Due to the flip flop phase shifter, fIF = fLo/2 + fI/Q.)
• 20 pin SSOP suitable for high-density surface mounting.
• Supply voltage V
• Equipped with Power Save Function.
APPLICATIONS
• Typical application – Digital cordless phone CT2. (In the case of I/Q method)
• Further application – Digital communication equipments.
Remark To order evaluation samples, please contact your local NEC sales office. (Order number: µPC8101GR)
CC = 2.7 to 5.5 V
(225 mil)Pin 1 indicates roll-in direction of tape.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for availability
and additional information.
Document No. P10818EJ3V0DS00 (3rd edition)
Date Published October 1999 N CP(K)
Printed in Japan
Local input for phase shifter.
This input impedance is 50 Ω matched
internally.
Bypass of local buffer amplifier input.
Grounded through capacitor.
It must be connected to the system ground
with minimum inductance. Ground pattern on the board should be formed as
wide as possible.
(Track length should be kept as short as
possible.)
These pins are to adjust local leakage
level.
These pins should be grounded through
register 1 kΩ adjustable 30 mV offset.
1
V
CC
2
6GND0–
7Q-INPUTVCC/2–
8Q-INPUTVCC/2–
9GND0–
10IF OUTPUT–1.4
Track length should be kept as short as
possible.
Input for Q signal. This input impedance
is larger than 500 kΩ. As Q signal, VCC/
2 bias DC signal should be input.
Input for Q signal. This input impedance
is larger than 500 kΩ. As Q signal, VCC/
2 biased 1VP–P signal should be input.
Track length should be kept as short as
possible.
IF output from modulator. This output is
emitter follower as 50 Ω impedance. IF
output frequency is provided as fIF = fLo/
2 + fI/Q.
5
4
7
8
10
11VCC2.7 to 5.5–
Supply voltage pin.
Data Sheet P10818EJ3V0DS00
3
Page 4
µ
PC8101GR
PIN
ASSIGNMENT
NO.
12POWER0 to 5.5–
SAVE
13I-INPUTVCC/2–
14I-INPUTVCC/2–
15GND0–
APPLIED
VOLTAGE (V)
PIN VOLTAGE
(V)
FUNCTION AND APPLICATIONEQUIVALENT CIRCUIT
Power save control pin. This pin can
control ON/OFF operation with bias as
follows;
Bias: VOperation
PS
V
Input for I signal. This input impedance is larger than 500 kΩ. As I signal,
VCC/2 biased 1 VP–P MAX. signal should
be input.
Input for I signal. This input impedance is larger than 500 kΩ. As I signal,
VCC/2 bias DC signal should be input.
Track length should be kept as short
as possible.
≥1.8ON
0 to 1.0OFF
12
13
14
16I-BIAS–0.175
17I-BIAS–0.175
18GND0–
19N.C––
20GND0–
* Pin voltage at VCC = 2.7 V
These pins are to adjust local leakage
level.
These pins should be grounded through
register 1 kΩ adjustable 30 mV offset.
Track length should be kept as short
as possible.
Non connection
Track length should be kept as short
as possible.
16
17
4
Data Sheet P10818EJ3V0DS00
Page 5
µ
PC8101GR
ABSOLUTE MAXIMUM RATINGS
Supply VoltageVCCTA = +25 °C6.0V
Power DissipationPDMounted on 50 × 50 × 1.6 mm double copper530mW
clad epoxy glass board at TA = +70 °C
Operating TemperatureTopt–20 to +70°C
Storage TemperatureT
SYMBOLApplied voltage (V)
VCC = VP/S2.7 to 5.5 V
VI = VIb = VO = VOb0.5 × VCC
6
Data Sheet P10818EJ3V0DS00
I/Q phase difference = 90°
In the case of local leak level measurement,
I/Q signal is applied as only DC.
Page 7
TYPICAL CHARACTERISTICS (Unless otherwise specified TA = +25 ˚C)
y
)
Output spectrum at IF out pin
–5
–25
–45
–65
–85
–105
I/Q 3d
PI/Q
PIm
ImR
PLO
LoL
Pout
VCC = 2.7 V
µ
PC8101GR
V
CC = 2.7 V fLO vs. Pout, PLO,PIm, PI/Q
0
–10
Pout
–20
–30
–40
–50
Output Level (dBm)
PI/Q
PLO
–60
–70
Im
–80
P
1050100500
Input LO frequency f
V
CC vs. ICC
LO (MHz)
40
VP/S = VCC, No signals
I/Q = VCC/2
V
30
= –30 ˚C
A
T
0
VCC = 5.5 V fLO vs. Pout, PLO,PIm, PI/Q
–10
Pout
–20
–30
–40
PLO
–50
–60
PI/Q
P
Im
Output Level (dBm)
– 70
–80
1050100500
Input LO frequency f
LO (MHz)
Pout, PIm and PI/Q3rd vs. Supply Voltage
Lo: f
CC
P/S = V
I/Q = VCC/2
LO = 300.1MHz
P
in = –10 dBm
I/Q = 450 kHz
I/Q: F
1V
p-p
0
PLOin is measued on I/Q bias Without signals
–10
–20
Pout
P
LO
PIm
PI/Q3rd
= +25 ˚C
A
T
20
= +80 ˚C
A
T
Circuit Current ICC (mA)
10
Recommended operating range
0
2.03.04.05.06.0
Supply Voltage V
CC (V)
–30
–40
–50
Output Level (dBm)
–60
–70
–80
2.733.544.555.5
Data Sheet P10818EJ3V0DS00
Suppl
Voltage VCC (V
7
Page 8
)
CC = 2.7 V TA vs. Pout, PLO, PIm, PI/Q
V
fLO = 300.1 MHz, PLO = – 10dBm
0
–10
Pout
PLO
PIm
PL/Q3d
I = Ib = Q = Qb = GND
30
20
P/S vs. Circuit Current
V
µ
PC8101GR
VCC = 5.5 V
–20
–30
–40
–50
Output Level (dBm)
–60
–70
–80
–30–20–100 1020304050607080
Ambrent Temperature TA (˚C
PLO
250
Circuit Curent ICC (mA)
200
100
50
10
µ
µ
µ
µ
1 1.21.41.623456
in appliod Voltage P/S (V)
P
V
CC = 2.7 V
8
Data Sheet P10818EJ3V0DS00
Page 9
TEST CIRCUIT ASSEMBLED ON EVALUATION BOARD
IC MOUNTED SIDE
µ
PC8101GR
C IN1
LO IN
C IN2
NEC
µ
PC8101
COMPONENT MOUNTED SIDE
V
CC
10 000 pF
I IN
RF OUT
Q IN
DC
I
b
I
IF
0 Ω
10 nF
1 000 pF
0 Ω
33 nF
1 kΩ
1 kΩ
141617
13
PS
12
2 000 pF
11
V
CC
200 pF
20 pF
19
20
1 000 pF
5
4
1 kΩ
1
30 pF
2
1 kΩ
10
8
7
0 Ω
50 Ω
0 Ω
0 Ω
0 Ω
Lo
f
Lo
= 300 MHz
in (Lo)
= –10 dBm
P
Q
DC
Q
b
33 nF
Data Sheet P10818EJ3V0DS00
9
Page 10
TYPICAL APPLICATION
CT2 BLOCK DIAGRAM
µ
PC8101GR
RX
PLL
SW
µ
PG131GR
0°
TX
µ
PC8100GR
The application circuits and their parameters are for references only and are not intended for use in actual design-in's.
F/F
90°
PC8101GR
µ
DEMO
PLL
I
Q
I
Q
10
Data Sheet P10818EJ3V0DS00
Page 11
PACKAGE DIMENSIONS
20 PIN PLASTIC SSOP (225 mil) (UNIT: mm)
µ
PC8101GR
20
11
110
6.7 ± 0.3
1.8 MAX.
1.5 ± 0.1
detail of lead end
3˚
6.4 ± 0.2
4.4 ± 0.1
+7˚
–3˚
1.0 ± 0.2
0.5 ± 0.2
0.65
0.22
+0.10
–0.05
0.10
0.15
M
0.575 MAX.
0.15
+0.10
–0.05
0.1 ± 0.1
NOTE Each lead centerline is located within 0.10 mm of its true position (T.P.) at maximum material condition.
Data Sheet P10818EJ3V0DS00
11
Page 12
µ
PC8101GR
NOTE ON CORRECT USE
(1) Observe precautions for handling because of electrostatic sensitive devices.
(2) Form a ground pattern as wide as possible to minimize ground impedance (to prevent undesired operation).
(3) Keep the track length of the ground pins as short as possible.
(4) Connect a bypass capacitor (e.q. 1 000 pF) to the V
CC pin.
RECOMMENDED SOLDERING CONDITIONS
This product should be soldered in the following recommended conditions. Other soldering method and conditions than
the recommended conditions are to be consulted with our sales representatives.
µ
PC8101GR
Soldering
process
Infrared ray reflow
VPS
Wave soldering
Partial heating method
Peak package’s surface temperature: 235 °C or below,
Reflow time: 30 seconds or below (210 °C or higher),
Number of reflow process: 2, Exposure limit*: None
Peak package’s surface temperature: 215 °C or below,
Reflow time: 40 seconds or below (200 °C or higher),
Number of reflow process: 2, Exposure limit*: None
Solder temperature: 260 °C or below,
Flow time: 10 seconds or below
Number of flow process: 1, Exposure limit*: None
Terminal temperature: 300 °C or below,
Flow time: 10 seconds or below,
Exposure limit*: None
Soldering conditions
*:Exposure limit before soldering after dry-pack package is opened.
Storage conditions: 25 °C and relative humidity at 65 % or less.
Note:Apply only a single process at once, except for “Partial heating method”.
For details of recommended soldering conditions for surface mounting, refer to information document SEMICONDUCTOR
DEVICE MOUNTING TECHNOLOGY MANUAL (C10535E).
Symbol
IR35–00-2
VP15–00-2
WS60–00-1
12
Data Sheet P10818EJ3V0DS00
Page 13
[MEMO]
µ
PC8101GR
Data Sheet P10818EJ3V0DS00
13
Page 14
[MEMO]
µ
PC8101GR
14
Data Sheet P10818EJ3V0DS00
Page 15
[MEMO]
µ
PC8101GR
Data Sheet P10818EJ3V0DS00
15
Page 16
µ
PC8101GR
ATTENTION
OBSERVE PRECAUTIONS
FOR HANDLING
ELECTROSTATIC
SENSITIVE
DEVICES
NESAT (NEC Silicon Advanced Technology) is a trademark of NEC Corporation.
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights
or other intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated “quality assurance program“ for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific:Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98.8
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