Page 1

SIPMOS ® Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
• dv/dt rated
• 175°C operating temperature
SPD31N05
SPU31N05
Pin 1 Pin 2 Pin 3
G D S
Type
SPD31N05 55 V 31 A 0.04
SPU31N05 55 V 31 A 0.04
Maximum Ratings
Parameter Symbol Values Unit
V
DS
I
D
R
DS(on
)
Ω
Ω
Continuous drain current
T
= 25 °C
C
T
= 100 °C
C
Pulsed drain current
T
= 25 °C
C
Avalanche energy, single pulse
I
= 31 A, VDD = 25 V, RGS = 25
D
L = 291 µH, T
= 25 °C
j
Avalanche current,limited by T
Avalanche energy,periodic limited by T
Ω
jmax
jmax
Reverse diode dv/dt
Package Ordering Code
P-TO252 Q67040 - S4121 - A2
P-TO251 Q67040 - S4113 - A2
I
D
A
31
22
I
Dpuls
124
E
AS
mJ
140
I
AR
E
AR
dv/dt
31 A
7.5 mJ
kV/µs
I
= 31 A, VDS = 40 V, diF/dt = 200 A/µs
S
T
= 175 °C
jmax
Gate source voltage V
Power dissipation
T
= 25 °C
C
Semiconductor Group 1 30/Jan/1998
GS
P
tot
6
±
20 V
75
W
Page 2

SPD31N05
SPU31N05
Maximum Ratings
Parameter Symbol Values Unit
Operating temperature T
Storage temperature T
Thermal resistance, junction - case R
Thermal resistance, junction - ambient (PCB mount)** R
Thermal resistance, junction - ambient R
j
stg
thJC
thJA
thJA
-55 ... + 175 °C
-55 ... + 175
≤
2 K/W
≤
50
≤
100
IEC climatic category, DIN IEC 68-1 55 / 175 / 56
** when mounted on 1 " square PCB ( FR4 );for recommended footprint
Electrical Characteristics,
Parameter Symbol Values Unit
Static Characteristics
Drain- source breakdown voltage
V
= 0 V, ID = 0.25 mA, Tj = 25 °C
GS
Gate threshold voltage
V
GS=VDS, ID
= 50 µA
Zero gate voltage drain current
V
= 50 V, VGS = 0 V, Tj = -40 °C
DS
V
= 50 V, VGS = 0 V, Tj = 25 °C
DS
V
= 50 V, VGS = 0 V, Tj = 150 °C
DS
Gate-source leakage current
V
= 20 V, VDS = 0 V
GS
Drain-Source on-resistance
V
= 10 V, ID = 22 A
GS
at Tj = 25°C, unless otherwise specified
min. typ. max.
V
(BR)DSS
55 - -
V
GS(th)
2.1 3 4
I
DSS
-
-
-
I
GSS
- 10 100
R
DS(on)
- 0.03 0.04
-
0.1
-
V
µA
0.1
1
100
nA
Ω
Semiconductor Group 2 30/Jan/1998
Page 3

SPD31N05
SPU31N05
Electrical Characteristics,
at Tj = 25°C, unless otherwise specified
Parameter Symbol Values Unit
min. typ. max.
Dynamic Characteristics
Transconductance
≥
V
2
DS
* ID * RDS(on)max, ID
= 22 A
Input capacitance
V
= 0 V, VDS = 25 V, f = 1 MHz
GS
Output capacitance
V
= 0 V, VDS = 25 V, f = 1 MHz
GS
Reverse transfer capacitance
V
= 0 V, VDS = 25 V, f = 1 MHz
GS
Turn-on delay time
V
= 30 V, VGS = 10 V, ID = 31 A
DD
= 13
Ω
R
G
Rise time
V
= 30 V, VGS = 10 V, ID = 31 A
DD
= 13
Ω
R
G
Turn-off delay time
V
= 30 V, VGS = 10 V, ID = 31 A
DD
= 13
Ω
R
G
Fall time
V
= 30 V, VGS = 10 V, ID = 31 A
DD
= 13
Ω
R
G
Gate charge at threshold
V
= 40 V, ID ≥ 0.1 A, VGS =0 to 1 V
DD
Gate charge at 7.0 V
V
= 40 V, ID = 31 A, VGS =0 to 7 V
DD
Gate charge total
V
= 40 V, ID = 31 A, VGS =0 to 10 V
DD
Gate plateau voltage
V
= 40 V, ID = 31 A
DD
g
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g(th)
Q
g(7)
Q
g(total)
V
(plateau)
S
10 - -
pF
- 720 900
- 230 300
- 125 160
ns
- 10 15
- 25 40
- 25 40
- 20 30
nC
- 0.7 1
- 20 30
- 25 40
V
- 5.9 -
Semiconductor Group 3 30/Jan/1998
Page 4

SPD31N05
SPU31N05
Electrical Characteristics,
at Tj = 25°C, unless otherwise specified
Parameter Symbol Values Unit
min. typ. max.
Reverse Diode
Inverse diode continuous forward current
T
= 25 °C
C
Inverse diode direct current,pulsed
T
= 25 °C
C
Inverse diode forward voltage
V
= 0 V, IF = 62 A
GS
Reverse recovery time
V
= 30 V, I
R
F=lS, diF
/dt = 100 A/µs
Reverse recovery charge
V
= 30 V, I
R
F=lS, diF
/dt = 100 A/µs
I
I
V
t
Q
S
SM
SD
rr
A
- - 31
- - 124
V
- 1.2 1.8
ns
- 55 85
rr
µC
- 0.1 0.15
Semiconductor Group 4 30/Jan/1998
Page 5

SPD31N05
SPU31N05
Power dissipation
P
= ƒ(TC)
tot
80
W
P
tot
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140 °C 180
Drain current
ID = ƒ(TC)
parameter: V
32
A
I
D
24
20
16
12
8
4
0
0 20 40 60 80 100 120 140 °C 180
T
C
GS
≥
10 V
T
C
Safe operating area
ID = ƒ(VDS)
parameter: D = 0, TC = 25°C
3
10
A
I
D
I
=
D
/
DS
V
1
10
10
10
10
2
DS(on)
R
1
0
0
10
t
= 13.0µs
p
DC
100 µs
1 ms
10 ms
10
V
Transient thermal impedance
Z
= ƒ(tp)
th JC
parameter: D = tp / T
1
10
K/W
0
10
Z
thJC
-1
10
D = 0.50
-2
10
-3
10
single pulse
-4
2
V
DS
10
10
-7
-6
-5
-4
10
10
10
10
-3
10
0.20
0.10
0.05
0.02
0.01
-2
-1
10
10 0 s
t
p
Semiconductor Group 5 30/Jan/1998
Page 6

SPD31N05
SPU31N05
Typ. output characteristics
ID = ƒ(VDS)
parameter: tp = 80 µs , T
70
P
= 75W
tot
A
60
I
55
D
50
45
40
35
30
25
20
15
10
5
0
0.0 1.0 2.0 3.0 4.0 V 5.5
l
= 25 °C
j
k
j
i
h
g
f
e
d
c
b
a
VGS [V]
a 4.0
b 4.5
c 5.0
d 5.5
e 6.0
f 6.5
g 7.0
h 7.5
i 8.0
j 9.0
k 10.0
l 20.0
V
DS
Typ. drain-source on-resistance
R
DS (on)
= ƒ(ID)
parameter: tp = 80 µs, Tj = 25 °C
0.13
R
DS (on)
Ω
0.11
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0.00
a
b
c
d
e
V
V
V
[V] =
[V] =
[V] =
GS
GS
GS
a
a
a
b
c
d
e
f
g
4.0
4.5
5.0
5.5
6.0
6.5
7.0
7.5
8.0
9.0
h
0 10 20 30 40 50 A 65
f
10.0
g
h
i
j
i
j
20.0
I
D
Typ. transfer characteristics ID = f (VGS)
parameter: tp = 80 µs
V
≥
2 x
x R
ID
DS(on)max
70
A
50
40
30
20
10
0
0 1 2 3 4 5 6 7 8 V 10
I
DS
D
V
GS
Semiconductor Group 6 30/Jan/1998
Page 7

SPD31N05
SPU31N05
Drain-source on-resistance
R
DS (on)
= ƒ(Tj)
parameter: ID = 22 A, VGS = 10 V
0.13
Ω
0.11
R
DS (on)
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0.00
-60 -20 20 60 100 °C 180
98%
typ
Gate threshold voltage
V
GS(th)
= f (Tj)
parameter:VGS=VDS, ID =50µA
5.0
V
4.4
V
4.0
GS(th)
3.6
3.2
2.8
2.4
2.0
1.6
1.2
0.8
0.4
0.0
T
j
-60 -20 20 60 100 140 V 200
max
typ
min
T
j
Typ. capacitances
C = f (V
DS
)
parameter:VGS = 0V, f = 1MHz
4
10
C
pF
3
10
2
10
0 5 10 15 20 25 30 V 40
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj, tp = 80 µs
3
10
A
I
F
2
10
C
iss
1
10
= 25 °C typ
T
j
= 175 °C typ
T
j
= 25 °C (98%)
C
oss
C
rss
V
DS
0
10
0.0 0.4 0.8 1.2 1.6 2.0 2.4 V 3.0
T
j
Tj = 175 °C (98%)
V
SD
Semiconductor Group 7 30/Jan/1998
Page 8

SPD31N05
SPU31N05
Avalanche energy EAS = ƒ(Tj)
parameter: ID = 31 A, VDD = 25 V
RGS = 25 Ω, L = 291 µH
150
mJ
130
120
E
AS
110
100
90
80
70
60
50
40
30
20
10
0
20 40 60 80 100 120 140 °C 180
Typ. gate charge
VGS = ƒ(Q
parameter: I
16
V
V
GS
12
10
8
6
4
2
0
T
j
)
Gate
= 31 A
D puls
V
0,2
DS max
0 4 8 12 16 20 24 28 32 nC 38
0,8
V
DS max
Q
Gate
Drain-source breakdown voltage
V
(BR)DSS
V
(BR)DSS
= ƒ(Tj)
65
V
61
59
57
55
53
51
49
-60 -20 20 60 100 °C 180
T
j
Semiconductor Group 8 30/Jan/1998