■ Enhanced ESD Specifications:
+15KV Human Body Model
+15KV IEC1000-4-2 Air Discharge
+8KV IEC1000-4-2 Contact Discharge
■ Low EMI Transceiver limited to 250kbps
DESCRIPTION
The SP483E is a half-duplex transceiver that meets the specifications of RS-485 and RS-422
serial protocols with enhanced ESD performance. The ESD tolerance has been improved on
this device to over ±15kV for both Human Body Model and IEC1000-4-2 Air Discharge
Method. This device is pin-to-pin compatible with Sipex's SP483 device as well as popular
industry standards. As with the original version, the SP483E features Sipex's BiCMOS
design allowing low power operation without sacrificing performance. The SP483E meet the
requirements of the RS-485 and RS-422 protocols up to 250kbps under load. The SP483E
is internally slew rate limited to reduce EMI and can meet the requirements of RS-485 and
RS-422 up to 250kbps. The SP483E is also equipped with a low power Shutdown mode.
These are stress ratings only and functional operation of the device at
these ratings or any other above those indicated in the operation sections
of the specifications below is not implied. Exposure to absolute maximum
rating conditions for extended periods of time may affect reliability.
Differential Output Voltage1.5V
Change in Magnitude of Driver
VoltsUnloaded; R = ∞ ;
CC
Voltswith load; R = 50Ω; (RS-422);
CC
Voltswith load; R = 27Ω; (RS-485);
CC
see Figure 1
see Figure 1
see Figure 1
Differential Output Voltage for
Complimentary States0.2VoltsR = 27Ω or R = 50Ω;
see Figure 1
Driver Common-Mode
Output Voltage3VoltsR = 27Ω or R = 50Ω;
see Figure 1
Input High Voltage2.0VoltsApplies to DE, DI, RE
Input Low Voltage0.8VoltsApplies to DE, DI, RE
Input CurrentApplies to DE, DI, RE
Driver Input 10µA DI
Control Lines 1µA DE, RE
Driver Short-Circuit Current
V
= HIGH±250mA-7V ≤ VO ≤ +12V
OUT
V
= LOW±250mA-7V ≤ VO ≤ +12V
OUT
SP483E DRIVER
AC Characteristics
Maximum Data Rate250KbpsRE = 5V, DE = 5V; R
CL1 = CL2 = 100pF
Driver Input to Output2508002000nst
Driver Input to Output2508002000nst
Driver Skew100800ns
Driver Rise or Fall Time2502000nsFrom 10% to 90%; R
Driver Enable to Output High2502000nsC
Driver Enable to Output Low2502000nsC
Driver Disable Time from Low3003000nsC
Driver Disable Time from High 3003000nsC
SP481E/SP485
E RECEIVER
; R
PLH
see Figures 3 and 5
PHL
see Figures 3 and 5
= 54Ω, CL1 = CL2 = 100pF;
DIFF
; R
= 54Ω, CL1 = CL2 = 100pF;
DIFF
see Figures 3 and 5,
t
SKEW
CL1 = C
= 100pF;
L
= 100pF;
L
= 15pF;
L
= 15pF;
L
= | t
- t
DPLH
= 100pF;
L2
see Figures 4 & 6;
see Figures 4 & 6;
see Figures 2 & 8;
see Figures 2 & 8;
= 54Ω,
DIFF
|
DPHL
= 54Ω,
DIFF
s
ee Figures 3 and
S1 closed
S2 closed
6
S2 closed
S1 closed
DC Characteristics
Differential Input Threshold-0.2+0.2Volts-7V ≤ V
Input Hysteresis20mVVCM = 0V
CM
≤ +12V
Output Voltage High3.5VoltsIO = -4mA, VID = +200mV
Output Voltage Low0.4VoltsIO = +4mA, VID = -200mV
Three-State (High Impedance)
Output Current±1µA0.4V ≤ VO ≤ 2.4V; RE = 5V
Input Resistance1215kΩ-7V ≤ V
Input Current (A, B); VIN = 12V+1.0mADE = 0V, VCC = 0V or 5.25V, VIN = 12V
CM
≤ +12V
Input Current (A, B); VIN = -7V-0.8mADE = 0V, VCC = 0V or 5.25V, VIN = -7V
Short-Circuit Current795mA0V ≤ VCM ≤ V
Maximum Data Rate250KbpsRE = 0V, DE = 0V
Receiver Input to Output2502000nst
Receiver Input to Output2502000nst
Diff. Receiver Skew It
I100nsR
PLH-tPHL
Receiver Enable to
Output Low4570nsC
Receiver Enable to
Output High4570nsC
Receiver Disable from Low4570nsC
Receiver Disable from High4570nsC
SP483E
Shutdown Timing
Time to Shutdown50200600nsRE = 5V, DE = 0V
Driver Enable from Shutdown
to Output High2000nsCL = 100pF;
Driver Enable from Shutdown
to Output Low2000nsCL = 100pF;
Receiver Enable from
Shutdown to Output High3002500nsCL = 15pF;
Receiver Enable from
Shutdown to Output Low3002500nsCL = 15pF;
; R
PLH
DIFF
CL1 = C
L2
; R
PHL
DIFF
CL1 = C
L2
= 54Ω; C
DIFF
Figures 3 & 7
= 15pF;
RL
= 15pF;
RL
= 15pF;
RL
= 15pF;
RL
= 100pF;
=
= 54Ω,
= 54Ω,
Figures 3 & 7
100pF;
Figures 3 & 7
= C
= 100pF;
L1
L2
Figures 2 & 8;
Figures 2 & 8;
Figures 2 & 8;
Figures 2 & 8;
S1 closed
S2 closed
S1 closed
S2 closed
See Figures 4 & 6;
See Figures 4 & 6;
See Figures 2 & 8;
See Figures 2 & 8;
The SP483E is a half-duplex differential
transceiver that meets the requirements of
RS-485 and RS-422. Fabricated with a Sipex
proprietary BiCMOS process, the SP483E
requires a fraction of the power of older bipolar
designs.
The RS-485 standard is ideal for multi-drop
applications and for long-distance interfaces.
RS-485 allows up to 32 drivers and 32 receivers
to be connected to a data bus, making it an ideal
choice for multi-drop applications. Since the
cabling can be as long as 4,000 feet, RS-485
transceivers are equipped with a wide (-7V to
+12V) common mode range to accommodate
ground potential differences. Because RS-485 is
a differential interface, data is virtually immune
to noise in the transmission line.
Drivers...
The driver outputs of the SP483E are differential
outputs meeting the RS-485 and RS-422 standards. The typical voltage output swing with no
load will be 0 Volts to +5 Volts. With worst case
loading of 54Ω across the differential outputs,
the drivers can maintain greater than 1.5V voltage levels. The drivers have an enable control
line which is active HIGH. A logic HIGH on DE
(pin 3) will enable the differential driver outputs.
A logic LOW on DE (pin 3) will tri-state the
driver outputs.
The SP483E has internally slew rate limited
driver outputs to minimize EMI. The maximum
data rate for the SP483E drivers is 250 Kbps
under load.
The SP483E receivers have differential inputs
with an input sensitivity as low as ±200mV.
Input impedance of the receivers is typically
15kΩ (12kΩ minimum). A wide common mode
range of -7V to +12V allows for large ground
potential differences between systems. The
receivers have a tri-state enable control pin.
A logic LOW on RE (pin 2) will enable the
receiver, a logic HIGH on RE (pin 2) will disable
the receiver.
The SP483E receiver is rated for data rates up
to 250 Kbps. The receivers are equipped with
the fail-safe feature. Fail-safe guarantees that
the receiver output will be in a HIGH state when
the input is left unconnected.
Shutdown Mode...
The SP483E is equipped with a Shutdown mode.
To enable the Shutdown state, both the driver
and receiver must be disabled simultaneously. A
logic LOW on DE (pin 3) and a logic HIGH on
RE (pin 2) will put the SP483E into Shutdown
mode. In Shutdown, supply current will drop to
typically 1µA.
ESD TOLERANCE...
The SP483E device incorporates ruggedized
ESD cells on all driver output and receiver input
pins. The ESD structure is improved over our
previous family for more rugged applications
and environments sensitive to electro-static
discharges and associated transients. The
improved ESD tolerance is at least ±15kV
without damage nor latch-up.
There are different methods of ESD testing
applied:
a) MIL-STD-883, Method 3015.7
b) IEC1000-4-2 Air-Discharge
c) IEC1000-4-2 Direct Contact
The Human Body Model has been the generally
accepted ESD testing method for semiconductors.
This method is also specified in MIL-STD-883,
Method 3015.7 for ESD testing. The premise of
this ESD test is to simulate the human body’s
potential to store electro-static energy and
discharge it to an integrated circuit. The
simulation is performed by using a test model as
shown in Figure 9. This method will test the
IC’s capability to withstand an ESD transient
during normal handling such as in manufacturing
areas where the ICs tend to be handled frequently.
The IEC-1000-4-2, formerly IEC801-2, is
generally used for testing ESD on equipment and
R
RR
C
CC
systems. For system manufacturers, they must
guarantee a certain amount of ESD protection
since the system itself is exposed to the outside
environment and human presence. The premise
with IEC1000-4-2 is that the system is required
to withstand an amount of static electricity when
ESD is applied to points and surfaces of the
equipment that are accessible to personnel during
normal usage. The transceiver IC receives most
of the ESD current when the ESD source is
applied to the connector pins. The test circuit for
IEC1000-4-2 is shown on Figure 10. There are
two methods within IEC1000-4-2, the Air
Discharge method and the Contact Discharge
method.
add up to 330add up to 330ΩΩ f for IEC1000-4-2.or IEC1000-4-2.
V V
7
Page 8
With the Air Discharge Method, an ESD voltage
is applied to the equipment under test (EUT)
through air. This simulates an electrically charged
person ready to connect a cable onto the rear of
the system only to find an unpleasant zap just
before the person touches the back panel. The
high energy potential on the person discharges
through an arcing path to the rear panel of the
system before he or she even touches the system.
This energy, whether discharged directly or
through air, is predominantly a function of the
discharge current rather than the discharge
voltage. Variables with an air discharge such as
approach speed of the object carrying the ESD
potential to the system and humidity will tend to
change the discharge current. For example, the
rise time of the discharge current varies with the
approach speed.
i ➙
30A
15A
0A
t=0nst=30ns
t ➙
Figure 11. ESD Test Waveform for IEC1000-4-2
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
voltage stored in the capacitor is then applied
through RS, the current limiting resistor, onto the
device under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under test
receives a duration of voltage.
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be directly
discharged to the equipment from a person already
holding the equipment. The current is transferred
on to the keypad or the serial port of the equipment
directly and then travels through the PCB and finally
For the Human Body Model, the current limiting
resistor (RS) and the source capacitor (CS) are
1.5kΩ an 100pF, respectively. For IEC-1000-4-
2, the current limiting resistor (RS) and the source
capacitor (CS) are 330Ω an 150pF, respectively.
to the IC.
The higher CS value and lower RS value in the
The circuit model in Figures 9 and 10 represent
the typical ESD testing circuit used for all three
methods. The CS is initially charged with the DC
power supply when the first switch (SW1) is on.
Now that the capacitor is charged, the second
switch (SW2) is on while SW1 switches off. The
SP483ECN ....................................................... 0˚C to +70˚C............................................... 8-pin Narrow SOIC
SP483ECP........................................................ 0˚C to +70˚C...................................................8-pin Plastic DIP
SP483EEN...................................................... .-40˚C to +85˚C............................................. 8-pin Narrow SOIC
SP483EEP ...................................................... -40˚C to +85˚C .................................................8-pin Plastic DIP
Please consult the factory for pricing and availability on a Tape-On-Reel option.
Corporation
SIGNAL PROCESSING EXCELLENCE
Sipex Corporation
Headquarters and
Sales Office
22 Linnell Circle
Billerica, MA 01821
TEL: (978) 667-8700
FAX: (978) 670-9001
e-mail: sales@sipex.com
Sales Office
233 South Hillview Drive
Milpitas, CA 95035
TEL: (408) 934-7500
FAX: (408) 935-7600
Sipex Corporation reserves the right to make changes to any products described herein. Sipex does not assume any liability arising out of the
application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others.