Atec UCS200M User Manual

Specifications

UCS 200M

Ultra-Compact Simulator for

Automotive Transients

Designed to meet the many test needs of today and the
rigours of converging world standards, the EM Test
UCS 200M generator offer a full range of conducted im­munity transient tests to ISO, JASO, SAE and manufac­turer standards.

The distinct operation features, convenient DUT connec­tion facilities, a clearly arranged menu structure and
display philosophy as well as the preprogrammed stan­dard test routines make testing easy, reliable and safe.
Extendable by a large variety of test accessories the
UCS 200M is the universal equipment for a wide range
of recommendations even for high power battery supply
application up to 200A.

• ISO 7637-2-2004

• SAE J1113 parts 11, 12

• SAE J1455

• JASO D001

• GM 3097

• Ford ES-XW7T

• Chrysler PF9326

• DC 10614

• BMW

• VW

• PSA

• Renault

• Fiat

• Nissan

• Honda

emc test equipment

Burst module, Pulse 3a/3b

Electrical Fast Transient Simulator based on ISO 7637-2:2004

S

Coupling Matrix type CNA

Test Level Output

acc. to ISO 7637-2:2004

Test voltage
Rise time tr
Pulse duration td 100ns (+100/-0)ns
Verification As per Annex D of ISO 7637-2:2004 into a

Source impedance
Polarity Pulse 3b positive and pulse 3a negative

25V – 1’000V ± 10%
5ns ± 1.5ns

50Ω and a 1,000Ω load
Zq = 50Ω

Trigger Circuit

Trigger of bursts Automatic, manual, external
Burst duration T4 = 0.1ms - 999.9ms
Burst repetition rate T5 = 10ms - 9,999ms
Spike frequency f = 0.1kHz - 200kHz
Test duration T = 0:01min - 999:59min or endless

Outputs

Direct
Coupling mode To the + battery line

CRO trigger 5V trigger signal for oscilloscope

Via 50Ω-coaxial connector

Test Routines

Quick Start On-line adjustable parameters, easy to use
Standard Test Routines acc. to ISO 7637-2:2004, level 1 - 4

User Test Routines User Test Routines

Random burst release
Change voltage after T by ∆T
Change frequency after T by ∆f

CRO trigger 5V trigger signal for oscilloscope

Technical data for standard CNA 50

DUT supply voltage Max. 60V
DUT supply current 50 A
Inrush current capability 100A for 500ms

Dimension UCS & CN

19“ / 3HU

Technical data for optional CNA 100

DUT supply voltage Max. 60V
DUT supply current 100 A
Inrush current capability 150A for 500ms

Dimension UCS & CN

19“ / 6HU

Technical data for optional CNA 150

DUT supply voltage Max. 60V
DUT supply current 150 A
Inrush current capability 150 A

Dimension UCS & CN

19“ / 9HU

Technical data for optional CNA 200

DUT supply voltage Max. 60V
DUT supply current 200 A
Inrush current capability 200 A

Dimension UCS & CN

19“ / 9HU

Input

DUT supply +/- Simulator type VDS 200B & PFS 200B
Pulse 5, 7 Standard for one type LD 200x

Output

+/- DUT supply Central DUT output
Coaxial output port To connect the capacitive coupling clamp as

per ISO 7637 part 3

Options

ACC Capacitive coupling clamp acc. to ISO 7637 part 3
KW50 100:1 divider, 50Ω
KW1000 400:1 divider, 1000Ω
CA EFT kit EFT/Burst verification kit
A6dB 6dB attenuator, 50Ω
ITP Immunity test probes (electrical field generation)
ITP/H Immunity test probes (magnetic field generation

EM TEST AG Tel: [phone]
Sternenhofstr. 15 Fax: [phone] ucs200m_eV115.doc
CH-4153 Reinach email: [e-mail] 09.08.07
Switzerland URL http://www.emtest.com Page 2/4

Interface

CN interface To control the internal CN by external pulse

generators such as LD 200B

Option

CNA Ext Extention to connect 3 additional generators

Micropulse module,

Pulse 1, 2 based on ISO 7637-2:2004

Micropulse module,

Pulses based on Jaso and Nissan

Test Level Output

Open circuit voltage

Repetition rate 0.2s – 99.0s

U = 20V – 600V ± 10% ( Peak voltage
and polarity acc. to the selected standard)

ISO Pulse 1 (12V)

Rise time tr (10 - 90%) 1µs + 0% // - 50%
Pulse duration td (10 - 10%)
Internal resistor

2ms ± 10%
10Ω ± 10%

ISO Pulse 1 (24V)

Rise time tr (10 - 90%) 3µs + 0% // - 50%
Pulse duration td (10 - 10%)
Internal resistor

1ms ± 10%
50Ω ± 10%

ISO Pulse 2 (12V/24V)

Rise time tr (10 - 90%) 1µs + 0% // - 50%
Pulse duration td (10 - 10%)
Internal resistor

50µs ± 10%
2Ω ± 10%

As per ISO 7637-2 the following standards can be covered

SAE J1113 GM 3097
BMW VW
Chrysler PF 9326 PSA
DC10614 Renault
FIAT Mitsubishi
Ford ES-XW7T Honda

Option Pulse Programming Mode

Rise time
Pulse duration
Internal resitor

1µs to 10µs with steps of 1µs
50µs to 10,000us
2Ω-100Ω in steps of 5Ω, 200, 400 & 450Ω

Trigger

Automatic Automatic release of the pulses
Manual Manual release of a single pulse
External External release of a single pulse
Battery supply switch Selectable Off time, to = 0 – 10,000ms

Output

+/- output Central DUT output
Coupling To the battery +line
Decoupling Via diode and battery supply switch

Test Routines

Quick Start Immediate start; easy to use and fast
User Test Routines 1. Custom made test routines

2. Change voltage after n pulses by ∆V
Pulse selctor
Service Service, setup, self test

Interface

Serial interface RS 232, baud rate 1200 - 19200
Parallel interface IEEE 488, address 1 - 30
CN interface To control the internal CN and battery

switch

JASO D 001

Pulse A2 as per JASO D 001

Test voltage +110V
Capacitor C = 4.7µF
Pulse duration at ττ(36,8%) = 2.5µs ± 30%
R1
R2
Polarity Positive

0.6Ω ± 10%

0.4Ω ± 10%

Pulse B2 as per JASO D 001

Test voltage -260V
Capacitor C = 33µF
Pulse duration at ττ(36,8%) = 2.0ms ± 20%
R1
R2
Polarity Negative

60Ω ± 10%
80Ω ± 10%

Pulse D2 as per JASO D 001

Test voltage +170V
Capacitor C = 2.2µF
Pulse duration at ττ(36,8%) = 2.5µs ± 30%
R1
R2
Polarity Positive

1.2Ω ± 10%

0.9Ω ± 10%

Nissan NDS

Pulse B2 as per Nissan

Open circuit voltage
Capacitor C = 33µF
R1
R2
Polarity Negative

– 300V ± 10%

100Ω ± 10%
75Ω ± 10%

Pulse C8 as per Nissan

Open circuit voltage
Capacitor C = 1µF
R1
R2
Polarity Positive and negative

±300V ± 10%

500Ω ± 10%
450Ω ± 10%

Pulse C50 as per Nissan

Open circuit voltage
Capacitor C = 33µF
R1
R2
Polarity Positive and negative

±300V ± 10%

30Ω ± 10%
200Ω ± 10%

Pulse C300 as per Nissan

Open circuit voltage
Capacitor C = 33µF
R1
R2
Polarity Negative

- 300V ± 10%

100Ω ± 10%
75Ω ± 10%

EM TEST AG Tel: [phone]
Sternenhofstr. 15 Fax: [phone] ucs200m_eV115.doc
CH-4153 Reinach email: [e-mail] 09.08.07
Switzerland URL http://www.emtest.com Page 3/4

Micropulse module,

Pulses based on SAE J1455

General data

SAE J1455

Mutual Pulse as per SAE J1455

Rise time tr (10% - 90%) 1µs +20%
Pulse duration td at τ 15µs ± 20%
Internal resistor

50Ω ± 10%

Inductive Pulse as per SAE J 1455

Rise time tr (10 - 90%)
Pulse duration td at τ 1,000µs ± 20%

Internal resistor

1µs ± 20%

20Ω ± 10%

Options

CA ISO Micropulse/Load Dump pulse verification kit

The SmartRack

Sophisticated Housing for Sophisticated Instruments

General data

Dimensions, weight
For models 50A 19“ / 3HU, approx. 20kg
For models 100A 19“ / 6HU, approx. 30kg
For models 150A and 200A 19“ / 9HU, approx. 35kg
Supply voltage 115/230V +10/-15%
Fuses 2 x T 2AT (230V) or 2 x T 4AT (115V)

Options

Rack For system integration; includes GPIB

bus, pulse bus, ground reference plane,
security switch and power contact.

ISMISO Software to control the test, including

standard library, test report facility and
data conversion generator.

UCS 200M 200A model

The best place to put your generators is in the SmartRack. A wired, "intel­ligent" rack, the SmartRack not only holds, but also interconnects and
controls equipment. Slide your generators into the SmartRack and you
can run entire test routines from your PC with no plugging or unplugging,
no stops or starts.

Select from a comprehensive directory of the most recent pre­programmed international and manufacturer standards – including custom
pulse waveforms – and the SmartRack does the rest. You can modify test
parameters and even create your own tests.

Just how easy is testing with the SmartRack? Consider this:

• The Device Under Test (DUT) voltage has one easy connection at the
UCS 200M coupling unit

• No need to keep plugging and unplugging DUTs

• The test rack has a ground reference plane that matches with the test
table specified in ISO 7637-2:2004

• ISM ISO (SmartRack) software controls the entire test process.

It generates test reports as well

• Tests can be initiated from front panels as well as from a PC

Technical data subject to change without notice.

EM TEST AG Tel: [phone]
Sternenhofstr. 15 Fax: [phone] ucs200m_eV115.doc
CH-4153 Reinach email: [e-mail] 09.08.07
Switzerland URL http://www.emtest.com Page 4/4