Dual center tap Schottky rectifiers suited for
Switch Mode Power Supply and high frequency
DC to DC converters.
2
Packaged in TO-220AB, D
PAK and I²PAK, these
devices are intended for use in low voltage, high
frequency inverters, free-wheeling and polarity
protection applications.
A1
A2
A1
TO-220AB
STPS30L30CT
STPS30L30CR
A2
K
I2PAK
K
K
A2
A1
2
PAK
D
STPS30L30CG
A2
K
A1
ABSOLUTE RATINGS (limiting values, per diode)
SymbolParameterValueUnit
V
RRM
I
F(RMS)
I
F(AV)
I
FSM
I
RRM
I
RSM
P
ARM
T
stg
Tj
dV/dt
July 2003 - Ed: 5C
Repetitive peak reverse voltage
RMS forward current
Average forward currentTc = 140°C
Surge non repetitive forward currenttp = 10 ms Sinusoidal
Peak repetitive reverse currenttp=2µsF=1kHz square
Non repetitive peak reverse currenttp = 100µs square
Repetitive peak avalanche powertp = 1µsTj = 25°C
Storage temperature range
Maximum operating junction temperature *
Critical rate of rise reverse voltage
δ = 0.5
Per diode
Per device
30V
30A
15
30
220A
1A
3A
5300W
- 65 to + 150°C
150°C
10000V/µs
A
1/5
Page 2
STPS30L30CT/CG/CR
THERMAL RESISTANCE
SymbolParameterValueUnit
R
th (j-c)
Junction to case
Per diode
Total
R
th (c)
Coupling0.1°C/W
When the diodes 1 and 2 are used simultaneously :
∆ Tj(diode 1) = P(diode1) x R
(Per diode) + P(diode 2) x R
th(j-c)
th(c)
STATIC ELECTRICAL CHARACTERISTICS (per diode)
SymbolParameterTests ConditionsMin.Typ.Max.Unit
*
I
R
V
F
Reverse leakage current
*
Forward voltage dropTj = 25°CI
Tj = 25°CV
Tj = 125°C
Tj = 125°CI
Tj = 25°CI
Tj = 125°CI
R=VRRM
=15A
F
=15A
F
=30A
F
=30A
F
Pulse test : * tp = 380 µs, δ <2%
To evaluate the conduction losses use the following equation :
P = 0.24x I
Fig. 1: Average forward power dissipation versus
average forward current (per diode).
F(AV)
+ 0.009 I
F2(RMS)
Fig.2:Averagecurrentversusambient
temperature (δ=0.5) (per diode).
1.5
°C/W
0.8
1.5mA
170350mA
0.46V
0.330.37
0.57
0.430.5
PF(av)(W)
10
9
8
7
6
5
4
3
2
1
0
0 2 4 6 8 101214161820
δ = 0.05
δ = 0.1
δ = 0.2
IF(av) (A)
δ = 0.5
δ
=tp/T
δ = 1
T
tp
Fig. 3: Normalized avalanche power derating
versus pulse duration.
P(t)
ARM p
P(1µs)
ARM
1
0.1
0.01
t (µs)
0.001
0.10.011
p
101001000
IF(av)(A)
16
14
12
10
8
6
4
2
δ
0
0255075100125150
=tp/T
Rth(j-a)=15°C/W
T
tp
Rth(j-a)=50°C/W
Tamb(°C)
Rth(j-a)=Rth(j-c)
Fig. 4: Normalized avalanche power derating
versus junction temperature.
P(t)
ARM p
P(25°C)
ARM
1.2
1
0.8
0.6
0.4
0.2
0
0255075100125150
T (°C)
j
2/5
Page 3
STPS30L30CT/CG/CR
Fig. 4: Non repetitive surge peak forward current
versus overload duration (maximum values) (per
diode).
IM(A)
250
225
200
175
150
125
100
75
IM
50
25
0
1E-31E-21E-11E+0
δ=0.5
t
t(s)
Tc=25°C
Tc=75°C
Tc=110°C
Fig. 6: Reverse leakage current versus reverse
voltage applied (typical values) (per diode).
IR(mA)
1E+3
1E+2
1E+1
Tj=150°C
Tj=125°C
Fig. 5: Relative variation of thermal transient
impedance junction to case versus pulse duration.
Zth(j-c)/Rth(j-c)
1.0
0.8
δ = 0.5
0.6
0.4
δ = 0.2
δ = 0.1
0.2
Single pulse
0.0
1E-41E-31E-21E-11E+0
tp(s)
δ
=tp/T
T
tp
Fig. 7: Junction capacitance versus reverse
voltage applied (typical values) (per diode).
C(nF)
5.0
1.0
F=1MHz
Tj=25°C
1E+0
1E-1
Tj=25°C
1E-2
051015202530
VR(V)
Fig. 8: Forward voltage drop versus forward
current (maximum values - per diode).
IFM(A)
200
100
Tj=150°C
(typical values)
Tj=125°C
10
Tj=25°C
1
0.00.20.40.60.81.01.21.41.6
VFM(V)
0.1
1251020 50
VR(V)
Fig. 9: Thermal resistance junction to ambient
versus copper surface under tab (epoxy printed
circuit board FR4, e(Cu) = 35 µm)
(STPS30L30CG).
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