Datasheet N74F3040D, N74F3040N Datasheet (Philips)

INTEGRATED CIRCUITS

74F3040

Dual 4-input NAND 30 Ω line driver

Product specification
IC15 Data Handbook

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1990 Jan 29

Philips Semiconductors Product specification

74F3040Dual 4-input NAND 30Ω line driver

FEA TURES

•30Ω line driver

•160mA output drive capability in the Low state

•67mA output drive capability in the High state

•High speed

•Facilitates incident wave switching

•3nh lead inductance each on V

are used

DESCRIPTION

The 74F3040 is a high current Line Driver composed of two 4-input
NAND gates. It has been designed to deal with the transmission line
effects of PC boards which appear when fast edge rates are used.

The drive capability of the 74F3040 is 67mA source and 160mA sink
with a V
with V
driving impedances as low as 30Ω. This is applicable with any
combination of outputs using continuous duty.

The propagation delay of the part is minimally affected by reflections
when terminated only by the TTL inputs of other devices.
Performance may be improved by full or partial line termination.

as low as 4.5V. This guarantees incident wave switching

CC

not less than 2.0V and VOL not more than 0.8V while

OH

and GND when both side pins

CC

PIN CONFIGURATION

1

D0a

2

D0b

3

Q0

4

GND

5

GND

1

6

Q

D1a

8

D1b

TYPICAL

TYPE

PROPAGATION

DELAY

74F3040 2.0ns 10mA

16

NC

15

D0d

14

D0c
V

13

CC

12

V

CC

11

D1d

107

D1c

9

NC

SF01362

TYPICAL

SUPPLY CURRENT

(TOTAL)

ORDERING INFORMATION

COMMERCIAL RANGE

DESCRIPTION

VCC = 5V ±10%,

T

= 0°C to +70°C

amb

16-pin Plastic DIP N74F3040N SOT38-4

16-pin Plastic SOL N74F3040D SOT162-1

PACKAGE
DRAWING

NUMBER

INPUT AND OUTPUT LOADING AND FAN-OUT TABLE

PINS DESCRIPTION

74F(U.L.)

HIGH/LOW

Dna, Dnb, Dnc, Dnd Data inputs 1.0/1.0 20µA/0.6mA
Qn Data outputs 3350/266 67mA/160mA

NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.

LOGIC SYMBOL

VCC = Pin 12, 13
GND = Pin 4, 5
NC = Pin 9, 16

1 2 14 15 7 8 10 11

D1a D1bD0a D0b D0c D1c D1dD0d

Q0 Q1

36

SF01363

IEC/IEEE SYMBOL

1

2

14

15

7

8

10

11

&

LOAD VALUE

HIGH/LOW

3

6

SF01364

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Philips Semiconductors Product specification

SYMBOL

PARAMETER

UNIT

74F3040Dual 4-input NAND 30Ω line driver

LOGIC DIAGRAM

D0a
D0b
D0c
D0d

1

2
14
15

3

Q0

FUNCTION TABLE

Dna Dnb Dnc Dnd Qn

L X X X H
X L X X H
X X L X H

VCC = Pin 12, 13
GND = Pin 4, 5
NC = Pin 9, 16

D1a
D1b
D1c
D1d

7

8
10
11

6

SF01365

Q1

X X X L H

H H H H L

H = High voltage level
L = Low voltage level
X = Don’t care

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)

SYMBOL

V

CC

V

IN

I

IN

V

OUT

I

OUT

T

amb

T

stg

Supply voltage –0.5 to +7.0 V
Input voltage –0.5 to +7.0 V
Input current –30 to +5 mA
Voltage applied to output in High output state –0.5 to V
Current applied to output in Low output state 320 mA
Operating free-air temperature range 0 to +70 °C
Storage temperature range –65 to +150 °C

PARAMETER RATING UNIT

INPUTS OUTPUT

CC

V

RECOMMENDED OPERATING CONDITIONS

V
V
V
I
I
I
T

CC
IH

IL
IK
OH
OL

amb

Supply voltage 4.5 5.0 5.5 V
High-level input voltage 2.0 V
Low-level input voltage 0.8 V
Input clamp current –18 mA
High-level output current –67 mA
Low-level output current 160 mA
Operating free-air temperature range 0 +70 °C

LIMITS

MIN NOM MAX

1990 Jan 29

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Philips Semiconductors Product specification

SYMBOL

PARAMETER

TEST CONDITIONS

1

UNIT

V

CC

MIN

I

45mA

V

MIN

VOLLow-level output current

V

MAX

ICCSupply current (total)

V

MAX

74F3040Dual 4-input NAND 30Ω line driver

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

LIMITS

MIN TYP

±10% V

V

OH

High-level output current

VIL = MAX

=

IH

VCC = MIN

=

p

V

I

I

IH

I

IL

I

O

Input clamp voltage VCC = MIN, II = I

IK

Input current at maximum input

I

voltage
High-level input current VCC = MAX, VI = 2.7V 20 µA
Low-level input current VCC = MAX, VI = 0.5V –0.6 mA
Output current

pp

5

I

CCH

I

CCL

=

IL

VIH = MIN

VCC = MAX, VO = 2.25V –100 –200 mA

= –

OH

I

OH1

= –67mA

3

IOL = 100mA ±10% V

I

OL1

= 160mA

4

IK

VCC = MAX, VI = 7.0V 100 µA

=

CC

±5% V

±10% V

±5% V

CC

CC

CC
CC

CC

2.5 V

2.7 3.4 V

2.0 V

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at V
is the current necessary to guarantee the Low-to-High transition in a 30Ω transmission line on the incident wave.

3. I

OH1

4. I

is the current necessary to guarantee the High-to-Low transition in a 30Ω transmission line on the incident wave.

OL1

is tested under conditions that produce current approximately one half of the true short-circuit output current (IOS).

5. I

O

= 5V, T

CC

amb

= 25°C.

2

MAX

0.30 0.50 V

0.30 0.50 V

–0.73 –1.2 V

3.0 5.0 mA
16 22 mA

AC ELECTRICAL CHARACTERISTICS

SYMBOL PARAMETER

t

PLH

t

PHL

Propagation delay
Dna, Dnb, Dnc, Dnd to Qn

AC WAVEFORMS

For all waveforms, VM = 1.5V.

Dna, Dnb, Dnc, Dnd

Qn

Waveform 1. Propagation Delay for Inputs to Output

TEST

CONDITION

Waveform 1

V

M

t

PHL

V

M

LIMITS

T

= +25°C

amb

VCC = +5.0V

C

= 50pF, RL = 500Ω

L

T

= 0°C to +70°C

amb

VCC = +5.0V ± 10%

C

= 50pF, RL = 500Ω

L

MIN TYP MAX MIN MAX

1.0

1.0

V

M

t

PLH

2.0

2.0

V

M

SF00069

5.0

4.5

1.0

1.0

5.5

5.0

UNIT

ns

1990 Jan 29

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Philips Semiconductors Product specification

74F3040Dual 4-input NAND 30Ω line driver

TEST CIRCUIT AND WAVEFORMS

V

CC

PULSE

GENERATOR

V

IN

R

T

D.U.T.

V

OUT

R

C

L

L

Test Circuit for Totem-Pole Outputs

DEFINITIONS:

= Load resistor;

R

L

see AC ELECTRICAL CHARACTERISTICS for value.

= Load capacitance includes jig and probe capacitance;

C

L

see AC ELECTRICAL CHARACTERISTICS for value.

R

= Termination resistance should be equal to Z

T

pulse generators.

OUT

of

NEGATIVE
PULSE

POSITIVE
PULSE

family

74F

90%

10%

amplitude

3.0V

t

w

V

M

10%

)

V

90%

M

t

THL (tf

t

TLH (tr

)

t

TLH (tr

t

t

w

THL (tf

10%

)

)

90%

V

M

V

Input Pulse Definition

INPUT PULSE REQUIREMENTS

V

M

1.5V

rep. rate

1MHz 500ns

t

w

90%

M

10%

t

TLHtTHL

2.5ns 2.5ns

AMP (V)

0V

AMP (V)

0V

SF00006

1990 Jan 29

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Philips Semiconductors Product specification

Dual 4-input NAND 30 Ω line driver

DIP20: plastic dual in-line package; 20 leads (300 mil) SOT146-1

74F3040

1990 Jan 29

6

Philips Semiconductors Product specification

Dual 4-input NAND 30 Ω line driver

SO20: plastic small outline package; 20 leads; body width 7.5 mm SOT163-1

74F3040

1990 Jan 29

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Philips Semiconductors Product specification

Dual 4-input NAND 30 Ω line driver

Data sheet status

Data sheet
status

Objective
specification

Preliminary
specification

Product
specification

Product
status

Development

Qualification

Production

Definition

This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.

This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.

This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.

[1]

74F3040

[1] Please consult the most recently issued datasheet before initiating or completing a design.

Definitions

Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For

detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one

or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.

Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.

Disclaimers

Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can

reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.

Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.

Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone [phone]

 Copyright Philips Electronics North America Corporation 1998

All rights reserved. Printed in U.S.A.

print code Date of release: 05-96
Document order number: 9397-750-05205

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1990 Jan 29

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