Datasheet HA-5177-883 Datasheet (Intersil Corporation)

Page 1
HA-5177/883
July 1994
Ultra Low Offset Voltage Operational Amplifier
Features
• This Circuit is Processed in Accordance to MIL-STD­883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
• Low Offset Voltage. . . . . . . . . . . . . . . . . . . . .60µV (Max)
10µV (Typ)
0.1µV/
o
C (Max)
o
• Low Offset Voltage Drift . . . . . . . . . . . . 0.6µV/
• High Voltage Gain . . . . . . . . . . . . . . . . . . . .126dB (Min)
150dB (Typ)
• High CMRR. . . . . . . . . . . . . . . . . . . . . . . . . . 110dB (Min)
140dB (Typ)
• High PSRR . . . . . . . . . . . . . . . . . . . . . . . . . .110dB (Min)
135dB (Typ)
• Low Noise. . . . . . . . . . . . . . . . . . . . . . . . 11nV/
9nV/
Hz (Max)
Hz (Typ)
• Low Power Consumption . . . . . . . . . . . . . 51mW (Max)
• Wide Gain Bandwidth Product . . . . . . . . . . 2MHz (Min)
• Unity Gain Stable
Applications
• High Gain Instrumentation Amplifiers
• Precision Control Systems
• Precision Integrators
• High Resolution Data Converters
• Precision Threshold Detectors
• Low Level Transducer Amplifiers
C (Typ)
Description
The HA-5177/883 is a monolithic, all bipolar, precision oper­ational amplifier, utilizing Intersil Dielectric Isolation and advance processing techniques. This design features a combination of precision input characteristics, wide gain bandwidth (2MHz) and high speed (0.5V/µs min) and is an improved version of the HA-5135/883.
The HA-5177/883 uses advanced matching techniques and laser trimming to produce low offset voltage (10µV typ, 60µV max) and low offset voltage drift (0.1µV/ max). This design also features low voltage noise (9nV/ typ), Low current noise (0.32pA/
o
C typ, 0.6µV/oC
Hz
Hz typ), nanoamp input
currents, and 126dB minimum gain. These outstanding features along with high CMRR (140dB
typ, 110dB min) and high PSRR (135dB typ, 110dB min) make this unity gain stable amplifier ideal for high resolution data acquisition systems, precision integrators, and low level transducer amplifiers.
Ordering Information
PART
NUMBER
HA2-5177/883 -55oC to +125oC 8 Pin Can
HA7-5177/883 -55oC to +125oC 8 Lead CerDIP
HA4-5177/883 -55oC to +125oC 20 Lead Ceramic LCC
TEMPERATURE
RANGE PACKAGE
Pinouts
HA-5177/883
(CERDIP)
TOP VIEW
BAL 2
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207
IN-
IN+
1
2
3
V-
4
-
+
BAL1
8
V+
7
OUT
6
NC
5
| Copyright © Intersil Corporation 1999
NC
-IN
NC
+IN
NC
HA-5177/883
(CLCC)
TOP VIEW
BAL 2
NC
NC
3212019 4 5 6 7 8
­+
9101112
V-
NC
NC
3-159
BAL1
13
NC
NC
NC
18
NC V+
17 16
NC OUT
15
NC
14
BAL 2
IN -
IN+
2
HA-5177/883
(METAL CAN)
TOP VIEW
BAL1
8
1
-
+
3
4 V-
Spec Number
File Number 3733.1
7
V+
6
OUT
5
NC
511041-883
Page 2
Specifications HA-5177/883
Absolute Maximum Ratings Thermal Information
Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 44V
Differential Input Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . 7V
Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . . V+ to V-
Input Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25mA
Output Current . . . . . . . . . . . . . . . . . . . .Full Short Circuit Protection
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC
ESD Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . <2000V
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +300oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Temperature Range. . . . . . . . . . . . . . . . -55oC to +125oC
Operating Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±15V
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: V
PARAMETERS SYMBOL CONDITIONS
Input Offset Voltage V
Input Bias Current I
Input Offset Current I
Common Mode Range
Large Signal Voltage Gain
Common Mode Rejection Ratio
Output Voltage Swing
SUPPLY
= ±15V, R
IO
B
SOURCE
= 50Ω, R
= 100k, V
LOAD
VCM = 0V 1 +25oC -60 60 µV
VCM = 0V, RS = 10k, 50Ω
+I

---------------------------- -

IO
VCM = 0V,
I–
+
B
B
2
+RS = 10k,
-RS = 10k
+CMR V+ = +3V, V- = -27V 1 +25oC12-V
-CMR V+ = +27V, V- = -3V 1 +25oC - -12 V
+A
VOL
V
= 0V and +10V,
OUT
RL = 2k
-A
VOL
V
= 0V and -10V,
OUT
RL = 2k
+CMRR VCM = 10V,
V+ = +5V, V- = - 25V, V
= -10
OUT
-CMRR VCM = 10V, V+ = +25V, V- = - 5V, V
= +10
OUT
+V
-V
+V
-V
OUT1
OUT1
OUT2
OUT2
RL = 2k 4 +25oC12-V
RL = 2k 4 +25oC - -12 V
RL = 600 4 +25oC10-V RL = 600 4 +25oC - -10 V
Thermal Resistance θ
JA
θ
CerDIP Package . . . . . . . . . . . . . . . . . . . 115oC/W 28oC/W
Ceramic LCC Package . . . . . . . . . . . . . . 65oC/W 15oC/W
Metal Can Package. . . . . . . . . . . . . . . . . 155oC/W 67oC/W
Package Power Dissipation Limit at +75oC for TJ≤ +175oC
CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .870mW
Ceramic LCC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.54W
Metal Can Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 645mW
Package Power Dissipation Derating Factor Above +75oC
CerDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8.7mW/oC
Ceramic LCC Package . . . . . . . . . . . . . . . . . . . . . . . .15.4mW/oC
Metal Can Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.5mW/oC
V
1/2 (V+ - V-)
INCM
RL≥ 600Ω
= 0V, Unless Otherwise Specified.
OUT
GROUP A
SUBGROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
2, 3 +125oC, -55oC -100 100 µV
1 +25oC-66nA
2, 3 +125oC, -55oC-8 8 nA
1 +25oC-66nA
2, 3 +125oC, -55oC-8 8 nA
2, 3 +125oC, -55oC12 - V
2, 3 +125oC, -55oC - -12 V
4 +25oC 126 - dB
5, 6 +125oC, -55oC 120 - dB
4 +25oC 126 - dB
5, 6 +125oC, -55oC 120 - dB
1 +25oC 116 - dB
2, 3 +125oC, -55oC 110 - dB
1 +25oC 116 - dB
2, 3 +125oC, -55oC 110 - dB
5, 6 +125oC, -55oC12 - V
5, 6 +125oC, -55oC - -12 V
JC
3-160
Spec Number 511041-883
Page 3
Specifications HA-5177/883
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at: V
PARAMETERS SYMBOL CONDITIONS
Output Current +I
Quiescent Power Supply Current
Power Supply Rejection Ratio
Offset Voltage Adjustment
NOTES:
1. The input stage has series 500 resistors along with back to back diodes. This provides large differential input voltage protection for a slight increase in noise voltage.
2. This test is for functionality only to assure adjustment through 0V.
SUPPLY
= ±15V, R
SOURCE
= 50Ω, R
= 100k, V
LOAD
OUT
GROUP A
= 0V, Unless Otherwise Specified.
LIMITS
SUBGROUPS TEMPERATURE
V
OUT
= -10V 4 +25oC15-mA
OUT
5, 6 +125oC, -55oC15 - mA
-I
OUT
V
= +10V 4 +25oC - -15 mA
OUT
5, 6 +125oC, -55oC - -15 mA
+I
CC
V
OUT
= 0V, I
= 0mA 1 +25oC - 1.7 mA
OUT
2, 3 +125oC, -55oC - 1.7 mA
-I
CC
V
OUT
= 0V, I
= 0mA 1 +25oC -1.7 - mA
OUT
2, 3 +125oC, -55oC -1.7 - mA
+PSRR V
-PSRR V
= 15V,
SUP
V+ = +5V, V- = - 15V, V+ = +20V, V- = - 15V
= 15V,
SUP
V+ = +15V, V- = - 5V, V+ = +15V, V- = - 20V
1 +25oC 110 - dB
2, 3 +125oC, -55oC 110 - dB
1 +25oC 110 - dB
2, 3 +125oC, -55oC 110 - dB
+VIOAdj Note 2 1 +25oC 0.3 - mV
2, 3 +125oC, -55oC 0.3 - mV
-VIOAdj Note 2 1 +25oC - -0.3 mV 2, 3 +125oC, -55oC - -0.3 mV
UNITSMIN MAX
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: V
SUPPLY
= ±15V, R
SOURCE
= 50, R
PARAMETERS SYMBOL CONDITIONS
Slew Rate +SR V
= -3V to +3V,
OUT
VIN S.R. 25V/µs
-SR V
= +3V to -3V,
OUT
VIN S.R. 25V/µs
Rise and Fall Time t
V
R
= 0 to +200mV
OUT
10% TR≤ 90%
t
V
F
= 0 to -200mV
OUT
10% TF≤ 90%
Overshoot +OS V
-OS V
= 0 to +200mV 7 +25oC - 40 %
OUT
= 0 to -200mV 7 +25oC - 40 %
OUT
LOAD
= 2k, C
LOAD
= 50pF, A
= +1V/V, Unless Otherwise Specified.
VCL
GROUP A
SUBGROUPS TEMPERATURE
7 +25oC 0.5 - V/µs
7 +25oC 0.5 - V/µs
7 +25oC - 420 ns
7 +25oC - 420 ns
LIMITS
UNITSMIN MAX
3-161
Spec Number
511041-883
Page 4
Specifications HA-5177/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: V
PARAMETERS SYMBOL CONDITIONS NOTES TEMPERATURE
Average Offset Voltage Drift
Average Offset Current Drift
Average Bias Current Drift IRTC Versus Temperature 1 -55oC to +125oC - 40 pA/oC Differential Input
Resistance Low Frequency
Peak-to-Peak Noise Voltage Low Frequency
Peak-to-Peak Noise Current Input Noise Voltage
Density
Input Noise Current Density
Gain Bandwidth Product GBWP VO= 100mV ,
Full Power Bandwidth FPBW V Minimum Closed Loop
Stable Gain Settling Time t Output Resistance R Power Consumption PC V
NOTES:
1. Parameters listed in T able 3 are controlled via design or process parameters and are not directly tested at final production. These param­eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV
3. Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
SUPPLY
= ±15V, R
LOAD
= 2k, C
= 50pF, AV = +1V/V, Unless Otherwise Specified.
LOAD
LIMITS
VIOTC VCM = 0V 1 -55oC to +125oC - 0.6 µV/oC
IIOTC Versus Temperature 1 -55oC to +125oC - 40 pA/oC
E
I
R
NP-P
NP-P
E
VCM = 0V 1 +25oC20-M
IN
0.1Hz to 10Hz 1 +25oC - 0.6 µV
0.1Hz to 10Hz 1 +25oC - 45 pA
RS = 20, fO = 10Hz 1 +25oC - 18 nV/√Hz
N
RS = 20, fO = 100Hz 1 +25oC - 13 nV/√Hz RS = 20, fO = 1kHz 1 +25oC - 11 nV/√Hz
I
RS = 2M, fO = 10Hz 1 +25oC-4pA/√Hz
N
RS = 2M, fO = 100Hz 1 +25oC - 2.3 pA/√Hz RS = 2M, fO = 1kHz 1 +25oC-1pA/√Hz
1 +25oC 2 - MHz
1Hz fO≤ 100kHz
= 10V 1, 2 +25oC 8 - kHz
PEAK
CLSG RL = 2k, CL = 50pF 1 -55oC to +125oC +1 - V/V
T o 0.1% for a 10V Step 1 +25oC-15µs
S
OUT
Open Loop 1 +25oC-70
OUT
= 0V, I
= 0mA 1, 3 -55oC to +125oC - 51 mW
OUT
).
PEAK
UNITSMIN MAX
P-P
P-P
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In) 1
Final Electrical Test Parameters 1 (Note 1), 2, 3, 4, 5, 6, 7
Group A Test Requirements 1, 2, 3, 4, 5, 6, 7
Groups C and D Endpoints 1
NOTE:
1. PDA applies to Subgroup 1 only.
3-162
Spec Number
511041-883
Page 5
Die Characteristics
DIE DIMENSIONS:
72 x 103 x 19 mils ± 1 mils 1840 x 2620 x 483µm ± 25.4µm
METALLIZATION:
Type: Al, 1% Cu Thickness: 16k
Å ± 2kÅ
GLASSIVATION:
Type: Nitride (Si3N4) over Silox (SIO2, 5% Phos.) Silox Thickness: 12k
Å ± 2kÅ
Nitride Thickness: 3.5kÅ ± 1.5kÅ
WORST CASE CURRENT DENSITY:
6.0 x 10
4
A/cm
2
SUBSTRATE POTENTIAL (Powered Up): V- TRANSISTOR COUNT: 71 PROCESS: Bipolar Dielectric Isolation
Metallization Mask Layout
HA-5177/883
HA-5177/883
BAL2
BAL1 V+ OUT NC
V-+IN-IN
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Spec Number 511041-883
3-163
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