(3096A)
CA3096CE-55 to 12516 Ld PDIPE16.3
CA3096E-55 to 12516 Ld PDIPE16.3
CA3096M
(3096)
CA3096M96
(3096)
TEMP.
RANGE (oC)PACKAGE
-55 to 12516 Ld SOICM16.15
-55 to 12516 Ld SOIC Tape
and Reel
-55 to 12516 Ld SOICM16.15
-55 to 12516 Ld SOIC Tape
and Reel
Pinout
CA3096, CA3096A, CA3096C
(PDIP, SOIC)
TOP VIEW
16
1
2
Q
1
3
4
5
6
7
8
Q
5
Q
2
Q
4
Q
3
SUBSTRATE
15
14
13
12
11
10
9
PKG.
NO.
M16.15
M16.15
NPN/PNP Transistor Arrays
Description
The CA3096C, CA3096, and CA3096A are general purpose
high voltage silicon transistor arrays. Each array consists of
five independent transistors (two PNP and three NPN types)
on a common substrate, which has a separate connection.
Independent connections for each transistor permit maximum flexibility in circuit design.
Types CA3096A, CA3096, and CA3096C are identical, except
that the CA3096A specifications include parameter matching
and greater stringency in I
CA3096C is a relaxed version of the CA3096.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. The collector of each transistor of the CA3096 is isolated from the substrate by an integral diode. The substrate (Terminal 16) must be
connected to the most negative point in the external circuit to maintain isolation between transistors and to provide for normal transistor
action.
2. θJA is measured with the component mounted on an evaluation PC board in free air.
3. Care must be taken to avoid exceeding the maximum junction temperature. Use the total power dissipation (all transistors) and thermal
resistances to calculate the junction temperature.
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . .-55oC to 125oC
f = 1kHz, VCE = 5V, IC = 100µA27kΩ
f = 1kHz, VCE = 5V, IC = 100µA680kΩ
VCE = 5V, IC = 100µA6.8MHz
VEB = -3V0.85pF
VCB = -3V2.25pF
VBI = 3V3.05pF
Typical Applications
(SUBSTRATE)
f
500Ω
1
V+ = 10V
f
500Ω
2
NOTE: F
2
1
0.1µF
3
1kΩ
1kΩ
0.1µF
6
Q
5
2
4
OR F2 < 10kHz
1
Q
Q
5
44003
4
11
8
15 1012
14
13
3kΩ
97
16
1µF3kΩ
OUTPUT
FIGURE 1. FREQUENCY COMPARATOR USING CA3096FIGURE 2. FREQUENCY COMPARATOR CHARACTERISTICS
9
CENTER FREQUENCY: 1kHz
8
7
6
5
4
3
OUTPUT VOLTAGE (V)
2
1
0
-20-1001020
f
- f1 > 0f1 = f
2
FREQUENCY DEVIATION (kHz)
2
f1 - f2 > 0
4
Typical Applications (Continued)
CA3096, CA3096A, CA3096C
120V
3
AC
6.8kΩ
2W
NTC
SENSOR
2
12V
+
-
11
100µF
Q
1
1
R
P
Q
3
16
987
5.1kΩ10kΩ
1310
Q
5
Q
4
15
12
10kΩ10kΩ5.1kΩ
14
5
FIGURE 3. LINE-OPERATED LEVEL SWITCH USING CA3096A OR CA3096
13
Q
14
1510
40841
MOSFET
5
11
Q
4
1kΩ
12
20kΩ5kΩ5kΩ
6
3
1
Q1Q
2
58
20kΩ
42
6
4
+6V
9
7
Q
Q
1kΩ
2
3
G
LOAD
OUTPUT
MT
MT
1
T2300B
2
36
---------------
V
±=
T
IOR
L
IF IO = 1mA AND RL = 1kΩ
= ± 36mV
V
T
V
IN
FIGURE 5. CA3096A SMALL-SIGNAL ZERO VOLTAGE DETECTOR HAVING NOISE IMMUNITY
50MΩ
5µF
1kΩ3.9kΩ10kΩ
TIME DELAY CHANGES ±7%
FOR SUPPLY VOLTAGE CHANGE OF ±10%
FIGURE 4. ONE-MINUTE TIMER USING CA3096A AND A MOSFET
V+
1kΩ
R
L
E
O
2kΩ
15
Q
5
136
Q
2
100Ω
5
42
I
O
Q
1kΩ
3
7
V-
100Ω
1
1kΩ
10
3
Q
1kΩ
12
Q
4
11
14
1
9
8
+V
16
T
V
IN
-V
T
E
O
0
t
t
5
Typical Applications (Continued)
CA3096, CA3096A, CA3096C
INPUT
100kΩ
13
14
15
Q
5
11
1.5MΩ
500kΩ
1.5V
10
Q
4
12
1
5µF
10kΩ
3
6
Q
Q
1
2
2
4
1kΩ
5
LAMP GE 2158D
OR EQUIVALENT
2kΩ
8
2kΩ
16
(SUBSTRATE)
9
Q
3
7
FIGURE 6. TEN-SECOND TIMER OPERATED FROM 1.5V SUPPLY USING CA3096
+6V
1%
11
51kΩ
1%
100kΩ
1%
10
13
Q
Q
4
12
14
5
100kΩ
15
1%
51kΩ
1%
6.2kΩ
1%
6
5
Q2Q
300Ω
1%
6.2kΩ
1%
3
1
24
9
Q
8
3
7
1kΩ
1%
OUTPUT
1
5kΩ
1%
16
-6V
NOTES:
5. Can be operated with either dual
supply or single supply.
6. Wide-input common mode range
+5V to -5V.
7. Low bias current: <1µA.
FIGURE 7. CASCADE OF DIFFERENTIAL AMPLIFIERS USING CA3096A
70
60
50
40
30
VOLTAGE GAIN (dB)
20
10
1101001000
FREQUENCY (kHz)
FIGURE 8. FREQUENCY RESPONSE
6
Typical Performance Curves
10
CA3096, CA3096A, CA3096C
4
10
3
10
1
-1
10
ZENER CURRENT (mA)
-2
10
77.588.59
ZENER VOLTAGE (V)
V
Z
2
10
10
1
COLLECTOR CUT-OFF CURRENT (pA)
-1
10
-100-75-50-250255075100
TEMPERATURE (oC)
VCE = 10V
FIGURE 9. BASE-TO-EMITTER ZENER CHARACTERISTIC (NPN)FIGURE 10. COLLECTOR CUT-OFF CURRENT (I
TEMPERATURE (NPN)
3
10
2
10
VCB = 15V
10
1
VCB = 10V
VCB = 5V
500
400
300
200
TA = 85oC
TA = 25oC
TA = -40oC
VCE = 5V
) vs
CEO
-1
10
COLLECTOR CUT-OFF CURRENT (pA)
-2
10
-75-50-250255075100
TEMPERATURE (oC)
FIGURE 11. COLLECTOR CUT-OFF CURRENT (I
TEMPERATURE (NPN)
0.9
VCE = 5V
0.8
0.7
0.6
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
0.010.1110
COLLECTOR CURRENT (mA)
CBO
) vs
100
DC FORW ARD CURRENT TRANSFER RATIO
0
0.010.1110
COLLECTOR CURRENT (mA)
FIGURE 12. TRANSISTOR (NPN) hFE vs COLLECTOR
CURRENT
= 10mA, 1.67mV/oC
I
0.9
0.8
0.7
0.6
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
-40-20020406080100
TEMPERATURE (
C
= 5mA, 1.77mV/oC
I
C
I
= 1mA, 1.90mV/oC
C
I
= 100µA, 2.05mV/oC
C
o
C)
FIGURE 13. VBE (NPN) vs COLLECTOR CURRENTFIGURE 14. VBE (NPN) vs TEMPERATURE
7
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
TA = 85oC
1.0
TA = 25oC
0.8
0.6
0.4
0.2
COLLECTOR TO EMITTER
SATURATION VOLTAGE (V)
0.1
0.11.010100
COLLECTOR CURRENT (mA)
β = 10
TA = -40oC
4
10
3
10
VCE = -10V
2
10
10
COLLECTOR CUT-OFF CURRENT (pA)
1
-50-250255075100
TEMPERATURE (
VCE = -15V
o
C)
VCE = -5V
FIGURE 15. V
3
10
2
10
10
COLLECTOR CUT-OFF CURRENT (pA)
1
-50-250255075100
(NPN) vs COLLECTOR CURRENTFIGURE 16. COLLECTOR CUT-OFF CURRENT (I
CE SAT
VCB = -15V
VCB = -10V
VCB = -5V
TEMPERATURE (
o
C)
FIGURE 17. COLLECTOR CUT -OFF CURRENT (I
TEMPERATURE (PNP)
100
IC = 100µA
80
IC = 10µA
60
IC = 1mA
40
20
DC FORWARD CURRENT TRANSFER RATIO
0
-40-20020406080
IC = 5mA
TEMPERATURE (
o
C)
CBO
) vs
VCE = 5V
) vs
CEO
TEMPERATURE (PNP)
110
100
90
80
70
60
50
40
30
20
10
DC FORWARD CURRENT TRANSFER RATIO
0
0.010.11.010
VCE = 5V
VCE = 1V
COLLECTOR CURRENT (mA)
VCE = 20V
FIGURE 18. TRANSISTOR (PNP) hFE vs COLLECTOR CURRENT
1.0
VCE = 5V
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
BASE TO EMITTER VOLTAGE (V)
0.1
0
0.010.11.010
COLLECTOR CURRENT (mA)
FIGURE 19. TRANSISTOR (PNP) hFE vs TEMPERATUREFIGURE 20. VBE (PNP) vs COLLECTOR CURRENT
8
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
0.9
0.8
0.7
0.6
IC = 100µA, -2.2mV/oC
0.5
BASE TO EMITTER VOLTAGE (V)
0.4
-40-20020406080
FIGURE 21. VBE (PNP) vs TEMPERATUREFIGURE 22. MAGNITUDE OF INPUT OFFSET V OLTA GE |VIO| vs
= 5mA, ∆VBE/∆T - 0.97mV/oC
I
C
IC = 1mA, -1.84mV/oC
TEMPERATURE (
o
C)
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
MAGNITUDE OF INPUT OFFSET V OLTAGE (mV)
0.010.11.010
COLLECTOR CURRENT (mA)
COLLECTOR CURRENT FOR NPN TRANSISTOR
Q1 - Q
2
0.5
0.4
0.3
0.2
0.1
0
MAGNITUDE OF INPUT OFFSET V OLTAGE (mV)
0.010.1110
COLLECTOR CURRENT (mA)
FIGURE 23. MAGNITUDE OF INPUT OFFSET VOL TAGE |VIO| vs
COLLECTOR CURRENT FOR PNP TRANSISTOR
Q4 - Q
5
18
16
IC = 3mA
14
12
10
1mA
8
6
NOISE FIGURE (dB)
4
2
0
0.010.1110100
100µA
FREQUENCY (kHz)
10µA
R
SOURCE
= 1kΩ
18
R
16
14
12
10
1mA
8
6
NOISE FIGURE (dB)
4
2
0
0.010.11.010100
SOURCE
100µA
= 500Ω
IC = 3mA
10µA
FREQUENCY (kHz)
FIGURE 24. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
28
R
24
20
16
12
NOISE FIGURE (dB)
8
4
0
0.010.11.010100
SOURCE
10µA
= 10kΩ
IC = 3mA
1mA
100µA
FREQUENCY (kHz)
FIGURE 25. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
FIGURE 26. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
9
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
28
24
20
100µA
16
12
NOISE FIGURE (dB)
10µA
8
4
10µA
0
0.010.1110100
IC = 1mA
FREQUENCY (kHz)
R
SOURCE
R
100µA
SOURCE
= 100kΩ
= 1MΩ
FIGURE 27. NOISE FIGURE vs FREQUENCY FOR NPN
TRANSISTORS
4.0
3.5
3.0
2.5
C
CI
400
VCE = 5V
300
200
100
GAIN-BANDWIDTH PRODUCT (MHz)
0
0.11.010
COLLECTOR CURRENT (mA)
FIGURE 28. GAIN-BANDWIDTH PRODUCT vs COLLECTOR
CURRENT (NPN)
1000
f = 1kHz
100
NPN
2.0
1.5
CAPACITANCE (pF)
1.0
0.5
012345678910
C
EB
C
CB
BIAS VOLTAGE (V)
10
INPUT RESISTANCE (kΩ)
1
0.011100.1
PNP
COLLECTOR CURRENT (mA)
FIGURE 29. CAPACITANCE vs BIAS VOLTAGE (NPN)FIGURE 30. INPUT RESISTANCE vs COLLECTOR CURRENT
4
10
3
10
2
10
10
OUTPUT RESISTANCE (kΩ)
1
0.011.0100.1
f = 1kHz
NPN
PNP
COLLECTOR CURRENT (mA)
40
) OR
) (mS)
FE
FE
30
20
10
0
-10
-20
FORW ARD TRANSFER CONDUCTANCE (g
FORW ARD TRANSFER SUSCEPTANCE (b
110100
gFEIC = 1mA
gFE100µA
bFE100µA
bFE1mA
FREQUENCY (MHz)
FIGURE 31. OUTPUT RESISTANCE vs COLLECTOR CURRENTFIGURE 32. FORWARD TRANSCONDUCTANCE vs FREQUENCY
10
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
6
g
IE
b
IE
5
) OR
) (mS)
IE
IE
4
3
2
1
INPUT CONDUCTANCE (g
INPUT SUSCEPTANCE (b
0
110100
100µA
10µA
1mA
FREQUENCY (MHz)
FIGURE 33. INPUT ADMITTANCE vs FREQUENCYFIGURE 34. OUTPUT ADMITTANCE vs FREQUENCY
IC = 10mA
10mA
1mA
100µA
10µA
2.5
) OR
) (mS)
2.0
OE
OE
1.5
1.0
0.5
OUTPUT CONDUCTANCE (g
OUTPUT SUSCEPTANCE (b
100µA
0
110100
FREQUENCY (MHz)
b
OE
100µA
IC = 1mA
b
OE
1mA
g
OE
g
OE
30
R
20
10
NOISE FIGURE (dB)
0
0.010.11.010100
SOURCE
10µA
100µA
= 500Ω
IC = 1mA
FREQUENCY (kHz)
30
R
20
10
NOISE FIGURE (dB)
0
0.010.1110100
SOURCE
100µA
= 1kΩ
10µA
IC = 1mA
FREQUENCY (kHz)
FIGURE 35. NOISE FIGURE vs FREQUENCY (PNP)FIGURE 36. NOISE FIGURE vs FREQUENCY (PNP)
40
R
30
20
SOURCE
= 10kΩ
IC = 1mA
8
VCE = 5V
7
6
NOISE FIGURE (dB)
10
10µA
0
0.010.11.010100
100µA
FREQUENCY (kHz)
5
GAIN-BANDWIDTH PRODUCT (MHz)
4
0.11.010
COLLECTOR CURRENT (mA)
FIGURE 37. NOISE FIGURE vs FREQUENCY (PNP)FIGURE 38. GAIN-BANDWIDTH PRODUCT vs COLLECTOR
CURRENT (PNP)
11
CA3096, CA3096A, CA3096C
Typical Performance Curves (Continued)
6
5
4
CAPACITANCE (pF)
Metallization Mask Layout
3
C
BC
2
C
1
0
012345678910
BE
BIAS VOLTAGE (V)
C
BI
FIGURE 39. CAPACITANCE vs BIAS VOLTAGE (PNP)
CA3096H
403020100
40
30
20
10
37-45
(0.940-1.143)
0
4-10 (0.102-0.254)
37-45
(0.940-1.143)
Dimensions in parentheses are in millimeters and are derived from the
basic inch dimensions as indicated. Grid graduations are in mils (10
inch).
The photographs and dimensions represent a chip when it is part of
the wafer. When the wafer is cut into chips, the cleavage angles are
57 degrees instead of 90 degrees with respect to the face of the chip .
Therefore, the isolated chip is actually 7mils (0.17mm) larger in both
dimensions.
12
-3
CA3096, CA3096A, CA3096C
Dual-In-Line Plastic Packages (PDIP)
E
C
L
e
A
C
e
B
BASE
PLANE
SEATING
PLANE
D1
B1
D
A2
A1
A
L
e
C
S
-C-
D1
e
B
0.010 (0.25)C AMB
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and
Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions.
Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E andare measured with the leads constrained to be perpendic-
e
A
ular to datum.
-C-
7. eB and eC are measured at the lead tips with the leads unconstrained.
eC must be zero or greater.
8. B1 maximum dimensions do not include dambar protrusions. Dambar
protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above
the seating plane, shall not exceed a maximum value of 0.61mm
(0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimensions are
not necessarily exact.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under an y patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.inter sil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
Taiwan Limited
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
14
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