3. Switching characteristics are independent of operating junction temperature.
SymbolMinTypMaxUnit
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
V
DS(on)
100
−
−
−
−
160
−
−
−
−
5.0
50
−−±100nAdc
2.0
−
−
−
2.92
−8.75
0.023
0.050
4.0
−
0.030
0.060
Vdc
mV/°C
µAdc
Vdc
mV/°C
Vdc
−1.251.45
−31−mhos
−22503150pF
−620860
−135265
−1525ns
−95180
−74150
−100190
−72135nC
−13−
−37−
−
−
−148−
1.06
0.95
1.5
−
Vdc
ns
−106−
−42−
−0.66−µC
C
C
C
t
d(on)
t
d(off)
Q
Q
Q
V
t
t
t
FS
iss
oss
rss
t
tot
gs
gd
SD
rr
a
b
RR
r
f
Ω
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2
Page 3
NTP52N10
100
VGS = 10 V
8 V
80
7 V
60
40
20
, DRAIN CURRENT (AMPS)
D
I
0
0
231
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
Figure 1. On−Region CharacteristicsFigure 2. Transfer Characteristics
0.05
VGS = 10 V
0.04
0.03
0.02
9 V
4 V
4675
TJ = 100°C
TJ = 25°C
4.5 V
TJ = 25°C
6 V
5.5 V
5 V
89
100
80
60
40
20
, DRAIN CURRENT (AMPS)
D
I
0
10
236
0.05
TJ = 25°C
0.04
0.03
0.02
VDS ≥ 10 V
TJ = 25°C
TJ = 100°C
TJ = −55°C
45
, GATE−TO−SOURCE VOLTAGE (VOLTS)
V
GS
VGS = 10 V
VGS = 15 V
87
0.01
TJ = −55°C
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0
DS(on)
R
10
30
204050100
607090
80
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus
Drain Current and Temperature
2.5
ID = 26 A
V
= 10 V
GS
2
1.5
1
(NORMALIZED)
0.5
, DRAIN−TO−SOURCE RESISTANCE
DS(on)
−6090600−30150
R
TJ, JUNCTION TEMPERATURE (°C)
30
120
0.01
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0
DS(on)
R
0
20406010080
ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
10000
, LEAKAGE (nA)
I
VGS = 0 V
TJ = 150°C
1000
100
DSS
TJ = 100°C
10
3070605040100
80
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
90
Figure 5. On−Resistance Variation with
Temperature
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Figure 6. Drain−To−Source Leakage
Current versus Voltage
3
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NTP52N10
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge
controlled. The lengths of various switching intervals (∆t)
are determined by how fast the FET input capacitance can
be charged by current from the generator.
The published capacitance data is difficult to use for
calculating rise and fall because drain−gate capacitance
varies greatly with applied voltage. Accordingly, gate
charge data is used. In most cases, a satisfactory estimate of
average input current (I
rudimentary analysis of the drive circuit so that
t = Q/I
G(AV)
During the rise and fall time interval when switching a
resistive load, VGS remains virtually constant at a level
known as the plateau voltage, V
times may be approximated by the following:
tr = Q2 x RG/(VGG − V
tf = Q2 x RG/V
GSP
GSP
where
VGG = the gate drive voltage, which varies from zero to V
RG = the gate drive resistance
and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is
not constant. The simplest calculation uses appropriate
values from the capacitance curves in a standard equation for
voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
) can be made from a
G(AV)
. Therefore, rise and fall
SGP
)
− V
GSP
)]
GG
GSP
)
GG
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when
calculating t
on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements
complicate the analysis. The inductance of the MOSFET
source lead, inside the package and in the circuit wiring
which is common to both the drain and gate current paths,
produces a voltage at the source which reduces the gate drive
current. The voltage is determined by Ldi/dt, but since di/dt
is a function of drain current, the mathematical solution is
complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
finite internal gate resistance which effectively adds to the
resistance of the driving source, but the internal resistance
is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate
resistance (Figure 9) shows how typical switching
performance is affected by the parasitic circuit elements. If
the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
The circuit used to obtain the data is constructed to minimize
common inductance in the drain and gate circuit loops and
is believed readily achievable with board mounted
components. Most power electronic loads are inductive; the
data in the figure is taken with a resistive load, which
approximates an optimally snubbed inductive load. Power
MOSFETs may be safely operated into an inductive load;
however, snubbing reduces switching losses.
6000
5000
4000
3000
2000
C, CAPACITANCE (pF)
1000
C
iss
C
rss
0
10502510515
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
VGS = 0 VVDS = 0 V
C
rss
V
GS
Figure 7. Capacitance Variation
DS
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4
TJ = 25°C
20
C
iss
C
oss
Page 5
20
18
16
14
12
10
, GATE−TO−SOURCE VOLTAGE (VOLTS)
GS
V
8
Q
1
6
4
2
0
0
207040
10503060
, TOTAL GATE CHARGE (nC)
Q
G
Q
T
V
Q
2
V
DS
ID = 52 A
T
J
Figure 8. Gate−T o−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
60
VGS = 0 V
50
T
= 25°C
J
GS
= 25°C
NTP52N10
V
DS
1000
100
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
80
60
40
20
0
100
t, TIME (ns)
10
t
t
r
d(off)
t
d(on)
VDD = 80 V
I
= 52 A
D
= 10 V
V
GS
1
110100
RG, GATE RESISTANCE (OHMS)
t
f
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
40
30
20
10
, SOURCE CURRENT (AMPS)
S
I
0
0.350.450.550.650.750.85
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous drain−to−source voltage and
drain current that a transistor can handle safely when it is
forward biased. Curves are based upon maximum peak
junction temperature and a case temperature (TC) of 25°C.
Peak repetitive pulsed power limits are determined by using
the thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal
Resistance−General Data and Its Use.”
Switching between the off−state and the on−state may
traverse any load line provided neither rated peak current
(I
) nor rated voltage (V
DM
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 µs. In addition the total
power averaged over a complete switching cycle must not
exceed (T
J(MAX)
− TC)/(R
).
JC
θ
A Power MOSFET designated E−FET can be safely used
in switching circuits with unclamped inductive loads. For
0.950.25
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases non−linearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many E−FETs can withstand the stress of
drain−to−source avalanche at currents up to rated pulsed
current (I
), the energy rating is specified at rated
DM
continuous current (ID), in accordance with industry custom.
The energy rating must be derated for temperature as shown
in the accompanying graph (Figure 12). Maximum e ner gy a t
currents below rated continuous I
can safely be assumed to
D
equal the values indicated.
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Page 6
NTP52N10
SAFE OPERATING AREA
1000
VGS = 20 V
SINGLE PULSE
= 25°C
T
100
C
10
1
, DRAIN CURRENT (AMPS)
D
I
R
LIMIT
DS(on)
THERMAL LIMIT
PACKAGE LIMIT
0.1
0.11100
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
10150
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.02
(NORMALIZED)
0.01
r(t). EFFECTIVE TRANSIENT THERMAL RESISTANCE
0.01
SINGLE PULSE
800
700
10 µs
100 µs
1 ms
10 ms
dc
1000
600
500
400
300
200
100
AVALANCHE ENERGY (mJ)
, SINGLE PULSE DRAIN−TO−SOURCE
0
255075100125
AS
E
Figure 12. Maximum Avalanche Energy versus
P
(pk)
t
1
t
2
DUTY CYCLE, D = t1/t
t, TIME (µs)
Figure 13. Thermal Response
ID = 40 A
TJ, STARTING JUNCTION TEMPERATURE (°C)
Starting Junction Temperature
R
(t) = r(t) R
θ
JC
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t
T
− TC = P
J(pk)
2
θ
JC
(pk)
1
R
(t)
θ
JC
1.0100.10.010.0010.00010.00001
di/dt
I
S
t
rr
t
t
a
b
TIME
I
S
0.25 I
S
t
p
Figure 14. Diode Reverse Recovery Waveform
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NTP52N10
PACKAGE DIMENSIONS
TO−220 THREE−LEAD
TO−220AB
CASE 221A−09
ISSUE AA
SEATING
−T−
PLANE
B
4
Q
123
F
T
A
U
C
S
H
K
Z
L
V
R
J
G
D
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL
BODY AND LEAD IRREGULARITIES ARE
ALLOWED.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
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Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
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NTP52N10/D
8
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