Silicon N Channel MOS FET
High Speed Power Switching
Features
• Low on-resistance
R
= 11.5 mΩ typ.
DS (on)
• High speed switching
• 4 V gate drive device can be driven from 5 V source
Outline
ADE-208-747A (Z)
2nd. Edition
February 1999
TO–3P
1
G
D
2
1. Gate
1
2
3
S
3
2. Drain
(Flange)
3. Source
Page 2
2SK3151
Absolute Maximum Ratings (Ta = 25°C)
ItemSymbolRatingsUnit
Drain to source voltageV
Gate to source voltageV
Drain currentI
Drain peak currentI
Body-drain diode reverse drain current I
Avalanche currentI
Avalanche energyE
Channel dissipationPch
DSS
GSS
D
D(pulse)
DR
Note3
AP
Note3
AR
Note1
Note2
Channel temperatureTch150°C
Storage temperatureTstg–55 to +150°C
Note:1. PW ≤ 10 µs, duty cycle ≤ 1%
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
Electrical Characteristics (Ta = 25°C)
100V
±20V
50A
200A
50A
50A
250mJ
125W
ItemSymbol MinTypMaxUnitTest Conditions
Drain to source breakdown voltage V
Gate to source breakdown voltage V
Gate to source leak currentI
Zero gate voltege drain currentI
Gate to source cutoff voltageV
Static drain to source on stateR
resistanceR
1.0—2.5VID = 1 mA, VDS = 10 V
—11.515mΩID = 25 A, VGS = 10 V
—1625mΩID = 25 A, VGS = 4 V
Forward transfer admittance|yfs|3050—S ID = 25 A, VDS = 10 V
Input capacitanceCiss—4000—pFVDS = 10 V
Output capacitanceCoss—1650—pFVGS = 0
Reverse transfer capacitanceCrss—590—pFf = 1 MHz
Turn-on delay timet
Rise timet
Turn-off delay timet
Fall timet
Body–drain diode forward voltageV
Body–drain diode reverse
recovery time
t
d(on)
r
d(off)
f
DF
rr
—30—nsID = 25 A, VGS = 10 V
—280—nsRL = 1.2 Ω
—830—ns
—450—ns
—0.95—VIF = 50 A, VGS = 0
—100—nsIF = 50 A, VGS = 0
diF/ dt = 50 A/ µs
Note:4. Pulse test
Note4
Note4
Note4
2
Page 3
Main Characteristics
2SK3151
160
Power vs. Temperature Derating
120
80
40
Channel Dissipation Pch (W)
0
50100150200
Case Temperature Tc (°C)
Typical Output Characteristics
50
40
D
30
V = 10 V
GS
4 V
3.5 V
Pulse Test
3 V
1000
300
D
300
100
100
30
10
Drain Current I (A)
3
1
12 5
100
80
D
60
Maximum Safe Operation Area
10 µs
100 µs
1 ms
PW = 10 ms (1 shot)
DC Operation (Tc = 25°C)
Operation in
this area is
limited by R
DS(on)
Ta = 25°C
50 100
20
10
Drain to Source Voltage V (V)
DS
Typical Transfer Characteristics
V = 10 V
DS
Pulse Test
200
20
Drain Current I (A)
10
0
246810
Drain to Source Voltage V (V)
2.5 V
2 V
DS
40
Drain Current I (A)
20
0
75°C
12345
Gate to Source Voltage V (V)
Tc = –25°C
25°C
GS
3
Page 4
2SK3151
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
1.0
Pulse Test
0.8
DS(on)
V (V)
0.6
I = 50 A
D
0.4
20 A
0.2
10 A
Drain to Source Saturation Voltage
0
0
48
Gate to Source Voltage V (V)
12
1620
GS
Static Drain to Source on State Resistance
vs. Temperature
50
Ω
Pulse Test
40
DS(on)
R (m )
30
20
4 V
I = 50 A
D
10,20 A
10,20 A
10
V = 10 V
GS
0
Static Drain to Source on State Resistance
–50050100150200
Case Temperature Tc (°C)
50 A
Static Drain to Source on State Resistance
vs. Drain Current
100
Ω
Pulse Test
50
V = 4 V
DS(on)
20
R (m )
GS
10
10 V
5
2
Drain to Source On State Resistance
1
1
2
Drain Current I (A)
20100
10
D
Forward Transfer Admittance vs.
Drain Current
500
V = 10 V
200
fs
DS
Pulse Test
100
50
20
10
Tc = –25 °C
25 °C
5
2
75 °C
1
Forward Transfer Admittance |y | (S)
0.5
0.10.3131030100
Drain Current I (A)
D
505
200
4
Page 5
2SK3151
Body–Drain Diode Reverse
Recovery Time
1000
500
200
100
50
20
Reverse Recovery Time trr (ns)
10
di / dt = 50 A / µs
V = 0, Ta = 25°C
GS
0.10.3131030100
Reverse Drain Current I (A)
Dynamic Input Characteristics
200
I = 50 A
D
DS
160
V = 100 V
DD
50 V
25 V
120
V
DS
80
40
Collector to Emitter Voltage V (V)
0
V = 100 V
DD
50 V
25 V
80160240320400
Gate Charge Qg (nc)
DR
V
GS
Typical Capacitance vs.
Drain to Source Voltage
30000
10000
3000
1000
Capacitance C (pF)
300
100
01020304050
Drain to Source Voltage V (V)
20
16
GE
5000
1000
Switching Characteristics
500
12
200
8
4
0
100
50
Switching Time t (ns)
Gate to Emitter Voltage V (V)
20
10
0.1 0.2
0.5
Drain Current I (A)
V = 0
GS
f = 1 MHz
Ciss
Coss
Crss
DS
t
d(off)
t
f
t
r
t
d(on)
V = 10 V, V = 30 V
GS
DD
PW = 5 µs, duty < 1%
2
1
5
10
20
D
50
5
Page 6
2SK3151
Reverse Drain Current vs.
Source to Drain Voltage
50
10 V
40
F
30
V = 0, –5 V
20
5 V
GS
10
Reverse Drain Current I (A)
0
0.40.81.21.62.0
Source to Drain Voltage V (V)
Avalanche Test CircuitAvalanche Waveform
V
DS
Monitor
Rg
Vin
15 V
50Ω
Pulse Test
SDF
L
I
AP
Monitor
D. U. T
Maximum Avalanche Energy vs.
Channel Temperature Derating
250
AR
200
150
100
50
0
Repetitive Avalanche Energy E (mJ)
255075100125150
Channel Temperature Tch (°C)
1
E = • L • I •
AR
2
I
AP
V
DD
I
V
DD
0
2
AP
D
I = 50 A
AP
V = 50 V
DD
duty < 0.1 %
Rg > 50
Ω
V
DSS
V – V
DSSDD
V
DS
V
(BR)DSS
6
Page 7
2SK3151
3
Normalized Transient Thermal Impedance vs. Pulse Width
s (t)
1
γ
D = 1
0.5
0.3
0.2
0.1
0.1
0.05
0.03
Normalized Transient Thermal Impedance
0.02
0.01
1shot pulse
0.01
10 µ
100 µ1 m10 m100 m110
Pulse Width PW (S)
Tc = 25°C
θ γ θ
ch – c(t) = s (t) • ch – c
θ
ch – c = 1.0°C/W, Tc = 25 °C
P
DM
PW
T
D =
PW
T
Switching Time Test CircuitWaveform
Vin Monitor
Vout
Monitor
D.U.T.
R
Vin
10 V
50Ω
L
V
DD
= 30 V
Vin
Vout
10%
10%
90%
td(on)
tr
90%
td(off)
90%
10%
t
f
7
Page 8
2SK3151
Package Dimensions
16.0 max
0.5 typ
φ
3.2 ± 0.2
1.0 typ
Unit: mm
5.0 max
1.5 typ
5.0 ± 0.3
1.6 typ
1.4 max
2.0 typ
1.0 ± 0.2
3.6 typ
5.45 ± 0.25.45 ± 0.2
0.9 typ
1.0 typ
2.0 typ
20.1 max18.0 ± 0.5
14.9 ± 0.2
0.3 typ
2.8 typ
0.6 ± 0.2
Hitachi Code
EIAJ
JEDEC
TO–3P
SC–65
—
8
Page 9
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
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For further information write to:
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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