Datasheet STLVD112CTR, STLVD112BTR Datasheet (SGS Thomson Microelectronics)

Page 1
HIGH SPEED PROTECTION SWITCH
24mA CMOS OUTPUT DRIV E CURRENT
LVTTL INPUT THRESHOLDS
CONTROLLEDSKEW BETWEEN DATA AND
CLOCK SIGNALS
LVDS INPUT-OUTPUT UP TO 155 MHZ
IMPROVED LATCH-UP IMMUNITY UP TO
300mA
The STLVD112 is a low voltage differential to LVTTL signal converter with enhanced l oop-back and crosspoint features. The synchronous design allows a phase alignment between a clock and its data; this means a better BER (Bit Error Rate) performance. The advanced 0.35µm tec hnology makes the STLVD112 suitable for data rates up to 200Mbit. The main application field is SDH/SONE T telecom infrastructure. The STLVD112 flexible switch architecture makes it eas y to implement multiple protection schemes in STM1 access systems. Thanks to the flexibl e multiplexing allowed, it becomes simple to redirect the data/c lock signal coming from the faulty access card to the spare card. In normal mode the STLVD11 2 c onv ert s the differential data levels of the LVDS and related
STLVD112
TSSOP
clock s ignal from (to) the line interface in LVTTL level signals to (from) the backpanel. In addition the switch functions prevent the equipment from line interface faults. In fact, it is possible to switch the signals coming from a different line interface to the local line interface or the signals from the loca l line interface to a different line interface.
ORDERING CODES
Type
STLVD112BTR -40 to 85 °C TSSOP48 (Tape & Reel) 1000 parts per reel STLVD112CTR 0 to 70 °C TSSOP48 (Tape & Reel) 1000 parts per reel
Temperature
Range
Package Comments
1/11April 2003
Page 2
STLVD112
PIN CONFIGURATION
2/11
Page 3
PIN DESCRIPTION
PlN N° SYMBOL NAME AND FUNCTION
1, 6, 14, 22 VS1 Main Power Supply
2 CKsp_in LVTTL Clock Input 3 DATAsp_in LVTTL Data Input
4, 9, 13, 17, 21,
25, 36, 44, 48
5 LOSch Control Output 7 CKsp_out LVTTL Clock Output 8 DATAsp_out LVTTL Data Output
10, 18, 31, 38 VS2 Second Power Supply
11 CKch_in LVTTL Clock Input 12 DATAch_in LVTTL Data Input 15 CKprev_in LVTTL Clock Input 16 DATAprev_in LVTTL Data Input 19 CKch_out LVTTL Clock Output 20 DATAch_out LVTTL Data Output 23 CKprev_out LVTTL Clock Output 24 DATAprev_out LVTTL Data Output
26, 30, 37, 43 N.C. Not Connected
27 Kloop_sp Control Input 28 Kloop_I Control Input 29 Ki Control Input 32 DATAinB LVDS Data Input ­33 DATAinA LVDS Data Input + 34 CKinB LVDS Clock Input ­35 CKinA LVDS Clock Input + 39 CKoutB LVDS Clock Output ­40 CKoutA LVDS Clock Output + 41 DATAoutB LVDS Data Output ­42 DATAoutA LVDS Data Output + 45 LOSsp Control Output 46 LOSi Control Input 47 LOSprev Control Input
GND
Ground
STLVD112
TRUTH TABLES FOR THE FIVE MUX
INPUTS OUTPUT
Ki Kloop_sp Kloop_i DATA_out
LOW X X DATAch_in
HIGH X X DATAsp_in
INPUTS OUTPUT
Ki Kloop_sp Kloop_i DATAch_out
X X LOW DATAin X X HIGH DATAch-in
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STLVD112
INPUTS OUTPUT
Ki Kloop_sp Kloop_i DATAsp_out
LOW LOW X DATAprev_in
HIGH LOW X DATA_in
X HIGH X DATAsp_in
INPUTS OUTPUT
Ki Kloop_sp Kloop_i LOSch
X X LOW LOSi X X HIGH LOW
INPUTS OUTPUT
Ki Kloop_sp Kloop_i LOSsp
LOW LOW X LOSprev
HIGH LOW X LOSi
X HIGH X LOW
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
VS1, VS2 Supply Voltage
VS2 Supply Voltage
V
V
DC Input Voltage
I
DC Output Voltage
O
Iik DC Input Diode Clamp Current ±20 mA
Iok DC Output Diode Clamp Current ±20 mA
I
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied.
DC Output Current
O
Lead Temperature (10sec)
L
Storage Temperature Range
stg
-0.3 to 4.6 V
-0.3 to (VS1 + 0.3) V
-0.3 to (VS1 + 0.3) V
-0.3 to (VS1 + 0.3) V
±50 mA 300 °C
-65 to 150 °C
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
VS1, VS2 Supply Voltage
VS2 Supply Voltage
V
V
DC Input Voltage
I
DC Output Voltage
O
Top Operating Temperature -45 to 85 °C
dt/dv Maximum Input Rise and Fall Time 10 ns/V
4/11
3 to 3.6 V
3 to (VS1 + 0.3) V
0 to VS1 V 0 to VS1 V
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STLVD112
ELECTRICAL CHARACTERISTICS (Over r ec ommended operating conditions, unless otherwise noted.
All typical values are at T
Symbol Parameter Test Conditions
Low Level Output Voltage I
V
OL
High Level Output Voltage I
V
OH
Low Level Input Thresholds V
V
IL
High Level Input Thresholds V
V
IH
I
Input Leakage Current VIN= GND or V
IN
Quiescent Supply Current VIN= GND or V
I
CC
LVDS DRIVER ELECTRICAL CHARACTERISTICS (Over recomm ended operating conditions, unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
Differential Output Voltage RL= 100 247 364 454 mV
OD
Change in differential output voltage
OD
between logic states Steady-state common-mode output
voltage Change in steady-state common-
mode output voltage between logic State
Peak-to-Peack common-mode output voltage
Short Circuit Output Current V
SC
Power Off Output Current VCC=0,VO= 2.4V -1 1 µA
V
V
V
V
V
OC(SS)
OC(SS)
OC(PP)
I
I
OFF
=25°C and VS1,VS2=3.3V)
A
= 24 mA 0.2 0.4 V
OUT
=24mA VSI-0.5 VSI-0.3 V
OUT
= 0.1V or VS1- 0.1 0 0.8 V
OUT
= 0.1V or VS1- 0.1 2 V
OUT
CC CC
= 155MHz 110
f
CLOCK
=25°C and VS1,VS2=3.3V)
A
or V
O(Y)
=0 ±12
V
OD
Value
Min. Typ. Max.
SI
-1 1 µA 15 mA
Value
Min. Typ. Max.
-50 50 mV
1 1.15 1.30 V
-50 50 mV
100 150 mV
= 0 -24 -4 mA
O(Z)
Unit
V
Unit
LVDS RECEIVER ELECTRICAL CHARACT ERISTICS (Over recommended operating conditions,
unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
V
V
|V
Positive-going Differential Input
ITH+
Voltage Threshold Negative-going Differential Input
ITH-
Voltage Threshold
| Magnitude of Differential Input
ID
Voltage
V
Common-mode Input Voltage 0.5
IC
=25°C and VS1,VS2=3.3V)
A
Min. Typ. Max.
-100 mV
0.1 0.6 V
|V
Value
100 mV
2.4-0.5
|
ID
|VID|
V
CC
-1
Unit
V
5/11
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STLVD112
LVDS SWITCHING TIMING CHARACTERISTICS (Over recommended operating conditions, unless
otherwise noted. All typical v alues are at T
Symbol Parameter Test Conditions
Minimum Pulse Width <1 ns
t
W
AC LVTTL IN LVTTL OUT (Over recommended op erating conditions, unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
t
PLH
t
PHL
t
TLH
t
THL
f
opr
=25°C and VS1,VS2=3.3V)
A
Propagation Delay Time, low-to-high­level output (50% to 50%)
Propagation Delay Time, high-to-low­level output (50% to 50%)
Transition Time, low-to-high-level output (10% to 90%)
Transition Time, high-to-low-level output (90% to 10%)
Operative frequency 100 155 200 MHz
=25°C and VS1,VS2=3.3V)
A
Measured with VIN=0 to 2.5V, f
= 1MHz, f
CLOCK
t
= 0.4ns, +Duty Cycle=50%
r=tf
t
PHL,tPLH
are referred to output
DATA
= 0.5MHz
clock transitions.
Value
Unit
Min. Typ. Max.
Value
Unit
Min. Typ. Max.
2.4 3.9 5.6 ns
2.5 4.2 5.3 ns
0.7 1.3 1.6 ns
0.7 1.1 1.3 ns
AC CONTROL OUTPUT (LOSsp, LOSch) (Over recommended operating conditions, unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
t
t
t
t
Propagation Delay Time, low-to-high-
PLH
level output (50% to 50%) Propagation Delay Time, high-to-low-
PHL
level output (50% to 50%) Transition Time, low-to-high-level
TLH
output (10% to 90%) Transition Time, high-to-low-level
THL
output (90% to 10%)
=25°C and VS1,VS2=3.3V)
A
Measured with VIN=0 to 2.5V, f
= 1MHz, f
CLOCK
t
= 0.4ns, +Duty Cycle=50%
r=tf
t
PHL,tPLH
are referred to output
clock transitions.
DATA
Value
Unit
Min. Typ. Max.
2.4 3.6 4.4 ns
= 0.5MHz
2.4 3.4 4.2 ns
0.9 1.9 2.3 ns
0.7 1.0 1.2 ns
AC LVTTL IN LVDS OUT (Over recommended operating conditions, unless otherwise note d. All typical values are at T
Symbol Parameter Test Conditions
t
PLH
t
PHL
t
TLH
t
THL
f
opr
=25°C and VS1,VS2=3.3V)
A
Value
Unit
Min. Typ. Max.
Propagation Delay Time, low-to-high­level output (50% to 50%)
Propagation Delay Time, high-to-low­level output (50% to 50%)
Transition Time, low-to-high-level
Measured with VIN=0 to 2.5V, f
= 1MHz, f
CLOCK
t
= 0.4ns, +Duty Cycle=50%
r=tf
t
PHL,tPLH
are referred to output
DATA
= 0.5MHz
clock transitions.
2.8 3.8 4.7 ns
2.6 3.4 4.1 ns
0.4 0.5 0.6 ns
output (20% to 80%) Transition Time, high-to-low-level
0.4 0.6 0.7 ns
output (80% to 20%) Operative frequency 100 155 200 MHz
6/11
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STLVD112
AC LVDS IN LVTTL O UT (Over recommended operating conditions, unless otherwise noted. All typical
values are at T
Symbol Parameter Test Conditions
t
PLH
t
PHL
t
TLH
t
THL
f
opr
=25°C and VS1,VS2=3.3V)
A
Value
Unit
Min. Typ. Max.
Propagation Delay Time, low-to-high­level output (50% to 50%)
Propagation Delay Time, high-to-low­level output (50% to 50%)
Transition Time, low-to-high-level output (10% to 90%)
Transition Time, high-to-low-level
V
= 400mV
DIFF
Measured with V f
= 1MHz, f
CLOCK
= 0.4ns, +Duty Cycle=50%
t
r=tf
t
PHL,tPLH
ICM
DATA
are referred to output
clock transitions
=1.2V,
= 0.5MHz
4.3 5.6 6.9 ns
4.1 5.4 6.7 ns
0.7 0.9 1.1 ns
0.8 1.0 1.3 ns
output (90% to 10%) Operative frequency 100 155 200 MHz
LVTTL IN LVTTL OUT (V T
=25°C)
A
=3to3.6VTA= -45 to 80°C, unless otherwise noted. Typical values are at
CC
Value
Symbol Parameter Test Conditions
Min. Typ. Max.
Setup Time f = 10MHz, V
t
s
Hold Time 1 ns
t
H-
V V
DIFF INTTL
= 400mV,
= 0 to 2.5V
ICM
= 1.2 V
1ns
LVTTL IN LVDS OUT (Over recommended operating conditions, unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
t
s
t
H-
=25°C and VS1,VS2=3.3V)
A
Value
Min. Typ. Max.
Setup Time f = 10MHz, V
V
= 400mV,
Hold Time 1 ns
V
DIFF INTTL
= 0 to 2.5V
ICM
= 1.2 V
1ns
LVDS IN LVTTL OUT (Over recommended operating conditions, unless otherwise noted. All typical values are at T
Symbol Parameter Test Conditions
t
s
t
H-
=25°C and VS1,VS2=3.3V)
A
Value
Min. Typ. Max.
Setup Time f = 10MHz, V
V
= 400mV,
Hold Time 1 ns
V
DIFF INTTL
= 0 to 2.5V
ICM
= 1.2 V
1.5 ns
Unit
Unit
Unit
7/11
Page 8
STLVD112
LOGIC DIAGRAM
8/11
Page 9
STLVD112
TSSOP48 MECHANICAL DATA
mm. inch
DIM.
MIN. TYP MAX. MIN. TYP. MAX.
A 1.2 0.047
A1 0.05 0.15 0.002 0.006
A2 0.9 0.035
b 0.17 0.27 0.0067 0.011
c 0.09 0.20 0.0035 0.0079
D 12.4 12.6 0.488 0.496
E 8.1 BSC 0 .31 8 BSC
E1 6.0 6.2 0.236 0.244
e 0.5 BSC 0.0197 BSC
K0˚ 8˚0˚ 8˚
L 0.50 0.75 0.020 0.030
A2
A
A1
b
e
D
K
c
E1
L
E
PIN 1 IDENTIFICATION
1
7065588C
9/11
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STLVD112
Tape & Reel TSSOP48 MECHANICAL DATA
mm. inch
DIM.
MIN. TYP MAX. MIN. TYP. MAX.
A 330 12.992 C 12.8 13.2 0.504 0.519 D 20.2 0.795 N 60 2.362
T 30.4 1.197 Ao 8.7 8.9 0.343 0.350 Bo 13.1 13.3 0.516 0.524 Ko 1.5 1.7 0.059 0.067 Po 3.9 4.1 0.153 0.161
P 11.9 12.1 0.468 0.476
10/11
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STLVD112
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use o f suc h inf ormat ion n or f or an y infr ingeme nt of paten ts or oth er ri gh ts of third part ies whic h may resul t f rom its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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