Datasheet TZA3044U-T-C2, TZA3044U-C2, TZA3044T-C2 Datasheet (Philips)

Page 1
DATA SH EET
Product specification Supersedes data of 1999 Mar 16 File under Integrated Circuits, IC19
1999 Nov 03
INTEGRATED CIRCUITS
TZA3044; TZA3044B
1.25 Gbits/s Gigabit Ethernet postamplifiers
Page 2
1999 Nov 03 2
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
FEATURES
PincompatiblewiththeNE/SA5224andNE/SA5225but with extended power supply range and less external component count
Wideband operation from 1.0 kHz to 1.25 GHz typical
Applicable in 622 Mbits/s SDH/SONET receivers and
1.25 Gbits/s Gigabit Ethernet receivers
Single supply voltage from 3.0 to 5.5 V
Positive Emitter Coupled Logic (PECL) compatible data
outputs
Positive Emitter Coupled Logic (PECL) compatible status outputs (TTL compatible status outputs for the TZA3044B)
Programmable input signal level detection to be adjusted using a single external resistor
On-chip DC offset compensation without external capacitor.
APPLICATIONS
Digital fibre optic receiver for SDH/SONET STM4/OC12 and Gigabit Ethernet applications
Wideband RF gain block.
GENERAL DESCRIPTION
The TZA3044 is a high gain limiting amplifier that is designed to process signals from fibre optic preamplifiers like the TZA3043 and TZA3023. It is pin compatible with the NE/SA5224 and NE/SA5225 but with extended power supply range, and needs less external components. Capable of operating up to 1.25 Gbits/s, the chip has input signalleveldetectionwithauser-programmablethreshold. The data and level detection status outputs are differential outputs for optimum noise margin and ease of use. The TZA3044B has the same functionality as the TZA3044, but with TTL compatible status outputs (pins ST and STQ), and TTL compatible JAM input.
ORDERING INFORMATION
TYPE
NUMBER
PACKAGE
NAME DESCRIPTION VERSION
TZA3044T SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 TZA3044TT TSSOP16 plastic thin shrink small outline package; 16 leads; body width 4.4 mm SOT403-1 TZA3044U bare die in waffle pack carriers; die dimensions 1.55 × 1.55 mm TZA3044BT SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 TZA3044BTT TSSOP16 plastic thin shrink small outline package; 16 leads; body width 4.4 mm SOT403-1 TZA3044BU bare die in waffle pack carriers; die dimensions 1.55 × 1.55 mm
Page 3
1999 Nov 03 3
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
BLOCK DIAGRAM
Fig.1 Block diagram.
The numbers in brackets refer to the pad numbers of the bare die version.
handbook, full pagewidth
MGR240
(3, 4, 6, 9) 3
15 (29)
(17) 9
16 (30)
(1, 14) 1
(11, 12) 6
(13) 7
2 (2, 10, 15, 21, 26)
(19, 20, 22, 25)11(27, 28)
14
25 k
DC-OFFSET
COMPENSATION
RECTIFIER
A1 A2 A3
A4
BAND GAP
REFERENCE
1 k
TZA3044
SUB
TEST
AGND V
CCA
CF
STQ
(18) 10
ST
(16) 8
JAM
(23) 12
DOUTQ
(24) 13
DOUT
DGND V
CCD
V
ref
RSET
5 (8)
DINQ
4 (7)
DIN
Fig.2 Pin configuration of TZA3044T and
TZA3044BT.
handbook, halfpage
TZA3044T
TZA3044BT
MGR241
1 2 3 4 5 6 7 8
16 15 14 13 12 11 10
9
SUB
TEST
AGND
DIN
DINQ
V
CCA
CF
JAM
STQ
ST
DGND
DOUTQ
DOUT
V
CCD
V
ref
RSET
Fig.3 Pin configuration of TZA3044TT and
TZA3044BTT.
handbook, halfpage
TZA3044TT
TZA3044BTT
MBK998
1 2 3 4 5 6 7 8
16 15 14 13 12 11 10
9
SUB
TEST
AGND
DIN
DINQ
V
CCA
CF
JAM
STQ
ST
DGND
DOUTQ
DOUT
V
CCD
V
ref
RSET
Page 4
1999 Nov 03 4
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
PINNING
Note
1. Pin type abbreviations: O = Output, I = Input, S = power Supply and A = Analog function.
SYMBOL
PIN
TZA3044T
TZA3044TT
PAD
TZA3044U
TYPE
(1)
DESCRIPTION
SUB 1 1, 14 S substrate pin; must be at the same potential as pin AGND TEST 2 2, 10, 15,
21, 26
for test purpose only; to be left open in the application
AGND 3 3, 4, 6, 9 S analog ground; must be at the same potential as pin DGND DIN 4 7 I differential input; complementary to pin DINQ; DC bias level is set
internally at approximately 2.1 V
DINQ 5 8 I differential input; complementary to pin DIN; DC bias level is set
internally at approximately 2.1 V
V
CCA
6 11, 12 S analog supply voltage; must be at the same potential as pin V
CCD
CF 7 13 A input for connection of capacitor to set time constant of level
detector input filter (optional); the capacitor should be connected between V
CCA
and pin CF
JAM 8 16 I PECL-compatible input (TTL compatible for the TZA3044B);
controls the output buffers pins DOUTand DOUTQ; when a LOW signal is applied, the outputs will follow the input signal; when a HIGH signal is applied, the output buffers will latch into LOW and HIGH states respectively; when not connected, pin JAM is actively pulled LOW
STQ 9 17 O PECL-compatible status output of the input signal level detector
(TTL compatible for the TZA3044B); when the input signal is below the user-programmed threshold level, this output is HIGH; complementary to pin ST
ST 10 18 O PECL-compatible status output of the input signal level detector
(TTL compatible for the TZA3044B); when the input signal is below the user-programmed threshold level, this output is LOW; complementary to pin STQ
DGND 11 19, 20, 22,
25
S digital ground; must be at the same potential as pin AGND
DOUTQ 12 23 O PECL-compatible differential output; forced into a HIGH condition
when pin JAM is HIGH; complementary to pin DOUT
DOUT 13 24 O PECL-compatible differential output; forced into a LOW condition
when pin JAM is HIGH; complementary to pin DOUTQ
V
CCD
14 27, 28 S digital supply voltage; must be at the same potential as V
CCA
V
ref
15 29 O band gap reference voltage; typical value is 1.2 V; internal series
resistor of 1 k
RSET 16 30 A input signal level detector programming; nominal DC voltage is
V
CCA
1.5 V; threshold level is set by connecting an external
resistor between V
CCA
and pin RSET or by forcing a current into pin RSET; default value for this resistor is 180 k which corresponds with approximately 4 mV (p-p) differential input signal
n.c. 5, 31, 32 not connected
Page 5
1999 Nov 03 5
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
FUNCTIONAL DESCRIPTION
The TZA3044 accepts up to 1.25 Gbits/s data streams, with amplitudes from 2 mV (p-p) up to 1.5 V (p-p) single-ended. The input signal will be amplified andlimited to differential PECL output levels (see Fig.1).
The input buffer A1 presents an impedance of approximately 4.5 kto the data stream on the inputs DIN and DINQ. The input can be used both single-ended and differential, but differential operation is preferred for better performance.
Because of the high gain of the postamplifier, a very small offset voltage would shift the decision level in such a way that the input sensitivity decreases drastically. Therefore a DC offset compensation circuit is implemented in the TZA3044, which keeps the input of buffer A3 at its toggle point in the absence of any input signal.
An input signal level detection is implemented to check if the input signal is above the user-programmed level. The outcome of this test is available at the PECL outputs ST and STQ (TTL for the TZA3044B). This flag can also be used to prevent the PECL outputs DOUT and DOUTQ from reacting to noise in the absence of a valid input signal, by connecting pin STQ to pin JAM. This guarantees that data will only be transmitted when the input signal-to-noise ratio is sufficient for low bit error rate system operation.
PECL logic
The logic level symbol definitions for PECL are shown in Fig.4.
Input biasing
The inputs, pins DIN and DINQ, are DC biased at approximately 2.1 V by an internal reference generator (see Fig.5). The TZA3044 can be DC coupled, but AC coupling is preferred. In case of DC coupling, the driving source must operate within the allowable input signal range (1.3 V to V
CCA
). Also a DC offset voltage of more than a few millivolts should be avoided, since the internal DC offset compensation circuit has a limited correction range.
If AC coupling is used to remove any DC compatibility requirement, the coupling capacitors must be large enough to pass the lowest input frequency of interest. For example, 1 nF coupling capacitors react with the internal 4.5 k input bias resistors to yield a lower 3dB frequency of 35 kHz. This then sets a limit on the maximum number of consecutive pulses that can be sensed accurately at the system data rate. Capacitor tolerance and resistor variation must be included for an accurate calculation.
DC-offset compensation
A control loop connected between the inputs of buffer A3 andamplifier A1 (see Fig.1) will keep theinputof buffer A3 at its toggle point in the absence of any input signal. Because of the active offset compensation which is integrated in the TZA3044, no external capacitor is required. The loop time constant determines the lower cut-off frequency of the amplifier chain, which is set at approximately 850 Hz.
Input signal level detection
The TZA3044 allows for user-programmable input signal leveldetectionand can automatically disable the switching of the PECL outputs if the input signal is below a set threshold. This prevents the outputs from reacting to noise in the absence of avalid input signal, and insures that data will only be transmitted when the signal-to-noise ratio of the input signal is sufficient for low bit-error-rate system operation. Complementary PECL (TTL forthe TZA3044B) flags (pins ST and STQ) indicate whether the input signal is above or below the programmed threshold level.
The input signal is amplified and rectified before being compared to a programmable threshold reference. A filter isincluded to prevent noise spikes from triggeringthe level detector. This filter has a nominal 1 µs time constant and additional filtering can be achieved by using an external capacitor between V
CCA
and pin CF (the internal driving impedance nominally is 25 k). The resultant signal is then compared to a threshold current through pin RSET. This current can be set by connecting an external resistor between V
CCA
and pin RSET, or by forcing a current into
pin RSET (see Fig.6).
Page 6
1999 Nov 03 6
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
The relationship between the threshold current and the detected input voltage is approximately:
(1)
In the formulas (1) and (3), the voltage on pins DIN and DINQ is measured as peak-to-peak value.
Since the voltage on pin RSET is held constant at 1.5 V below V
CCA
, the current flowing into this pin will be:
(2)
Combining these two formulas results in a generalformula to calculate R
ADJ
for a given input signal level detection:
(3)
Example: Detection should occur if the differential voltage of the input signals drops below 4 mV (p-p). In this case, a reference current of 0.0018 × 0.004 = 7.2 µA should flow into pin RSET. This can be set using a current source or simply by connecting a resistor of the appropriate value. The resistor must be connected between V
CCA
and
pin RSET. In this example the value would be:
The hysteresis is fixed internally at 3 dB electrical. In the example of above, a differential level below 4 mV (p-p) of the input signal will drive pin ST to LOW, and an input signal level above 5.7 mV (p-p) will drive pin ST to HIGH.
A function is provided to automatically disable the signal transmission when the chip senses that the input signal is below the programmed threshold level. This function can be put into operation by connecting pin JAM with pin STQ. When the input signal is below the programmed threshold level, the data outputs are then forced to a predetermined state (pin DOUT = LOW and pin DOUTQ = HIGH).
Response time of the input signal level detection circuit is determined by the time constant of the input capacitors, together with the filter time constant (1 µs internal plus the additional capacitor at pin CF). For SDH/SONET applications couple capacitors of 1.5 nF are recommended, leading to a high-pass frequency of
approximately 30 kHz and a maximum assert time of 30 µs.
Dissipation
Since the thermal resistance from junction to ambient R
th(j-a)
of the TSSOP package is higher than the thermal resistance of the SO package (see Chapter “Thermal characteristics”), the dissipation should be considered when using the TZA3044TT version.
The formula to calculate the worst case die temperature is:
(4)
where
T
j
= junction temperature
T
amb
= ambient temperature
R
th(j-a)
= thermal resistance from junction to ambient
P
max
= maximum power dissipation.
For the TZA3044T (SO package), the worst case die temperatureTj=85+115×0.3 = 119.5 °Cwhichis below the maximum operating temperature.
For the TZA3044TT (TSSOP package), the worst casedie temperature Tj=85+150×0.3 = 130 °C which is higher than the maximum operating temperature, and therefore strongly discouraged. It is recommended to lower the thermalresistancefromjunctiontoambient, e.g. by means of a dedicated board layout.
However, if the ambient temperature is limited to 75 °Cor the power supply is limited to 3.3 ±0.3 V, the junction temperature will stay below the maximum value without further precautions.
Output circuits
The output circuit of ST and STQ is given in Fig.7. The output circuit of DOUT and DOUTQ is given in Fig.8. Some PECL termination schemes are given in Fig.9.
I
RSET
0.0018 V
DINVDINQ
()A[]×=
I
RSET
1.5
R
ADJ
-------------
A[]=
R
ADJ
830
V
DINVDINQ
()
--------------------------------------
Ω[]=
R
ADJ
830
0.004
-------------- -
207.5 k==
T
j
T
ambRth j a–()
P×
max
+=
Page 7
1999 Nov 03 7
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
handbook, halfpage
MGS812
(1)
(2)
V
OL(min)
V
OL(max)
V
OH(min)
V
OH(max)
V
CC
GND
Fig.4 Logic level symbol definitions for PECL.
(1) Output signal on pin DOUT or pin ST; complementary to output signal (2). (2) Output signal on pin DOUTQ or pin STQ; complementary to output signal (1)
Fig.5 Data input circuit DIN and DINQ.
MGR958
handbook, halfpage
1 mA
2.1 V
DINQ
4.5 k
DIN
V
CC
4.5 k
Page 8
1999 Nov 03 8
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
handbook, halfpage
MGS815
RSET
I
RSET
R
ADJ
V
CCA
TZA3044
V
RSET
Fig.6 Level detect input circuit RSET.
V
RSET=VCCA
1.5 V
handbook, full pagewidth
10 k
ST
V
CC
V
CC
V
LOW
V
HIGH
MGS816
ST
Fig.7 Output circuit ST and STQ for the TZA3044 (left) and TZA3044B (right).
Output STQ is complementary to output ST.
Fig.8 PECL output circuit DOUT and DOUTQ.
handbook, halfpage
MGR247
105 105
V
CC
DOUTQ
DOUT
0.5 mA
9 mA
0.5 mA
Page 9
1999 Nov 03 9
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Fig.9 PECL output termination schemes.
handbook, full pagewidth
V
OQ
V
O
V
IQ
V
I
R1 = 50 R1 = 50
Zo = 50
VCC 2 V
MGR248
handbook, full pagewidth
V
OQ
V
O
V
IQ
V
I
Zo = 50
GND
VCC = 3.3 V
MGR249
R1 = 127
R2 = 82.5
R1 = 127
R2 = 82.5
handbook, full pagewidth
V
OQ
V
O
V
IQ
V
I
R1 = 83.3
R2 = 125
R1 = 83.3
R2 = 125
Zo = 50
GND
VCC = 5.0 V
MGR250
Page 10
1999 Nov 03 10
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
Note
1. For the TZA3044B the minimum value is 0.5 V for ST and STQ outputs.
HANDLING
This device is ESD sensitive and should be handled with care. Precautions should be taken to avoid damage through electrostatic discharge. This is particularly important during assembly and handling of the bare die. Additional safety can be obtained by bonding the V
CC
and GND pads first, the remaining pads may then be bonded to their external
connections in any order.
THERMAL CHARACTERISTICS
Note
1. Thermal resistance from junction to ambient is determined with the IC soldered on a standard single-sided 57 × 57 × 1.6 mmFR4 epoxy printed-circuit board with 35 µm thickcoppertraces. The measurements are performed in still air.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
supply voltage 0.5 +6 V
V
n
DC voltage
pins DIN, DINQ, CF, JAM and RSET 0.5 V
CC
+ 0.5 V
pins ST, STQ, DOUT and DOUTQ note 1 V
CC
2VCC+ 0.5 V
pin V
ref
0.5 +3.2 V
I
n
DC current
pins DIN, DINQ, CF and JAM 1+1mA pins ST, STQ, DOUT and DOUTQ 25 +10 mA pin V
ref
2 +2.5 mA
pin RSET 2+2mA
P
tot
total power dissipation 300 mW
T
stg
storage temperature 65 +150 °C
T
j
junction temperature 150 °C
T
amb
ambient temperature 40 +85 °C
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th(j-a)
thermal resistance from junction to ambient note 1
SO16 package 115 K/W TSSOP16 package 150 K/W
Page 11
1999 Nov 03 11
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
CHARACTERISTICS
For typical values T
amb
=25°C and VCC= 3.3 V; minimum and maximum values are valid over the entire ambient temperature range and supply voltage range; all voltages are measured with respect to ground; unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Supply
V
CC
supply voltage 3 3.3 5.5 V
I
CCD
digital supply current notes 1 and 2 18 31 mA
I
CCA
analog supply current note 2 15 24 mA
P
tot
total power dissipation notes 1 and 2 110 300 mW
T
j
junction temperature 40 +125 °C
T
amb
ambient temperature 40 +25 +85 °C
Input signal pins DIN and DINQ
V
i(se)(p-p)
single-ended input signal voltage (peak-to-peak)
note 3 0.002 1.5 V
V
i(dif)(p-p)
differential input signal voltage (peak-to-peak)
note 3 0.004 3.0 V
V
I
absolute input signal voltage 1.3 2.1 V
CCA
V
V
IO(eq)
equivalent input signal offset voltage
−−50 µV
V
IO(cor)
inputoffsetvoltagecorrection note 4; positive 3 mV
note 4; negative −−3−mV
R
i
input resistance single-ended 2.9 4.5 7.6 k
C
i
input capacitance single-ended; note 5 −−2.5 pF
V
n(i)(rms)
equivalent input RMS noise voltage
notes 5 and 6 100 145 µV
Input signal level detect pin RSET
I
RSET
reference current notes 5 and 7 5 60 µA
V
RSET
reference voltage referred to V
CCA
V
CCA
1.65 V
CCA
1.5 V
CCA
1.4 V
V
th(p-p)
threshold adjusting range (single-ended, peak-to-peak)
Vi= 1.25 Gbits/s PRBS 27− 1 sequence; note 5
2 12 mV
hys hysteresis electrically measured 236dB R
F
filter resistance 14 25 41 k
t
F
filter time constant CF = 0; note 5 0.5 1.0 2.0 µs
PECL output pins DOUT and DOUTQ
V
OL
LOW-level output voltage note 8 VCC− 1.84 VCC− 1.6 V
V
OH
HIGH-level output voltage note 8 VCC− 1.1 VCC− 0.9 V
t
r
rise time 20% to 80%; note 5 200 250 ps
t
f
fall time 80% to 20%; note 5 200 250 ps
t
PWD
pulse width distortion note 5 −−30 ps
f
3dB(l)
low frequency 3 dB point 0.85 1.5 kHz
f
3dB(h)
high frequency 3 dB point note 9 1000 MHz
Page 12
1999 Nov 03 12
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Notes
1. PECL outputs (pins DOUT, DOUTQ, ST and STQ) are not connected.
2. Maximum currents are specified at Tj= 125 °C, VCC= 5.5 V and worst case processing.
3. 2 mV (p-p) single-ended is the minimum input signal to achieve full clipping of the output signal. Typical an input
signal of 0.8 mV (p-p) single-ended results in a Bit Error Rate (BER) of less than 10
10
.
4. If the input is DC coupled, the preceding amplifier’s output offset voltage should not exceed these limits, in order to
avoid malfunctioning of the DC offset compensation circuit.
5. Specifications guaranteed by design and characterisation. Each device is tested at full operating speed to guarantee
RF functionality.
6.
7. The reference current can be set by connecting a resistor between V
CCA
and pin RSET. The corresponding input signallevel detect range isfrom 2 to 12 mV (p-p) single-ended. SeeSection “Input signal level detection” for detailed information.
8. RL=50Ω connected to a level of VCC− 2 V (see Fig.9).
9. Large signal response of TZA3044T and TZA3044TT show very little deviation, although the small signal frequency response of the TZA3044TT is more flat and shows a larger bandwidth.
10. Internal pull-down resistor of 500 k to DGND.
11. Internal series resistor of 1 k.
PECL output pins ST and STQ (TZA3044)
V
OL
LOW-level output voltage note 8 VCC− 1.84 VCC− 1.6 V
V
OH
HIGH-level output voltage note 8 VCC− 1.1 VCC− 0.9 V
C
L
load capacitance RL= ∞−20 pF
R
L
=1kΩ−100 pF
R
L
=50Ω−1000 pF
TTL output pins ST and STQ (TZA3044B)
V
OL
LOW-level output voltage IOL = 4 mA −−0.4 V
V
OH
HIGH-level output voltage IOH = 400 µA 2.4 −−V
PECL input pin JAM (TZA3044)
V
IL
LOW-level input voltage −−V
CC
1.49 V
V
IH
HIGH-level input voltage VCC− 1.165 −−V
I
I(JAM)
JAM input current note 10 20 +20 µA
TTL input pin JAM (TZA3044B)
V
IL
LOW-level input voltage −−0.8 V
V
IH
HIGH-level input voltage 2.0 −−V
I
I(JAM)
JAM input current note 10 20 +20 µA
Reference voltage output pin V
ref
V
ref
reference voltage note 11 1.165 1.20 1.235 V
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Input RMS noise
total output RMS noise
low frequency gain
------------------------------------------------------------
=
Page 13
1999 Nov 03 13
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
TYPICAL PERFORMANCE CHARACTERISTICS
Fig.10 Total power supply current as function of
junction temperature.
PECL outputs not connected (1) VCC= 5.5 V. (2) VCC= 3.0 V.
handbook, halfpage
40 0 40 120
50
20
10
40
MGR959
30
80
I
CC
(mA)
Tj (°C)
(2)
(1)
Fig.11 Differential output voltage as function of
junction temperature.
handbook, halfpage
1.40
1.16
1.32
1.36
MGR960
40 0 40 12080 Tj (°C)
1.28
1.24
1.20
V
o(dif) (V)
V
o(dif)=VDOUT
V
DOUTQ
.
Fig.12 Differential output voltage as function of
differential input voltage.
handbook, halfpage
1
1.1
1.2
1.3
1.4
MGR961
10
3
10
2
10
1
110
V
i(dif)(p-p)
(V)
V
o(dif)
(V)
V
o(dif)=VDOUT
V
DOUTQ
.
Fig.13 Differential output rise time and fall time as
function of differential input voltage.
handbook, halfpage
100
140
180
220
260
MGR962
t
(ps)
10
3
10
2
10
1
110
t
r
t
f
V
i(dif)(p-p)
(V)
Page 14
1999 Nov 03 14
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Fig.14 Differential output rise time and fall time as
function of junction temperature.
handbook, halfpage
40 0 40 120
300
100
0
200
MGR963
80
t
(ps)
Tj (°C)
t
r
t
f
Fig.15 Status detect level as function of I
RSET
.
V
i(dif)=VDIN
V
DINQ
. (1) Input high threshold for 1 0 1 0 pattern (pin ST = HIGH). (2) Input high threshold for 27− 1 PRBS pattern (pin ST = HIGH). (3) Input low threshold for 1 0 1 0 pattern (pin ST = LOW). (4) Input low threshold for 27− 1 PRBS pattern (pin ST = LOW).
handbook, halfpage
51525 45
20
10
0
40
MGR964
50
30
35
I
RSET
(µA)
(1)
(2)
(4)
(3)
V
i(dif)
(mV)
Fig.16 Status detect level as function of junction
temperature.
handbook, halfpage
40 0 40 120
20
10
0
30
MGR965
40
80
Tj (°C)
V
i(dif)
(mV)
(1)
(2)
(3)
(4)
V
i(dif)=VDIN
V
DINQ
. (1) Input high threshold for 1 0 1 0 pattern (pin ST = HIGH). (2) Input high threshold for 27− 1 PRBS pattern (pin ST = HIGH). (3) Input low threshold for 1 0 1 0 pattern (pin ST = LOW). (4) Input low threshold for 27− 1 PRBS pattern (pin ST = LOW).
Fig.17 Status detect hysteresis as function of
I
RSET
.
(1) 1 0 1 0 pattern. (2) 27− 1 PRBS pattern.
handbook, halfpage
6
2
0
4
MGR966
51525 4535
I
RSET
(µA)
hys
(dB)
(2)
(1)
Page 15
1999 Nov 03 15
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Fig.18 Status detect hysteresis as function of
junction temperature.
handbook, halfpage
40 0 40 120
4
2
1
3
MGR967
80
hys
(dB)
Tj (°C)
(2)
(1)
(1) I
RSET
=45µA.
(2) I
RSET
=10µA.
Fig.19 Status detect ratio as function of I
RSET
.
where V
i(dif)
= input low threshold (pin ST = LOW).
(1) 2
7
1 PRBS pattern.
(2) 1 0 1 0 pattern.
Ratio
I
RSET
V
idif()
--------------
=
handbook, halfpage
0.003
0.001
0
0.002
MGR968
51525 4535
I
RSET
(µA)
Ratio (A/V)
(2)
(1)
Fig.20 Pulse Width Distortion (t
PWD
) as function of
differential input voltage.
handbook, halfpage
0
10
20
30
40
MGR969
10
3
10
2
10
1
110
t
PWD
(ns)
V
i(dif)(p-p)
(V)
Fig.21 V
RSET
as function of junction temperature.
handbook, halfpage
40 0 40 120
1.555
1.535
1.525
1.545
MGR970
80
Tj (°C)
(2)
(1)
V
RSET
(V)
V
RSET=VCCA
1.5 V. (1) VCC= 5.5 V. (2) VCC= 3.0 V.
Page 16
1999 Nov 03 16
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Fig.22 Differential output waveform with 4 mV differential input voltage.
handbook, full pagewidth
MGR956
200 mV/div
Fig.23 Differential output waveform with 2 V differential input voltage.
handbook, full pagewidth
MGR957
200 mV/div
Page 17
1999 Nov 03 17
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
APPLICATION INFORMATION
Fig.24 Application diagram.
The numbers in brackets refer to the pad numbers of the bare die version.
handbook, full pagewidth
MGR251
(23) 12
DOUTQ
(24) 13
DOUT
1 k
50 50
1.5 nF
1.5 nF
100 nF
180 k
TZA3044
(1, 14)
1
(19, 20, 22, 25)
11
SUB
(16)
8
JAM
(17)
9
STQ
(18)
10
ST
(3, 4, 6, 9)
3
AGND
V
CC
6
(11, 12)
V
CCA
16
(30)
RSET
7
(13)
CF
15
(29)
V
ref
14
(27, 28)
V
CCD
DGND
data outdata in
level detect status
VCC 2 V
5 (8)
DINQ
4 (7)
DIN
100 nF
Page 18
1999 Nov 03 18
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
This text is here in white to force landscape pages to be rotated correctly when browsing through the pdf in the Acrobat reader.This text is here in
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g
ewidth
MGR252
(23) 12
DOUTQ
6
OUT
7
OUTQ
(24) 13
DOUT
1 k
50 50
1.5 nF
1.5 nF
100 nF
4 pF
1 µF
noise filter: 1-pole, 800 MHz
100
61 k
TZA3043T TZA3044
(1, 14)
1
(19, 20, 22, 25)
11
SUB
(16)
8
JAM
(17)
9
STQ
(18)
10
ST
(3, 4, 6, 9)
3
AGND
8
V
CC
V
CC
6
(11, 12)
V
CCA
16
(30)
RSET
7
(13)
CF
15
(29)
V
ref
14
(27, 28)
V
CCD
DGND
data out
level detect status
VCC 2 V
5 (8)
DINQ
4 (7)
DIN
3
1
22 nF
680 nF
100 nF
(1) (1) (1)
2
GND4GND5GND
IPhoto
DREF
Fig.25 Gigabit Ethernet receiver using the TZA3043T and TZA3044.
(1) Ferrite bead e.g. Murata BLM10A700S. The numbers in brackets refer to the pad numbers of the bare die version.
Page 19
1999 Nov 03 19
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
This text is here in white to force landscape pages to be rotated correctly when browsing through the pdf in the Acrobat reader.This text is here in
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n
dbook, full pagewidth
MBK999
(23) 12
DOUTQ
6
OUT
7
OUTQ
(24) 13
DOUT
1 k
50 50
1.5 nF
1.5 nF
100 nF
8 pF
noise filter: 1-pole, 400 MHz
100
61 k
TZA3023T TZA3044
(1, 14)
1
(19, 20, 22, 25)
11
SUB
(16)
8
JAM
(17)
9
STQ
(18)
10
ST
(3, 4, 6, 9)
3
AGND
8
V
CC
V
CC
6
(11, 12)
V
CCA
16
(30)
RSET
7
(13)
CF
15
(29)
V
ref
14
(27, 28)
V
CCD
DGND
data out
level detect status
VCC 2 V
5 (8)
DINQ
4 (7)
DIN
3
IPhoto
1
DREF
680 nF
100 nF
7.5 pF
1.1 pF
16.4 nH
16.4 nH
optional noise filter: 3-pole, 470 MHz Bessel
(1) (1) (1)
2
GND4GND5GND
Fig.26 STM4/OC12 receiver using the TZA3023T and TZA3044.
(1) Ferrite bead e.g. Murata BLM10A700S. The numbers in brackets refer to the pad numbers of the bare die version.
Page 20
1999 Nov 03 20
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
BONDING PADS
Note
1. The x and y coordinates represent the position of the centre of the pad with respect to the centre of the die (see Fig.27).
SYMBOL PAD
COORDINATES
(1)
XY
SUB 1 235.7 +647.8 TEST 2 392.8 +647.8 AGND 3 532.8 +647.8 AGND 4 647.8 +507.1 n.c. 5 647.8 +350.0 AGND 6 647.8 +210.0 DIN 7 647.8 +70.0 DINQ 8 647.8 70.0 AGND 9 647.8 210.0 TEST 10 647.8 350.0 V
CCA
11 647.8 507.1
V
CCA
12 532.8 647.8 CF 13 392.8 647.8 SUB 14 235.7 647.8 TEST 15 78.6 647.8 JAM 16 +61.4 647.8 STQ 17 +218.5 647.8 ST 18 +375.6 647.8 DGND 19 +532.7 647.8 DGND 20 +647.8 507.1 TEST 21 +647.8 350.0 DGND 22 +647.8 210.0 DOUTQ 23 +647.8 70.0 DOUT 24 +647.8 +70.0 DGND 25 +647.8 +210.0 TEST 26 +647.8 +350.0 V
CCD
27 +647.8 +507.1 V
CCD
28 +532.7 +647.8 V
ref
29 +392.7 +647.8 RSET 30 +235.6 +647.8 n.c. 31 +78.5 +647.8 n.c. 32 78.6 +647.8
Page 21
1999 Nov 03 21
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Physical characteristics of bare die
PARAMETER VALUE
Glass passivation 2.1 µm PSG (PhosphoSilicate Glass) on top of 0.65 µm oxynitride Bonding pad dimension minimum dimension of exposed metallization is 90 × 90 µm (pad size = 100 × 100 µm) Metallization 1.22 µm W/AlCu/TiW Thickness 380 µm nominal Size 1.55 × 1.55 mm (2.4 mm
2
) Backing silicon; electrically connected to GND potential through substrate contacts Attache temperature <440 °C; recommended die attache is glue Attache time <15 s
Fig.27 Bonding pad locations of TZA3044U and TZA3044BU.
handbook, full pagewidth
AGND 4
V
CCD
27
TEST
26
DGND
25
DOUT
24
DOUTQ
23
DGND
22
TEST21
DGND
20
AGND
6
DIN
7
DINQ
8
AGND 9
TEST 10
V
CCA
11
n.c.
5
TZA3044U
TZA3044BU
12
V
CCA
3
AGND2TEST1SUB32n.c.31n.c.30RSET29V
ref
28
V
CCD
13CF14
SUB
15
TEST
16
JAM
17
STQ
18ST19
DGND
MGR242
1.55
(1)
mm
1.55
(1)
mm
x
y
0
0
(1) Typical value.
Page 22
1999 Nov 03 22
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
PACKAGE OUTLINES
X
w M
θ
A
A
1
A
2
b
p
D
H
E
L
p
Q
detail X
E
Z
e
c
L
v M
A
(A )
3
A
8
9
1
16
y
pin 1 index
UNIT
A
max.
A1A2A
3
b
p
cD
(1)E(1) (1)
eHELLpQZywv θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC EIAJ
mm
inches
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8
1.27
6.2
5.8
0.7
0.6
0.7
0.3
8 0
o o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
1.0
0.4
SOT109-1
95-01-23 97-05-22
076E07S MS-012AC
0.069
0.010
0.004
0.057
0.049
0.01
0.019
0.014
0.0100
0.0075
0.39
0.38
0.16
0.15
0.050
1.05
0.041
0.244
0.228
0.028
0.020
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
0 2.5 5 mm
scale
SO16: plastic small outline package; 16 leads; body width 3.9 mm
SOT109-1
Page 23
1999 Nov 03 23
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
UNIT A
1
A2A
3
b
p
cD
(1)E(2) (1)
eHELLpQZywv θ
REFERENCES
OUTLINE VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC EIAJ
mm
0.15
0.05
0.95
0.80
0.30
0.19
0.2
0.1
5.1
4.9
4.5
4.3
0.65
6.6
6.2
0.4
0.3
0.40
0.06
8 0
o o
0.13 0.10.21.0
DIMENSIONS (mm are the original dimensions)
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
0.75
0.50
SOT403-1 MO-153
94-07-12 95-04-04
w M
b
p
D
Z
e
0.25
18
16
9
θ
A
A
1
A
2
L
p
Q
detail X
L
(A )
3
H
E
E
c
v M
A
X
A
y
0 2.5 5 mm
scale
TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm
SOT403-1
A
max.
1.10
pin 1 index
Page 24
1999 Nov 03 24
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
SOLDERING Introduction to soldering surface mount packages
Thistextgivesaverybriefinsight to a complex technology. A more in-depth account of soldering ICs can be found in our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011). There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering is not alwayssuitable for surface mount ICs, or for printed-circuit boards with high population densities. In these situations reflow soldering is often used.
Reflow soldering
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied tothe printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example, infrared/convection heating in a conveyor type oven. Throughput times (preheating, soldering and cooling) vary between 100 and 200 seconds depending on heating method.
Typical reflow peak temperatures range from 215 to 250 °C. The top-surface temperature of the packages should preferable be kept below 230 °C.
Wave soldering
Conventional single wave soldering is not recommended forsurfacemountdevices(SMDs)orprinted-circuitboards with a high component density, as solder bridging and non-wetting can present major problems.
To overcome these problems the double-wave soldering method was specifically developed.
If wave soldering is used the following conditions must be observed for optimal results:
Use a double-wave soldering method comprising a turbulent wave with high upward pressure followed by a smooth laminar wave.
For packages with leads on two sides and a pitch (e): – larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the printed-circuit board.
The footprint must incorporate solder thieves at the downstream end.
Forpackageswithleadsonfoursides,thefootprintmust be placed at a 45° angle to the transport direction of the printed-circuit board. The footprint must incorporate solder thieves downstream and at the side corners.
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Typical dwell time is 4 seconds at 250 °C. A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two diagonally-opposite end leads. Use a low voltage (24 V or less) soldering iron applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C.
When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
Page 25
1999 Nov 03 25
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
Suitability of surface mount IC packages for wave and reflow soldering methods
Notes
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum temperature (with respect to time) and body size of the package, there is a risk that internal or external package cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the Drypack information in the
“Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”
.
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink (at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction. The package footprint must incorporate solder thieves downstream and at the side corners.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm; it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
PACKAGE
SOLDERING METHOD
WAVE REFLOW
(1)
BGA, SQFP not suitable suitable HLQFP, HSQFP, HSOP, HTSSOP, SMS not suitable
(2)
suitable
PLCC
(3)
, SO, SOJ suitable suitable
LQFP, QFP, TQFP not recommended
(3)(4)
suitable
SSOP, TSSOP, VSO not recommended
(5)
suitable
Page 26
1999 Nov 03 26
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
DEFINITIONS
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
BARE DIE DISCLAIMER
All die are tested and are guaranteed to comply with all data sheet limits up to the point of wafer sawing for a period of ninety (90) days from the date of Philips' delivery. If there are data sheet limits not guaranteed, these will be separately indicated in the data sheet. There is no post waffle pack testing performed on individual die. Although the most modern processes are utilized for wafer sawing and die pick and place into waffle pack carriers, Philips Semiconductors has no control of third party procedures in the handling, packing or assembly of the die. Accordingly, Philips Semiconductors assumes no liability for device functionality or performance of the die or systems after handling, packing or assembly of the die. It is the responsibility of the customer to test and qualify their application in which the die is used.
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Page 27
1999 Nov 03 27
Philips Semiconductors Product specification
SDH/SONET STM4/OC12 and
1.25 Gbits/s Gigabit Ethernet postamplifiers
TZA3044; TZA3044B
NOTES
Page 28
© Philips Electronics N.V. SCA All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
1999
68
Philips Semiconductors – a w orldwide compan y
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
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Sweden: Kottbygatan 7, Akalla, S-16485 STOCKHOLM, Tel. +46 8 5985 2000, Fax. +46 8 5985 2745
Switzerland: Allmendstrasse 140, CH-8027 ZÜRICH, Tel. +41 1 488 2741 Fax. +41 1 488 3263
Taiwan: Philips Semiconductors, 6F, No. 96, Chien Kuo N. Rd., Sec. 1, TAIPEI, Taiwan Tel. +886 2 2134 2886, Fax. +886 2 2134 2874
Thailand: PHILIPS ELECTRONICS (THAILAND) Ltd., 209/2 Sanpavuth-Bangna Road Prakanong, BANGKOK 10260, Tel. +66 2 745 4090, Fax. +66 2 398 0793
Turkey: Yukari Dudullu, Org. San. Blg., 2.Cad. Nr. 28 81260 Umraniye, ISTANBUL, Tel. +90 216 522 1500, Fax. +90 216 522 1813
Ukraine: PHILIPS UKRAINE, 4 Patrice Lumumba str., Building B, Floor 7, 252042 KIEV, Tel. +380 44 264 2776, Fax. +380 44 268 0461
United Kingdom: Philips Semiconductors Ltd., 276 Bath Road, Hayes, MIDDLESEX UB3 5BX, Tel. +44 208 730 5000, Fax. +44 208 754 8421
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409, Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America Vietnam: see Singapore Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 62 5344, Fax.+381 11 63 5777
Printed in The Netherlands 465012/100/03/pp28 Date of release: 1999 Nov 03 Document order number: 9397 750 06335
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