■ Meets true EIA/TIA-232-F Standards
from a +3.0V to +5.5V power supply
■ Interoperable with RS-232 down to +2.7V
power source
■ 1µA Low-Power Shutdown with Receivers
Active (SP3222EH)
■ Enhanced ESD Specifications:
+15kV Human Body Model
+15kV IEC1000-4-2 Air Discharge
+8kV IEC1000-4-2 Contact Discharge
■ 460Kbps Minimum Transmission Rate
■ Ideal for Handheld, Battery Operated
Applications
DESCRIPTION
The SP3222EH and the 3232EH are 2 driver/2 receiver RS-232 transceiver solutions
intended for portable or hand-held applications such as notebook or palmtop computers.
Their data transmission rate of 460Kbps meeting the demands of high speed RS-232
applications. Both ICS have a high-efficiency, charge-pump power supply that requires only
0.1µF capacitors for 3.3V operation. The charge pump allows the SP3222EH and the 3232EH
series to deliver true RS-232 performance from a single power supply ranging from +3.3V
to +5.0V. The ESD tolerance of the SP3222EH/3232EH devices exceeds +15kV for both
Human Body Model and IEC1000-4-2 Air discharge test methods.
The SP3222EH device has a low-power shutdown mode where the devices' driver outputs
and charge pumps are disabled. During shutdown, the supply current is less than 1µA.
These are stress ratings only and functional operation of the
device at these ratings or any other above those indicated in
the operation sections of the specifications below is not
implied. Exposure to absolute maximum rating conditions
for extended periods of time may affect reliability and cause
permanent damage to the device.
VCC................................................................-0.3V to +6.0V
V+ (NOTE 1)................................................-0.3V to +7.0V
V- (NOTE 1)................................................+0.3V to -7.0V
Unless otherwise noted, the following performance characteristics apply for VCC = +3.3V, 1Mbps data rates, all drivers
loaded with 3kΩ, 0.1µF charge pump capacitors, and T
= +25°C.
AMB
6
4
2000
Vout+
Vout-
Transmitter Output Voltage [V]
2
0
0
-2
-4
-6
500
1000
Load Capacitance [pF]
1500
Figure 1. Transmitter Output Voltage VS. Load
Capacitance for the SP3222EH and the SP3232EH
50
5
0
0500
118KHz
60KHz
10KHz
1000
Load Capacitance [pF]
1500
2000
45
40
35
30
25
20
15
Supply Current [mA]
10
2330
14
12
10
8
6
Slew Rate [V/µs]
4
2
0
0500
1000
Load Capacitance [pF]
1500
2000
+Slew
-Slew
Figure 2. Slew Rate VS. Load Capacitance for the
SP3222EH and the SP3232EH
2330
Figure 3. Supply Current VS. Load Capacitance when
Transmitting Data for the SP3222EH and the SP3232EH
The SP3222EH and SP3232EH are 2-driver/
2-receiver devices ideal for portable or hand-held
applications. The SP3222EH features a 1µA
shutdown mode that reduces power consumption
and extends battery life in portable systems.
Its receivers remain active in shutdown mode,
allowing external devices such as modems to be
monitored using only 1µA supply current.
The SP3222EH/3232EH transceivers meet the
EIA/TIA-232 and V.28/V.24 communication
protocols. They feature Sipex's proprietary
on-board charge pump circuitry that generates
2 x VCC for RS-232 voltage levels from a single
+3.0V to +5.5V power supply. The SP3222EH/3232EH drivers operate at a minimum data
rate of 460Kbps.
THEORY OF OPERATION
The SP3222EH/3232EH are made up of three
basic circuit blocks: 1. Drivers, 2. Receivers, and 3.
the Sipex proprietary charge pump.
Drivers
The drivers are inverting level transmitters that
convert TTL or CMOS logic levels to +5.0V
EIA/TIA-232 levels inverted relative to the input
logic levels. Typically, the RS-232 output voltage
swing is +5.5V with no load and at least +5V
minimum fully loaded. The driver outputs are
protected against infinite short-circuits to ground
without degradation in reliability. Driver outputs
will meet EIA/TIA-562 levels of +3.7V with
supply voltages as low as 2.7V.
The drivers have a minimum data rate of
460Kbps fully loaded with 3KΩ in parallel with
1000pF, ensuring compatibility with PC-to-PC
communication software.
The slew rate of the driver output is internally
limited to a maximum of 30V/µs in order to meet
the EIA standards (EIA RS-232D 2.1.7,
Paragraph 5). The transition of the loaded output
from HIGH to LOW also meets the monotonicity
requirements of the standard.
The SP3222EH/3232EH drivers can maintain
high data rates up to 240Kbps when fully
loaded. Figure 8 shows a loopback circuit used
to test the RS-232 drivers. Figure 9 shows the
test results of the loopback circuit with all drivers
active at 120Kbps and RS-232 loads in parallel
with 1000pF capacitors. Figure 10 shows the test
results where one driver is active at 235Kbps and
all drivers are loaded with an RS-232 receiver
in parallel with a 1000pF capacitor.
The SP3222EH driver's output stages are
tri-stated in shutdown mode. When the power is
off, the SP3222EH device permits the outputs to
be driven up to +12V. Because the driver's
inputs do not have pull-up resistors, unused
inputs should be connected to VCC or GND.
In the shutdown mode, the supply current is less
than 1µA, where SHDN = LOW. When the
SP3222EH device is shut down, the device's
driver outputs are disabled (tri-stated) and the
charge pumps are turned off with V+ pulled
down to VCC and V- pulled to GND. The time
required to exit shutdown is typically 100µs.
SHDN is connected to VCC if the shutdown mode
is not used. SHDN has no effect on RxOUT or
RxOUTB. As they become active, the two driver
outputs go to opposite RS-232 levels: one driver
input is HIGH and the other LOW. Note that the
drivers are enabled only when the magnitude of
V- exceeds approximately 3V.
The receivers convert EIA/TIA-232 levels to
TTL or CMOS logic output levels. All receivers
have an inverting tri-state output. Receiver
outputs (RxOUT) are tri-stated when the enable
control EN = HIGH. In the shutdown mode, the
receivers can be active or inactive. EN has no
effect on TxOUT. The truth table logic of the
SP3222EH/3232EH driver and receiver outputs
can be found in Table 2.
Since receiver input is usually from a transmission line where long cable lengths and system
interference can degrade the signal and inject
noise, the inputs have a typical hysteresis margin
of 300mV. Should an input be left unconnected,
a 5kΩ pulldown resistor to ground forces the
output of the receiver HIGH.
Charge Pump
The Sipex patented charge pump (5,306,954)
uses a four–phase voltage shifting technique to
attain symmetrical 5.5V power supplies and
requires four external capacitors. The internal
power supply consists of a regulated dual charge
pump that provides an output voltage of 5.5V
regardless of the input voltage (VCC) over the
+3.0V to +5.5V range.
In most circumstances, decoupling the power
supply can be achieved adequately using a
0.1µF bypass capacitor at C5 (refer to Figures 6
and 7). In applications that are sensitive to
power-supply noise,VCC and ground can be
decoupled with a capacitor of the same value
as charge-pump capacitor C1. It is always
important to physically locate bypass capacitors
close to the IC.
The charge pump operates in a discontinuous
mode using an internal oscillator. If the output
voltage is less than 5.5V, the charge pump is
enabled. If the output voltage exceeds 5.5V,
the charge pump is disabled. An oscillator
controls the four phases of the voltage shifting.
A description of each phase follows.
Phase 1: VSS Charge Storage (Figure 12)
During this phase of the clock cycle, the positive
side of capacitors C1 and C2 are charged to VCC.
+
C
is then switched to GND and the charge in
l
–
C
is transferred to C
1
–
. Since C
2
+
is connected
2
to VCC, the voltage potential across capacitor C
is now 2 times VCC.
Phase 2: VSS Transfer (Figure 13)
Phase two of the clock connects the negative
terminal of C2 to the V
storage capacitor and
SS
the positive terminal of C2 to GND. This
transfers a negative generated voltage to C3.
This generated voltage is regulated to a
minimum voltage of -5.5V. Simultaneous with
the transfer of the voltage to C3, the positive side
of capacitor C1 is switched to VCC and the
negative side is connected to GND.
2
NDHSNETUOxTTUOxR
00etats-irTevitcA
01etats-irTetats-irT
Phase 3: VDD Charge Storage (Figure 15)
The third phase of the clock is identical to the
first phase — the charge transferred in C
produces –VCC in the negative terminal of C1,
which is applied to the negative side of capacitor
10evitcAevitcA
11evitcAetats-irT
Table 2. Truth Table Logic for Shutdown and Enable
Control
The fourth phase of the clock connects the
negative terminal of C2 to GND, and transfers
this positive generated voltage across C2 to C4,
the VDD storage capacitor. This voltage is
regulated to +5.5V. At this voltage, the internal
oscillator is disabled. Simultaneous with the
transfer of the voltage to C4, the positive side of
capacitor C1 is switched to VCC and the negative
side is connected to GND, allowing the charge
pump cycle to repeat. The charge pump cycle
will continue as long as the operational
conditions for the internal oscillator are present.
Since both V+ and V– are separately generated
from VCC; in a no–load condition V+ and V– will
be symmetrical. Older charge pump approaches
that generate V– from V+ will show a decrease in
the magnitude of V– compared to V+ due to the
inherent inefficiencies in the design.
The charge pump clock rate typically operates
at 250kHz. The external capacitors can be as low
as 0.1µF with a 16V breakdown voltage rating.
ESD Tolerance
The SP3222EH/3232EH series incorporates
ruggedized ESD cells on all driver output
and receiver input pins. The improved ESD
tolerance is at least ±15kV without damage or
latch-up.
Three methods of ESD testing are performed:
a) MIL-STD-883, Method 3015.7
b) IEC1000-4-2 Air-Discharge
c) IEC1000-4-2 Direct Contact
The Human Body Model has been the generally
accepted ESD testing method for semiconductors. This method is also specified in MIL-STD883, Method 3015.7 for ESD testing. The premise
of this ESD test is to simulate the human body’s
potential to store electro-static energy and
discharge it to an integrated circuit. The
simulation is performed by using a test model as
shown in Figure 17. This method will test the
IC’s capability to withstand an ESD transient
during normal handling such as in manufacturing
areas where the ICs tend to be handled
frequently.
The IEC-1000-4-2, formerly IEC801-2, is
used for testing ESD on equipment and
systems. For system manufacturers, they must
guarantee a certain amount of ESD protection
since the system itself is exposed to the outside
environment and human presence. The premise
with IEC1000-4-2 is that the system is required
to withstand an amount of static electricity when
ESD is applied to points and surfaces of the
equipment that are accessible to personnel
during normal usage. In many cases, the RS232
transceiver IC receives most of the ESD current
when the ESD source is applied to the connector
pins. The test circuit for IEC1000-4-2 is shown on
Figure 18. There are two methods within
IEC1000-4-2, the Air Discharge method and the
Contact Discharge method.
With the Air Discharge Method, an ESD
voltage is applied to the equipment under
test (EUT) through air. This simulates an
electrically charged person ready to connect a
cable onto the rear of the system. The high
energy potential on the person discharges
through an arcing path to the rear panel of the
system before he or she touches the system.
This energy, whether discharged directly or
through air, is predominantly a function of the
discharge current rather than the discharge
voltage. Variables with an air discharge such
as approach speed of the object carrying the
ESD potential to the system and humidity will
tend to change the discharge current. For example,
the rise time of the discharge current varies
with the approach speed.
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be
directly discharged to the equipment from a
person already holding the equipment. The
current is transferred on to the keypad or the
serial port of the equipment directly and then
travels through the PCB and finally to the IC.
SW2
SW2SW2
C
CC
S
SS
Device
Under
Test
The circuit models in Figures 17 and 18
represent the typical ESD testing circuits used
for all three methods. The CS is initially charged
with the DC power supply when the first
switch (SW1) is on. Now that the capacitor is
charged, the second switch (SW2) is on while
SW1 switches off. The voltage stored in the
capacitor is then applied through RS, the current
limiting resistor, onto the device under test
(DUT). In ESD tests, the SW2 switch is pulsed
so that the device under test receives a duration
of voltage.
add up to 330add up to 330ΩΩ f for IEC1000-4-2.or IEC1000-4-2.
V V
Device
Under
Test
13
Page 14
For the Human Body Model, the current
limiting resistor (RS) and the source capacitor
(CS) are 1.5kΩ an 100pF, respectively. For
I ➙
30A
IEC-1000-4-2, the current limiting resistor (RS)
and the source capacitor (CS) are 330Ω an 150pF,
respectively.
15A
The higher CS value and lower RS value in the
IEC1000-4-2 model are more stringent than the
Human Body Model. The larger storage
capacitor injects a higher voltage to the test
0A
point when SW2 is switched on. The lower
current limiting resistor increases the current
SP3222EHCA .......................................... 0˚C to +70˚C .......................................... 20-Pin SSOP
SP3222EHCP .......................................... 0˚C to +70˚C ............................................ 18-Pin PDIP
SP3222EHCT........................................... 0˚C to +70˚C ........................................... 18-Pin SOIC
SP3222EHCY .......................................... 0˚C to +70˚C ........................................ 20-Pin TSSOP
SP3232EHCA .......................................... 0˚C to +70˚C .......................................... 16-Pin SSOP
SP3232EHCP .......................................... 0˚C to +70˚C ............................................ 16-Pin PDIP
SP3232EHCT........................................... 0˚C to +70˚C .................................. 16-Pin Wide SOIC
SP3232EHCY .......................................... 0˚C to +70˚C ........................................ 16-Pin TSSOP
Please consult the factory for pricing and availability on a Tape-On-Reel option.
Corporation
SIGNAL PROCESSING EXCELLENCE
Sipex Corporation
Headquarters and
Sales Office
22 Linnell Circle
Billerica, MA 01821
TEL: (978) 667-8700
FAX: (978) 670-9001
e-mail: sales@sipex.com
Sales Office
233 South Hillview Drive
Milpitas, CA 95035
TEL: (408) 934-7500
FAX: (408) 935-7600
Sipex Corporation reserves the right to make changes to any products described herein. Sipex does not assume any liability arising out of the
application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others.