• Scalable performance by applying 1, 2 or 3 external
field memories
• Improved recursive de-interlacing
• Film (25 Hz, 30 Hz) upconversion to 100/120
movement phases per second
• Variable vertical sharpness enhancement
• Motion compensated 3D dynamic noise reduction
• High quality vertical zoom
• 2 Mbaud serial interface (SNERT).
SAA4992H
2GENERAL DESCRIPTION
The SAA4992H is a completely digital monolithic
integrated circuit which can be used for field and line rate
conversion of all global TV standards.
It features improved‘Natural Motion’ performance and full
film upconversion for all 50 and 60 Hz film material.
It can be configured to emulate the SAA4990H as well as
the SAA4991WP. For demonstration purposes a split
screen mode to show the Dynamic Noise Reduction
(DNR) function and a colour vector overlay is available.
The SAA4992H supports a Boundary Scan Test (BST)
circuit in accordance with IEEE 1149.
Field and line rate converter with noise
reduction
5BLOCK DIAGRAMS
SEQUENCER
YE0 to YE7
122 to 129
61 to 68
SAA4992H
YF7 to YF0
YG7 to YG0
82 to 89
ZOOM
VERTICAL
PEAKING
VERTICAL
SAA4992H
MHB645
dbook, full pagewidth
YD7 to YD0
111, 112,
FIELD MEMORY 3
FIELD MEMORY 2
114 to 119
YC0 to YC7
2 to 9
YB7 to YB0
151, 152,
154 to 159
DECOMPRESS
COMPRESS
NOISE
DYNAMIC
REDUCTION
45 to 52
27
MUX
MUX
SNERT
26
DE-INTERLACER
INTERFACE
25
MPR
RIGHT
vectors
SPMTPMESM
MPR
LEFT
CONTROL
35
vectors
MOTION ESTIMATOR
34
33
UPCONVERSION
BST/TEST
32
31
30
Fig.1 Block diagram of the luminance part.
79
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2000 Feb 044
YA0 to YA7
SNCL
SNDA
SNRST
TCK
TDO
TDI
TMS
TRST
TEST
CLK32
The solid lines represent pixel data; the broken lines represent controls.
Page 5
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
UVE0 to UVE3
130 to 133
SAA4992H
UVD3 to UVD0
107 to 110
UVF7 to YVF0
UVG7 to YVG0
70 to 77
91 to 98
FORMAT
ZOOM
VERTICAL
SAA4992H
MHB646
book, full pagewidth
UVC0 to UVC3
10 to 13
FIELD MEMORY 2FIELD MEMORY 3
UVB3 to UVB0
147 to 150
REFORMAT
DECOMPRESS/
FORMAT
COMPRESS/
DNR
REFORMAT
DECOMPRESS/
37 to 44
MPR
vectors
MPR
RIGHT
UPCONVERSION
LEFT
Fig.2 Block diagram of the chrominance part.
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2000 Feb 045
UVA0 to UVA7
The solid lines represent pixel data; the broken lines represent controls.
Page 6
Philips SemiconductorsProduct specification
Field and line rate converter with noise
SAA4992H
reduction
6PINNING
SYMBOLPINTYPEDESCRIPTION
V
SSE
1ground ground of output pads
YC02inputbus C luminance input from field memory 2 bit 0 (LSB)
YC13inputbus C luminance input from field memory 2 bit 1
YC24inputbus C luminance input from field memory 2 bit 2
YC35inputbus C luminance input from field memory 2 bit 3
YC46inputbus C luminance input from field memory 2 bit 4
YC57inputbus C luminance input from field memory 2 bit 5
YC68inputbus C luminance input from field memory 2 bit 6
YC79inputbus C luminance input from field memory 2 bit 7 (MSB)
UVC010inputbus C chrominance input from field memory 2 bit 0 (LSB)
UVC111inputbus C chrominance input from field memory 2 bit 1
UVC212inputbus C chrominance input from field memory 2 bit 2
UVC313inputbus C chrominance input from field memory 2 bit 3 (MSB)
REC14outputread enable output for busC
V
V
V
V
SSE
DDE
SSI
DDI
15ground ground of output pads
16supply supply voltage of output pads
17ground core ground
18supply core supply voltage
JUMP019inputconfiguration pin 0; will be stored in register 0B3 e.g. to indicate presence of 3rd field
memory; should be connected to ground or to V
JUMP120inputconfiguration pin 1; will be stored in register 0B5 e.g. to indicate presence of 16-bit
1st field memory for full 4:2:2; should be connected to ground or to V
pull-up resistor; note 3
V
V
V
DDE
DDI
SSI
21supply supply voltage of output pads
22supply core supply voltage
23ground core ground
RAMTST124inputtest pin 1 for internal RAM testing; connect to ground for normal operation
SNRST25inputSNERT bus reset
SNDA26I/OSNERT bus data
SNCL27inputSNERT bus clock
V
SSE
28ground ground of output pads
RAMTST229inputtest pin 2 for internal RAM testing; connect to ground for normal operation
TEST30inputtest mode input; if not used it has to be connected to ground
TRST31inputboundary scan test: reset input signal; if not used it has to be connected to ground via
pull-down resistor; note 3
TMS32inputboundary scan test: test mode select; if not used it has to be connected to V
pull-up resistor; note 3
TDI33inputboundary scan test: data input signal; if not used it has to be connected to V
pull-up resistor; note 3
TDO34outputboundary scan test: data output signal
(1)(2)
via pull-up resistor; note 3
DDI
DDI
via
DDI
DDI
via
via
2000 Feb 046
Page 7
Philips SemiconductorsProduct specification
Field and line rate converter with noise
SAA4992H
reduction
SYMBOLPINTYPEDESCRIPTION
TCK35inputboundary scan test: clock input signal; if not used it has to be connected to V
pull-up resistor; note 3
V
SSE
36ground ground of output pads
UVA037inputbus A chrominance input from field memory 1 bit 0 (LSB)
UVA138inputbus A chrominance input from field memory 1 bit 1
UVA239inputbus A chrominance input from field memory 1 bit 2
UVA340inputbus A chrominance input from field memory 1 bit 3
UVA441inputbus A chrominance input from field memory 1 bit 4
UVA542inputbus A chrominance input from field memory 1 bit 5
UVA643inputbus A chrominance input from field memory 1 bit 6
UVA744inputbus A chrominance input from field memory 1 bit 7 (MSB)
YA045inputbus A luminance input from field memory 1 bit 0 (LSB)
YA146inputbus A luminance input from field memory 1 bit 1
YA247inputbus A luminance input from field memory 1 bit 2
YA348inputbus A luminance input from field memory 1 bit 3
YA449inputbus A luminance input from field memory 1 bit 4
YA550inputbus A luminance input from field memory 1 bit 5
YA651inputbus A luminance input from field memory 1 bit 6
YA752inputbus A luminance input from field memory 1 bit 7 (MSB)
REA53outputread enable output for bus A
V
V
V
V
V
V
SSE
SSI
DDI
DDI
SSI
SSE
54ground ground of output pads
55ground core ground
56supply core supply voltage
57supply core supply voltage
58ground core ground
59ground ground of output pads
REF60inputread enable input for bus F and G
YF761outputbus F luminance output bit 7 (MSB)
YF662outputbus F luminance output bit 6
YF563outputbus F luminance output bit 5
YF464outputbus F luminance output bit 4
YF365outputbus F luminance output bit 3
YF266outputbus F luminance output bit 2
YF167outputbus F luminance output bit 1
YF068outputbus F luminance output bit 0 (LSB)
V
DDE
69supply supply voltage of output pads
UVF770outputbus F chrominance output bit 7 (MSB)
UVF671outputbus F chrominance output bit 6
UVF572outputbus F chrominance output bit 5
UVF473outputbus F chrominance output bit 4
UVF374outputbus F chrominance output bit 3
(1)(2)
DDI
via
2000 Feb 047
Page 8
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
SYMBOLPINTYPEDESCRIPTION
UVF275outputbus F chrominance output bit 2
UVF176outputbus F chrominance output bit 1
UVF077outputbus F chrominance output bit 0 (LSB)
V
SSE
78ground ground of output pads
CLK3279inputsystem clock input
V
V
SSI
SSE
80ground core ground
81ground ground of output pads
YG782outputbus G luminance output bit 7 (MSB)
YG683outputbus G luminance output bit 6
YG584outputbus G luminance output bit 5
YG485outputbus G luminance output bit 4
YG386outputbus G luminance output bit 3
YG287outputbus G luminance output bit 2
YG188outputbus G luminance output bit 1
YG089outputbus G luminance output bit 0 (LSB)
V
DDE
90supply supply voltage of output pads
UVG791outputbus G chrominance output bit 7 (MSB)
UVG692outputbus G chrominance output bit 6
UVG593outputbus G chrominance output bit 5
UVG494outputbus G chrominance output bit 4
UVG395outputbus G chrominance output bit 3
UVG296outputbus G chrominance output bit 2
UVG197outputbus G chrominance output bit 1
UVG098outputbus G chrominance output bit 0 (LSB)
V
V
V
V
V
V
V
SSE
SSI
DDI
DDE
DDI
SSI
SSE
99ground ground of output pads
100ground core ground
101supply core supply voltage
102supply supply voltage of output pads
103supply core supply voltage
104ground core ground
105ground ground of output pads
WED106outputwrite enable output for bus D
UVD3107output bus D chrominance output to field memory 3 bit 3 (MSB)
UVD2108output bus D chrominance output to field memory 3 bit 2
UVD1109output bus D chrominance output to field memory 3 bit 1
UVD0110output bus D chrominance output to field memory 3 bit 0 (LSB)
YD7111output bus D luminance output to field memory 3 bit 7 (MSB)
YD6112output bus D luminance output to field memory 3 bit 6
V
DDE
113supply supply voltage of output pads
YD5114output bus D luminance output to field memory 3 bit 5
YD4115output bus D luminance output to field memory 3 bit 4
(1)(2)
SAA4992H
2000 Feb 048
Page 9
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
SYMBOLPINTYPEDESCRIPTION
YD3116output bus D luminance output to field memory 3 bit 3
YD2117output bus D luminance output to field memory 3 bit 2
YD1118output bus D luminance output to field memory 3 bit 1
YD0119output bus D luminance output to field memory 3 bit 0 (LSB)
V
V
SSE
SSE
120ground ground of output pads
121ground ground of output pads
YE0122inputbus E luminance input from field memory 3 bit 0 (LSB)
YE1123inputbus E luminance input from field memory 3 bit 1
YE2124inputbus E luminance input from field memory 3 bit 2
YE3125inputbus E luminance input from field memory 3 bit 3
YE4126inputbus E luminance input from field memory 3 bit 4
YE5127inputbus E luminance input from field memory 3 bit 5
YE6128inputbus E luminance input from field memory 3 bit 6
YE7129inputbus E luminance input from field memory 3 bit 7 (MSB)
UVE0130inputbus E chrominance input from field memory 3 bit 0 (LSB)
UVE1131inputbus E chrominance input from field memory 3 bit 1
UVE2132inputbus E chrominance input from field memory 3 bit 2
UVE3133inputbus E chrominance input from field memory 3 bit 3 (MSB)
REE134output read enable output for bus E
V
SSE
135ground ground of output pads
n.c.136−not connected
V
SSI
V
DDI
137ground core ground
138supply core supply voltage
n.c.139−not connected
n.c.140−not connected
V
V
V
DDE
DDI
SSI
141supply supply voltage of output pads
142supply core supply voltage
143ground core ground
n.c.144−not connected
V
SSE
145ground ground of output pads
WEB146outputwrite enable output for bus B
UVB3147outputbus B chrominance output to field memory 2 bit 3 (MSB)
UVB2148outputbus B chrominance output to field memory 2 bit 2
UVB1149outputbus B chrominance output to field memory 2 bit 1
UVB0150outputbus B chrominance output to field memory 2 bit 0 (LSB)
YB7151output bus B luminance output to field memory 2 bit 7 (MSB)
YB6152output bus B luminance output to field memory 2 bit 6
V
DDE
153supply supply voltage of output pads
YB5154output bus B luminance output to field memory 2 bit 5
YB4155output bus B luminance output to field memory 2 bit 4
YB3156output bus B luminance output to field memory 2 bit 3
(1)(2)
SAA4992H
2000 Feb 049
Page 10
Philips SemiconductorsProduct specification
Field and line rate converter with noise
SAA4992H
reduction
SYMBOLPINTYPEDESCRIPTION
YB2157output bus B luminance output to field memory 2 bit 2
YB1158output bus B luminance output to field memory 2 bit 1
YB0159output bus B luminance output to field memory 2 bit 0 (LSB)
V
SSE
Notes
1. Not used input pins (e.g. bus E) should be connected to ground.
2. Because of the noisy characteristic of the output pad supply it is recommended not to connect the core supply and
the output pad supply directly at the device. The output pad supply should be buffered as close as possible to the
device.
3. The external pull-up resistor should be 47 kΩ.
160ground ground of output pads
(1)(2)
2000 Feb 0410
Page 11
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
Field and line rate converter with noise
reduction
7FUNCTIONAL DESCRIPTION
The FAL (fal_top) module builds the functional top level of
theSAA4992H.It connects the luminance data path (KER,
kernel), the chrominance data path (COL, colour) and the
luminance (de)compression (YDP, Y-DPCM) with
SAA4992H inputs and outputs as well as controlling logic
(LSE, line sequencer; SNE, SNERT interface). Outside of
fal_top there are only the pad cells, boundary scan test
cells, the boundary scan test controller, the clock tree, the
test enable tree and the input port registers.
Figure 4 shows a simplified block diagram of fal_top. It
displays the flow of pixel data (solid lines) and controls
(broken lines) between the modules inside.
Basic functionality of the modules in fal_top is as follows:
• KER (kernel): Y (luminance) data path
• COL (colour): UV (chrominance) data path
• YDP (Y-DPCM): compression (and decompression) of
luminance output (and input) data by Differential Pulse
Code Modulation (DPCM)
• LSE (line sequencer): generate line frequent control
signals
• SNE: Synchronous No parity Eight bit Reception and
Transmission (SNERT) interface to a microcontroller.
The SNERT interface operates in a slave receive and
transmit mode for communication with a microprocessor,
which resides on peripheral circuits (e.g. SAA4978H)
together with a SNERT master. The SNERT interface
transforms serial data from the microprocessor (via the
SNERT bus) into parallel data to be written into the
SAA4992Hs write registers and parallel data from
SAA4992Hsreadregisters into serial data to be sent to the
microprocessor. The SNERT bus consists of 3 signals:
1. SNCL: used as serial clock signal, generated by the
master
2. SNDA: used as bidirectional data line
3. SNRST: used as a reset signal, generated by the
microprocessor to indicate the start of a transmission.
SAA4992H
Table 1 Clock cycle references
SIGNALLATENCY
RE_F0
RE_C and
RE_E
YC, YE, UVC
and UVE
RE_A94 cycles + REaShift
YA and UVA94 cycles
YF, YG, UVF
and UVG
WE_B and
WE_D
YB, YD, UVB
and UVD
There is an algorithmic delay of 3 lines between input and
output data. Therefore, the main data output on the
F and G bus begins while the fourth input line is read.
Writing to the B and D bus starts one input line later.
The read and write enable signals RE_A, WE_B, RE_C,
WE_D and RE_E can be shifted by control registers
REaShift, WEbdShift and REceShift, which are
implemented in the line sequencer.
The fal_top module itself reads the following control
register bits(addresses):
• NrofFMs (017)
• MatrixOn (026)
• MemComp and MemDecom (026).
NrofFMs and MatrixOn are used to enable the D and G
output bus, respectively. MemComp and MemDecom are
connected to YDP to control luminance data compression
and decompression. These control register signals are not
displayed in Fig.4. Further information on the control
registers is given in Chapter 8.
63 cycles + REceShift
63 cycles
148 cycles + 3 input lines
160 cycles + 4 input lines + WEbdShift
160 cycles + 4 input lines
The processing of a video field begins on the rising edge
of the RE_F input signal. As indicated in Fig.4, the
SAA4992H expects its inputs and generates its outputs at
the following clock cycles after RE_F (see Table 1).
2000 Feb 0412
Page 13
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
handbook, full pagewidth
RE_C,
RE_W
63
cycles
UVA
94 cycles
SNDA
RE_A
94 cycles
YA
94 cycles
fal_top
WE_B,
WE_D
160
cycles
external field memories
UVB,
UVD
160
cycles
COL
LSESNE
UVC,
UVE
63
cycles
KER
YB,
YD
160
cycles
YDP
YC,
YE
63
cycles
SAA4992H
UVF, UVG
148 cycles
RE_F
0 cycles
YF, YG
148 cycles
The solid lines represent pixel data; the broken lines represent controls.
Fig.4 Block diagram of fal_top.
MHB648
2000 Feb 0413
Page 14
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
1. Index X refers to different I/O buses:
a) X = A: input from 1st field memory
b) X = B: output to 2nd field memory
c) X = C: input from 2nd field memory
d) X = D: output to 3rd field memory
e) X = E: input from 3rd field memory
f) X = F: main output
g) X = G: 2nd output for matrix purposes.
The first index digit defines the sample number, the second defines the bit number.
2. X = don’t care or not available.
2000 Feb 0432
Page 33
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
12 PACKAGE OUTLINE
QFP160: plastic quad flat package;
160 leads (lead length 1.6 mm); body 28 x 28 x 3.4 mm; high stand-off height
c
y
120
121
X
A
81
80
Z
E
SAA4992H
SOT322-2
pin 1 index
160
1
D
28.1
27.9
Z
(1)
w M
b
3.60
3.20
0.25
p
D
H
D
0.38
0.23
0.22
0.13
e
DIMENSIONS (mm are the original dimensions)
mm
A
max.
4.07
0.50
0.25
UNITA1A2A3bpcE
41
40
D
0510 mm
(1)(1)(1)
28.1
0.650.31.6
27.9
e
H
E
E
w M
b
p
v M
A
B
v M
B
scale
eH
H
D
31.45
30.95
E
31.45
30.95
LL
1.03
0.73
p
A
A
2
A
1
0.130.1
detail X
Z
D
1.5
1.1
(A )
3
L
p
L
Zywvθ
E
o
1.5
7
o
1.1
0
θ
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
OUTLINE
VERSION
SOT322-2135E12 MS-022
IEC JEDEC EIAJ
REFERENCES
2000 Feb 0433
EUROPEAN
PROJECTION
ISSUE DATE
99-11-03
00-01-19
Page 34
Philips SemiconductorsProduct specification
Field and line rate converter with noise
reduction
13 SOLDERING
13.1Introduction to soldering surface mount
packages
Thistextgivesaverybriefinsighttoa complex technology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering is not always suitable
for surface mount ICs, or for printed-circuit boards with
high population densities. In these situations reflow
soldering is often used.
13.2Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
totheprinted-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
infrared/convection heating in a conveyor type oven.
Throughput times (preheating, soldering and cooling) vary
between 100 and 200 seconds depending on heating
method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 230 °C.
13.3Wave soldering
Conventional single wave soldering is not recommended
forsurfacemountdevices(SMDs)orprinted-circuitboards
with a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
SAA4992H
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackageswithleadsonfoursides,thefootprintmust
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
13.4Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
If wave soldering is used the following conditions must be
observed for optimal results:
2000 Feb 0434
Page 35
Philips SemiconductorsProduct specification
Field and line rate converter with noise
SAA4992H
reduction
13.5Suitability of surface mount IC packages for wave and reflow soldering methods
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
, SO, SOJsuitablesuitable
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
The package footprint must incorporate solder thieves downstream and at the side corners.
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
15 LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
2000 Feb 0435
Page 36
Philips Semiconductors – a w orldwide compan y
Argentina: see South America
Australia: 3 Figtree Drive, HOMEBUSH, NSW 2140,
United States: 811 East Arques Avenue, SUNNYVALE, CA 94088-3409,
Tel. +1 800 234 7381, Fax. +1 800 943 0087
Uruguay: see South America
Vietnam: see Singapore
Yugoslavia: PHILIPS, Trg N. Pasica 5/v, 11000 BEOGRAD,
Tel. +381 11 3341 299, Fax.+381 11 3342 553
For all other countries apply to: Philips Semiconductors,
International Marketing & Sales Communications, Building BE-p, P.O. Box 218,
5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
2000
Internet: http://www.semiconductors.philips.com
69
Printed in The Netherlands753504/01/pp36 Date of release: 2000 Feb 04Document order number: 9397 750 06587
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