These are N-Channel enhancement mode silicon gate
power field effect transistors. They are advanced power
MOSFETs designed, tested, and guaranteed to withstand a
specified level of energy in the breakdown avalanche mode
of operation. All of these power MOSFETs are designed for
applications such as switching regulators, switching
convertors, motor drivers, relay drivers, and drivers for high
power bipolar switching transistors requiring high speed and
low gate drive power. These types can be operated directly
from integrated circuits.
Formerly developmental type TA17412.
Ordering Information
PART NUMBERPACKAGEBRAND
IRF630TO-220ABIRF630
RF1S630SMTO-263ABRF1S630
NOTE: When ordering,usetheentire part number.Addthe suffix9A to
obtain the TO-263AB variant in the tape and reel, i.e., RF1S630SM9A.
File Number
Features
• 9A, 200V
DS(ON)
= 0.400Ω
•r
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Symbol
D
G
S
1578.2
Packaging
DRAIN (FLANGE)
JEDEC TO-220ABJEDEC TO-263AB
SOURCE
DRAIN
GATE
GATE
SOURCE
DRAIN
(FLANGE)
4-202
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
150mJ
-55 to 150
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
D(ON)
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
0.8
2µs PULSE TEST
VGS = 10V
0.6
0.4
, DRAIN TO SOURCE
ON RESISTANCE
0.2
DS(ON)
r
0
0
10
ID, DRAIN CURRENT (A)
20
VGS = 20V
3040
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
2.2
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 10V, ID = 5A
GS
1.8
1.4
1
ON RESISTANCE
0.6
NORMALIZED DRAIN TO SOURCE
0.2
-40040
T
, JUNCTION TEMPERATURE (oC)
J
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
43
80
120
4-205
Page 5
IRF630, RF1S630SM
Typical Performance Curves
1.25
ID = 250µA
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
-40040
T
, JUNCTION TEMPERATURE (oC)
J
Unless Otherwise Specified (Continued)
80
120160
FIGURE 10. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
10
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
8
2000
1600
1200
800
C, CAPACITANCE (pF)
400
0
C
ISS
C
OSS
C
RSS
1020
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
V
GS
C
ISS
C
RSS
C
OSS
3040501
= 0V, f = 1MHz
= CGS + C
= C
= CDS+ C
GD,CDS
GD
GD
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
100
6
4
2
, TRANSCONDUCTANCE (S)
fs
g
0
02468
ID, DRAIN CURRENT (A)
55oC
o
25
125oC
C
10
10
, SOURCE TO DRAIN CURRENT (A)
SD
I
1
0
150oC
25oC
2341
VSD, SOURCE TO DRAIN VOLTAGE (V)
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
20
ID = 9A
VDS = 40V
15
10
5
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
08162432
20
VDS = 100V
VDS = 160V
IRF630, IRF632
, GATE CHARGE (nC)
Q
g
40
4-206
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
Page 6
IRF630, RF1S630SM
Test Circuits and Waveforms
V
DS
BV
DSS
L
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
+
V
DD
-
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUITFIGURE 16. UNCLAMPED ENERGY WAVEFORMS
t
P
I
AS
t
AV
V
DS
V
DD
t
ON
t
d(ON)
t
R
L
+
V
R
G
DD
-
V
DS
90%
0
r
10%
DUT
V
GS
V
GS
10%
0
50%
PULSE WIDTH
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
12V
BATTERY
0
0.2µF
50kΩ
I
g(REF)
CURRENT
REGULATOR
0.3µF
G
IG CURRENT
SAMPLING
RESISTORRESISTOR
SAME TYPE
AS DUT
D
DUT
S
CURRENT
I
D
SAMPLING
(ISOLATED
SUPPLY)
V
DS
V
DD
Q
g(TOT)
Q
gd
Q
gs
V
DS
0
I
G(REF)
0
t
d(OFF)
90%
V
GS
t
OFF
50%
t
f
90%
10%
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORMS
4-207
Page 7
IRF630, RF1S630SM
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only .Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
4-208
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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