Page 1
SPP08N50C3, SPI08N50C3
SPA08N50C3
Cool MOS™ Power Transistor
Feature
• New revolutionary high voltage technology
VDS @ T
R
DS(on)
I
D
• Ultra low gate charge
• Periodic avalanche rated
PG -TO220FP PG -TO262 PG -TO220
• Extreme dv /dt rated
• Ultra low effective capacitances
• Improved transconductance
P-TO220-3-31
3
2
1
• PG -TO-220-3-31;-3-111 : Fully isolated package (2500 VAC; 1 minute)
Type Package Ordering Code
SPP08N50C3 PG -TO220 Q67040-S4567
SPI08N50C3 PG -TO262 Q67040-S4568
Marking
08N50C3
08N50C3
jmax
560 V
0.6 Ω
7.6 A
SPA08N50C3 PG -TO220FP SP000216306
Maximum Ratings
Parameter
Continuous drain current
T
= 25 °C
C
T
= 100 °C
C
Pulsed drain current, t p limited by T
max
Avalanche energy, single pulse
I
=5.5A, V
D
Avalanche energy, repetitive t
I
=7.6A, V
D
Avalanche current, repetitive t
DD
DD
=50V
=50V
limited by T
AR
limited by T
R
jmax
max
2)
Gate source voltage
Gate source voltage AC (f >1Hz)
Power dissipation, T
= 25°C P
C
08N50C3
Symbol Value Unit
I
D
I
Dpuls
E
AS
E
AR
I
R
V
GS
V
GS
tot
SPP_I
7.6
4.6
22.8 22.8 A
230 230 mJ
0.5 0.5
7.6 7.6 A
±20 ±20 V
±30 ±30
83 32 W
SPA
7.6
4.6
A
1)
1)
Operating and storage temperature T
Reverse diode dv/dt
Rev. 2. 9 P age 1
6)
,
T
st
-55...+150 °C
dv/dt 15 V/ns
2007 -08 -30
Page 2
Maximum Ratings
SPP08N50C3, SPI08N50C3
SPA08N50C3
Parameter
Drain Source voltage slope
V
= 400 V, I
DS
= 7.6 A, T
D
= 125 °C
j
Symbol Value Unit
dv /dt 50 V/ns
Thermal Characteristics
Parameter
Thermal resistance, junction - case
Thermal resistance, junction - case, FullPAK R
Thermal resistance, junction - ambient, leaded
Thermal resistance, junction - ambient, FullPAK R
Soldering temperature, wavesoldering
1.6 mm (0.063 in.) from case for 10s
3)
Symbol Values Unit
R
thJC
thJC_FP
R
thJA
thJA FP
T
sold
Electrical Characteristics, at T j=25°C unless otherwise specified
Parameter
Symbol Conditions Values Unit
min. typ. max.
- - 1.5 K/W
- - 3.9
- - 62
- - 80
- - 260 °C
min. typ. max.
Drain-source breakdown voltage
Drain-Source avalanche
V
V
breakdown voltage
Gate threshold voltage V
Zero gate voltage drain current I
Gate-source leakage current I
Drain-source on-state resistance R
Gate input resistance
R
(BR)DSS
(BR)DS
GS(th)
DSS
GSS
DS(on)
G
V
=0V, I D=0.25mA 500 - - V
GS
V
=0V, I D=7.6A - 600 -
GS
ID=350µ A, VGS=V
VDS=500V, V
=25°C
T
j
=150°C
T
j
VGS=20V, V
V
=10V, I D=4.6A
GS
T
=25°C
j
=150°C
T
j
f =1MHz, open drain - 1.2 -
=0V,
GS
=0V - - 100 nA
DS
2.1 3 3.9
DS
-
-
-
-
0.5
-
0.5
1.5
100
0.6
µA
1
Ω
-
Rev. 2. 9 P age 2
2007 -08 -30
Page 3
Electrical Characteristics
SPP08N50C3, SPI08N50C3
SPA08N50C3
Parameter
Symbol Conditions Values Unit
Transconductance g
Input capacitance C
Output capacitance C
Reverse transfer capacitance C
Effective output capacitance,
4)
C
energy related
Effective output capacitance,
5)
C
time related
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
fs
iss
oss
rss
o(er)
o(tr)
d(on)
r
d(off)
f
V
≥2*I D*R
DS
I
=4.6A
D
VGS=0V, V
f=1MHz
VGS=0V, V
VDD=380V, V
I
=7.6A,
D
R
=12Ω
G
DS
DS
min. typ. max.
DS(on)max
=25V,
,
- 6 - S
- 750 - pF
- 350 -
- 12 -
=400 - 56 -
- 30 -
GS
=0/10V,
- 6 - ns
- 5 -
- 60 -
- 7 -
Gate Charge Characteristics
Gate to source charge
Gate to drain charge Q
Gate charge total Q
Gate plateau voltage V
1
Limited only by maximum temperature
2
Repetitve avalanche causes additional power losses that can be calculated as P
3
Soldering temperature for TO-263: 220°C, reflow
4
is a fixed capacitance that gives the same stored energy as C
C
o(er)
5
is a fixed capacitance that gives the same charging time as C
C
o(tr)
6
ISD<=I
Identical low-side and high-side switch.
, di/dt<=4 00A/us, V
D
DClink
Q
gs
gd
g
(plateau)
=400V, V
peak<VBR, DSS
V
=400V, I D=7.6A - 3 - nC
DD
V
=400V, I D=7.6A,
DD
V
=0 to 10V
GS
V
=400V, I D=7.6A - 5 - V
DD
while V
oss
while V
oss
, Tj<T
j,max
.
- 17 -
- 32 -
=E AR*f .
AV
is rising from 0 to 80% V
DS
is rising from 0 to 80% V
DS
DSS
DSS
.
.
Rev. 2. 9 P age 3
2007 -08 -30
Page 4
Electrical Characteristics
SPP08N50C3, SPI08N50C3
SPA08N50C3
Parameter
Inverse diode continuous
Symbol Conditions Values Unit
I
S
forward current
Inverse diode direct current,
I
SM
pulsed
Inverse diode forward voltage V
Reverse recovery time t
Reverse recovery charge Q
Peak reverse recovery current I
Peak rate of fall of reverse
SD
rr
rr
rrm
dirr/dt
recovery current
Typical Transient Thermal Characteristics
Symbol
SPP_I SPP_I
Value Unit Symbol Value Unit
SPA SPA
min. typ. max.
T
=25°C - - 7.6 A
C
- - 22.8
V
=0V, I F=I
GS
V
=400V, I F=I S ,
R
/dt=100A/µs
di
F
S
- 1 1.2 V
- 370 - ns
- 3.6 - µC
- 25 - A
T
=25°C - 700 - A/µs
j
R
R
R
R
R
R
th1
th2
th3
th4
th5
th6
0.024 0.024 K/W C
0.046 0.046 C
0.085 0.085 C
0.308 0.195 C
0.317 0.45 C
0.112 2.511 C
T
R
j T
th1
P
(t)
tot
C
th1
C
th2
R
C
th,n
th,n
th1
th2
th3
th4
th5
th6
0.00012 0.00012 Ws/K
0.0004578 0.0004578
0.000645 0.000645
0.001867 0.001867
0.004795 0.007558
0.045 0.412
External Heatsink
T
case
amb
Rev. 2. 9 P age 4
2007 -08 -30
Page 5
SPP08N50C3, SPI08N50C3
SPA08N50C3
1 Power dissipation
P
= f (T
tot
tot
P
100
W
80
70
60
50
40
30
20
10
)
C
SPP08N50C3
0
0 20 40 60 80 100 120
°C
2 Power dissipation FullPAK
P
= f (T
tot
35
W
25
tot
P
20
15
10
160
T
C
)
C
5
0
0 20 40 60 80 100 120
°C
T
150
C
3 Safe operating area
I
= f ( V DS )
D
parameter : D = 0 ,
2
10
A
1
10
D
I
0
10
-1
10
-2
10
0
10
T
C
tp = 0.001 ms
tp = 0.01 ms
tp = 0.1 ms
tp = 1 ms
DC
1
10
=25°C
10
4 Safe operating area FullPAK
I
= f (V
D
parameter: D = 0,
10
A
10
D
I
10
10
2
V
3
10
V
DS
10
)
DS
T
= 25°C
C
2
1
0
tp = 0.001 ms
0
tp = 0.01 ms
tp = 0.1 ms
tp = 1 ms
tp = 10 ms
DC
1
10
10
2
V
3
10
V
DS
-1
-2
10
Rev. 2. 9 P age 5
2007 -08-30
Page 6
SPP08N50C3, SPI08N50C3
SPA08N50C3
5 Transient thermal impedance
Z
= f (t p)
thJC
parameter: D = t
1
10
K/W
0
10
thJC
Z
-1
10
-2
10
-3
10
-7
10
10
/T
p
D = 0.5
D = 0.2
D = 0.1
D = 0.05
D = 0.02
D = 0.01
single pulse
-6
10
-5
10
-4
10
-3
6 Transient thermal impedance FullPAK
Z
= f (t
thJC
parameter: D =
10
K/W
10
thJC
Z
10
10
-1
10
s
t
p
10
)
p
t
/t
p
1
0
-1
D = 0.5
D = 0.2
D = 0.1
-2
-3
10-710-610-510-410-310-210
D = 0.05
D = 0.02
D = 0.01
single pulse
-1
1
10
s
t
p
7 Typ. output characteristic
I
= f (V DS); T
D
parameter: t
24
A
16
D
I
12
8
4
0
0 5 10 15
=25°C
j
= 10 µs, V
p
20V
10V
8V
GS
8 Typ. output characteristic
I
= f (V DS); T
D
parameter: t
13
A
7V
6,5V
6V
5,5V
5V
4,5V
V
DS
25
V
11
10
9
D
I
8
7
6
5
4
3
2
1
0
0 2 4 6 8 10 12 14 16 18 20 22 V25
=150°C
j
= 10 µs, V
p
20V
8V
6.5V
GS
5.5V
5V
4.5V
4V
V
6V
DS
Rev. 2. 9 P age 6
2007 -08 -30
Page 7
SPP08N50C3, SPI08N50C3
SPA08N50C3
9 Typ. drain-source on resistance
R
DS(on)
parameter:
R
=f (I
)
D
T
=150°C, V
j
10
4V
Ω
8
7
DS(on)
6
5
4
3
2
1
0
0 2 4 6 8 10 12
4.5V
5V
GS
5.5V
6V
6.5V
8V
20V
A
I
D
15
10 Drain-source on-state resistance
R
DS(on)
parameter : I
R
= f (T j)
= 4.6 A, V
D
SPP08N50C3
3.4
Ω
2.8
2.4
DS(on)
2
1.6
1.2
0.8
0.4
0
-60 -20 20 60 100
98%
typ
= 10 V
GS
°C
180
T
j
11 Typ. transfer characteristics
I
= f ( V GS ); V
D
DS
≥ 2 x I
D
x R
DS(on)max
parameter: t p = 10 µs
24
A
25°C
20
18
16
D
I
14
12
10
8
6
4
2
0
0 2 4 6
150°C
V
12 Typ. gate charge
= f (Q
V
GS
parameter: I
SPP08N50C3
16
V
12
GS
10
V
8
6
4
2
10
V
GS
0
0 5 10 15 20 25 30 35 40
)
Gate
= 7.6 A pulsed
D
0,2
V
DS max
0,8 V
DS max
nC
Q
50
Gate
Rev. 2. 9 P age 7
2007 -08 -30
Page 8
SPP08N50C3, SPI08N50C3
SPA08N50C3
13 Forward characteristics of body diode
I
= f (VSD)
F
parameter: T
2
SPP08N50C3
10
A
1
10
F
I
0
10
-1
10
0 0.4 0.8 1.2 1.6 2 2.4
, tp = 10 µs
Tj = 25 °C typ
Tj = 150 °C typ
Tj = 25 °C (98%)
Tj = 150 °C (98%)
3
V
V
SD
14 Avalanche SOA
I
= f (t AR)
AR
par.:
T
≤ 150 °C
j
8
A
6
5
AR
I
4
3
2
1
0
10-310-210-110010110
T
(START)
j
=125°C
(START)=25°C
T
j
2
µs
t
AR
10
4
15 Avalanche energy
E
= f (T
AS
par.: I
mJ
AS
E
260
220
200
180
160
140
120
100
)
j
= 5.5 A, V
D
80
60
40
20
0
20 40 60 80 100 120
DD
= 50 V
°C
16 Drain-source breakdown voltage
V
(BR)DSS
(BR)DSS
V
160
T
j
= f (T
SPP08N50C3
600
V
570
560
550
540
530
520
510
500
490
480
470
460
450
-60 -20 20 60 100
)
j
°C
180
T
j
Rev. 2. 9 P age 8
2007 -08 -30
Page 9
SPP08N50C3, SPI08N50C3
SPA08N50C3
17 Avalanche power losses
P
= f (f )
AR
parameter:
500
W
AR
P
300
200
100
E
=0.5mJ
AR
0
10
4
10
5
MHz
18 Typ. capacitances
C = f (
parameter:
6
10
f
V
)
DS
V
=0V, f =1 MHz
GS
4
10
pF
3
10
C
2
10
1
10
Crss
0
10
0 100 200 300
Ciss
Coss
V
500
V
DS
19 Typ. C
E
=f (V
oss
4
µJ
3
oss
2.5
E
2
1.5
1
0.5
0
0 100 200 300
stored energy
oss
)
DS
V
500
V
DS
Rev. 2. 9 P age 9
2007 -08 -30
Page 10
Definition of diodes switching characteristics
SPP08N50C3, SPI08N50C3
SPA08N50C3
Rev. 2. 9 P age 10
2007 -08 -30
Page 11
PG -TO220-3-1, PG-TO220-3-21
SPP08 N5 0C3, SPI08N50C3
SPA08 N5 0C3
Rev. 2. 9 P age 11
2007 -08-30
Page 12
SPP08 N5 0C3, SPI08N50C3
PG -TO-220-3-3 1/3-111 Fully isolated package (2500VAC; 1 minute)
SPA08 N5 0C3
Rev. 2. 9 P age 12
2007 -08 -30
Page 13
PG -TO26 2-3-1, PG-TO262-3-21 (I²-PAK)
SPP08 N5 0C3, SPI08N50C3
SPA08 N5
0C3
Rev. 2. 9 P age 13
2007 -08 -30
Page 14
SPP08N50C3, SPI08N50C3
SPA08N50C3
Published by
Infineon Technologies AG,
Bereichs Kommunikation
St.-Martin-Strasse 53,
D-81541 München
© Infineon Technologies AG 1999
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as warranted
characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement,
regarding circuits, descriptions and charts stated herein.
Infineon Technologies is an approved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list).
Warnings
Due to technical requirements components may contain dangerous substances.
For information on the types in question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express
written approval of Infineon Technologies, if a failure of such components can reasonably be expected to
cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device
or system Life support devices or systems are intended to be implanted in the human body, or to support
and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health
of the user or other persons may be endangered.
Rev. 2. 9 P age 14
2007 -08 -30