These Dual P-Channel logic level enhancement mode field effect
transistors are produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance. This device
has been designed especially for low voltage applications as a
replacement for digital transistors in load switchimg applications.
Since bias resistors are not required this one P-Channel FET
can replace several digital transistors with different bias resistors
like the IMBxA series.
SOT-23
SuperSOTTM-6
SuperSOTTM-8
-25 V, -0.12 A continuous, -0.5 A Peak.
R
= 13 Ω @ VGS= -2.7 V
DS(ON)
R
= 10 Ω @ V
DS(ON)
= -4.5 V.
GS
Very low level gate drive requirements allowing direct
operation in 3V circuits. V
GS(th)
< 1.5V.
Gate-Source Zener for ESD ruggedness.
>6kV Human Body Model
Replace multiple PNP digital transistors (IMHxA series) with
one DMOS FET.
SO-8
SOT-223
SOIC-16
3
2
1
Absolute Maximum RatingsT
4
5
6
= 25oC unless other wise noted
A
SymbolParameterFDC6302PUnits
V
DSS
V
GSS
I
D
Drain-Source Voltage-25V
Gate-Source Voltage-8V
Drain Current - Continuous-0.12A
Turn - On Delay TimeVDD = -6 V, ID = -0.2 A,
Turn - On Rise Time816ns
VGS = -4.5 V, R
GEN
= 50 Ω
512ns
Turn - Off Delay Time918ns
Turn - Off Fall Time510ns
Total Gate ChargeVDS = -5 V, ID = - 0.2 A,
Gate-Source Charge0.12nC
VGS = -4.5 V
0.220.31nC
Gate-Drain Charge0.05nC
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
I
S
V
SD
Notes:
1. R
JA
θ
design while R
Maximum Continuous Drain-Source Diode Forward Current-0.7A
Drain-Source Diode Forward Voltage
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
-50-250255075100125150
T , JUNCTION TEMPERATURE (°C)
J
-2.0
2
V = -2.0 V
GS
1.5
-2.5
-2.7
-3.0
1
DS(ON)
R , NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
0.5
00.050.10.150.2
-I , DRAIN CURRENT (A)
D
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
25
T = 25°C
A
20
15
10
5
,DRAIN-SOURCE ON-RESISTANCE
0
012345678
DS(ON)
125 °C
-V ,GATE TO SOURCE VOLTAGE (V)
GS
-4.0
-3.5
I = -0.05A
D
-4.5
Figure 3. On-Resistance Variation
with Temperature.
-1
V = -5V
DS
-0.75
-0.5
-0.25
D
I , DRAIN CURRENT (A)
0
V , GATE TO SOURCE VOLTAGE (V)
GS
Figure 5. Transfer Characteristics.
T = -55°C
J
25°C
125°C
Figure 4. On Resistance Variation with
Gate-To- Source Voltage.
0.5
V = 0V
GS
0.1
0.01
S
-3-2.5-2-1.5-1-0.5
-I , REVERSE DRAIN CURRENT (A)
0.0001
00.20.40.60.811.2
-V , BODY DIODE FORWARD VOLTAGE (V)
SD
T= 125°C
J
25°C
-55°C
Figure 6. Body Diode Forward Voltage
Variation with Source Current and
Temperature.
FDC6302P Rev.C
Page 4
Typical Electrical And Thermal Characteristics
8
I = -0.2A
D
6
4
2
GS
-V , GATE-SOURCE VOLTAGE (V)
0
00.10.20.30.40.5
Q , GATE CHARGE (nC)
V = -5V
DS
-10
-15
g
Figure 7. Gate Charge Characteristics.
0.8
0.5
0.2
0.1
0.05
D
-I , DRAIN CURRENT (A)
0.02
0.01
RDS(ON) LIMIT
DC
V = -2.7V
GS
SINGLE PULSE
R =See Note 1b
JA
θ
T = 25°C
A
125102040
- V , DRAIN-SOURCE VOLTAGE (V)
DS
10ms
100ms
1s
1ms
25
15
C
C
C
iss
oss
rss
10
5
3
CAPACITANCE (pF)
2
f = 1 MHz
V = 0 V
GS
1
0.10.312510 1525
-V , DRAIN TO SOURCE VOLTAGE (V)
DS
Figure 8. Capacitance Characteristics.
5
4
3
2
POWER (W)
1
0
0.010.1110100300
SINGLE PULSE TIME (SEC)
SINGLE PULSE
R =See note 1b
JA
θ
T= 25°C
A
Figure 9. Maximum Safe Operating Area.
1
D = 0.5
0.5
0.2
0.2
0.1
0.1
0.05
r(t), NORMALIZED EFFECTIVE
0.02
TRANSIENT THERMAL RESISTANCE
0.01
0.05
0.02
0.01
Single Pulse
0.00010.0010.010.1110100300
Figure 11. Transient Thermal Response Curve.
Note: Thermal characterization performed using the conditions described in note 1b.Transient thermal
response will change depending on the circuit board design.
t , TIME (sec)
1
Figure 10. Single Pulse Maximum Power
Dissipation.
R (t) = r(t) * R
JA
θ
R = See Note 1b
JA
θ
P(pk)
t
1
t
2
T - T = P * R (t)
J
A
Duty Cycle, D = t / t
θ
JA
θ
JA
2
1
FDC6302P Rev.C
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