Datasheet STF40NF06 Datasheet (ST)

Page 1
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STF40NF06
N-CHANNEL 60V - 0.024 - 23A - TO-220FP
STripFET™II MOSFET
Table 1: Ge neral Features
TYPE V
STF40NF06 60 V < 0.028 23 A
TYPICAL R
LOW GATE CHARGE AT 100°C
APPLICATION ORIENTED
DSS
(on) = 0.024
DS
R
DS(on)
I
D
CHARACTERIZATION
100% AVALANCHE TESTED
DESCRIPTION
This MOSFET is th e latest developm ent of STM i­croelectronics unique “Single Feature Size
™”
strip-based process. The resulting transistor shows extremely high pac king density for low on­resistance, rugged avalance characteristics and less critical alignment steps therefore a remark­able manufacturing reproducibility.
APPLICATIONS
DC-DC & DC-AC CONVERTERS
MOTOR CONTROL, AUDIO AMPLIFIERS
HIGH CURRENT, HIGH SPEED SWITCHING
SOLENOID AND RELAY DRIVERS
Figure 1: Package
3
2
1
TO-220FP
Figure 2: Internal Schematic Diagram
Table 2: Order Codes
Part Number Marking Package Packaging
STF40NF06 F40NF06 TO-220FP TUBE
Rev.2
1/9November 2004
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STF40NF06
Table 3: Absolute Maximum ratings
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
D
I
D
I
DM
P
TOT
dv/dt (1) Peak Diode Recovery voltage slope 10 V/ns
E
AS
V
ISO
T
stg
T
j
(1) ISD 40A, di/dt 300A/µs, VDD V (2) Starting T
) Pulse wi dt h l i m i ted by safe operating area
(
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
60 V
60 V Gate- source Voltage ± 20 V Drain Current (continuous) at TC = 25°C Drain Current (continuous) at TC = 100°C
()
Drain Current (pulsed) 92 A Total Dissipation at TC = 25°C
23 A
16 A
30 W Derating Factor 0.2 W/°C
(2)
Single Pulse Avalanche Energy 250 mJ Insulation Withstand Voltage (DC) 2500 V Storage Temperature Operating Junction Temperature
=25°C, ID=20A, VDD=30V
j
(BR)DSS
, Tj T
JMAX.
.
–55 to 175 °C
Table 4: Thermal Data
Rthj-case Thermal Resistance Junction-case Max 5.0 °C/W
T
l
ELECTRICAL CHARACTERISTICS (T
Maximum Lead Temperature For Soldering Purpose 275 °C
=25°C UNLESS OTHERWISE SPECIFIED)
CASE
Table 5: Off
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
ID = 250 µA, VGS = 0 60 V
Breakdown Voltage
I
DSS
I
GSS
Zero Gate Voltage Drain Current (V
GS
Gate-body Leaka ge Current (V
DS
= 0)
V
= Max Rating
= 0)
DS
VDS= Max Rating, TC= 125°C V
= ± 20V ±100 nA
GS
A
10 µA
Table 6: On
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage Static Drain-source On
Resistance
= VGS, ID = 250µA
DS
24V
VGS = 10V, ID = 11.5 A 0.024 0.028
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STF40NF06
ELECTRICAL CHARACTERISTICS (CONTINUED) Table 7: Dynamic
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS = 30 V
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance Reverse Transfer Capacitance
V
DS
ID
= 25V, f = 1 MHz, VGS = 0 920
Table 8: Switching On
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
Q Q Q
Turn-on Delay Time
t
r
g gs gd
Rise Time
Total Gate Charge Gate-Source Charge Gate-Drain Charge
VDD = 30V, ID = 20A R
=4.7Ω VGS = 10V
G
(see Figure 16) VDD = 48V, ID = 10A,
VGS = 10V
=11.5A 12 S
225
80
27 11
32
43 nC
6.5 15
pF pF pF
ns ns
nC nC
Table 9: Switching Off
Symbol Paramet er Test Conditions Min. Typ. Max. Unit
t
d(off)
Turn-off-Delay Time
t
f
Fall Time
VDD = 30V, ID = 20A, RG=4.7Ω, V
GS
= 10V
27 11
(see Figure 16)
Table 10: Source Drain Diode
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
(2)
SDM
VSD (1)
t
rr
Q
rr
I
RRM
(1) Pulsed: Pulse du rat i on = 300 µs, duty cycle 1. 5 %. (2) Pulse width limited by safe operating area.
Source-drain Current 23 A Source-drain Current (pulsed) 92 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
ISD = 23A, VGS = 0
= 40A, di/dt = 100A/µs,
I
SD
V
= 10V, Tj = 150°C
DD
(see test circuit, Figure 5)
1.3 V
63
150
4.8
ns ns
ns nC
A
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STF40NF06
Figure 3: Safe Operating Area
Figure 4: Output Characteristics
Figure 6: Thermal Impedance
Figure 7: Transfer Characteristics
Figure 5: Transconductance
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Figure 8: Static Drain-source On Resistance
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STF40NF06
Figure 9: Gate Charge vs Gate-source Voltag e
Figure 10: Normalized Gate Thereshold Volt­age vs Temperature
Figure 12: Capacitance Variations
Figure 13: Normal ized On R esistance vs Tem­perature
Figure 11: S ource-Drain Diode Forw ard Char­acteristics
Figure 14: Normalized Breakdown Voltage vs Temperature
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STF40NF06
Figure 15: Unclamped Inductive Load Test Cir­cuit
Figure 16: Switching Times Test Circuit For Resistive Load
Figure 18: Unclamped Inductive Wafeform
Figure 19: Gate Charge Test Circuit
Figure 17: Test Circuit For Inductive Load Switching and Diode Recovery Times
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TO-220FP MECHANICAL DATA
STF40NF06
DIM.
A 4.4 4.6 0.173 0.181 B 2.5 2.7 0.098 0.106 D 2.5 2.75 0.098 0.108 E 0.45 0.7 0.017 0.027
F 0.75 1 0.030 0.039 F1 1.15 1.7 0.045 0.067 F2 1.15 1.7 0.045 0.067
G 4.95 5.2 0.195 0.204 G1 2.4 2.7 0.094 0.106
H 10 10.4 0.393 0.409 L2 16 0.630 L3 28.6 30.6 1.126 1.204 L4 9.8 10.6 .0385 0.417 L5 2.9 3.6 0.114 0.141 L6 15.9 16.4 0.626 0.645 L7 9 9.3 0.354 0.366
Ø 3 3.2 0.118 0.126
MIN. TYP MAX. MIN. TYP. MAX.
mm. inch
E
A
D
B
L3
L6
L7
F1
F
G1
H
F2
123
L4
L2
L5
G
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STF40NF06
Table 11: Revision History
Date Revision Description of Change s
07-Oct-2004 1 First release
11-Nov-2004 2 Final datasheet
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STF40NF06
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of suc h inf ormati on nor for a ny i nfring eme nt o f p atent s or o ther r ights of t hird par ties wh ich m ay res ul t from i ts use. No licens e i s gr an ted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are no t authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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