Datasheet 2SD2583 Datasheet (NEC)

Page 1
DATA SHEET
PACKAGE DIMENSIONS
in millimeters (inches)
8.5 MAX.
(0.334 MAX.)
1.2
(0.047)
1.2
(0.047)
0.8 (0.031)
2.3 (0.090)
1.
2.
3.
Emitter Collector connected to mounting plane Base
2.3
(0.090)
+0.08
0.05
0.55 (0.021)
+0.08
0.05
123
12.0 MAX. (0.472 MAX.)
3.8 ± 0.2 (0.149)
φ
φ
φ
φ
3.2 ± 0.2
( 0.126)
2.5 ± 0.2
(0.098)
13.0 MIN. (0.512 MIN.)
2.8 MAX.
(0.110 MAX.)
3.2 ± 0.2 ( 0.126)
AUDIO FREQUENCY AMPLIFIER, SWITCHING
NOPN SILICON EPITAXIAL TRANSISTORS
FEATURES
Low VCE(sat) VCE(sat) = 0.15 V Max (@lC/lB = 1.0 A/50 mA)
High DC Current Gain hEF = 150 to 600 (@VCE = 2.0 V, lC = 1.0 A)
ABSOLUTE MAXIMUM RATINGS
Maximum Voltage and Current (TA = 25 °C)
Collector to Base Voltage V Collector to Emitter Volteage V Emitter to Base Voltage V Collector Current (DC) I Collector Current (Pulse)* I Base Current (DC) I * PW 10ms, Duty Cycle 10 %
Maximum Power Dissipation
Total Power Dissipation (T Total Power Dissipation (T
C = 25 °C) PT 10 W A = 25 °C) PT 1.0 W
Maximum Temperature
Junction Temperature Tj 150 °C Storage Temperature T
CB0 30 V CE0 30 V
EB0 6.0 V C(DC) 5.0 A C(Pulse) 10 A B(DC) 2.0A
stg −55 to 150 °C
SILICON TRANSISTOR
2SD2583
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
Document No. D10628EJ1V0DS00 (1st edition) Date Published June 1996 P Printed in Japan
Collector Cutoff Currnet ICB0 VCB = 30 V, IE = 0 100 nA Emitter Cutoff Current IEB0 VEB = 6.0 V, IC = 0 100 nA DC Current Gain hFE1 VCE = 2.0 V, IC = 1.0 A 150 600 DC Current Gain hFE2 VCE = 2.0 V, IC = 4.0 A 50 Collector Saturation Voltage VCE(sat)1 IC = 1.0 A, IB = 50 mA 0.07 0.15 V Collector Saturation Voltage VCE(sat)2 IC = 2.0 A, IB = 0.1 A 0.13 0.25 V Collector Saturation Voltage VCE(sat)3 IC = 4.0 A, IB = 0.2 A 0.24 0.50 V Base Saturation Voltage VBE(sat) IC = 2.0 A, IB = 0.1 A 0.86 1.50 V Gain Bandwidth Product fT VCE = 10 V, IE = 50 mA 120 MHz Output Capacitance Cob VCB = 10 V, IE = 0, f = 1 MHz 77 pF
CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
The information in this document is subject to change without notice.
©
1996
Page 2
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
100
2SD2583
80
60
40
dT - Percentage of Rated Power - %
20
TC -Case Temperature - °C
TOTAL POWER DISSIPATION vs. CASE TEMPERATURE
14
S/b Limited
Dissipation Limited
140120100806040200
160
12
10
8
6
4
- Total Power Dissipation - W
T
P
2
0
TC -Case Temperature - °C
14012010080604020
160
2
Page 3
100
10
I
C(DC)
- Collector Current - A
1
C
I
TC = 25 °C Single Pulse
0.1
FORWARD BIAS SAFE OPERATING AREA
I
C(pulse)
1 ms
10 ms
Power Dissipation Limited
100 ms
S/b Limited
2SD2583
PW = 0.1 ms
1001010.1
VCE - Collector to Emitter Voltage - V
3
Page 4
4.0
3.0
2.0
- Collector Current - A
C
I
1.0
2SD2583
Collector to Emitter Voltage vs Collector Current
16 mA
12 mA
8mA
IB = 4 mA
1000
100
- DC Current Gain
FE
h
10
VCE - Collector to Emitter Voltage - V
DC Current Gain vs Collector Current
6543210
V
C E
= 2 V
1
1.0 10100 m10 m1 m
I
C
- Collector Current - A
4
Page 5
COLLECTOR SATURATION VOLTAGE vs COLLECTOR CURRENT
10
IC/IB = 20
1
0.1
- Collector Saturation Voltage - V
CE(sat)
V
2SD2583
0.01
10
1010.10.01
IC - Collector Current - A
BASE SATURATION VOLTAGE vs COLLECTOR CURRENT
IC/IB = 20
1
0.1
- Base Saturation Voltage - V
BE(sat)
V
0.01
1010.10.01
IC - Collector Current - A
5
Page 6
OUTPUT CAPACITANCE vs COLLECTOR TO BASE VOLTAGE
1000
100
10
- Output Capacitance - pF
ob
C
2SD2583
1
VCB - Collector to Base Voltage - V
1001010.1
6
Page 7
REFERENCE
Document Name Document No. NEC semiconductor device reliability/quality control system TEI-1202 Quality grade on NEC semiconductor devices IEI-1209 Semiconductor device mounting technology manual C10535E Semiconductor device package manual C10943X Guide to quality assurance for semiconductor devices MEI-1202 Semiconductor selection guide X10679E
2SD2583
7
Page 8
2SD2583
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product.
M4 96.5
8
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