Datasheet CA3096C, CA3096A, CA3096 Datasheet (Intersil Corporation)

CA3096, CA3096A,
CA3096C
December 1997
Applications
• Five-Independent Transistors
- Three NPN and
- Two PNP
• Differential Amplifiers
• DC Amplifiers
• Sense Amplifiers
• Timers
• Lamp and Relay Drivers
• Thyristor Firing Circuits
• Temperature Compensated Amplifiers
Operational Amplifiers
Ordering Information
PART NUMBER
(BRAND)
CA3096AE -55 to 125 16 Ld PDIP E16.3 CA3096AM
(3096A) CA3096AM96
(3096A) CA3096CE -55 to 125 16 Ld PDIP E16.3 CA3096E -55 to 125 16 Ld PDIP E16.3 CA3096M
(3096) CA3096M96
(3096)
TEMP.
RANGE (oC) PACKAGE
-55 to 125 16 Ld SOIC M16.15
-55 to 125 16 Ld SOIC Tape and Reel
-55 to 125 16 Ld SOIC M16.15
-55 to 125 16 Ld SOIC Tape and Reel
Pinout
CA3096, CA3096A, CA3096C
(PDIP, SOIC)
TOP VIEW
16
1
2
Q
1
3
4
5
6
7
8
Q
5
Q
2
Q
4
Q
3
SUBSTRATE
15
14
13
12
11
10
9
PKG.
NO.
M16.15
M16.15
NPN/PNP Transistor Arrays
Description
The CA3096C, CA3096, and CA3096A are general purpose high voltage silicon transistor arrays. Each array consists of five independent transistors (two PNP and three NPN types) on a common substrate, which has a separate connection. Independent connections for each transistor permit maxi­mum flexibility in circuit design.
Types CA3096A, CA3096, and CA3096C are identical, except that the CA3096A specifications include parameter matching and greater stringency in I CA3096C is a relaxed version of the CA3096.
CA3096, CA3096A, CA3096C Essential Differences
CHARACTERISTIC CA3096A CA3096 CA3096C
V
(BR)CEO
V
(BR)CBO
hFE at 1mA
hFE at 100µA
I
CBO
I
CEO
V
CE SAT
|VIO| (mV) (Max)
|IIO| (µA) (Max)
(V) (Min)
NPN 35 35 24 PNP -40 -40 -24
(V) (Min)
NPN 45 45 30 PNP -40 -40 -24
NPN 150-500 150-500 100-670 PNP 20-200 20-200 15-200
PNP 40-250 40-250 30-300
(nA) (Max)
NPN 40 100 100 PNP -40 -100 -100
(nA) (Max)
NPN 100 1000 1000 PNP -100 -1000 -1000
(V) (Max)
NPN 0.5 0.7 0.7
NPN 5 - ­PNP 5 - -
NPN 0.6 - ­PNP 0.25 - -
CBO
, I
, and VCE(SAT). The
CEO
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
1
File Number 595.4
CA3096, CA3096A, CA3096C
Absolute Maximum Ratings Operating Conditions
NPN PNP
Collector-to-Emitter Voltage, V
CEO
CA3096, CA3096A . . . . . . . . . . . . . . . . . . . . . 35V -40V
CA3096C . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24V -24V
Collector-to-Base Voltage, V
CBO
CA3096, CA3096A . . . . . . . . . . . . . . . . . . . . . 45V -40V
CA3096C . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30V -24V
Collector-to-Substrate Voltage, V
CIO
(Note 1)
CA3096, CA3096A . . . . . . . . . . . . . . . . . . . . . 45V -
CA3096C . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30V -
Emitter-to-Substrate Voltage, V
EIO
CA3096, CA3096A . . . . . . . . . . . . . . . . . . . . . . - -40V
CA3096C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - -24V
Emitter-to-Base Voltage, V
EBO
CA3096, CA3096A . . . . . . . . . . . . . . . . . . . . . . 6V -40V
CA3096C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6V -24V
Collector Current, IC (All Types). . . . . . . . . . . . 50mA -10mA
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. The collector of each transistor of the CA3096 is isolated from the substrate by an integral diode. The substrate (Terminal 16) must be connected to the most negative point in the external circuit to maintain isolation between transistors and to provide for normal transistor action.
2. θJA is measured with the component mounted on an evaluation PC board in free air.
3. Care must be taken to avoid exceeding the maximum junction temperature. Use the total power dissipation (all transistors) and thermal resistances to calculate the junction temperature.
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . .-55oC to 125oC
Thermal Information
Thermal Resistance (Typical, Note 2) θJA (oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
Maximum Pow er Dissipation (Each Transistor, Note 3) . . . . . 200mW
Maximum Junction Temperature (Plastic Package) . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Electrical Specifications For Equipment Design, At T
CA3096 CA3096A CA3096C
PARAMETER
TEST
CONDITIONS
= 25oC
A
DC CHARACTERISTICS FOR EACH NPN TRANSISTOR
I
CBO
VCB = 10V,
- 0.001 100 - 0.001 40 - 0.001 100 nA
IE = 0
I
CEO
VCE = 10V,
- 0.006 1000 - 0.006 100 - 0.006 1000 nA
IB = 0
V
(BR)CEO
V
(BR)CBO
IC = 1mA, IB = 0 35 50 - 35 50 - 24 35 - V IC = 10µA,
45 100 - 45 100 - 30 80 - V
IE = 0
V
(BR)CIO
ICI = 10µA,
45 100 - 45 100 - 30 80 - V
IB = IE = 0
V
(BR)EBO
IE = 10µA,
68-68-68 - V
IC = 0
V
Z
V
CE SAT
IZ = 10µA 6 7.9 9.8 6 7.9 9.8 6 7.9 9.8 V lC = 10mA,
- 0.24 0.7 - 0.24 0.5 - 0.24 0.7 V
IB = 1mA VBE (Note 4) IC = 1mA, hFE (Note 4) 150 390 500 150 390 500 100 390 670
VCE = 5V
|VBE/T| (Note 4) IC = 1mA,
0.6 0.69 0.78 0.6 0.69 0.78 0.6 0.69 0.78 V
- 1.9 - - 1.9 - - 1.9 - mV/oC
VCE = 5V
DC CHARACTERISTICS FOR EACH PNP TRANSISTOR
I
CBO
VCB = -10V,
- -0.06 -100 - -0.006 -40 - -0.06 -100 nA
IE = 0
UNITSMIN TYP MAX MIN TYP MAX MIN TYP MAX
2
CA3096, CA3096A, CA3096C
Electrical Specifications For Equipment Design, At T
TEST
PARAMETER
I
CEO
CONDITIONS
VCE = -10V,
IB = 0 V
(BR)CEO
IC = -100µA,
IB = 0 V
(BR)CBO
IC = -10µA,
IE = 0 V
(BR)EBO
IE = -10µA,
IC = 0 V
(BR)ElO
IEI = 10µA,
IB = IC = 0 V
CE SAT
IC = -1mA,
IB = -100µA VBE (Note 4) IC = -100µA,
VCE = -5V hFE (Note 4) IC = -100µA,
VCE = -5V
IC = -1mA,
VCE = -5V |VBE/T| (Note 4) IC = -100µA,
VCE = -5V I
CBO
I
CEO
V
(BR)CEO
V
(BR)CBO
V
(BR)CIO
V
(BR)EBO
Collector-Cutoff Current V Collector-Cutoff Current V Collector-to-Emitter Breakdown Voltage V Collector-to-Base Breakdown Voltage h Collector-to-Substrate Breakdown Voltage |VBE/T| Magnitude of Temperature Coefficient: Emitter-to-Base Breakdown Voltage
NOTE:
4. Actual forcing current is via the emitter for this test.
CA3096 CA3096A CA3096C
- -0.12 -1000 - -0.12 -100 - -0.12 -1000 nA
-40 -75 - -40 -75 - -24 -30 - V
-40 -80 - -40 -80 - -24 -60 - V
-40 -100 - -40 -100 - -24 -80 - V
40 100 - 40 100 - 24 80 - V
- -0.16 -0.4 - -0.16 -0.4 - -0.16 -0.4 V
-0.5 -0.6 -0.7 -0.5 -0.6 -0.7 -0.5 -0.6 -0.7 V
40 85 250 40 85 250 30 85 300
20 47 200 20 47 200 15 47 200
- 2.2 - - 2.2 - - 2.2 - mV/oC
= 25oC (Continued)
A
Z CE SAT BE
FE
UNITSMIN TYP MAX MIN TYP MAX MIN TYP MAX
Emitter-to-Base Zener Voltage Collector-to-Emitter Saturation Voltage Base-to-Emitter Voltage DC Forward-Current Transfer Ratio
(for each transistor)
Electrical Specifications For Equipment Design At T
= 25oC (CA3096A Only)
A
CA3096A
PARAMETER SYMBOL TEST CONDITIONS
FOR TRANSISTORS Q1 AND Q2 (AS A DIFFERENTIAL AMPLIFIER)
Absolute Input Offset Voltage |VIO|VCE = 5V, IC = 1mA - 0.3 5 mV Absolute Input Offset Current |IIO| - 0.07 0.6 µA Absolute Input Offset Voltage
Temperature Coefficient
V
IO
----------------- -
T
- 1.1 - µV/oC
FOR TRANSISTORS Q4 AND Q5 (AS A DIFFERENTIAL AMPLIFIER)
Absolute Input Offset Voltage |VIO|VCE = -5V, IC = -100µA
- 0.15 5 mV
RS= 0
Absolute Input Offset Current |IIO| - 2 250 nA Absolute Input Offset Voltage
Temperature Coefficient
V
IO
----------------- -
T
- 0.54 - µV/oC
3
UNITSMIN TYP MAX
CA3096, CA3096A, CA3096C
Electrical Specifications Typical Values Intended Only for Design Guidance At T
= 25oC
A
TYPICAL
PARAMETER SYMBOL TEST CONDITIONS
VALUES UNITS
DYNAMIC CHARACTERISTICS FOR EACH NPN TRANSISTOR
Noise Figure (Low Frequency) NF f = 1kHz, VCE = 5V, IC = 1mA, RS = 1k 2.2 dB Low-Frequency, Input Resistance R Low-Frequency Output Resistance R
I
O
f = 1.0kHz, VCE = 5V IC = 1 mA 10 k f = 1.0kHz, VCE = 5V IC = 1 mA 80 k
Admittance Characteristics
Forward Transfer Admittance
Input Admittance
Output Admittance
Gain-Bandwidth Product f
g
f = 1MHz, VCE = 5V, IC = 1mA 7.5 mS
y
FE
y
y
OE
FE
b
f = 1MHz, VCE = 5V, IC = 1mA -j13 mS
FE
g
f = 1MHz, VCE = 5V, IC = 1mA 2.2 mS
IE
IE
b
f = 1MHz, VCE = 5V, IC = 1mA j3.1 mS
IE
g
f = 1MHz, VCE = 5V, IC = 1mA 0.76 mS
OE
b
f = 1MHz, VCE = 5V, IC = 1mA j2.4 mS
OE
T
VCE = 5V, IC = 1.0mA 280 MHz
VCE = 5V, IC = 5mA 335 MHz Emitter-To-Base Capacitance C Collector-To-Base Capacitance C Collector-To-Substrate Capacitance C
EB CB
CI
VEB = 3V 0.75 pF
VCB = 3V 0.46 pF
VCI = 3V 3.2 pF
DYNAMIC CHARACTERISTICS FOR EACH PNP TRANSISTOR
Noise Figure (Low Frequency) NF f = 1kHz, IC = 100µA, RS = 1k 3dB Low-Frequency Input Resistance R Low-Frequency Output Resistance R Gain-Bandwidth Product f Emitter-To-Base Capacitance C Collector-To-Base Capacitance C Base-To-Substrate Capacitance C
I
O
T EB CB
BI
f = 1kHz, VCE = 5V, IC = 100µA27k f = 1kHz, VCE = 5V, IC = 100µA 680 k VCE = 5V, IC = 100µA 6.8 MHz VEB = -3V 0.85 pF VCB = -3V 2.25 pF VBI = 3V 3.05 pF
Typical Applications
(SUBSTRATE)
f
500
1
V+ = 10V
f
500
2
NOTE: F
2
1
0.1µF
3
1k
1k
0.1µF
6
Q
5
2
4
OR F2 < 10kHz
1
Q
Q
5
44003
4
11
8
15 10 12 14
13
3k
97
16
1µF3k
OUTPUT
FIGURE 1. FREQUENCY COMPARATOR USING CA3096 FIGURE 2. FREQUENCY COMPARATOR CHARACTERISTICS
9
CENTER FREQUENCY: 1kHz
8
7
6
5
4
3
OUTPUT VOLTAGE (V)
2
1
0
-20 -10 0 10 20 f
- f1 > 0 f1 = f
2
FREQUENCY DEVIATION (kHz)
2
f1 - f2 > 0
4
Typical Applications (Continued)
CA3096, CA3096A, CA3096C
120V
3
AC
6.8k
2W
NTC
SENSOR
2
12V
+
-
11
100µF
Q
1
1
R
P
Q
3
16
987
5.1k 10k
1310
Q
5
Q
4
15
12
10k10k 5.1k
14
5
FIGURE 3. LINE-OPERATED LEVEL SWITCH USING CA3096A OR CA3096
13
Q
14
15 10
40841 MOSFET
5
11
Q
4
1k
12
20k 5k 5k
6
3
1
Q1Q
2
5 8
20k
42
6
4
+6V
9
7
Q
Q
1k
2
3
G
LOAD
OUTPUT
MT
MT
1
T2300B
2
36
---------------
V
±=
T
IOR
L
IF IO = 1mA AND RL = 1k
= ± 36mV
V
T
V
IN
FIGURE 5. CA3096A SMALL-SIGNAL ZERO VOLTAGE DETECTOR HAVING NOISE IMMUNITY
50M
5µF
1k 3.9k 10k
TIME DELAY CHANGES ±7% FOR SUPPLY VOLTAGE CHANGE OF ±10%
FIGURE 4. ONE-MINUTE TIMER USING CA3096A AND A MOSFET
V+
1k
R
L
E
O
2k
15
Q
5
13 6
Q
2
100
5
42
I
O
Q
1k
3
7
V-
100
1
1k
10
3
Q
1k
12
Q
4
11
14
1
9
8
+V
16
T
V
IN
-V
T
E
O
0
t
t
5
Typical Applications (Continued)
CA3096, CA3096A, CA3096C
INPUT
100k
13
14 15
Q
5
11
1.5M
500k
1.5V
10
Q
4
12
1
5µF
10k
3
6
Q
Q
1
2
2
4
1k
5
LAMP GE 2158D OR EQUIVALENT
2k
8
2k
16
(SUBSTRATE)
9
Q
3
7
FIGURE 6. TEN-SECOND TIMER OPERATED FROM 1.5V SUPPLY USING CA3096
+6V
1%
11
51k
1%
100k
1%
10
13
Q
Q
4
12
14
5
100k
15
1%
51k
1%
6.2k
1%
6
5
Q2Q
300
1%
6.2k
1%
3
1
24
9
Q
8
3
7
1k
1%
OUTPUT
1
5k
1%
16
-6V
NOTES:
5. Can be operated with either dual supply or single supply.
6. Wide-input common mode range +5V to -5V.
7. Low bias current: <1µA.
FIGURE 7. CASCADE OF DIFFERENTIAL AMPLIFIERS USING CA3096A
70
60
50
40
30
VOLTAGE GAIN (dB)
20
10
1 10 100 1000
FREQUENCY (kHz)
FIGURE 8. FREQUENCY RESPONSE
6
Typical Performance Curves
10
CA3096, CA3096A, CA3096C
4
10
3
10
1
-1
10
ZENER CURRENT (mA)
-2
10
7 7.5 8 8.5 9
ZENER VOLTAGE (V)
V
Z
2
10
10
1
COLLECTOR CUT-OFF CURRENT (pA)
-1
10
-100 -75 -50 -25 0 25 50 75 100 TEMPERATURE (oC)
VCE = 10V
FIGURE 9. BASE-TO-EMITTER ZENER CHARACTERISTIC (NPN) FIGURE 10. COLLECTOR CUT-OFF CURRENT (I
TEMPERATURE (NPN)
3
10
2
10
VCB = 15V
10
1
VCB = 10V
VCB = 5V
500
400
300
200
TA = 85oC
TA = 25oC
TA = -40oC
VCE = 5V
) vs
CEO
-1
10
COLLECTOR CUT-OFF CURRENT (pA)
-2
10
-75 -50 -25 0 25 50 75 100 TEMPERATURE (oC)
FIGURE 11. COLLECTOR CUT-OFF CURRENT (I
TEMPERATURE (NPN)
0.9 VCE = 5V
0.8
0.7
0.6
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
0.01 0.1 1 10 COLLECTOR CURRENT (mA)
CBO
) vs
100
DC FORW ARD CURRENT TRANSFER RATIO
0
0.01 0.1 1 10 COLLECTOR CURRENT (mA)
FIGURE 12. TRANSISTOR (NPN) hFE vs COLLECTOR
CURRENT
= 10mA, 1.67mV/oC
I
0.9
0.8
0.7
0.6
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
-40 -20 0 20 40 60 80 100
TEMPERATURE (
C
= 5mA, 1.77mV/oC
I
C
I
= 1mA, 1.90mV/oC
C
I
= 100µA, 2.05mV/oC
C
o
C)
FIGURE 13. VBE (NPN) vs COLLECTOR CURRENT FIGURE 14. VBE (NPN) vs TEMPERATURE
7
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
TA = 85oC
1.0 TA = 25oC
0.8
0.6
0.4
0.2
COLLECTOR TO EMITTER
SATURATION VOLTAGE (V)
0.1
0.1 1.0 10 100 COLLECTOR CURRENT (mA)
β = 10
TA = -40oC
4
10
3
10
VCE = -10V
2
10
10
COLLECTOR CUT-OFF CURRENT (pA)
1
-50 -25 0 25 50 75 100 TEMPERATURE (
VCE = -15V
o
C)
VCE = -5V
FIGURE 15. V
3
10
2
10
10
COLLECTOR CUT-OFF CURRENT (pA)
1
-50 -25 0 25 50 75 100
(NPN) vs COLLECTOR CURRENT FIGURE 16. COLLECTOR CUT-OFF CURRENT (I
CE SAT
VCB = -15V
VCB = -10V
VCB = -5V
TEMPERATURE (
o
C)
FIGURE 17. COLLECTOR CUT -OFF CURRENT (I
TEMPERATURE (PNP)
100
IC = 100µA
80
IC = 10µA
60
IC = 1mA
40
20
DC FORWARD CURRENT TRANSFER RATIO
0
-40 -20 0 20 40 60 80
IC = 5mA
TEMPERATURE (
o
C)
CBO
) vs
VCE = 5V
) vs
CEO
TEMPERATURE (PNP)
110 100
90 80 70 60 50 40 30 20 10
DC FORWARD CURRENT TRANSFER RATIO
0
0.01 0.1 1.0 10
VCE = 5V
VCE = 1V
COLLECTOR CURRENT (mA)
VCE = 20V
FIGURE 18. TRANSISTOR (PNP) hFE vs COLLECTOR CURRENT
1.0 VCE = 5V
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
BASE TO EMITTER VOLTAGE (V)
0.1
0
0.01 0.1 1.0 10 COLLECTOR CURRENT (mA)
FIGURE 19. TRANSISTOR (PNP) hFE vs TEMPERATURE FIGURE 20. VBE (PNP) vs COLLECTOR CURRENT
8
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
0.9
0.8
0.7
0.6 IC = 100µA, -2.2mV/oC
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
-40 -20 0 20 40 60 80
FIGURE 21. VBE (PNP) vs TEMPERATURE FIGURE 22. MAGNITUDE OF INPUT OFFSET V OLTA GE |VIO| vs
= 5mA,VBE/T - 0.97mV/oC
I
C
IC = 1mA, -1.84mV/oC
TEMPERATURE (
o
C)
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1 0
MAGNITUDE OF INPUT OFFSET V OLTAGE (mV)
0.01 0.1 1.0 10
COLLECTOR CURRENT (mA)
COLLECTOR CURRENT FOR NPN TRANSISTOR Q1 - Q
2
0.5
0.4
0.3
0.2
0.1
0
MAGNITUDE OF INPUT OFFSET V OLTAGE (mV)
0.01 0.1 1 10 COLLECTOR CURRENT (mA)
FIGURE 23. MAGNITUDE OF INPUT OFFSET VOL TAGE |VIO| vs
COLLECTOR CURRENT FOR PNP TRANSISTOR Q4 - Q
5
18 16
IC = 3mA
14 12 10
1mA
8 6
NOISE FIGURE (dB)
4 2 0
0.01 0.1 1 10 100
100µA
FREQUENCY (kHz)
10µA
R
SOURCE
= 1k
18
R
16 14 12 10
1mA
8 6
NOISE FIGURE (dB)
4 2 0
0.01 0.1 1.0 10 100
SOURCE
100µA
= 500
IC = 3mA
10µA
FREQUENCY (kHz)
FIGURE 24. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
28
R
24
20
16
12
NOISE FIGURE (dB)
8
4
0
0.01 0.1 1.0 10 100
SOURCE
10µA
= 10k
IC = 3mA
1mA
100µA
FREQUENCY (kHz)
FIGURE 25. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
FIGURE 26. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
9
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
28
24
20
100µA
16
12
NOISE FIGURE (dB)
10µA
8
4
10µA
0
0.01 0.1 1 10 100
IC = 1mA
FREQUENCY (kHz)
R
SOURCE
R
100µA
SOURCE
= 100k
= 1M
FIGURE 27. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
4.0
3.5
3.0
2.5
C
CI
400
VCE = 5V
300
200
100
GAIN-BANDWIDTH PRODUCT (MHz)
0
0.1 1.0 10 COLLECTOR CURRENT (mA)
FIGURE 28. GAIN-BANDWIDTH PRODUCT vs COLLECTOR
CURRENT (NPN)
1000
f = 1kHz
100
NPN
2.0
1.5
CAPACITANCE (pF)
1.0
0.5
012345678910
C
EB
C
CB
BIAS VOLTAGE (V)
10
INPUT RESISTANCE (k)
1
0.01 1 100.1
PNP
COLLECTOR CURRENT (mA)
FIGURE 29. CAPACITANCE vs BIAS VOLTAGE (NPN) FIGURE 30. INPUT RESISTANCE vs COLLECTOR CURRENT
4
10
3
10
2
10
10
OUTPUT RESISTANCE (k)
1
0.01 1.0 100.1
f = 1kHz
NPN
PNP
COLLECTOR CURRENT (mA)
40
) OR
) (mS)
FE
FE
30
20
10
0
-10
-20
FORW ARD TRANSFER CONDUCTANCE (g
FORW ARD TRANSFER SUSCEPTANCE (b
1 10 100
gFEIC = 1mA
gFE100µA
bFE100µA
bFE1mA
FREQUENCY (MHz)
FIGURE 31. OUTPUT RESISTANCE vs COLLECTOR CURRENT FIGURE 32. FORWARD TRANSCONDUCTANCE vs FREQUENCY
10
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
6
g
IE
b
IE
5
) OR
) (mS)
IE
IE
4
3
2
1
INPUT CONDUCTANCE (g
INPUT SUSCEPTANCE (b
0
1 10 100
100µA
10µA 1mA
FREQUENCY (MHz)
FIGURE 33. INPUT ADMITTANCE vs FREQUENCY FIGURE 34. OUTPUT ADMITTANCE vs FREQUENCY
IC = 10mA
10mA
1mA
100µA
10µA
2.5
) OR
) (mS)
2.0
OE
OE
1.5
1.0
0.5
OUTPUT CONDUCTANCE (g
OUTPUT SUSCEPTANCE (b
100µA
0
1 10 100
FREQUENCY (MHz)
b
OE
100µA
IC = 1mA
b
OE
1mA
g
OE
g
OE
30
R
20
10
NOISE FIGURE (dB)
0
0.01 0.1 1.0 10 100
SOURCE
10µA
100µA
= 500
IC = 1mA
FREQUENCY (kHz)
30
R
20
10
NOISE FIGURE (dB)
0
0.01 0.1 1 10 100
SOURCE
100µA
= 1k
10µA
IC = 1mA
FREQUENCY (kHz)
FIGURE 35. NOISE FIGURE vs FREQUENCY (PNP) FIGURE 36. NOISE FIGURE vs FREQUENCY (PNP)
40
R
30
20
SOURCE
= 10k
IC = 1mA
8
VCE = 5V
7
6
NOISE FIGURE (dB)
10
10µA
0
0.01 0.1 1.0 10 100
100µA
FREQUENCY (kHz)
5
GAIN-BANDWIDTH PRODUCT (MHz)
4
0.1 1.0 10 COLLECTOR CURRENT (mA)
FIGURE 37. NOISE FIGURE vs FREQUENCY (PNP) FIGURE 38. GAIN-BANDWIDTH PRODUCT vs COLLECTOR
CURRENT (PNP)
11
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
6
5
4
CAPACITANCE (pF)
Metallization Mask Layout
3
C
BC
2
C
1
0
012345678910
BE
BIAS VOLTAGE (V)
C
BI
FIGURE 39. CAPACITANCE vs BIAS VOLTAGE (PNP)
CA3096H
403020100
40
30
20
10
37-45
(0.940-1.143)
0
4-10 (0.102-0.254)
37-45
(0.940-1.143)
Dimensions in parentheses are in millimeters and are derived from the basic inch dimensions as indicated. Grid graduations are in mils (10 inch).
The photographs and dimensions represent a chip when it is part of the wafer. When the wafer is cut into chips, the cleavage angles are 57 degrees instead of 90 degrees with respect to the face of the chip . Therefore, the isolated chip is actually 7mils (0.17mm) larger in both dimensions.
12
-3
CA3096, CA3096A, CA3096C
Dual-In-Line Plastic Packages (PDIP)
E
C
L
e
A
C
e
B
BASE
PLANE
SEATING
PLANE
D1
B1
D
A2
A1
A
L
e
C
S
-C-
D1
e
B
0.010 (0.25) C AMB
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JE­DEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be perpendic-
e
A
ular to datum .
-C-
7. eB and eC are measured at the lead tips with the leads unconstrained. eC must be zero or greater.
8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
E16.3 (JEDEC MS-001-BB ISSUE D)
16 LEAD DUAL-IN-LINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A - 0.210 - 5.33 4 A1 0.015 - 0.39 - 4 A2 0.115 0.195 2.93 4.95 -
B 0.014 0.022 0.356 0.558 ­B1 0.045 0.070 1.15 1.77 8, 10
C 0.008 0.014 0.204 0.355 -
D 0.735 0.775 18.66 19.68 5 D1 0.005 - 0.13 - 5
E 0.300 0.325 7.62 8.25 6 E1 0.240 0.280 6.10 7.11 5
e 0.100 BSC 2.54 BSC -
e
A
e
B
0.300 BSC 7.62 BSC 6
- 0.430 - 10.92 7 L 0.115 0.150 2.93 3.81 4 N16 169
NOTESMIN MAX MIN MAX
Rev. 0 12/93
13
CA3096, CA3096A, CA3096C
Small Outline Plastic Packages (SOIC)
N
INDEX AREA
123
-A-
0.25(0.010) B
H
E
-B-
SEATING PLANE
D
A
-C-
M
L
h x 45
M
o
α
e
B
0.25(0.010) C AMB
M
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
A1
0.10(0.004)
S
C
M16.15 (JEDEC MS-012-AC ISSUE C)
16 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
INCHES MILLIMETERS
SYMBOL
A 0.0532 0.0688 1.35 1.75 -
A1 0.0040 0.0098 0.10 0.25 -
B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 ­D 0.3859 0.3937 9.80 10.00 3 E 0.1497 0.1574 3.80 4.00 4
e 0.050 BSC 1.27 BSC -
H 0.2284 0.2440 5.80 6.20 -
h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6
N16 167
o
α
0
o
8
o
0
o
8
Rev. 0 12/93
NOTESMIN MAX MIN MAX
-
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under an y patent or patent rights of Intersil or its subsidiaries.
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Sales Office Headquarters
NORTH AMERICA
Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (321) 724-7000 FAX: (321) 724-7240
EUROPE
Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05
ASIA
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14
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