
2SK3152
Silicon N Channel MOS FET
High Speed Power Switching
Features
• Low on-resistance
RDS = 100 mΩ typ.
• High speed switching
• 4 V gate drive device can be driven from 5 V source
Outline
ADE-208-732 (Z)
1st. Edition
February 1999
TO–220FM
G
D
1. Gate
2. Drain
1
2
3
S
3. Source

2SK3152
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
Gate to source voltage V
Drain current I
Drain peak current I
Body-drain diode reverse drain current I
Avalanche current I
Avalanche energy E
Channel dissipation Pch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10 µs, duty cycle ≤ 1%
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
120 V
±20 V
10 A
40 A
10 A
10 A
8.5 mJ
25 W
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Gate to source leak current I
Zero gate voltege drain current I
Gate to source cutoff voltage V
Static drain to source on state R
resistance R
(BR)DSS
(BR)GSS
GSS
DSS
GS(off)
DS(on)
DS(on)
120 — — V ID = 10 mA, VGS = 0
±20——V I
= ±100 µA, VDS = 0
G
——±10 µAVGS = ±16 V, VDS = 0
——10µAVDS = 120 V, VGS = 0
1.0 — 2.5 V ID = 1 mA, VDS = 10 V
— 100 130 mΩ ID = 5 A, VGS = 10 V
— 130 170 mΩ ID = 5 A, VGS = 4 V
Forward transfer admittance |yfs| 5.5 9.5 — S ID = 5 A, VDS = 10 V
Input capacitance Ciss — 580 — pF VDS = 10 V
Output capacitance Coss — 240 — pF VGS = 0
Reverse transfer capacitance Crss — 130 — pF f = 1 MHz
Turn-on delay time t
Rise time t
Turn-off delay time t
Fall time t
Body–drain diode forward voltage V
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
— 11 — ns ID = 5 A, VGS = 10 V
— 55 — ns RL = 6 Ω
— 140 — ns
—80—ns
— 0.9 — V IF = 10 A, VGS = 0
— 100 — ns IF = 10 A, VGS = 0
diF/ dt = 50 A/ µs
Note: 4. Pulse test
Note4
Note4
Note4
2

Main Characteristics
2SK3152
Power vs. Temperature Derating
40
30
20
10
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
Typical Output Characteristics
20
10 V
16
D
6 V
4 V
12
Pulse Test
3.5 V
100
Maximum Safe Operation Area
30
10
D
PW =10 ms (1shot)
DC Operation (Tc = 25°C)
3
1
Operation in
0.3
this area is
Drain Current I (A)
limited by R
0.1
DS(on)
0.03
Ta = 25 °C
0.01
12
550
Drain to Source Voltage V (V)
Typical Transfer Characteristics
10
V = 10 V
DS
Pulse Test
8
D
6
10 20
1 ms
100 µs
DS
10 µs
100
200
8
Drain Current I (A)
4
0
246810
Drain to Source Voltage V (V)
3 V
V =2.5 V
GS
DS
4
2
0
Tc = 75°C
12345
Drain Current I (A)
Gate to Source Voltage V (V)
–25°C
25°C
GS
3

2SK3152
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
5
)
4
DS(on
V (V)
3
2
1
Pulse Test
I = 15 A
D
10 A
Drain to Source Saturation Voltage
0
48
Gate to Source Voltage V (V)
12
16 20
GS
Static Drain to Source on State Resistance
vs. Temperature
500
Pulse Test
mΩ
400
DS(on)
R ( )
300
5 A
10 A
200
100
V = 4 V
GS
10 A
10 V
0
Static Drain to Source on State Resistance
–40 0 40 80 120 160
Case Temperature T
c
(°C)
5 A
2, 5 A
2 A
Static Drain to Source on State Resistance
vs. Drain Current
500
Pulse Test
200
DS(on)
R ( )mΩ
100
V = 4 V
GS
50
20
Drain to Source On State Resistance
10
0.1 1 100.2 5
Drain Current I (A)
20.5
D
Forward Transfer Admittance vs.
Drain Current
50
fs
20
Tc = –25 °C
25 °C
10
5
75 °C
2
1
Forward Transfer Admittance |y | (S)
0.5
V = 10 V
DS
Pulse Test
0.1 0.3 1 3 10 30 100
Drain Current I (A)
D
10 V
5020
4

2SK3152
Body–Drain Diode Reverse
Recovery Time
1000
di / dt = 50 A / µs
500
V = 0, Ta = 25 °C
GS
200
100
50
20
Reverse Recovery Time trr (ns)
10
0.1 0.3 1 3 10 30 100
Reverse Drain Current I (A)
DR
Dynamic Input Characteristics
200
I = 20 A
D
160
DS
120
V = 100 V
DD
50 V
25 V
V
80
V
DS
40
Drain to Source Voltage V (V)
0
8 16243240
V = 100 V
DD
50 V
25 V
Gate Charge Qg (nc)
GS
Typical Capacitance vs.
Drain to Source Voltage
5000
2000
1000
500
200
100
Capacitance C (pF)
50
V = 0
GS
20
f = 1 MHz
10
01020304050
Drain to Source Voltage V (V)
Switching Characteristics
20
500
300
16
GS
100
t
f
12
8
4
30
10
Switching Time t (ns)
3
Gate to Source Voltage V (V)
0
1
0.1 0.3
Drain Current I (A)
Ciss
Coss
Crss
DS
t
d(off)
t
r
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1 %
3
1
10 30100
D
5

2SK3152
Reverse Drain Current vs.
Source to Drain Voltage
10
8
DR
6
10 V
4
2
5 V
Reverse Drain Current I (A)
0
0.4 0.8 1.2 1.6 2.0
V = 0, –5 V
GS
Pulse Test
Source to Drain Voltage V (V)
SD
Maximun Avalanche Energy vs.
Channel Temperature Derating
10
I = 10 A
AP
V = 50 V
AR
8
DD
duty < 0.1 %
Rg > 50
6
4
2
0
Repetive Avalanche Energy E (mJ)
25 50 75 100 125 150
Channel Temperature Tch (°C)
Avalanche WaveformAvalanche Test Circuit
Ω
Vin
15 V
V
DS
Monitor
Rg
50Ω
L
I
AP
Monitor
D. U. T
V
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
DSS
V – V
DSS DD
V
DS
V
(BR)DSS
6

2SK3152
Normalized Transient Thermal Impedance vs. Pulse Width
3
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.01
10 µ
0.02
0.01
1shot pulse
100 µ 1 m 10 m
Pulse Width PW (S)
Switching Time Test Circuit Waveform
Tc = 25°C
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 5.0 °C/W, Tc = 25°C
P
DM
PW
T
D =
100 m 1 10
PW
T
Vin Monitor
Vin
10 V
50Ω
D.U.T.
R
L
V
DD
= 30 V
Vout
Monitor
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
7

Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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