Datasheet 2N7002LT1 Datasheet (Motorola)

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
SEMICONDUCTOR TECHNICAL DATA
Order this document
by 2N7002LT1/D
  
N–Channel Enhancement
1 GATE
MAXIMUM RATINGS
Rating Symbol Value Unit
Drain–Source Voltage V Drain–Gate Voltage (RGS = 1.0 M) V Drain Current — Continuous TC = 25°C
Drain Current — Continuous TC = 100°C Drain Current — Pulsed
Gate–Source Voltage
— Continuous — Non–repetitive (tp 50 µs)
(2)
(1)
(1)
I
V
V
DSS
DGR
I
D
I
D
DM
GS
GSM
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Device Dissipation FR–5 Board,
Derate above 25°C Thermal Resistance, Junction to Ambient R Total Device Dissipation
Alumina Substrate,
Derate above 25°C Thermal Resistance, Junction to Ambient R Junction and Storage Temperature TJ, T
(4)
TA = 25°C
(3)
TA = 25°C
DEVICE MARKING
2N7002L T1 = 702
±115
±75
±800
±20 ±40
3 DRAIN
2 SOURCE
mAdc
Vdc Vpk
P
D
θJA
P
D
θJA
stg

Motorola Preferred Device
3
1
2
CASE 318–08, STYLE 21
SOT–23 (TO–236AB)
225
1.8 556 °C/W 300
2.4 417 °C/W
–55 to +150 °C
mW
mW/°C
mW
mW/°C
ELECTRICAL CHARACTERISTICS (T
Characteristic
= 25°C unless otherwise noted)
A
Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain–Source Breakdown Voltage
(VGS = 0, ID = 10 µAdc)
Zero Gate Voltage Drain Current TJ = 25°C
(VGS = 0, VDS = 60 Vdc) TJ = 125°C
Gate–Body Leakage Current, Forward
(VGS = 20 Vdc)
Gate–Body Leakage Current, Reverse
(VGS = –20 Vdc)
1. The Power Dissipation of the package may result in a lower continuous drain current.
2. Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%.
3. FR–5 = 1.0 x 0.75 x 0.062 in.
4. Alumina = 0.4 x 0.3 x 0.025 in 99.5% alumina.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 2
Motorola Small–Signal Transistors, FETs and Diodes Device Data
Motorola, Inc. 1997
V
(BR)DSS
I
DSS
I
GSSF
I
GSSR
60 Vdc
— —
100 nAdc
–100 nAdc
— —
1.0
500
µAdc
1
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2N7002LT1
(
DD
,
D
,
(T
ELECTRICAL CHARACTERISTICS
Characteristic
ON CHARACTERISTICS
Gate Threshold Voltage
(VDS = VGS, ID = 250 µAdc)
On–State Drain Current
(VDS 2.0 V
Static Drain–Source On–State Voltage
(VGS = 10 Vdc, ID = 500 mAdc) (VGS = 5.0 Vdc, ID = 50 mAdc)
Static Drain–Source On–State Resistance
(VGS = 10 V, ID = 500 mAdc) TC = 25°C
(VGS = 5.0 Vdc, ID = 50 mAdc) TC = 25°C
Forward Transconductance
(VDS 2.0 V
DS(on)
DS(on)
(2)
, VGS = 10 Vdc)
, ID = 200 mAdc)
DYNAMIC CHARACTERISTICS
Input Capacitance
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Output Capacitance
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
Reverse Transfer Capacitance
(VDS = 25 Vdc, VGS = 0, f = 1.0 MHz)
SWITCHING CHARACTERISTICS
Turn–On Delay Time Turn–Off Delay Time
(VDD = 25 Vdc, ID ^ 500 mAdc, RG = 25 , RL = 50 )
BODY–DRAIN DIODE RATINGS
Diode Forward On–Voltage
(IS = 11.5 mAdc, VGS = 0 V)
Source Current Continuous
(Body Diode)
Source Current Pulsed I
2. Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%.
= 25°C unless otherwise noted) (Continued)
A
TC = 125°C
TC = 125°C
(2)
Symbol Min Typ Max Unit
V
GS(th)
I
D(on)
V
DS(on)
r
DS(on)
g
C
C
C
t
d(on)
t
d(off)
V
I
SM
FS
iss
oss
rss
SD
S
1.0 2.5 Vdc
500 mA
— —
— — — —
80 mmhos
50 pF
25 pF
5.0 pF
30 ns — 40 ns
–1.5 Vdc
–115 mAdc
–800 mAdc
— —
— — — —
3.75
0.375
7.5
13.5
7.5
13.5
Vdc
Ohms
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Motorola Small–Signal Transistors, FETs and Diodes Device Data
Page 3
2N7002LT1
2.0
1.8
TA = 25°C
1.6
1.4
1.2
1.0
0.8
0.6
, DRAIN CURRENT (AMPS)
D
I
0.4
0.2 0
VDS, DRAN SOURCE VOLTAGE (VOLTS)
VGS = 10 V
9 V 8 V 7 V
6 V 5 V 4 V
3 V
100 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0
Figure 1. Ohmic Region
2.4
2.2 VGS = 10 V
2.0 ID = 200 mA
1.8
1.6
1.4
1.2
(NORMALIZED)
1.0
0.8
, STA TIC DRAIN–SOURCE ON–RESISTANCE
0.6
0.4
DS(on)
r
–60 –20 + 20 +60 +100 +140 –60 – 20 +20 +60 +100 +140
°
T, TEMPERA TURE (
C)
1.0 VDS = 10 V
0.8
0.6
0.4
, DRAIN CURRENT (AMPS)
D
I
0.2
1.2
1.05
1.1
1.10
1.0
0.95
0.9
0.85
0.8
, THRESHOLD VOLTAGE (NORMALIZED)
0.75
GS(th)
V
0.7
–55°C
125°C
VGS, GATE SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
VDS = V ID = 1.0 mA
T, TEMPERA TURE (°C)
25°C
100 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0
GS
Figure 3. T emperature versus Static
Drain–Source On–Resistance
Figure 4. T emperature versus Gate
Threshold V oltage
Motorola Small–Signal Transistors, FETs and Diodes Device Data
3
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2N7002LT1
INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total design. The footprint for the semiconductor packages must be the correct size to insure proper solder connection
0.037
0.95
0.035
0.9
SOT–23 POWER DISSIP ATION
The power dissipation of the SOT–23 is a function of the pad size. This can vary from the minimum pad size for soldering to a pad size given for maximum power dissipation. Power dissipation for a surface mount device is determined by T die, R ambient, and the operating temperature, TA. Using the values provided on the data sheet for the SOT–23 package, PD can be calculated as follows:
The values for the equation are found in the maximum ratings table on the data sheet. Substituting these values into the equation for an ambient temperature TA of 25°C, one can calculate the power dissipation of the device which in this case is 225 milliwatts.
The 556°C/W for the SOT–23 package assumes the use of the recommended footprint on a glass epoxy printed circuit board to achieve a power dissipation of 225 milliwatts. There are other alternatives to achieving higher power dissipation from the SOT–23 package. Another alternative would be to use a ceramic substrate or an aluminum core board such as Thermal Clad. Using a board material such as Thermal Clad, an aluminum core board, the power dissipation can be doubled using the same footprint.
, the maximum rated junction temperature of the
J(max)
, the thermal resistance from the device junction to
θJA
PD =
T
PD =
150°C – 25°C
556°C/W
J(max)
R
θJA
– T
A
= 225 milliwatts
0.031
0.8
SOT–23
interface between the board and the package. With the correct pad geometry, the packages will self align when subjected to a solder reflow process.
0.037
0.95
0.079
2.0
inches
mm
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated temperature of the device. When the entire device is heated to a high temperature, failure to complete soldering within a short time could result in device failure. Therefore, the following items should always be observed in order to minimize the thermal stress to which the devices are subjected.
Always preheat the device.
The delta temperature between the preheat and
soldering should be 100°C or less.*
When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum temperature ratings as shown on the data sheet. When using infrared heating with the reflow soldering method, the difference shall be a maximum of 10°C.
The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
When shifting from preheating to soldering, the
maximum temperature gradient shall be 5°C or less.
After soldering has been completed, the device should
be allowed to cool naturally for at least three minutes. Gradual cooling should be used as the use of forced cooling will increase the temperature gradient and result in latent failure due to mechanical stress.
Mechanical stress or shock should not be applied during
cooling.
* Soldering a device without preheating can cause excessive thermal shock and stress which can result in damage to the device.
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Motorola Small–Signal Transistors, FETs and Diodes Device Data
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2N7002LT1
P ACKAGE DIMENSIONS
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
A
L
3
1
S
B
2
GV
C
D
H
K
J
CASE 318–08
3. MAXIUMUM LEAD THICKNESS INCLUDES LEAD FINISH THICKNESS. MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL.
INCHES
DIMAMIN MAX MIN MAX
0.1102 0.1197 2.80 3.04
B 0.0472 0.0551 1.20 1.40 C 0.0350 0.0440 0.89 1.11 D 0.0150 0.0200 0.37 0.50 G 0.0701 0.0807 1.78 2.04 H 0.0005 0.0040 0.013 0.100 J 0.0034 0.0070 0.085 0.177 K 0.0140 0.0285 0.35 0.69 L 0.0350 0.0401 0.89 1.02 S 0.0830 0.1039 2.10 2.64 V 0.0177 0.0236 0.45 0.60
STYLE 21:
PIN 1. GATE
2. SOURCE
3. DRAIN
MILLIMETERS
ISSUE AF
SOT–23 (TO–236AB)
Motorola Small–Signal Transistors, FETs and Diodes Device Data
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2N7002LT1
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty , representation or guarantee regarding the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “T ypical” parameters which may be provided in Motorola data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part. Motorola and are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer.
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Motorola Small–Signal Transistors, FETs and Diodes Device Data
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2N7002LT1/D
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