Datasheet SPT9693SCC, SPT9693SCP, SPT9693SCU Datasheet (SPT)

Page 1
FEATURES
SPT9693
WIDE INPUT V O LTA GE, JFET COMPARATOR
TECHNICAL DATA
MARCH 1, 2001
APPLICATIONS
• Common mode range –3.0 to +8.0 V
• Low input bias current <100 pA
• Propagation delay 1.5 ns (max)
• Low offset ±25 mV
• Low feedthrough and crosstalk
• Differential latch control
GENERAL DESCRIPTION
The SPT9693 is a high-speed, wide common mode volt­age, JFET input, dual comparator. It is designed for appli­cations that measure critical timing parameters in which wide common mode input voltages of –3.0 to +8.0 V are required. Propagation delays are constant for overdrives greater than 50 mV.
JFET inputs reduce the input bias currents to the nanoamp level, eliminating the need for input drivers and
BLOCK DIAGRAM
Q
Q
A
A
• Automated test equipment
• High-speed instrumentation
• Window comparators
• High-speed timing
• Line receivers
• High-speed triggers
• Threshold detection
• Peak detection
buffers in most applications. The device has differential analog inputs and complementary logic outputs com­patible with ECL systems. Each comparator has a complementary latch enable control that can be driven by standard ECL logic.
The SPT9693 is available in 20-contact LCC and 20-lead PLCC packages over the commercial temperature range. It is also available in die form.
Q
Q
B
GND
B
B
AV
GND
LE
LE
N/C
EE
(A)
A
A
A
AVCC(A)
IN
+IN
A
+IN
A
IN
B
B
LE
LE
N/C
AV
AV
B
B
EE
(B)
(B)
Signal Processing Technologies, Inc.
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: 719-528-2300 Fax: 719-528-2370 Web Site: http://www .spt.com e-mail: sales@spt.com
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ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages (Measured to GND)
Positive Supply Voltage (AVCC) ............–0.5 to +11.0 V
Negative Supply Voltage (AVEE)........... –11.0 to +0.5 V
Input Voltages
Input Common Mode Voltage ................–6 to +AVCC+1
Differential Input Voltage ....................–12.0 to +12.0 V
Input Voltage, Latch Controls ......................–6 to 0.5 V
V
to AVCC Differential Voltage ...............–16 to +1.0 V
IN
VIN to AVEE Differential Voltage ...............+4 to +21.0 V
Output
Output Current ................................................... 30 mA
Temperature
Operating Temperature, ambient ................ 0 to +70 °C
junction......................+150 °C
Lead Temperature, (soldering 60 seconds) ..... +300 °C
Storage Temperature............................ –65 to +150 °C
Note: 1. Operation at any Absolute Maximum Rating is not implied. See
Electrical Specifications for proper nominal applied conditions in typical applications. Application of m ultiple maximum rating conditions at the same time may damage the device.
ELECTRICAL SPECIFICATIONS
TA = +25 °C, A VCC = +10 V, AVEE = –10.0 V, RL = 50 Ohm to –2 V, unless otherwise specified.
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS DC CHARACTERISTICS
Input Offset Voltage V Offset Voltage Tempco V 50 µV/°C
Input Bias Current T Input Bias Current T Input Offset Current V ±1.0 nA Positive Supply Current (Dual) AV
Negative Supply Current (Dual) AVEE=–10.0 V I 40 55 mA Positive Supply Voltage, AV
Negative Supply Voltage, AV Input Common Mode Range I –3.0 +8.0 V Latch Enable
Common Mode Range IV –2.0 0 V Differential Voltage Range I ±10 V Open Loop Gain V 52 dB Differential Input Resistance V 2 G Input Capacitance V 1.0 pF Power Supply Sensitivity V 60 dB Common Mode Rejection Ratio I 50 60 dB
Power Dissipation Dual I 430 610 m W Output High Level ECL 50 Ohms to –2 V I –.98 –.70 V
Output Low Level ECL 50 Ohms to –2 V I –1.95 –1.65 V
CC
TEST TEST
(Common Mode) = 0 I –25 0.0 +25 mV
IN
T
MIN<TA<TMAX
MIN<TA<TMAX
VIN (Common Mode) = –3 to +7 V
MIN<TA<TMAX
VIN (Common Mode) = +7 to +8 V T
MIN<TA<TMAX
=10 V I 3 6 mA
CC
EE
T
MIN<TA<TMAX
IV –25 0 . 0 +25 mV
I ±10 ±100 nA I ±50 ±150 nA
V ±10 nA
IV 9.75 10.0 10.25 V IV –9.75 –10.0 –10.25 V
IV 45 55 dB
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ELECTRICAL SPECIFICATIONS
TA = +25 °C, A VCC = +10 V, AVEE = –10.0 V, RL = 50 Ohm to –2 V, unless otherwise specified.
TEST TEST
PARAMETERS CONDITIONS LEVEL MIN TYP MAX UNITS AC ELECTRICAL PARAMETERS
Propagation Delay Propagation Delay Tempco V 2 ps/ °C Propagation Delay Skew (A vs B) V 100 ps Delay Dispersion from V 50 ps
Input Direction Delay Dispersion from V 60 ps
Input Common Mode Latch Set-up Time V 500 ps Latch to Output Delay 50 mV O.D. V 500 ps Latch Pulse Width V 500 ps Latch Hold Time V 0 ps Rise Time 20% to 80% V 0.45 ns Fall Time 20% to 80% V 0.45 ns Slew Rate V 5 V/ns
1
Valid f or both high-to-low and low-to-high transitions
1
50 mV O.D., Slew 10 V/ns IV .75 1.25 1.50 n s
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indi­cates the specific device testing actually per­formed during production and Quality Assur­ance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
LEVEL TEST PROCEDURE
I 100% production tested at the specified temperature.
II 100% production tested at TA = +25 °C, and sample tested at the
specified temperatures. III QA sample tested only at the specified temperatures. IV Parameter is guaranteed (but not tested) by design and characteri-
zation data.
V Parameter is a typical value for information purposes only.
VI 100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
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TYPICAL PERFORMANCE CHARACTERISTICS
INPUT OFFSET VOLTAGE vs COMMON MODE VOLTAGE
(T=+25 °C)
+10.0
+6.0
+2.0
2.0
INPUT OFFSET VOLTAGE (mV)
6.0
10.0
3.0 1.6 +0.8 +3.2 +5.6 +8.0
COMMON MODE VOLTAGE (V)
PROPAGATION DELAY TIME vs TEMPERATURE
INPUT BIAS CURRENT vs COMMON MODE VOLTAGE
(+25 °C)
100
10
1.0
0.1
INPUT BIAS CURRENT (nA)
0.01
0.001 3.0 1.6 +0.8 +3.2 +5.6 +8.0
COMMON MODE VOLTAGE (V)
DELAY DISPERSION vs INPUT PULSE WIDTH
1600
1500
1400
1300
PROPAGATION DELAY TIME (ps)
1200
0 +25 +50
Slope  2 ps/ °C
+75 +100
TEMPERATURE (°C)
+125 +150
50
40
30
20
DELAY DISPERSION (ps)
10
0 500 1000 1500 2000 30002500
INPUT PULSE WIDTH (ps)
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TYPICAL PERFORMANCE CHARACTERISTICS
HYSTERESIS vs DLATCH VOLTAGE
V Hysteresis (mV)
RISE AND FALL OF OUTPUTS vs TIME CROSSOVER
.90
50
40
30
HYSTERESIS (mV)
20
10
30 20 10 0 10 3020
PROPAGATION DELAY vs INPUT
OVERDRIVE VOLTAGE
1500
1400
Input Slew Rates
= 1 V/ns
= 2 V/ns = 5 V/ns
VLEVLE
(mV)
1.10
1.30
1.50
OUTPUT RISE & FALL (V)
1.70
1.90
1.1 1.5 1.9 2.3 2.7
TIME (ns)
PROPAGATION DELAY vs
COMMON MODE INPUT VOLTAGE
1600
1500
3.5
1300
1200
PROPAGATION DELAY TIME (ps)
1100
SPT
50 100 150 200 250 300 350 400
V
(mV)
OD
1400
1300
PROPAGATION DELAY TIME (ps)
1200
4 2 0
+2 +4
VIN, cm (V)
+6 +8
SPT9693
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GENERAL INFORMATION
The SPT9693 is an ultrahigh-speed dual voltage com­parator. It offers tight absolute characteristics. The device has differential analog inputs and complementary logic outputs compatible with ECL systems. The output stage is adequate for driving terminated 50 ohm transmission lines.
Single-channel operation can be accomplished by floating
all
pins (including the ground and supply pins) of the un­used comparator. P o wer dissipation during single-channel operation is 50% of the dissipation during dual-channel operation.
This comparator offers the following improvements over existing devices:
The SPT9693 has a complementary latch enable control for each comparator. Both should be dr iven by standard ECL logic levels.
A common mode voltage range of –3 V to +8 V is achie ved by a proprietary JFET input design, which requires a separate negative power supply (AV
EE
).
The dual comparators have separate AVCC, AVEE, and grounds for each comparator to achieve high crosstalk rejection.
Figure 1 – Internal Function Diagram
+IN
IN
+
AMP
PRE
LATCH
Ultra low input bias current and input current offset
Common mode voltage of 3 to +8 V
Short propagation delays
Excellent input and output rejection between
comparator channels
Improved input protection reliability due to JFET input
stage design All of these combined features produce high-performance
products with timing stability and repeatability for large system precision.
Q
ECL
OUT
Q
REF
1
AV
EE
V
CC
GND
CLK
BUF
LE LE
REF
2
SPT9693
SPT
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TYPICAL INTERFACE CIRCUIT
LE
LE
+
V
C
AV
CC
GND
AV
EE
V
IN
V
Ref
.1 µF
.1 µF
Q Output
D2
D2
D2
D2
D1
550 W
» 5 V
Notes:
1) D1 = 1N5231B or 1N751 or equivalent.
2) D2 = 1N914 or equivalent.
3) At no time should both inputs be allowed to float with power applied to the device. At least one of the inputs should be tied to a voltage within the common mode range (3.0 to +8.0 V) to prevent possible damage to the device. Additional protection diodes D2 should be used on the inputs if there is the possibility of exceeding the absolute maximum ratings.
0.1 µF
2 V
Q Output
100 W 0 to 200 W
2 V
1.3 V
R
L
50 W
0.1 µF
R
L
50 W
The typical interface circuit using the comparator is shown in figure 2. Although it needs few external components and is easy to apply, there are several conditions that should be noted to achieve optimal perf ormance. The v ery high operating speeds of the comparator require careful layout, decoupling of supplies , and proper design of trans­mission lines.
Since the SPT9693 comparator is a very high-frequency and high-gain device, certain layout rules must be f ollowed to avoid oscillations. The comparator should be soldered to the board with component lead lengths kept as short as possible. A ground plane should be used, while the input impedance to the part is kept as low as possible, to de­crease parasitic feedback. If the output board traces are
techniques must be employed to prevent ringing on the output waveform. Also, the microstriplines must be ter mi­nated at the far end with the characteristic impedance of the line to prevent reflections. All supply voltages should be decoupled with high-frequency capacitors as close to the device as possible. If using the SPT9693 as a single comparator, the outputs of the inactiv e comparator can be grounded, left open or terminated with 50 ohms to –2 V . All outputs on the active comparator, whether used or un­used, should have identical terminations to minimize ground current switching transients.
All ground pins should be connected to the same ground plane to further improve noise immunity and shielding. Unused outputs must be terminated with 50 ohms to ground.
longer than approximately half an inch, microstripline
Figure 2 – SPT9693 Typical Interface Circuit Figure 3 – SPT9693 Typical Interface Circuit
with Hysteresis
EE
CC
AV
AV
GND
D2
D2
V
IN
D2
V
Ref
D1
550 W
Notes:
1) D1 = 1N5231B or 1N751 or equivalent.
2) D2 = 1N914 or equivalent.
3) At no time should both inputs be allowed to float with power applied
D2
V
» 5 V
C
to the device. At least one of the inputs should be tied to a voltage within the common mode range (3.0 to +8.0 V) to prevent possible damage to the device. Additional protection diodes D2 should be used on the inputs if there is the possibility of exceeding the absolute maximum ratings.
.1 µF
.1 µF
+
LE
LE
50 W
R
L
2 V
R
L
50 W
Q Output
Q Output
.1 µF
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TIMING INFORMATION
The timing diagram for the comparator is shown in figure
4. If LE is high and LE low in the SPT9693, the compar ator tracks the input difference voltage. When LE is driven low and LE high, the comparator outputs are latched into their existing logic states.
The leading edge of the input signal (which consists of a 150 mV overdrive voltage) changes the comparator out­put after a time of t must be maintained for a time tS (set-up time) before the LE falling edge and LE rising edge and held for time t
Figure 4 – Timing Diagram
or t
pdL
Latch Enable
Latch Enable
Differential
Input Voltage
Output Q
(Q or Q). The input signal
pdH
t
S
V
OD
V
IN
t
H
t
pdL
after the falling edge for the comparator to accept data. After tH, the output ignores the input status until the latch is strobed again. A minimum latch pulse width of tpL is needed for strobe operation, and the output transitions occur after a time of t
pLOH
or t
pLOL
.
The set-up and hold times are a measure of the time required for an input signal to propagate through the first stage of the comparator to reach the latching circuitry. Input signals occurring before t
will be detected and held;
S
those occurring after tH will not be detected. Changes between tS and tH may not be detected.
H
50%
t
pL
V
±V
Ref
OS
t
pLOH
50%
Output Q
t
pdH
SWITCHING TERMS (Refer to figure 4)
t
INPUT TO OUTPUT HIGH DELAY – The propaga-
pdH
tion delay measured from the time the input signal reaches the reference voltage (± the input offset voltage) to the 50% point of an output LOW to HIGH transition.
t
INPUT TO OUTPUT LOW DELAY – The propaga-
pdL
tion delay measured from the time the input signal reaches the reference voltage (± the input offset voltage) to the 50% point of an output HIGH to LOW transition.
t
LATCH ENABLE TO OUTPUT HIGH DELAY – The
pLOH
propagation delay measured from the 50% point of the Latch Enable signal LOW to HIGH transition to 50% point of an output LOW to HIGH transition.
t
LATCH ENABLE TO OUTPUT LOW DELAY – The
pLOL
propagation delay measured from the 50% point of the Latch Enable signal LOW to HIGH transition to the 50% point of an output HIGH to LOW transition.
t
pLOL
VIN+ = 300 mV, VOD= 150 mV
t
MINIMUM HOLD TIME – The minimum time after
H
the negative transition of the Latch Enable signal that the input signal must remain unchanged in order to be acquired and held at the outputs.
t
MINIMUM LATCH ENABLE PULSE WIDTH – The
pL
minimum time that the Latch Enable signal must be HIGH in order to acquire an input signal change.
t
MINIMUM SET-UP TIME – The minimum time
S
before the negative transition of the Latch Enable signal that an input signal change must be present in order to be acquired and held at the outputs.
VODVOLTAGE OVERDRIVE – The difference between
the differential input and reference input voltages.
50%
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PACKAGE OUTLINES
20-Contact Leadless Chip Carrier (LCC)
A
H
INCHES MILLIMETERS
SYMBOL MIN MAX MIN MAX
A .040 typ 1.02 typ
G
B .050 typ 1.27 typ C 0.045 0.055 1.14 1.40
B
View
Bottom
Pin 1
D 0.345 0.360 8.76 9.14 E 0.054 0.066 1.37 1.68 F .020 typ 0.51 typ
C
D
F
E
G 0.022 0.028 0.56 0.71 H 0.075 1.91
20-Lead Plastic Leadless Chip Carrier (PLCC)
A
B
Pin 1
TOP
VIEW
C
D
Pin 1
BOTTOM
VIEW
E
F
G
INCHES MILLIMETERS
SYMBOL MIN MAX MIN MAX
A .045 typ 1.14 typ
N
B .045 typ 1.14 typ C 0.350 0.356 8.89 9.04
M
O
D 0.385 0.395 9.78 10.03 E 0.350 0.356 8.89 9.04
L
F 0.385 0.395 9.78 10.03 G 0.042 0.056 1.07 1.42 H 0.165 0.180 4.19 4.57
K
J
I
H
I 0.085 0.110 2.16 2.79
J 0.025 0.040 0.64 1.02
K 0.015 0.025 0.38 0.64
L 0.026 0.032 0.66 0.81
M 0.013 0.021 0.33 0.53
N 0.050 1.27 O 0.290 0.330 7.37 8.38
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PIN ASSIGNMENTS PIN FUNCTIONS
A
NAME FUNCTION
Q
A
Q
A
GND LE
A
LE
A
AVCC(A) Positive Supply Voltage (+10 V) AVEE(A) Negative Supply Voltage (–10 V) AVCC(B) Positive Supply Voltage (+10 V) AVEE(B) Negative Supply Voltage (–10 V) –IN
A
+IN
A
+IN
B
–IN
B
LE
B
LE
B
GND Q
B
Q
B
N/C Not Connected
Output A Inverted Output A Ground A
A
Inverted Latch Enable A Latch Enable A
Inverting Input A Noninverting Input A Noninverting Input B Inverting Input B Inverted Latch Enabled B Latch Enable B Ground B
B
Inverted Output B Output B
GND
LE
LE
N/C
VEE(A)
A
A
A
Q
A
A
B
QBGND
Q
Q
3212019
4
5
6
TOP VIEW
LCC/PLCC
7
8
91011
AVCC(A)
IN
A
+IN
12
+IN
A
B
18
LE
B
LE
17
16
15
14
N/C
AV
AV
B
EE
CC
(B)
(B)
13
IN
B
B
ORDERING INFORMATION
PART NUMBER TEMPERATURE RANGE PACKAGE TYPE
SPT9693SCC 0 to +70 °C LCC SPT9693SCP 0 to +70 °C PLCC SPT9693SCU +25 °CDie*
*Please see the die specification for guaranteed electrical performance.
Signal Processing Technologies, Inc. reserves the right to change products and specifications without notice. Permission is hereby expressly granted to copy this literature for informational purposes only. Copying this material for any other use is strictly prohibited.
WARNING – LIFE SUPPORT APPLICATIONS POLICY – SPT products should not be used within Life Support Systems without the specific written consent of SPT. A Life Support System is a product or system intended to support or sustain life which, if it fails, can be reasonably expected to result in significant personal injury or death.
Signal Processing Technologies believes that ultrasonic cleaning of its products may damage the wire bonding, leading to device failure. It is therefore not recommended, and exposure of a device to such a process will void the product warranty.
SPT
10 3/1/01
SPT9693
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