The NE5517 contains two current-controlled transconductance
amplifiers, each with a differential input and push-pull output. The
NE5517 offers significant design and performance advantages over
similar devices for all types of programmable gain applications.
Circuit performance is enhanced through the use of linearizing diodes
at the inputs which enable a 10 dB signal-to-noise improvement
referenced to 0.5% THD. The NE5517 is suited for a wide variety of
industrial and consumer applications.
Constant impedance of the buffers on the chip allow general use of
the NE5517. These buffers are made of Darlington transistors and a
biasing network that virtually eliminate the change of offset voltage
due to a burst in the bias current I
noise that could otherwise be heard in high quality audio applications.
Features
• Constant Impedance Buffers
• DV
of Buffer is Constant with Amplifier I
BE
• Excellent Matching Between Amplifiers
• Linearizing Diodes
• High Output Signal-to-Noise Ratio
• This is a Pb−Free Device
Applications
• Multiplexers
• Timers
• Electronic Music Synthesizers
• Dolby® HX Systems
• Current-Controlled Amplifiers, Filters
• Current-Controlled Oscillators, Impedances
, hence eliminating the audible
ABC
Change
BIAS
DATA SHEET
www.onsemi.com
1
SOIC−16
D SUFFIX
CASE 751B
MARKING DIAGRAM
xx5517DG
AWLYWW
1
xx= NE
A= Assembly Location
WL= Wafer Lot
YY, Y = Year
WW = Work Week
G= Pb−Free Package
PIN CONNECTIONS
1
I
ABCa
2
D
a
3
+IN
a
4
−IN
a
5
VO
a
6
V−
IN
BUFFERa
VO
BUFFERa
7
8
(Top View)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 13 of this data sheet.
NOTE: V+ of output buffers and amplifiers are internally connected.
Figure 2. Connection Diagram
B
BUFFER
OUTPUT
BUFFER
OUTPUT
A
MAXIMUM RATINGS
RatingSymbolValueUnit
Supply Voltage (Note 1)V
Power Dissipation, T
= 25 °C (Still Air) (Note 2)P
amb
Thermal Resistance, Junction−to−Ambient
Differential Input VoltageV
Diode Bias CurrentI
Amplifier Bias CurrentI
Output Short-Circuit DurationI
Buffer Output Current (Note 3)I
Operating Temperature RangeT
Operating Junction TemperatureT
DC Input VoltageV
Storage Temperature RangeT
Lead Soldering Temperature (10 sec max)T
R
ABC
OUT
S
D
q
JA
IN
D
SC
amb
J
DC
stg
sld
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. For selections to a supply voltage above ±22 V, contact factory.
2. The following derating factors should be applied above 25 °C
D package at 7.1 mW/°C.
3. Buffer output current should be limited so as to not exceed package dissipation.
44 VDC or ±22V
1125mW
140°C/W
±5.0V
2.0mA
2.0mA
Indefinite
20mA
0 °C to +70 °C°C
150°C
+VS to −V
S
−65 °C to +150 °C°C
230°C
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3
Page 4
NE5517
ELECTRICAL CHARACTERISTICS (Note 4)
Characteristic
Input Offset Voltage
DVOS/DT
VOS Including DiodesDiode Bias Current
Input Offset Change
Input Offset CurrentI
DIOS/DT
Input Bias Current
DIB/DT
Forward Transconductance
gM Tracking0.3dB
Peak Output Current
Peak Output Voltage
Positive
Negative
Supply Current
VOS Sensitivity
Positive
Negative
Common-mode Rejection RationCMRR8011 0dB
Common-mode Range±12±13.5V
CrosstalkReferred to Input (Note 5)
Differential Input CurrentI
Leakage CurrentI
Input ResistanceR
Open-loop BandwidthB
Slew RateUnity Gain CompensatedSR50
Buffer Input Current5IN
Peak Buffer Output Voltage5VO
DVBE of Buffer
4. These specifications apply for VS = ±15 V, T
specified. The inputs to the buffers are grounded and outputs are open.
5. These specifications apply for V
is connected to the transconductance amplifier output.
6. V
= ±15, R
S
= 5.0 kW connected from Buffer output to −VS and 5.0 mA ≤ I
OUT
= ±15 V, I
S
= 25°C, amplifier bias current (I
amb
= 500 mA, R
ABC
Test ConditionsSymbolMinTypMaxUnit
Overtemperature Range
5.0 mA
I
ABC
V
OS
0.4
0.3
Avg. TC of Input Offset Voltage7.0
0.55mV
) = 500 mA
(I
D
5.0 mA ≤ I
ABC
≤ 500 mA
V
OS
OS
0.1mV
0.10.6
Avg. TC of Input Offset Current0.001
Overtemperature Range
I
BIAS
0.4
1.0
Avg. TC of Input Current0.01
Overtemperature Range
RL = 0, I
= 0, I
R
L
RL = 0, Overtemperature
ABC
ABC
= 5.0 mA
= 500 mA
g
I
OUT
6700
M
5400
960013000
5.0
500
350
650
300
Range
RL = ∞, 5.0 mA ≤ I
= ∞, 5.0 mA ≤ I
R
L
I
= 500 mA, both channels
ABC
D VOS/D V+
/D V−
D V
OS
ABC
ABC
≤ 500 mA
≤ 500 mA
OUT
I
CC
+12
−12
+14.2
−14.4
2.64.0mA
20
150
20
150
V
100dB
20 Hz < f < 20 kHz
= 0, Input = ±4.0 VI
ABC
= 0 (Refer to Test Circuit)0.2100nA
ABC
IN
IN
W
BUFFER
BUFFER
Refer to Buffer VBE Test
0.02100nA
1026
2.0MHz
0.45.0
10V
0.55.0mV
Circuit (Note 6)
) = 500 mA, Pins 2 and 15 open unless otherwise
ABC
= 5.0 kW connected from the buffer output to −VS and the input of the buffer
Figure 17. Leakage Current Test CircuitFigure 18. Differential Input Current Test Circuit
V+
V
50kW
V−
Figure 19. Buffer V
Test Circuit
BE
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6
Page 7
NE5517
APPLICATIONS
+15V
0.01mF
INPUT
10kW
390pF
51W
1.3kW
3, 14
2, 15
4, 13
Figure 20. Unity Gain Follower
CIRCUIT DESCRIPTION
The circuit schematic diagram of one-half of the NE5517,
a dual operational transconductance amplifier with
linearizing diodes and impedance buffers, is shown in
Figure 21.
Transconductance Amplifier
The transistor pair, Q4 and Q5, forms a transconductance
stage. The ratio of their collector currents (I
respectively) is defined by the differential input voltage, V
and I5,
4
IN
which is shown in Equation 1.
VIN+
KT
In
q
I
4
(eq. 1)
I
5
Where VIN is the difference of the two input voltages
KT ≅ 26 mV at room temperature (300°k).
Transistors Q
focuses the sum of current I
current I
B
, Q2 and diode D1 form a current mirror which
1
and I5 to be equal to amplifier bias
4
:
I4) I5+ I
B
(eq. 2)
−
+
1, 16
0.01mF
62kW
5, 12
7, 10
8, 9
5kW
−15V
OUTPUT
NE5517
10kW
11
6
−15V
0.001mF
If VIN is small, the ratio of I5 and I4 will approach unity and
the Taylor series of In function can be approximated as
[
B
I5* I
2KT
q
ǒ
2KT
I
I
B
4
4
B
I5* I
I
B
q
Ǔ
4
KT
q
4
+
IN
I
5
KT
In
q
I
4
and I4^ I5^ I
5
[
4
I5* I
KT
q
1ń2I
I5* I4+ V
I
KT
In
q
I
,
The remaining transistors (Q6 to Q11) and diodes (D4 to D6)
form three current mirrors that produce an output current equal
to I
minus I4. Thus:
5
V
q
ǒ
Ǔ
I
The term
B
is then the transconductance of the amplifier
2KT
and is proportional to I
q
ǒ
Ǔ
I
IN
B
.
B
2KT
+ I
O
+ V
(eq. 3)
(eq. 4)
IN
(eq. 5)
V+
11
2,15
−INPUT
AMP BIAS
INPUT
V−
6
4,13
1,16
Q11
Q9
D6
Q14
V
OUTPUT
5,12
Q15 Q16
R1
D5
7,10
D7
D8
Q12
Q13
8,9
Q3
D4
Q6
Q7
Q5
D3
+INPUT
3,14
D2
Q4
Q2
Q1
D1
Q10
Q8
Figure 21. Circuit Diagram of NE5517
www.onsemi.com
7
Page 8
NE5517
Linearizing Diodes
For VIN greater than a few millivolts, Equation 3 becomes
invalid and the transconductance increases non-linearly.
Figure 22 shows how the internal diodes can linearize the
transfer function of the operational amplifier. Assume D
and D3 are biased with current sources and the input signal
current is I
that is: I
= (I
4
I
I
S
. Since I
S
− I0), I
B
I
D
2
D
1/2I
S
* I
3
D
S
1/2I
D
5
+VS
I
= (I
I
D
2
+ I
4
D
) I
= IB and I
5
+ I0)
B
S
D
2
I0+ I5* I
I
4
Q
4
−VS
I
B
− I
5
I0+ 2I
4
I
I
5
= I0,
4
I
B
ǒ
S
I
D
5
Figure 22. Linearizing Diode
For the diodes and the input transistors that have identical
geometries and are subject to similar voltages and
temperatures, the following equation is true:
I
D
) I
2
I
D
* I
2
IO+ I
S
S
S
+
2IB
I
D
KT
In
q
for |IS| t
T
In
q
1ń2(I
1ń2(I
) IO)
B
* IO)
B
I
D
2
(eq. 6)
The only limitation is that the signal current should not
exceed I
.
D
Impedance Buffer
The upper limit of transconductance is defined by the
maximum value of I
(2.0 mA). The lowest value of IB for
B
which the amplifier will function therefore determines the
overall dynamic range. At low values of I
2
, a buffer with
B
very low input bias current is desired. A Darlington
amplifier with constant-current source (Q
D
, and R1) suits the need.
8
, Q15, Q16, D7,
14
APPLICATIONS
Voltage-Controlled Amplifier
In Figure 23, the voltage divider R2, R3 divides the
Ǔ
input-voltage into small values (mV range) so the amplifier
operates in a linear manner.
It is:
R
I
+*VIN@
OUT
+ I
V
OUT
V
OUT
A +
V
IN
(3) g
+
M
(gM in mmhos for I
Since gM is directly proportional to I
is controlled by the voltage V
When V
is taken relative to −VCC the following formula
C
3
@ RL;
3
ABC
@ gM;
3
@ gM@ R
3
ABC
in mA)
R2) R
OUT
R
R2) R
= 19.2 I
ABC
in a simple way.
C
L
, the amplification
is valid:
* 1.2V)
(V
+
C
R
1
I
ABC
The 1.2 V is the voltage across two base-emitter baths in
the current mirrors. This circuit is the base for many
applications of the NE5517.
V
IN
R4 = R2/ /R
R
2
V
C
+V
CC
R
I
1
3
3
+
11
NE5517
6
−
4
R
3
TYPICAL VALUES:
ABC
1
5
7
I
OUT
R
L
R1 = 47kW
R
= 10kW
2
R
= 200W
3
= 200W
R
4
RL = 100kW
R
= 47kW
S
INT
+V
CC
8
V
OUT
R
S
INT
−V
CC
Figure 23.
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8
Page 9
NE5517
Stereo Amplifier With Gain Control
Figure 24 shows a stereo amplifier with variable gain via
a control input. Excellent tracking of typical 0.3 dB is easy
to achieve. With the potentiometer, R
, the offset can be
P
adjusted. For AC-coupled amplifiers, the potentiometer
may be replaced with two 510 W resistors.
V
IN1
V
V
IN2
10kW
R
IN
1k
30kW
C
R
C
10kW
R
IN
1k
15kW
R
P
R
D
+V
CC
15kW
R
P
+V
CC
15
R
D
14
13
Modulators
Because the transconductance of an OTA (Operational
Transconductance Amplifier) is directly proportional to I
the amplification of a signal can be controlled easily. The
output current is the product from transconductance×input
voltage. The circuit is effective up to approximately 200 kHz.
Modulation of 99% is easy to achieve.
+V
CC
3
+
4
NE5517
−
+
NE5517
−
11
I
ABC
1
R
L
10kW
16
I
ABC
6
10
12
R
L
10kW
5.1kW
R
S
8
9
INT
+V
V
OUT1
−V
+V
V
OUT2
−V
INT
CC
CC
CC
CC
ABC
,
V
IN2
SIGNAL
V
IN1
CARRIER
Figure 24. Gain-Controlled Stereo Amplifier
R
C
V
OS
10kW
1kW
30kW
I
D
15kW
I
ABC
+V
CC
11
3
+
2
NE5517
−
4
6
−V
CC
1
Figure 25. Amplitude Modulator
INT
+V
CC
5
R
L
10kW
7
8
V
OUT
R
S
−V
CC
INT
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9
Page 10
NE5517
Voltage-Controlled Resistor (VCR)
Because an OTA is capable of producing an output current
proportional to the input voltage, a voltage variable resistor
can be made. Figure 26 shows how this is done. A voltage
presented at the R
This voltage is multiplied by g
through the R
terminals forces a voltage at the input.
X
and thereby forces a current
M
terminals:
X
R
+
x
R ) R
gM) R
A
A
where gM is approximately 19.21 mMHOs at room
temperature. Figure 27 shows a Voltage Controlled Resistor
using linearizing diodes. This improves the noise
performance of the resistor.
Voltage-Controlled Filters
Figure 28 shows a Voltage Controlled Low-Pass Filter.
The circuit is a unity gain buffer until X
R/R
. Then, the frequency response rolls off at a 6dB per
A
C/gM
is equal to
octave with the −3 dB point being defined by the given
equations. Operating in the same manner, a Voltage
Controlled High-Pass Filter is shown in Figure 29. Higher
order filters can be made using additional amplifiers as
shown in Figures 30 and 31.
Voltage-Controlled Oscillators
Figure 32 shows a voltage-controlled triangle-square
wave generator. With the indicated values a range from
2.0 Hz to 200 kHz is possible by varying I
from 1.0 mA
ABC
to 10 mA.
The output amplitude is determined by I
OUT
× R
OUT
.
Please notice the differential input voltage is not allowed
to be above 5.0 V.
With a slight modification of this circuit you can get the
sawtooth pulse generator, as shown in Figure 33.
APPLICATION HINTS
To hold the transconductance gM within the linear range,
I
should be chosen not greater than 1.0 mA. The current
ABC
mirror ratio should be as accurate as possible over the entire
current range. A current mirror with only two transistors is
not recommended. A suitable current mirror can be built
with a PNP transistor array which causes excellent matching
and thermal coupling among the transistors. The output
current range of the DAC normally reaches from 0 to
−2.0 mA. In this application, however, the current range is
set through R
I
(10 kW) to 0 to −1.0 mA.
REF
V
DACMAX
+ 2 @
REF
R
REF
+ 2 @
5V
10kW
+ 1mA
200W200W
R ) R
+V
CC
3
2
4
+
NE5517
−
−V
11
CC
30kW
I
O
5
7
C
100kW
8
R
10kW
R
X
V
V
−V
+V
INT
C
INT
RX+
CC
OUT
CC
gM@ R
A
A
Figure 26. VCR
+V
CC
I
D
R
P
V
OS
1kW
+V
3
2
NE5517
4
−V
CC
1
CC
11
6
30kW
5
7
C
R
X
8
R
100kW
10kW
−V
V
INT
+V
INT
C
CC
CC
Figure 27. VCR with Linearizing Diodes
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10
Page 11
NE5517
NOTE:
fO+
V
NULL
NOTE:
fO+
V
IN
g(R ) RA) 2pC
+V
CC
OS
-V
CC
RAg
g(R ) RA) 2pC
30kW
5
7
C
100kW10kW
R
100kW
RAg
200W
M
1
+V
CC
3
2
R
A
4
200W
+
NE5517
−
−V
11
6
CC
I
ABC
150pF
Figure 28. Voltage-Controlled Low-Pass Filter
30kW
5
7
C
100kW10kW
R
100kW
1kW
1
+V
CC
3
2
R
A
1kW
M
4
+
NE5517
−
−V
11
6
CC
I
ABC
0.005mF
V
C
INT
+V
CC
8
V
OUT
−V
CC
INT
V
C
INT
+V
CC
8
V
OUT
−V
CC
INT
V
IN
fO+
NOTE:
200W
R
A
200
RAg
M
(R ) RA)2p C
+V
+
NE5517
−
−V
Figure 29. Voltage-Controlled High-Pass Filter
CC
CC
C
100pF
R
100kW10kW
100kW
-V
CC
+V
200W
CC
R
100
kW
A
Figure 30. Butterworth Filter − 2nd Order
+
NE5517
−
R
A
200W
15kW
200pF
C
2
10kW
V
C
INT
+V
CC
V
OUT
−V
CC
INT
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11
Page 12
NE5517
10kW
800pF
20kW
15kW
5.1kW
LOW
PASS
V
OUT
9
V
C
INT
+V
CC
−V
CC
INT
1kW
1
+V
CC
3
+
11
2
NE5517
−
6
−V
CC
5
7
800pF
20kW5.1kW
+V
20kW
−V
CC
CC
14
15
13
1kW
BANDPASS OUT
+
NE5517
−
16
1210
Figure 31. State Variable Filter
V
C
30kW
+V
CC
4
−
11
NE5517
3
+
6
−V
CC
1
0.1mF
5
7
C
20kW
INT
+V
CC
13
−
NE5517
8
−V
V
CC
OUT1
+
14
+V
CC
10kW
INT
+V
CC
V
OUT2
−V
CC
INT
GAIN
CONTROL
47kW
1210
16
9
NOTE:
VPK+
V
30kW
(VC* 0.8) R
R1) R
Figure 32. Triangle−Square Wave Generator (VCO)
I
1
2VPKxC
B
0.1mF
I
C
+V
CC
INT
+V
CC
13
5
7
C
20kW
I
f
OSC
2VPKxC
−V
C
V
CC
OUT1
ICttI
8
−
NE5517
+
14
B
16
47kW
1210
R
2
30kW
INT
+V
CC
30kW
−V
CC
V
OUT2
INT
I
C
470kW
C
+V
CC
4
+
11
2
NE5517
3
−
6
R
1
1
TH+
2
−V
CC
2VPKxC
I
B
TL+
Figure 33. Sawtooth Pulse VCO
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12
Page 13
NE5517
ORDERING INFORMATION
DeviceTemperature RangePackageShipping
NE5517DR2G0 to +70 °CSOIC−16
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
2500 / Tape & Reel
†
Intel is a registered trademark of Intel Corporation in the U.S. and/or other countries.
www.onsemi.com
13
Page 14
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SCALE 1:1
−A−
169
−B−
18
G
K
C
−T−
SEATING
PLANE
D
16 PL
0.25 (0.010)A
M
S
B
T
S
CASE 751B−05
8 PLP
0.25 (0.010)B
SOIC−16
ISSUE K
M
DATE 29 DEC 2006
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
M
S
X 45
R
_
F
J
PROTRUSION. ALLOWABLE DAMBAR PROTRUSION
SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL CONDITION.
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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Page 15
onsemi, , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
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information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use
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