Datasheet 2SK3150-S, 2SK3150-L Datasheet (HIT)

Page 1
2SK3150(L), 2SK3150(S)
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-750A (Z)
2nd. Edition
February 1999
Features
RDS = 45 m typ.
High speed switching
4 V gate drive device can be driven from 5 V source
Outline
1. Gate
2. Drain
3. Source
4. Drain
1
2
3
4
1
2
3
4
LDPAK
G
D
S
Page 2
2SK3150(L),2SK3150(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
DSS
100 V
Gate to source voltage V
GSS
±20 V
Drain current I
D
20 A
Drain peak current I
D(pulse)
Note1
60 A
Body-drain diode reverse drain current I
DR
20 A
Avalanche current I
AP
Note3
20 A
Avalanche energy E
AR
Note3
40 mJ
Channel dissipation Pch
Note2
50 W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10 µs, duty cycle 1%
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg 50
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V
(BR)DSS
100 V ID = 10 mA, VGS = 0
Gate to source breakdown voltage V
(BR)GSS
±20——V I
G
= ±100 µA, VDS = 0
Gate to source leak current I
GSS
——±10 µAVGS = ±16 V, VDS = 0
Zero gate voltege drain current I
DSS
——10µAVDS = 100 V, VGS = 0
Gate to source cutoff voltage V
GS(off)
1.0 2.5 V ID = 1 mA, VDS = 10 V
Static drain to source on state R
DS(on)
—4560m ID = 10 A, VGS = 10 V
Note4
resistance R
DS(on)
—6585m ID = 10 A, VGS = 4 V
Note4
Forward transfer admittance |yfs| 8.5 15 S ID = 10 A, VDS = 10 V
Note4
Input capacitance Ciss 900 pF VDS = 10 V Output capacitance Coss 400 pF VGS = 0 Reverse transfer capacitance Crss 210 pF f = 1 MHz Turn-on delay time t
d(on)
15 ns ID = 10 A, VGS = 10 V
Rise time t
r
120 ns RL = 3
Turn-off delay time t
d(off)
200 ns
Fall time t
f
150 ns
Body–drain diode forward voltage V
DF
0.9 V IF = 20 A, VGS = 0
Body–drain diode reverse recovery time
t
rr
90 ns IF = 20 A, VGS = 0
diF/ dt = 50A/ µs
Note: 4. Pulse test
Page 3
2SK3150(L),2SK3150(S)
3
Main Characteristics
80
60
40
20
0
50 100 150 200
100
3
10
1
0.1
0.05 1 2 10 20 100
20
16
12
8
4
0
12345
0
246810
Ta = 25 °C
Tc = 75°C
25°C
–25°C
Channel Dissipation Pch (W)
Case Temperature Tc (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Operation in this area is limited by R
DS(on)
V = 10 V Pulse Test
DS
100 µs
1 ms
PW =10 ms (1shot)
DC Operation (Tc = 25°C)
10 µs
20
16
12
8
4
3.5 V
3 V
V =2.5 V
GS
10 V
Pulse Test
6 V
4 V
0.3
500
30
550
200
0.5
500
Page 4
2SK3150(L),2SK3150(S)
4
1
10 100
2
50
500
20
50
10
250
200
150
100
50
–40 0 40 80 120 160
0
0.1 0.3 1 3 10 30 100
50
20
5
10
1
2
0.5
205
2.5
2.0
1.5
1.0
0.5
0
48
12
16 20
I = 15 A
D
5 A
10 A
200
100
V = 4 V
GS
10 V
V = 4 V
GS
10 V
25 °C
Tc = –25 °C
75 °C
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on
)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )m
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature T
c
(°C)
DS(on)
R ( )
Static Drain to Source on State Resistance
m
Static Drain to Source on State Resistance
vs. Temperature
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
Pulse Test
Pulse Test
V = 10 V Pulse Test
DS
Pulse Test
15 A
5,10 A
15 A
5,10 A
Page 5
2SK3150(L),2SK3150(S)
5
0.1 0.3
13
10 30 50
01020304050
2000
10000
1000
100
200
500
200
160
120
80
40
0
20
16
12
8
4
20 40 60 80 100
0
500
50
5
10
2 1
20
200
1000
20
100
10
0.1 0.2 1
2
10
20
di / dt = 50 A / µs V = 0, Ta = 25°C
GS
10
20
50
V = 0 f = 1 MHz
GS
Ciss
Coss
Crss
I = 15 A
D
V
GS
V
DS
V = 100 V
50 V 25 V
DD
t
f
r
t
d(on)
t
d(off)
t
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs. Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
V = 10 V, V = 30 V PW = 5 µs, duty < 1%
GS
DD
V = 100 V
50 V 25 V
DD
50
500
0.5 50
5000
100
200
Page 6
2SK3150(L),2SK3150(S)
6
20
16
12
8
4
0
0.2 0.4 0.6 0.8 1.0
V = 0, –5 V
GS
10 V
5 V
50
40
30
20
10
25 50 75 100 125 150
0
D. U. T
Rg
I Monitor
AP
V Monitor
DS
V
DD
50
Vin 15 V
0
I
D
V
DS
I
AP
V
(BR)DSS
L
V
DD
E = • L • I •
2
1
V
V – V
AR
AP
DSS
DSS DD
2
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Test
Channel Temperature Tch (°C)
Repetive Avalanche Energy E (mJ)
AR
Maximun Avalanche Energy vs.
Channel Temperature Derating
Avalanche WaveformAvalanche Test Circuit
I = 20 A V = 50 V duty < 0.1 % Rg > 50
AP
DD
Page 7
2SK3150(L),2SK3150(S)
7
Vin Monitor
D.U.T.
Vin 10 V
R
L
V = 30 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout Monitor
50
90%
10%
t
f
Switching Time Test Circuit Waveform
3
1
0.3
0.1
0.03
0.01 10 µ
100 µ 1 m 10 m
Pulse Width PW (S)
Normalized Transient Thermal Impedance
100 m 1 10
s (t)
γ
DM
P
PW
T
D =
PW
T
ch – c(t) = s (t) • ch – c ch – c = 2.5 °C/W, Tc = 25 °C
θ γ θ θ
Tc = 25°C
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Normalized Transient Thermal Impedance vs. Pulse Width
Page 8
2SK3150(L),2SK3150(S)
8
Package Dimensions
Unit: mm
10.2 ± 0.3 (1.4)
8.6 ± 0.3
1.27 ± 0.2
1.2 ± 0.2
2.54 ± 0.5
11.3 ± 0.5
(1.5)
0.86
+0.2 –0.1
3.0
+0.3
–0.5
0.76 ± 0.1
10.0
+0.3
–0.5
2.54 ± 0.5
4.44 ± 0.2
1.3 ± 0.2
2.59 ± 0.2
0.4 ± 0.1
11.0 ± 0.5
10.2 ± 0.3 (1.4)
8.6 ± 0.3
1.27 ± 0.2
2.54 ± 0.5
(1.5)
0.86
+0.2 –0.1
10.0
+0.3
–0.5
2.54 ± 0.5
4.44 ± 0.2
1.3 ± 0.2
2.59 ± 0.2
0.4 ± 0.1
1.2 ± 0.2
(1.5)
0.1
+0.2 –0.1
L type S type
Hitachi Code
EIAJ
JEDEC
LDPAK
— —
Page 9
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533
URL NorthAmerica : http:semiconductor.hitachi.com/
Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180
Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX
Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322
Hitachi Europe GmbH Electronic components Group Dornacher Stra§e 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223
For further information write to:
Loading...