FIXED DIP DELAY LINE
TD/TR = 5
(SERIES 1504)
delay
devices,
FEATURES PACKAGE
IN
• Fast rise time for high frequency applications
• Delays as large as 1000ns available
• Low DC resistance
• Standard 16-pin DIP package
• Epoxy encapsulated
• Meets or exceeds MIL-D-23859C
N/C
N/C
N/C
OUT
N/C
N/C
GND
1
2
3
4
5
6
7
8
FUNCTIONAL DESCRIPTION
The 1504-series device is a fixed, single-input, single-output, passive delay
line. The signal input (IN) is reproduced at the output (OUT), shifted by a
time (TD) given by the device dash number. The characteristic impedance
of the line is given by the letter code that follows the dash number (See
Table). The rise time (TR) of the line is 20% of TD, and the 3dB bandwidth is given by 1.75 / TD.
N/C
16
N/C
15
N/C
14
N/C
13
N/C
12
N/C
11
N/C
10
N/C
9
1504-xxz
xx = Delay (TD)
PIN DESCRIPTIONS
IN Signal Input
OUT Signal Output
GND Ground
SERIES SPECIFICATIONS
• Dielectric breakdown: 50 Vdc
• Distortion @ output: 10% max.
• Operating temperature: -55°C to +125°C
• Storage temperature: -55°C to +125°C
• Temperature coefficient: 100 PPM/°C
IN OUT
GND
Functional Diagram
inc.
Part
Number
1504-20A
1504-25A
1504-30A
1504-40A
1504-45A
1504-60A
1504-75A
1504-100A
1504-10B
1504-20B
1504-30B
1504-40B
1504-50B
1504-60B
1504-80B
1504-100B
1504-120B
1504-150B
1504-200B
1504-250B
1504-20C
1504-40C
1504-60C
1504-80C
1504-100C
1504-120C
1504-140C
Delay
(ns)
20 ± 1.0
25 ± 1.3
30 ± 1.5
40 ± 2.0
45 ± 2.3
60 ± 3.0
75 ± 3.8
100 ± 5.0
10 ± 1.0
20 ± 1.0
30 ± 1.5
40 ± 2.0
50 ± 2.5
60 ± 3.0
80 ± 4.0
100 ± 5.0
120 ± 6.0
150 ± 7.5
200 ± 10.0
250 ± 12.5
20 ± 1.0
40 ± 2.0
60 ± 3.0
80 ± 4.0
100 ± 5.0
120 ± 6.0
140 ± 7.0
2001 Data Delay Devices
DASH NUMBER SPECIFICATIONS
Imped
(ΩΩ)
50 1.0 1504-160C
50 1.0 1504-180C
50 1.2 1504-240C
50 1.5 1504-300C
50 1.5 1504-400C
50 1.5 1504-25D
50 1.8 1504-50D
50 2.0 1504-75D
100 1.0 1504-100D
100 1.5 1504-125D
100 1.5 1504-150D
100 1.8 1504-200D
100 2.0 1504-225D
100 3.0 1504-300D
100 3.5 1504-375D
100 4.0 1504-500D
100 4.0 1504-30E
100 5.0 1504-60E
100 6.0 1504-90E
100 7.0 1504-120E
200 3.0 1504-150E
200 4.0 1504-180E
200 4.5 1504-240E
200 5.5 1504-270E
200 6.0 1504-360E
200 6.5 1504-450E
200 7.0 1504-600E
RDC
(ΩΩ)
Part
Number
Delay
(ns)
160 ± 8.0
180 ± 9.0
240 ± 12.0
300 ± 15.0
400 ± 20.0
25 ± 1.3
50 ± 2.5
75 ± 3.8
100 ± 5.0
125 ± 6.3
150 ± 7.5
200 ± 10.0
225 ± 12.0
300 ± 15.0
375 ± 18.8
500 ± 25.0
30 ± 1.5
60 ± 3.0
90 ± 4.5
120 ± 6.0
150 ± 7.5
180 ± 9.0
240 ± 12.0
270 ± 13.5
360 ± 18.0
450 ± 22.5
600 ± 30.0
Imped
RDC
(ΩΩ)
(ΩΩ)
200 7.0 1504-40F
200 8.5 1504-80F
200 9.5 1504-120F
200 16.0 1504-160F
200 18.0 1504-200F
250 5.0 1504-240F
250 5.5 1504-320F
250 6.0 1504-360F
250 7.0 1504-480F
250 8.0 1504-600F
250 8.5 1504-800F
250 10.0 1504-50G
250 11.0 1504-100G
250 17.0 1504-150G
250 20.0 1504-200G
250 24.0 1504-220G
300 5.0 1504-250G
300 6.0 1504-300G
300 7.0 1504-380G
300 8.0 1504-400G
300 9.0 1504-450G
300 11.0 1504-500G
300 16.0 1504-600G
300 18.0 1504-750G
300 21.0 1504-1000G
300 24.0
300 40.0
Part
Number
Delay
(ns)
40 ± 2.0
80 ± 4.0
120 ± 6.0
160 ± 8.0
200 ± 10.0
240 ± 12.0
320 ± 16.0
360 ± 18.0
480 ± 24.0
600 ± 30.0
800 ± 40.0
50 ± 2.5
100 ± 5.0
150 ± 7.5
200 ± 10.0
220 ± 11.0
250 ± 12.5
300 ± 15.0
380 ± 19.0
400 ± 20.0
450 ± 22.5
500 ± 25.0
600 ± 30.0
750 ± 37.5
1000 ± 50
Imped
(ΩΩ)
400 8.5
400 9.0
400 9.0
400 16.0
400 18.0
400 20.0
400 26.0
400 28.0
400 38.0
400 45.0
400 40.0
500 6.0
500 10.0
500 16.0
500 30.0
500 31.0
500 25.0
500 26.0
500 33.0
500 42.0
500 45.0
500 55.0
500 58.0
500 50.0
500 65.0
RDC
(ΩΩ)
Doc #01006 DATA DELAY DEVICES, INC. 1
10/30/01 3 Mt. Prospect Ave. Clifton, NJ 07013
16 15 14 13 12 11 10 9
1 2 3 4 5 6 7 8
Lead Material:
Nickel-Iron alloy 42
TIN PLATE
.280
MAX.
.290
MAX.*
.018
TYP.
.700±.010
7 Equal spaces
each .100±.010
Non-Accumulative
.010±.002
.350
MAX.
Package Dimensions
PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT: OUTPUT:
Ambient Temperature: 25oC ± 3oC R
Input Pulse: High = 3.0V typical C
Low = 0.0V typical Threshold: 50% (Rising & Falling)
Source Impedance: 50Ω Max.
Rise/Fall Time: 3.0 ns Max. (measured
at 10% and 90% levels)
Pulse Width (TD <= 75ns): PWIN = 100ns
Period (TD <= 75ns): PERIN = 1000ns
Pulse Width (TD > 75ns): PWIN = 2 x T
Period (TD > 75ns): PERIN = 10 x T
D
D
: 10MΩ
load
: 10pf
load
*.320 MAX for delays
larger than 500ns
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
PER
IN
PW
IN
INPUT
SIGNAL
OUTPUT
SIGNAL
PULSE
GENERATOR
T
RISE
V
IH
D
RISE
T
RISE
Timing Diagram For Testing
R
50
IN
Ω
DEVICE UNDER
TEST (DUT)
RIN = R
OUT
Test Setup
= Z
LINE
T
FALL
V
IL
D
FALL
T
FALL
V
OH
V
OL
R
OUT
Doc #01006 DATA DELAY DEVICES, INC. 2
10/30/01 Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com