1-157
Package Characteristics
All Typicals at TA = 25°C.
Parameter Sym. Package Min. Typ. Max. Units Test Conditions Fig. Note
Input-Output I
I-O
* Single 8-Pin DIP 1 µA 45% RH, t = 5 s, 20, 21
Insulation Single SO-8 V
I-O
= 3 kV dc, TA = 25°C
Input-Output V
ISO
8-Pin DIP, SO-8 2500 V rms RH ≤ 50%, t = 1 min, 20, 21
Momentary With- Widebody 5000 T
A
= 25°C 20, 22
stand Voltage** OPT 020† 5000
Input-Output R
I-O
8-Pin DIP, SO-8 10
12
Ω V
I-O
= 500 V dc 1, 20,
Resistance Widebody 10
12
10
13
TA = 25°C23
10
11
TA = 100°C
Input-Output C
I-O
8-Pin DIP, SO-8 0.6 pF f = 1 MHz, TA = 25°C 1, 20,
Capacitance Widebody 0.5 0.6 23
Input-Input I
I-I
Dual Channel 0.005 µA RH ≤ 45%, t = 5 s, 24
Insulation V
I-I
= 500 V
Leakage Current
Resistance R
I-I
Dual Channel 10
11
Ω 24
(Input-Input)
Capacitance C
I-I
Dual 8-Pin DIP 0.03 pF f = 1 MHz 24
(Input-Input) Dual SO-8 0.25
*JEDEC registered data for the 6N137. The JEDEC Registration specifies 0°C to 70°C. HP specifies -40°C to 85°C.
**The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output
continuous voltage rating. For the continuous voltage rating refer to the VDE 0884 Insulation Characteristics Table (if applicable),
your equipment level safety specification or HP Application Note 1074 entitled “Optocoupler Input-Output Endurance Voltage.”
†For 6N137, HCPL-2601/2611/2630/2631/4661 only.
Notes:
1. Each channel.
2. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current does
not exceed 20 mA.
3. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current does
not exceed 15 mA.
4. Derate linearly above 80°C free-air temperature at a rate of 2.7 mW/°C for the SOIC-8 package.
5. Bypassing of the power supply line is required, with a 0.1 µF ceramic disc capacitor adjacent to each optocoupler as illustrated in
Figure 17. Total lead length between both ends of the capacitor and the isolator pins should not exceed 20 mm.
6. The JEDEC registration for the 6N137 specifies a maximum IOH of 250 µA. HP guarantees a maximum IOH of 100 µA.
7. The JEDEC registration for the 6N137 specifies a maximum I
CCH
of 15 mA. HP guarantees a maximum I
CCH
of 10 mA.
8. The JEDEC registration for the 6N137 specifies a maximum I
CCL
of 18 mA. HP guarantees a maximum I
CCL
of 13 mA.
9. The JEDEC registration for the 6N137 specifies a maximum IEL of –2.0 mA. HP guarantees a maximum IEL of -1.6 mA.
10. The t
PLH
propagation delay is measured from the 3.75 mA point on the falling edge of the input pulse to the 1.5 V point on the
rising edge of the output pulse.
11. The t
PHL
propagation delay is measured from the 3.75 mA point on the rising edge of the input pulse to the 1.5 V point on the
falling edge of the output pulse.
12. t
PSK
is equal to the worst case difference in t
PHL
and/or t
PLH
that will be seen between units at any given temperature and specified
test conditions.
13. See application section titled “Propagation Delay, Pulse-Width Distortion and Propagation Delay Skew” for more information.
14. The t
ELH
enable propagation delay is measured from the 1.5 V point on the falling edge of the enable input pulse to the 1.5 V
point on the rising edge of the output pulse.
15. The t
EHL
enable propagation delay is measured from the 1.5 V point on the rising edge of the enable input pulse to the 1.5 V point
on the falling edge of the output pulse.
16. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state
(i.e., VO > 2.0 V).
17. CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state
(i.e., VO < 0.8 V).
18. For sinusoidal voltages, (|dVCM | / dt)
max
= πfCMVCM(p-p).