Datasheet SPT9712 Datasheet (Fairchild Semiconductor)

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SPT9712
12-BIT, 100 MWPS ECL D/A CONVER TER
TECHNICAL DATA
FEBRUARY 15, 2001
FEATURES
• 12-Bit, 100 MWPS digital-to-analog converter
• ECL compatibility
• Low power: 600 mW
• 1/2 LSB DNL
• 40 MHz multiplying bandwidth
• Industrial temperature range
• Superior performance over AD9712 – Improved settling time of 13 ns – Improved glitch energy 15 pV-s – Master-slave latches
GENERAL DESCRIPTION
The SPT9712 is a 12-bit, 100 MWPS digital-to-analog converter designed for direct digital synthesis, high reso­lution imaging, and arbitrary wavef orm generation applica­tions.
This device is pin-for-pin compatib le with the AD9712 with significantly improved performance. The only difference between the SPT9712 and the AD9712 is that the Latch Enable (LE, pin 26) for the SPT9712 is rising-edge trig-
APPLICATIONS
• Fast frequency hopping spread spectrum radios
• Direct sequence spread spectrum radios
• Microwave and satellite modems
gered (see figure 1), whereas the Latch Enable (LE, pin
26) for the AD9712 functions in the transparent mode. The SPT9712 is an ECL-compatible device. It features a
fast settling time of 13 ns and low glitch impulse energy of 15 pV-s, which results in excellent spurious-free dynamic range characteristics.
The SPT9712 is available in a 28-lead PLCC package in the industrial temperature range (–40 to +85 °C).
BLOCK DIAGRAM
R
Control Amp In
Ref Out
Latch Enable
Digital Inputs
D1
through
D12
Set
+
Control
Amp
(MSB)
Decoders
and
Drivers
(LSB)
Internal Voltage
Reference
Network
Latches
Switch
Control Amp Out
Ref In
I
Out
I
Out
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ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
Negative Supply Voltage (VEE) .............................. –7 V
A/D Ground Voltage Differential ...........................0.5 V
Input Voltages
Digital Input Voltage
(D1–D12, Latch Enable)............................... 0 V to V
Control Amp Input Voltage Range...............0 V to –4 V
Reference Input Voltage Range (V
) ........0 V to V
REF
Output Currents
Internal Reference Output Current.................... 500 µA
Control Amplifier Output Current.....................±2.5 mA
Temperature
Operating Temperature .......................... –40 to +85 °C
EE
Junction Temperature ...................................... +150 °C
Lead, Soldering (10 seconds) .........................+300 °C
EE
Storage ................................................ –65 to +150 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See
Electrical Specifications for proper nominal applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS
TA = T
PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS DC Performance
– T
, V
MIN
MAX
= –5.2 V, R
EE
= 7.5 k, Control Amp In = Ref Out, V
Set
= 0 V, unless otherwise specified.
OUT
TEST TEST SPT9712A SPT9712B
Resolution 12 12 Bits Differential Linearity I ±0.5 ±0.75 ±1.0 ±1.25 LSB Differential Linearity Max at Full Temp. VI ±1.5 ±2.0 LSB Integral Linearity Best Fit I ±0.75 ±1.0 ±1.0 ±1.5 LSB Integral Linearity Max at Full Temp. VI ±1.75 ±2.0 LSB Output Capacitance +25 °C V 10 10 pF Gain Error
1
+25 °C I 1.0 5.0 1.0 5.0 % FS
Full Temp. VI 8.0 8 . 0 % FS Gain Error Tempco Full Temp. V 150 150 PPM/°C Zero-Scale Offset Error +25 °C I 0.5 2.5 0.5 2.5 µA
Full Temp. VI 5.0 5.0 µA Offset Drift Coefficient Full Temp. V 0.01 0.01 µA/°C Output Compliance Voltage +25 °C IV –1.2 +2.0 –1.2 +2.0 V Equivalent Output Resistance +25 °C IV 0.8 1.0 1.2 0.8 1.0 1.2 k
Dynamic Performance
Conversion Rate +25 °C IV 100 1 00 MWPS Settling Time t Output Propagation Delay t Glitch Energy Full Scale Output Current
2
ST
4
D
5
Spurious-Free Dynamic Range
+25 °C V 13 13 ns
3
+25 °C V 1 1 ns
+25 °C V 15 15 pV-s
+25 °C V 20.48 20.48 mA
6
+25 °C
1.23 MHz; 10 MWPS 2 MHz Span V 70 70 dBc
5.055 MHz; 20 MWPS 2 MHz Span V 68 68 dBc
10.1 MHz; 50 MWPS 2 MHz Span V 68 68 dBc 16 MHz; 40 MWPS 10 MHz Span V 68 68 d Bc
Rise Time / Fall Time R
= 50 V2 2ns
L
Power Supply Requirements
Negative Supply Voltage IV –5.46 –5.2 –4.94 –5.46 –5.2 –4.94 V Negative Supply Current (–5.2 V) +25 °C I 115 140 115 140 m A
Full Temp VI 148 148 mA Nominal Power Dissipation V 600 600 m W Power Supply Rejection Ratio ±5% of V
EE
I 30 100 30 100 µA/V
External Ref, +25 °C
1
Gain is measured as a ratio of the full-scale current to I
2
Measured as voltage at mid-scale transition to ±0.024%; RL=50 Ω.
3
Measured from the rising edge of Latch Enable to where the output signal has left a 1 LSB error band.
4
Glitch is measured as the largest single transient.
5
Calculated using IFS = 128 x (Control Amp In / R
6
SFDR is defined as the difference in signal energy between the fundamental and worst case spurious frequencies in the output spectrum window , which is centered at the fundamental frequency and covers the indicated span.
Set
. The ratio is nominally 128.
Set
)
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ELECTRICAL SPECIFICATIONS
TA = T
MIN
– T
MAX
, V
EE
= –5.2 V, R
= 7.5 k, Control Amp In = Ref Out, V
SET
= 0 V, unless otherwise specified.
OUT
TEST TEST SPT9712A SPT9712B
PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS Voltage Input and Control
Reference Input Impedance +25 °C V 3 3 k Ref. Multiplying Bandwidth +25 °C V 40 40 MHz Internal Reference Voltage VI –1.15 –1.20 –1.25 –1.15 –1.20 –1.25 V Internal Reference Voltage Dr ift V 50 50 ppm/°C Amplifier Input Impedance +25 °C V 3 3 M Amplifier Input Bandwidth +25 °C V 1 1 MHz
Digital Inputs
Logic 1 Voltage Full Temp. VI –1.0 –0.8 –1.0 –0.8 V Logic 0 Voltage Full Temp. VI –1.7 –1.5 –1.7 –1.5 V Logic 1 Current Full Temp. VI 20 20 µA Logic 0 Current Full Temp. VI 10 10 µA Input Capacitance +25 °C V 3 3 pF Input Setup Time – t Input Setup Time – t Input Hold Time – t Input Hold Time – t Latch Pulse Width – t
S
S H H
PWL, tPWH
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indi­cates the specific device testing actually per­formed during production and Quality Assur­ance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
+25 °C IV 3 2 3 2 ns Full Temp. IV 3.5 3.5 ns +25 °C IV 0.5 0 0 .5 0 ns Full Temp. IV 0.5 0.5 ns +25 °C IV 5.0 4.0 5. 0 4.0 ns
LEVEL TEST PROCEDURE
I 100% production tested at the specified temperature.
II 100% production tested at T
specified temperatures.
III QA sample tested only at the specified temperatures.
IV Parameter is guaranteed (but not tested) by design and characteri-
zation data.
V Parameter is a typical value for information pur poses only.
VI 100% production tested at TA = +25 °C. Parameter is guaranteed
= +25 °C, and sample tested at the
A
over specified temperature range.
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THEORY OF OPERATION
VOLT AGE REFERENCE
The SPT9712 uses a segmented architecture incorporat­ing most significant bit (MSB) decoding. The four MSBs (D1–D4) are decoded to thermometer code lines to drive 15 discrete current sinks. For the eight least significant bits (LSBs), D5 and D6 are binary weighted and D7–D12 are applied to the R-2R network. The 12-bit decoded data is input to internal master/slave latches. The latched data is input to the switching network and is presented on the output pins as complementary current outputs.
TYPICAL INTERFACE CIRCUIT
The SPT9712 requires few external components to achieve the stated operation and performance. Figure 2 shows the typical interface requirements when using the SPT9712 in normal circuit operation. The following sec­tions provide descriptions of the pin functions and outline critical performance criteria to consider for achieving opti­mal device performance.
POWER SUPPLIES AND GR OUNDING
The SPT9712 requires the use of a single –5.2 V supply. All supplies should be treated as analog supply sources. This means the ground returns of the device should be connected to the analog ground plane. All supply pins should be bypassed with .01 µF and 10 µF decoupling capacitors as close to the device as possible.
The two grounds available on the SPT9712 are DGND and AGND . These grounds are not tied together internal to the device. The use of ground planes is recommended to achieve the best perf ormance of the SPT9712. All g round, reference and analog output pins should be tied directly to the DAC ground plane. The DAC and system ground planes should be separate from each other and only con­nected at a single point through a ferrite bead to reduce ground noise pickup.
DIGITAL INPUTS AND TIMING
The SPT9712 uses single-ended, 10K ECL-compatible inputs for data inputs D1–D12 and Latch Enable. It also employs master/slave latches to simplify digital interface timing requirements and reduce glitch energy by synchro­nizing the current switches. This is an improvement over the AD9712, which typically requires external latches for digital input synchronization.
When using the internal reference, Ref Out should be con­nected to Control Amp In and decoupled with a 0.1 µF capacitor. Control Amp Out should be connected to Ref In and decoupled to the analog supply. (See figure 2.)
Full-scale output current is determined by Control Amp In and R
using the following formula:
Set
I
(FS) = (Control Amp In / R
Out
) x 128
Set
(Current Out is a constant 128 factor of the reference current)
The internal reference is typically –1.20 V with a tolerance of ±0.05 V and a typical drift of 50 ppm/°C. If greater accu­racy or temperature stability is required, an external refer­ence can be utilized.
OUTPUTS
The output of the SPT9712 is comprised of complemen­tary current sinks, I at either I
Out
or I The sum of the two is always equal to the full-scale output current minus one LSB.
By terminating the output current through a resistive load to ground, an associated voltage develops. The effective resistive load (R (R
) in parallel with the resistive load (RL). The voltage
Out
which develops can be determined using the following formulas:
Control Amp Out = –1.2 V, and R I
(FS) = (–1.2 V / 7.5 k) x 128 = –20.48 mA
Out
RL = 51 R
= 1.0 k
Out
R
= 51 || 1.0 k = 48.52
Eff
V
= R
Out
Eff
x I
The resistive load of the SPT9712 can be modified to in­corporate a wide variety of signal levels. Howev er , optimal device performance is achieved when the outputs are equivalently loaded.
and I
Out
are based upon the digital input code.
Out
) is the output resistance of the device
Eff
(FS) = 48.52 x –20.48 mA
Out
. The output current levels
Out
= 7.5 k
Set
= –0.994 V
Referring to figure 1, data is latched into the DAC on the rising edge of the latch enable clock with the associated setup and hold times. The output transition occurs after a typical 1 ns propagation delay and settles to within ±1 LSB in typically 13 ns. Because of the SPT9712’s rising-edge triggering, no timing changes are required when replacing an AD9712 operating in the transparent mode.
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Figure 1 – Timing Diagram
Latch
Enable
1.3 V
t
PWL
t
PWH
1.3 V
OUT
OUT+
Figure 2 – Typical Interface Circuit
5.2 V
Digital Inputs
Clock Input
System
GND
t
S
Data Inputs
10 µF
28
D1 (MSB)
1
D2
2
D3
3
D4
4
D5
5
D6
6
D7
7
D8
8
ECL Logic Drivers
D9
9
D10
10
D11
11
D12 (LSB)
26
LE
t
H
t
D
t
1/2 LSB
0.1 µF
0.001 µF
23
DV
N/C
EE
SPT9712
DGND AGND Ref GND
27 13 22
AV
Ref In
Control
Amp Out
Ref Out
Control Amp In
ST
R
I
15,2512,21
EE
Set
Out
I
Out
0.1 µF
0.001 µF
17
18
20
19
24
R
Set
16
R
L
R
L
14
0.1 µF
20 W
1 LSB
0.1 µF
V
Out
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PACKAGE OUTLINE
28-Lead PLCC
C
Pin 1
TOP
VIEW
A
B
H
G
I
F
E
D
INCHES MILLIMETERS
SYMBOL MIN MAX MIN MAX
A 0.452 0.456 11.48 11.58 B 0.485 0.495 12.32 12.57 C 30° 30° D 0.170 0.179 4.32 4.55 E 0.020 0.025 0.51 0.64 F 0.031 0.035 0.79 0.89 G 0.013 0.021 0.33 0.53 H 0.048 0.052 1.22 1.32
I 0.410 0.430 10.41 10.92
Pin 1
BOTTOM
VIEW
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PIN ASSIGNMENTS PIN FUNCTIONS
D6
D7
D8
D9
D10
D11
(LSB) D12
Latch Enable
(MSB) D1
DGND
D2
D3
D4
D5
26
27
28
1
2
3
4
25
5
6
7
8
9
10
11
12
Digital V
EE
PLCC
15
14
13
Analog Return
I
Out
Analog V
EE
I
Out
18
17
16
Ref In
Control Amp Out
Analog V
24
R
Set
23
N/C
22
Ref GND
21
Digital V
20
Ref Out
19
Control Amp In
EE
EE
Name Function
Out+ Analog Current Output Out– Complementary Analog Current Output D1–D12 Digital Input Bits (D12 is the LSB) Latch Enable Latch Control Line Ref In Voltage Reference Input Ref Out Internal Voltage Reference Output
Normally Connected to Control Amp In
Ref GND Ground Return For Internal Voltage
Reference and Amplifier
Control Amp In Normally Connected to Ref Out If Not
Connected to External Reference
Control Amp Out Output of Internal Control Amplifier
Normally Connected to Ref In
1
R
Set
Connection for External Resistance Reference When Using Internal Amplifier
Nominally 7.5 k Analog Return Analog Return Ground Analog V Digital V
EE
EE
Analog Negative Supply (–5.2 V)
Digital Negative Supply (–5.2 V) DGND Digital Ground Return N/C Not Connected
1Full-Scale Current Out = 128 (Control Amp In / R
Set
)
ORDERING INFORMATION
PART NUMBER DNL/INL TEMPERATURE RANGE PACKAGE
SPT9712AIP ±0.75/±1.0 –40 to +85 °C 28L PLCC SPT9712BIP ±1.25/±1.5 –40 to +85 °C 28L PLCC
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
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FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
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2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
SPT9712
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