Datasheet NTP52N10 Datasheet (ON Semiconductor)

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NTP52N10
Power MOSFET 52 Amps, 100 Volts
N−Channel Enhancement Mode TO−220
Source−to−Drain Diode Recovery Time comparable to a Discrete
Fast Recovery Diode
Avalanche Energy Specified
I
and R
DSS
T ypical Applications
PWM Motor Controls
Power Supplies
Converters
MAXIMUM RATINGS (T
Drain−to−Source Voltage V Drain−to−Source Voltage (RGS = 1.0 MΩ) V Gate−to−Source Voltage
− Continuous
− Non−Repetitive (t
Drain− Continuous @ TA 25°C
− Continuous @ T
− Pulsed (Note 1.)
Total Power Dissipation @ TA 25°C
Derate above 25°C
Operating and Storage Temperature Range TJ, T
Single Drain−to−Source Avalanche Energy
− Starting T (V
= 50 V, VGS = 10 Vdc,
DD
I
(pk) = 40 A, L = 1.0 mH, RG = 25 Ω)
L
Thermal Resistance
− Junction−to−Case
− Junction−to−Ambient
Maximum Lead Temperature for Soldering
Purposes, 1/8 from case for 10 seconds
1. Pulse Test: Pulse Width = 10 µs, Duty Cycle = 2%.
Specified at Elevated Temperature
DS(on)
= 25°C unless otherwise noted)
C
Rating Symbol Value Unit
stg
100 Vdc 100 Vdc
2040
52 40
156 178
1.43
−55 to +150
800 mJ
0.7
62.5 260 °C
= 25°C
J
10 ms)
p
100°C
A
V
V
I
E
R R
DSS DGR
GS
GSM
I
D
I
D
DM
P
D
AS
θ
JC
θ
JA
T
L
Vdc
Adc
Watts
W/°C
°C
°C/W
1
2
3
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52 AMPERES
100 VOLTS
D
= 10 V
GS
S
Gate
1
30 m @ V
N−Channel
G
MARKING DIAGRAM
& PIN ASSIGNMENT
4
TO−220AB
CASE 221A
STYLE 5
NTP52N10 = Device Code LL = Location Code Y = Year WW = Work Week
4
Drain
NTP52N10 LLYWW
3 Source
2
Drain
Semiconductor Components Industries, LLC, 2003
December, 2003 − Rev. 2
ORDERING INFORMATION
Device Package Shipping
NTP52N10 TO−220AB 50 Units/Rail
1 Publication Order Number:
NTP52N10/D
Page 2
NTP52N10
)
f = 1.0 MHz)
(V
DD
80 Vdc, I
D
Adc
)
V
GS
Vdc)
)
diS/dt = 100 A/µs)
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
C
Characteristic
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
(V
= 0 Vdc, ID = 250 µAdc)
GS
Temperature Coefficient (Positive) Zero Gate Voltage Drain Current
= 0 Vdc, VDS = 100 Vdc, TJ =25°C)
(V
GS
= 0 Vdc, VDS = 100 Vdc, TJ =125°C)
(V
GS
Gate−Body Leakage Current (VGS = ±20 Vdc, VDS = 0 Vdc) I
ON CHARACTERISTICS
Gate Threshold Voltage
= VGS, ID = 250 µAdc)
(V
DS
Temperature Coefficient (Negative) Static Drain−to−Source On−State Resistance
= 10 Vdc, ID = 26 Adc)
(V
GS
(V
= 10 Vdc, ID = 26 Adc, TJ = 125°C)
GS
Drain−to−Source On−Voltage
= 10 Vdc, ID = 52 Adc)
(V
GS
Forward Transconductance (VDS = 26 Vdc, ID = 10 Adc) g
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz
Transfer Capacitance
SWITCHING CHARACTERISTICS (Notes 2. & 3.)
Turn−On Delay Time Rise Time Turn−Off Delay Time
(V
= 80 Vdc, ID = 52 Adc,
DD
= 10 Vdc, RG = 9.1 Ω)
V
GS
52
,
Fall Time t Gate Charge
(VDS = 80 Vdc, ID = 52 Adc,
V
= 10 Vdc
= 10
BODY−DRAIN DIODE RATINGS (Note 2.)
Diode Forward On−Voltage
(IS = 52 Adc, VGS = 0 Vdc)
(I
= 52 Adc, VGS = 0 Vdc, TJ = 125°C)
S
Reverse Recovery Time
(IS = 52 Adc, VGS = 0 Vdc,
di
/dt = 100 A/µs
Reverse Recovery Stored Charge Q
2. Indicates Pulse Test: P.W. = 300 µs Max, Duty Cycle = 2%.
3. Switching characteristics are independent of operating junction temperature.
Symbol Min Typ Max Unit
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
V
DS(on)
100
160
5.0 50
±100 nAdc
2.0
2.92
−8.75
0.023
0.050
4.0
0.030
0.060
Vdc
mV/°C
µAdc
Vdc
mV/°C
Vdc
1.25 1.45
31 mhos
2250 3150 pF
620 860
135 265
15 25 ns
95 180
74 150
100 190
72 135 nC
13
37
148
1.06
0.95
1.5
Vdc
ns
106
42
0.66 µC
C C C
t
d(on)
t
d(off)
Q
Q
Q
V
t t t
FS
iss oss rss
t
tot
gs
gd
SD
rr
a
b RR
r
f
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NTP52N10
100
VGS = 10 V
8 V
80
7 V
60
40
20
, DRAIN CURRENT (AMPS)
D
I
0
0
231
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
0.05 VGS = 10 V
0.04
0.03
0.02
9 V
4 V
4675
TJ = 100°C
TJ = 25°C
4.5 V
TJ = 25°C
6 V
5.5 V
5 V
89
100
80
60
40
20
, DRAIN CURRENT (AMPS)
D
I
0
10
23 6
0.05 TJ = 25°C
0.04
0.03
0.02
VDS 10 V
TJ = 25°C
TJ = 100°C
TJ = −55°C
45
, GATE−TO−SOURCE VOLTAGE (VOLTS)
V
GS
VGS = 10 V
VGS = 15 V
87
0.01
TJ = −55°C
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0
DS(on)
R
10
30
20 40 50 100
60 70 90
80
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus
Drain Current and Temperature
2.5 ID = 26 A
V
= 10 V
GS
2
1.5
1
(NORMALIZED)
0.5
, DRAIN−TO−SOURCE RESISTANCE
DS(on)
−60 90600−30 150
R
TJ, JUNCTION TEMPERATURE (°C)
30
120
0.01
, DRAIN−TO−SOURCE RESISTANCE (Ω)
0
DS(on)
R
0
20 40 60 10080
ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
10000
, LEAKAGE (nA) I
VGS = 0 V
TJ = 150°C
1000
100
DSS
TJ = 100°C
10
30 70605040 100
80
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
90
Figure 5. On−Resistance Variation with
Temperature
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Figure 6. Drain−To−Source Leakage
Current versus Voltage
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NTP52N10
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (I rudimentary analysis of the drive circuit so that
t = Q/I
G(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, V times may be approximated by the following:
tr = Q2 x RG/(VGG − V tf = Q2 x RG/V
GSP
GSP
where VGG = the gate drive voltage, which varies from zero to V RG = the gate drive resistance and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
) can be made from a
G(AV)
. Therefore, rise and fall
SGP
)
− V
GSP
)]
GG
GSP
)
GG
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when calculating t on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
6000
5000
4000
3000
2000
C, CAPACITANCE (pF)
1000
C
iss
C
rss
0
10 5 0 2510515
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
VGS = 0 VVDS = 0 V
C
rss
V
GS
Figure 7. Capacitance Variation
DS
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TJ = 25°C
20
C
iss
C
oss
Page 5
20 18 16 14 12
10
, GATE−TO−SOURCE VOLTAGE (VOLTS)
GS
V
8
Q
1
6 4 2
0
0
20 7040
10 5030 60
, TOTAL GATE CHARGE (nC)
Q
G
Q
T
V
Q
2
V
DS
ID = 52 A T
J
Figure 8. Gate−T o−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
60
VGS = 0 V
50
T
= 25°C
J
GS
= 25°C
NTP52N10
V
DS
1000
100
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
80
60
40
20
0
100
t, TIME (ns)
10
t
t
r
d(off)
t
d(on)
VDD = 80 V I
= 52 A
D
= 10 V
V
GS
1
1 10 100
RG, GATE RESISTANCE (OHMS)
t
f
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
40
30
20
10
, SOURCE CURRENT (AMPS)
S
I
0
0.35 0.45 0.55 0.65 0.75 0.85
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance−General Data and Its Use.”
Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (I
) nor rated voltage (V
DM
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 µs. In addition the total power averaged over a complete switching cycle must not exceed (T
J(MAX)
− TC)/(R
).
JC
θ
A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For
0.950.25
reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature.
Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (I
), the energy rating is specified at rated
DM
continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum e ner gy a t currents below rated continuous I
can safely be assumed to
D
equal the values indicated.
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NTP52N10
SAFE OPERATING AREA
1000
VGS = 20 V SINGLE PULSE
= 25°C
T
100
C
10
1
, DRAIN CURRENT (AMPS)
D
I
R
LIMIT
DS(on)
THERMAL LIMIT PACKAGE LIMIT
0.1
0.1 1 100 , DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
10 150
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
1.0 D = 0.5
0.2
0.1
0.1
0.05
0.02
(NORMALIZED)
0.01
r(t). EFFECTIVE TRANSIENT THERMAL RESISTANCE
0.01
SINGLE PULSE
800 700
10 µs
100 µs
1 ms
10 ms dc
1000
600 500 400 300 200
100
AVALANCHE ENERGY (mJ)
, SINGLE PULSE DRAIN−TO−SOURCE
0
25 50 75 100 125
AS
E
Figure 12. Maximum Avalanche Energy versus
P
(pk)
t
1
t
2
DUTY CYCLE, D = t1/t
t, TIME (µs)
Figure 13. Thermal Response
ID = 40 A
TJ, STARTING JUNCTION TEMPERATURE (°C)
Starting Junction Temperature
R
(t) = r(t) R
θ
JC
D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t T
− TC = P
J(pk)
2
θ
JC
(pk)
1
R
(t)
θ
JC
1.0 100.10.010.0010.00010.00001
di/dt
I
S
t
rr
t
t
a
b
TIME
I
S
0.25 I
S
t
p
Figure 14. Diode Reverse Recovery Waveform
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NTP52N10
PACKAGE DIMENSIONS
TO−220 THREE−LEAD
TO−220AB
CASE 221A−09
ISSUE AA
SEATING
−T−
PLANE
B
4
Q
123
F
T
A
U
C
S
H
K
Z
L
V
R J
G
D
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED.
DIM MIN MAX MIN MAX
A 0.570 0.620 14.48 15.75 B 0.380 0.405 9.66 10.28 C 0.160 0.190 4.07 4.82 D 0.025 0.035 0.64 0.88
F 0.142 0.147 3.61 3.73 G 0.095 0.105 2.42 2.66 H 0.110 0.155 2.80 3.93
J 0.018 0.025 0.46 0.64 K 0.500 0.562 12.70 14.27
L 0.045 0.060 1.15 1.52 N 0.190 0.210 4.83 5.33 Q 0.100 0.120 2.54 3.04 R 0.080 0.110 2.04 2.79 S 0.045 0.055 1.15 1.39
T 0.235 0.255 5.97 6.47 U 0.000 0.050 0.00 1.27 V 0.045 −−− 1.15 −−−
Z −−− 0.080 −−− 2.04
STYLE 5:
PIN 1. GATE
2. DRAIN
MILLIMETERSINCHES
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NTP52N10
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to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
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